DE69708369T2 - Dickenmessgerät - Google Patents

Dickenmessgerät

Info

Publication number
DE69708369T2
DE69708369T2 DE69708369T DE69708369T DE69708369T2 DE 69708369 T2 DE69708369 T2 DE 69708369T2 DE 69708369 T DE69708369 T DE 69708369T DE 69708369 T DE69708369 T DE 69708369T DE 69708369 T2 DE69708369 T2 DE 69708369T2
Authority
DE
Germany
Prior art keywords
thickness gauge
gauge
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69708369T
Other languages
English (en)
Other versions
DE69708369D1 (de
Inventor
Halil Hassan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beta Lasermike Ltd
Original Assignee
Beta Lasermike Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beta Lasermike Ltd filed Critical Beta Lasermike Ltd
Application granted granted Critical
Publication of DE69708369D1 publication Critical patent/DE69708369D1/de
Publication of DE69708369T2 publication Critical patent/DE69708369T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69708369T 1996-04-12 1997-03-10 Dickenmessgerät Expired - Fee Related DE69708369T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9607654A GB2312043B (en) 1996-04-12 1996-04-12 Thickness measuring device

Publications (2)

Publication Number Publication Date
DE69708369D1 DE69708369D1 (de) 2002-01-03
DE69708369T2 true DE69708369T2 (de) 2002-07-18

Family

ID=10791996

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69708369T Expired - Fee Related DE69708369T2 (de) 1996-04-12 1997-03-10 Dickenmessgerät

Country Status (4)

Country Link
US (1) US5886521A (de)
EP (1) EP0801288B1 (de)
DE (1) DE69708369T2 (de)
GB (1) GB2312043B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021190713A1 (de) * 2020-03-25 2021-09-30 Micro-Epsilon Optronic Gmbh Optische positionierhilfe für einen abstandssensor, abstandsmesssystem und entsprechendes verfahren

Families Citing this family (24)

* Cited by examiner, † Cited by third party
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GB9616157D0 (en) * 1996-08-01 1996-09-11 Switched Reluctance Drives Ltd Current transducer
JP4874465B2 (ja) * 2000-03-28 2012-02-15 株式会社東芝 渦電流損失測定センサ
US7112961B2 (en) * 2002-12-13 2006-09-26 Applied Materials, Inc. Method and apparatus for dynamically measuring the thickness of an object
DE502006000795D1 (de) * 2005-10-05 2008-07-03 Komax Holding Ag Einrichtung zur Bestimmung des Leiterdurchmessers eines Kabels
ITMI20070063A1 (it) * 2007-01-18 2008-07-19 Electronics Systems S P A Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili
US7711217B2 (en) * 2007-04-13 2010-05-04 Kabushiki Kaisha Toshiba Active sensor, multipoint active sensor, method for diagnosing deterioration of pipe, and apparatus for diagnosing deterioration of pipe, and apparatus for diagnosis deterioration of pipe
US8078303B2 (en) * 2007-07-03 2011-12-13 Southwire Company Electronic supervisor
US8337278B2 (en) * 2007-09-24 2012-12-25 Applied Materials, Inc. Wafer edge characterization by successive radius measurements
KR101648989B1 (ko) * 2008-06-13 2016-08-17 쉴로이니게르 홀딩 아게 케이블 처리기의 케이블 자동감지장치, 케이블 처리방법 및 케이블처리기에서 케이블을 자동 식별하는 방법
EP2406579A4 (de) * 2009-03-12 2017-02-15 Daprox Ab Verfahren und vorrichtung zur kontaktfreien messung der dicke einer metallfreien beschichtung auf einer metallmatrixoberfläche
JP5621686B2 (ja) * 2011-03-29 2014-11-12 住友電装株式会社 ハーネス部品の膜厚検査方法及びハーネス部品の膜厚検査装置
DE102011107771B4 (de) * 2011-04-15 2013-10-17 Micro-Epsilon Messtechnik Gmbh & Co. Kg Vorrichtung und Verfahren zur Dickenmessung eines Messobjekts
EP2791617A4 (de) * 2011-12-14 2014-12-10 Daprox Ab Vorrichtung zur messung einer materialdicke
US10591515B2 (en) 2016-11-11 2020-03-17 Fluke Corporation Non-contact current measurement system
JP6822322B2 (ja) * 2017-06-02 2021-01-27 オムロン株式会社 センサ取付構造およびセンサ用取付具
WO2019109414A1 (zh) * 2017-12-06 2019-06-13 济南兰光机电技术有限公司 一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪
CN108050972B (zh) * 2017-12-30 2024-02-27 苏州宇邦新型材料股份有限公司 一种圆丝焊带涂层厚度测量装置及测量方法
CN108592834B (zh) * 2018-06-20 2023-10-31 国网安徽省电力有限公司电力科学研究院 一种用于电缆绝缘层厚度及内外径尺寸的测量装置
CN111486782A (zh) * 2019-01-26 2020-08-04 保定长空科技有限公司 一种玻璃钢涂层膜厚非接触式监测设备
CN113970687B (zh) * 2021-10-28 2023-10-27 中铁第四勘察设计院集团有限公司 一种常导高速磁悬浮长定子地面线圈的电缆试验方法
CN114018182A (zh) * 2021-11-16 2022-02-08 广西广缆科技集团有限公司 一种电力电缆生产测偏系统及测偏方法
CN115235354B (zh) * 2022-09-23 2022-12-30 湖北尚德金力电线电缆有限公司 一种电缆生产过程中铜管护套厚度及导体外径的测量方法
CN116989655B (zh) * 2023-09-26 2024-01-30 天蔚蓝电驱动科技(江苏)有限公司 绝缘涂层有效厚度的确定方法及涂覆方法
CN117261166B (zh) * 2023-10-09 2024-03-26 冀东普天线缆有限公司 电缆绝缘厚度在线监控系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH667327A5 (de) * 1984-06-18 1988-09-30 Zumbach Electronic Ag Verfahren und vorrichtung zum pruefen der wandstaerke einer isolierenden schicht.
GB8808261D0 (en) * 1988-04-08 1988-05-11 Kineron Gauging Systems Ltd Thickness measurement device
US5355083A (en) * 1988-11-16 1994-10-11 Measurex Corporation Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
JP2622885B2 (ja) * 1989-10-09 1997-06-25 明産株式会社 シート厚さ測定装置
DE4327712C2 (de) * 1993-08-18 1997-07-10 Micro Epsilon Messtechnik Sensoranordnung und Verfahren zum Erfassen von Eigenschaften der Oberflächenschicht eines metallischen Targets
GB2291185A (en) * 1994-07-12 1996-01-17 Beta Instr Co Eccentricity gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021190713A1 (de) * 2020-03-25 2021-09-30 Micro-Epsilon Optronic Gmbh Optische positionierhilfe für einen abstandssensor, abstandsmesssystem und entsprechendes verfahren

Also Published As

Publication number Publication date
US5886521A (en) 1999-03-23
GB9607654D0 (en) 1996-06-12
EP0801288A1 (de) 1997-10-15
DE69708369D1 (de) 2002-01-03
GB2312043B (en) 2000-07-05
GB2312043A (en) 1997-10-15
EP0801288B1 (de) 2001-11-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee