ITMI20070063A1 - Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili - Google Patents

Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili

Info

Publication number
ITMI20070063A1
ITMI20070063A1 IT000063A ITMI20070063A ITMI20070063A1 IT MI20070063 A1 ITMI20070063 A1 IT MI20070063A1 IT 000063 A IT000063 A IT 000063A IT MI20070063 A ITMI20070063 A IT MI20070063A IT MI20070063 A1 ITMI20070063 A1 IT MI20070063A1
Authority
IT
Italy
Prior art keywords
tapes
films
conductive
procedure
measuring
Prior art date
Application number
IT000063A
Other languages
English (en)
Inventor
Pictures S R L Eagle
Original Assignee
Electronics Systems S P A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronics Systems S P A filed Critical Electronics Systems S P A
Priority to IT000063A priority Critical patent/ITMI20070063A1/it
Priority to EP08000902.0A priority patent/EP1947416B1/en
Publication of ITMI20070063A1 publication Critical patent/ITMI20070063A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/42—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IT000063A 2007-01-18 2007-01-18 Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili ITMI20070063A1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT000063A ITMI20070063A1 (it) 2007-01-18 2007-01-18 Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili
EP08000902.0A EP1947416B1 (en) 2007-01-18 2008-01-18 Apparatus and process for measuring the thickness of electrically non conductive and non ferromagnetic materials in the form of films, webs and the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT000063A ITMI20070063A1 (it) 2007-01-18 2007-01-18 Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili

Publications (1)

Publication Number Publication Date
ITMI20070063A1 true ITMI20070063A1 (it) 2008-07-19

Family

ID=39322549

Family Applications (1)

Application Number Title Priority Date Filing Date
IT000063A ITMI20070063A1 (it) 2007-01-18 2007-01-18 Apparecchio e procedimento per misurare lo spessore di materiali elettricamente non conduttivi e non ferromagnetici in forma di film nastri e simili

Country Status (2)

Country Link
EP (1) EP1947416B1 (it)
IT (1) ITMI20070063A1 (it)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1228274A (it) * 1969-04-16 1971-04-15
DE3404720A1 (de) * 1984-02-10 1985-08-14 Karl Deutsch Prüf- und Meßgerätebau GmbH + Co KG, 5600 Wuppertal Verfahren und vorrichtung zur schichtdickenmessung
US5355083A (en) 1988-11-16 1994-10-11 Measurex Corporation Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
JP3284029B2 (ja) * 1995-09-06 2002-05-20 株式会社東芝 磁気記録再生装置における信号再生方法および磁気記録再生装置
GB2312043B (en) * 1996-04-12 2000-07-05 Beta Instr Co Thickness measuring device
IT1282789B1 (it) 1996-06-07 1998-03-31 Electronic Systems Spa Dispositivo di misurazione senza contatto di spessore per materiali non metallici in film,fogli,nastri o simili
US6593738B2 (en) * 2001-09-17 2003-07-15 Boris Kesil Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors

Also Published As

Publication number Publication date
EP1947416B1 (en) 2018-02-07
EP1947416A3 (en) 2014-07-23
EP1947416A2 (en) 2008-07-23

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