EP2406579A4 - Verfahren und vorrichtung zur kontaktfreien messung der dicke einer metallfreien beschichtung auf einer metallmatrixoberfläche - Google Patents

Verfahren und vorrichtung zur kontaktfreien messung der dicke einer metallfreien beschichtung auf einer metallmatrixoberfläche Download PDF

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Publication number
EP2406579A4
EP2406579A4 EP10751099.2A EP10751099A EP2406579A4 EP 2406579 A4 EP2406579 A4 EP 2406579A4 EP 10751099 A EP10751099 A EP 10751099A EP 2406579 A4 EP2406579 A4 EP 2406579A4
Authority
EP
European Patent Office
Prior art keywords
metal
contact measuring
measuring thickness
metal coating
metal matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10751099.2A
Other languages
English (en)
French (fr)
Other versions
EP2406579A1 (de
Inventor
Bengt ÅKERBLOM
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daprox AB
Original Assignee
Daprox AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daprox AB filed Critical Daprox AB
Publication of EP2406579A1 publication Critical patent/EP2406579A1/de
Publication of EP2406579A4 publication Critical patent/EP2406579A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/42—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
EP10751099.2A 2009-03-12 2010-03-12 Verfahren und vorrichtung zur kontaktfreien messung der dicke einer metallfreien beschichtung auf einer metallmatrixoberfläche Withdrawn EP2406579A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0950148 2009-03-12
PCT/SE2010/050278 WO2010104466A1 (en) 2009-03-12 2010-03-12 Method and means for non-contact measuring thickness of non-metal coating on surface of metal matrix

Publications (2)

Publication Number Publication Date
EP2406579A1 EP2406579A1 (de) 2012-01-18
EP2406579A4 true EP2406579A4 (de) 2017-02-15

Family

ID=42728574

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10751099.2A Withdrawn EP2406579A4 (de) 2009-03-12 2010-03-12 Verfahren und vorrichtung zur kontaktfreien messung der dicke einer metallfreien beschichtung auf einer metallmatrixoberfläche

Country Status (2)

Country Link
EP (1) EP2406579A4 (de)
WO (1) WO2010104466A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011051601A1 (de) * 2011-05-16 2012-11-22 Wolfgang Hausmann Vorrichtung und Verfahren zur einseitig berührungslosen Dickenmessung eines Messguts
EP2791617A4 (de) * 2011-12-14 2014-12-10 Daprox Ab Vorrichtung zur messung einer materialdicke
US8737183B1 (en) 2013-01-07 2014-05-27 Elwha, Llc Topographic feedforward system
WO2014107658A1 (en) * 2013-01-07 2014-07-10 Elwha Llc Topographic feedforward system
CN109489538B (zh) * 2018-12-20 2021-05-07 长庆石油勘探局有限公司技术监测中心 小口径长距离管道内壁非金属涂层厚度检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
US20050157314A1 (en) * 2003-12-22 2005-07-21 Pekka Typpoe Measuring device
US20090059232A1 (en) * 2007-08-31 2009-03-05 Abb Ltd. Web Measurement Device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE416844B (sv) * 1979-06-05 1981-02-09 Sunds Defibrator Sett och anordning for avstandsmetning mellan tva motstaende ytor av magnetiskt ledande material
DE3919131A1 (de) * 1989-06-12 1990-12-13 Tzn Forschung & Entwicklung Vorrichtung und verfahren zur beruehrungslosen messung der schichtdicke eines nichtleitenden materials sowie verwendung der vorrichtung zur messung kunststoffbeschichteter metallteile
GB2312043B (en) * 1996-04-12 2000-07-05 Beta Instr Co Thickness measuring device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
US20050157314A1 (en) * 2003-12-22 2005-07-21 Pekka Typpoe Measuring device
US20090059232A1 (en) * 2007-08-31 2009-03-05 Abb Ltd. Web Measurement Device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2010104466A1 *

Also Published As

Publication number Publication date
WO2010104466A1 (en) 2010-09-16
EP2406579A1 (de) 2012-01-18

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