WO2019109414A1 - 一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪 - Google Patents

一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪 Download PDF

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WO2019109414A1
WO2019109414A1 PCT/CN2017/118500 CN2017118500W WO2019109414A1 WO 2019109414 A1 WO2019109414 A1 WO 2019109414A1 CN 2017118500 W CN2017118500 W CN 2017118500W WO 2019109414 A1 WO2019109414 A1 WO 2019109414A1
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Prior art keywords
sample
tested
detecting
fixed
expansion ratio
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PCT/CN2017/118500
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English (en)
French (fr)
Inventor
姜允中
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济南兰光机电技术有限公司
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Priority claimed from CN201721686913.9U external-priority patent/CN207488497U/zh
Priority claimed from CN201711276523.9A external-priority patent/CN107884778A/zh
Application filed by 济南兰光机电技术有限公司 filed Critical 济南兰光机电技术有限公司
Publication of WO2019109414A1 publication Critical patent/WO2019109414A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/28—Investigating ductility, e.g. suitability of sheet metal for deep-drawing or spinning

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  • the invention relates to the technical field of material expansion rate detection, in particular to a device and a method for detecting material expansion ratio and a film heat shrinkage tester.
  • Ordinary displacement sensors require a certain amount of pulling force to be able to measure normally. Therefore, when the ordinary displacement sensor is used for measurement, it needs to be in contact with the sample to be tested, and the sample shrinks to generate a certain tensile force, thereby measuring the amount of expansion and contraction.
  • the object of the present invention is to solve the above problems.
  • the present invention provides a device and a method for detecting the expansion ratio of a material, and a film heat shrinkage tester, which fills the market gap of the film material expansion rate which cannot detect the small expansion force value at present, and greatly Improve detection accuracy.
  • the invention discloses a device for detecting the expansion ratio of a material, comprising: a sample fixing device for fixing one end of the sample to be tested, and the other end is free to sag;
  • the non-contact displacement detecting device adopts a non-contact measuring method to obtain a telescopic shape variable of the sample to be tested by capturing a position change at a set position of the sample to be tested.
  • the non-contact displacement detecting device comprises: a laser displacement sensor; the laser displacement sensor is connected to the sample fixing device directly or through a connecting member.
  • the non-contact displacement detecting device further includes: a reflecting plate fixed at a position on the sample to be tested that needs to reflect the laser; when the sample material does not reflect the laser, or the area of the sample reflecting the laser passes Hours, set the reflector to assist the sample to reflect the laser.
  • the non-contact displacement detecting device comprises: a light curtain sensor and a position board; the light curtain sensor is fixed on the sample fixing device, and the position board is fixed on the sample to be tested.
  • the non-contact displacement detecting device includes: a high frequency camera fixed to a side wall of the sample fixing device; and the high frequency on the other side wall of the sample fixing device Set the screen relative to the position of the camera; set the tablet or the marker on the sample to be tested.
  • the sample fixing device is provided with a plurality of fixed positions to be tested, and each fixed position of the sample to be tested corresponds to a non-contact displacement detecting device.
  • a heat insulation plate is disposed between the sample fixing device and the non-contact displacement measuring device.
  • the invention also discloses a method for detecting the expansion ratio of a material, comprising:
  • test sample is fixed at one end and the other end is free to sag;
  • the non-contact measurement method is used to obtain the telescopic shape variable of the sample to be tested by capturing the position change at the set position of the sample to be tested.
  • the invention further discloses a film heat shrink tester comprising: a base, a high temperature chamber and any of the above-mentioned devices for detecting the expansion ratio of the material;
  • the device for detecting the expansion ratio of the material and the high temperature chamber are respectively fixed on the base directly or through a connecting member, and the high temperature chamber is movably connected with the base.
  • the method further includes: at least one telescopic force value detecting device, the telescopic force value detecting device comprising: a telescopic force value detecting station disposed on the sample fixing device; and a force for detecting a telescopic force value of the sample to be tested Value sensor
  • the telescopic force value detecting device includes a force value sensor that is fixed to the heat shield.
  • the measuring device and method of the invention fills the market gap in which the material expansion rate of the small telescopic force value cannot be detected at present, and the detection precision is improved.
  • the end of the sample to be tested is unconstrained, close to freely stretchable, and more reactive to the true stretchability of the sample when heated or in case of cold.
  • the non-contact measurement method can detect the expansion and contraction of the sample in real time and grasp the telescopic characteristics of the material under specific circumstances.
  • FIG. 1 is a schematic structural view of a device for measuring a telescopic amount of a laser displacement sensor according to the present invention
  • FIG. 2 is a schematic structural view of a second embodiment of a device for measuring a telescopic amount of a laser displacement sensor according to the present invention
  • FIG. 3 is a schematic structural view of a device for measuring a telescopic amount of a light curtain sensor according to the present invention
  • FIG. 4 is a schematic structural view of an apparatus for measuring an expansion and contraction amount of a camera image or a video recording according to the present invention
  • Figure 5 is a side view showing the film thermal expansion tester of the present invention.
  • Figure 6 is a front elevational view showing the film thermal expansion tester of the present invention.
  • Figure 7 is a schematic view of a horizontal film thermal expansion tester of the present invention.
  • the embodiment discloses a device for detecting the expansion ratio of a material, as shown in FIG. 1 , comprising: a sample fixing device to be tested and a non-contact measuring device;
  • the non-contact measuring device is a laser displacement sensor 7, and one end of the sample to be tested 5 is fixed, and the other end is freely suspended.
  • the laser displacement sensor emits laser light to be reflected back by the sample to be tested, and the distance between the laser displacement sensor and the reflection point is calculated according to the distance; the distance between the laser displacement sensor and the reflection point measured before and after the expansion and contraction is obtained, and the sample to be tested is obtained. The amount of expansion and contraction, and then the expansion ratio.
  • the sample to be tested is a transparent material or a material that cannot reflect the laser
  • a reflector 6 is disposed at the end of the free hanging end of the sample 5 to be tested, and the quality of the reflector 6 is negligible. The influence on the state of the free drooping end of the sample to be tested is negligible.
  • One side of the reflecting plate 6 facing the laser displacement sensor 7 is a reflecting surface.
  • the fixing device to be tested comprises: a fixing frame 2 and a base 1 , and the fixing frame 2 is mounted on the base 1; the top of the fixing frame 2 is provided with a cross bar 3 for fixing the sample 5 to be tested; It is fixed to the cross bar 3 by means of bonding and fixing of the high temperature resistant adhesive tape 4, and the sample to be tested 5 is fixed by sticking, and the structure is simple.
  • the sample 5 to be tested enters the high temperature cavity, it is connected with the sample to be tested 5
  • the relevant components do not absorb heat from the high temperature chamber, causing temperature fluctuations in the high temperature chamber.
  • the laser displacement sensor 7 is fixed to the position of the base 1 on which the test sample 5 is to be treated.
  • the laser displacement sensor 7 is fixed to the lower end surface of the base 1 by screws 8.
  • the reflecting surface of the reflecting plate 6 faces the laser displacement sensor 7, and the reflecting surface of the reflecting plate 6 is flush with the bottommost end of the sample to be tested.
  • the base is provided as a light transmissive material or a hole is provided on the base which allows the laser to pass smoothly.
  • the laser displacement sensor 7 can be fixed above the sample to be tested, the position of the test sample being treated.
  • the reflecting surface of the reflecting plate 6 faces the laser displacement sensor 7, and the reflecting surface of the reflecting plate 6 is flush with the bottommost end of the sample to be tested.
  • the laser beam is irradiated from above to the reflecting plate and returned, thereby recording the amount of displacement change of the sample.
  • the laser displacement sensor 7 can also be fixed on one of the side walls of the fixing frame 2 at the position of the sample 5 to be tested. At this time, the reflecting surface of the reflecting plate 6 faces the laser displacement sensor 7; The bundle can reach the reflector directly.
  • the reflective mark is directly added to the set position of the sample to be tested, and the laser light is reflected.
  • the sample fixing device includes: a rectangular fixing frame 2, the sample to be tested 5 is fixed to the cross bar 3 of the rectangular fixing frame 2, and the laser displacement sensor 7 is fixed to the rectangular fixing frame 2 to be treated. Test the position of sample 5.
  • the crossbar 3 can be removed from the sample holder 2 to be tested to facilitate fixing the sample 5 to be tested, and then returning the sample holder 2 to be tested.
  • the laser displacement sensor 7 can be fixed on the bottom end of the rectangular fixing frame 2, or fixed on one side wall of the rectangular fixing frame 2, or directly fixed on a structure above the sample to be tested, and the specific implementation manner The same as the previous introduction, and will not be described here.
  • a plurality of to-be-tested sample expansion rate detecting stations can be set on the fixture to be tested, and correspondingly, each detecting station corresponds to one laser displacement sensor, so that multiple testables can be simultaneously performed. The sample is tested to improve the detection efficiency.
  • One end of the sample to be tested 5 is fixed to the cross bar 3, and the other end is bonded to the reflecting plate 6, and is free to sag.
  • the reflection plate 6 changes with the expansion and contraction position of the sample 5, and the laser displacement sensor 7 emits laser light.
  • the portion of the reflection plate 6 on the sample 5 to be tested reflects the laser light, according to the position of the laser reflection.
  • the position of the reflecting plate 6 is changed at a time, and the amount of change in the position of the reflecting plate 6 is calculated, thereby obtaining the amount of expansion and contraction of the sample 5.
  • one end of the sample to be tested 5 is fixed to the cross bar 3 by a jig for fixing the sample 5.
  • the jig for fixing the sample 5 is divided into a left collet 11 and a right collet 12, and the right collet 12 is fixed to the screw 9, the screw 9 passes through the through hole of the left collet 11, and the nut 10 on the other side of the left collet 11 Tighten.
  • the sample to be tested 5 is placed between the left and right chucks 12, and the nut 10 is tightened to the left and right chucks 12 to fix the sample 5.
  • the embodiment discloses a device for detecting the expansion ratio of a material, as shown in FIG. 3, comprising: a sample fixing device to be tested and a non-contact measuring device;
  • the non-contact measuring device selects a light curtain sensor
  • the light curtain sensor is an infrared sensor.
  • the infrared sensor includes an infrared emitter 13 and an infrared receiver 14.
  • the infrared emitter 13 includes a plurality of infrared transmitting tubes, and the infrared receiving unit
  • the device 14 includes a plurality of infrared receiving tubes.
  • the fixture to be tested comprises a base 1 and the light curtain sensor is fixed on the base 1; the sample to be tested 5 is suspended between the infrared emitter 13 and the infrared receiver 14; the end of the sample 5 to be tested is directly fixed to the light curtain On the sensor, the other end is bonded to the tablet 6 and is free to sag.
  • a plurality of to-be-tested expansion ratio detecting stations can be set on the fixture to be tested, and correspondingly, each inspection station corresponds to one light curtain sensor, so that multiple testables can be simultaneously performed. The sample is tested to improve the detection efficiency.
  • the positional plate 6 changes with the expansion and contraction position of the sample 5, and part of the laser beam blocked by the position plate 6 also changes, and the light curtain sensor records the change of the position of the laser beam.
  • the amount of change of the tablet 6 is calculated, and the amount of expansion and contraction of the sample 5 is obtained.
  • This embodiment discloses a device for detecting the expansion ratio of a material, as shown in FIG. Including: a sample fixture to be tested and a non-contact measurement device;
  • the non-contact measuring device is a high-frequency camera 15, the sample to be tested 5 is fixed at one end, the other end is freely suspended, and a position board 6 is disposed at the end of the free hanging end of the sample 5 to be tested, and the position is recorded.
  • the plate 6 is flush with the lowermost end surface of the sample 5 to be tested.
  • the fixing device to be tested comprises: a fixing frame 2 and a base 1 , and the fixing frame 2 is mounted on the base 1; the top of the fixing frame 2 is provided with a cross bar 3 for fixing the sample 5 to be tested; It is fixed to the cross bar 3 by means of adhesive bonding of the high temperature resistant adhesive tape 4, or the end of the test sample 5 can also be fixed to the cross bar 3 by the jig of the fixed sample 5 described in the second embodiment.
  • the sample fixing device includes: a rectangular fixing frame 2, the sample to be tested 5 is fixed to the crossbar 3 of the rectangular fixing frame 2, and the high frequency camera 15 is fixed to one side of the rectangular fixing frame 2 Positioning the sample 5 on the wall, setting the screen 16 at a position opposite to the high-frequency camera 15 on the other side wall of the rectangular holder 2; placing the position board 6 at the end of the free hanging end of the sample to be tested, The bottom edge of the bit plate 6 is flush with the bottom end of the sample to be tested.
  • the crossbar 3 can be removed from the sample holder 2 to be tested to facilitate fixing the sample 5 to be tested, and then returning the sample holder 2 to be tested.
  • testable telescope detection stations can be set on the fixture to be tested.
  • each test station corresponds to a high frequency camera 15 so that multiple test pieces can be simultaneously tested. The sample is tested to improve the detection efficiency.
  • the position plate When detecting the expansion ratio of the sample 5, the position plate changes with the expansion and contraction position of the sample 5, and the high frequency camera 15 takes a picture to acquire image information at a certain frequency, and then analyzes and processes the image information to calculate the position of the position board 6. The change was made, and the amount of expansion and contraction of the sample 5 and the expansion ratio were obtained.
  • a scale is provided on the curtain panel 16, so that the amount of displacement change of the positioner 6 can be directly read.
  • the invention discloses a film thermal expansion tester, as shown in FIG. 5 and FIG. 6, comprising: a base, a high temperature chamber and a device for detecting the expansion ratio of the material in the first embodiment;
  • the fixture to be tested is fixed to the base, wherein the laser displacement sensor is connected to the fixture to be tested through the heat shield.
  • the high temperature chamber is also mounted on the base, and can reciprocate in the vertical direction; when detecting, the high temperature chamber 17 is moved downward to cover the fixture to be tested; after the detection is completed, the high temperature chamber 17 is moved up.
  • the telescopic force value detecting station to be tested is set on the fixture to be tested, and the value of the telescopic force of the test sample is detected by the force value sensor 18.
  • One end of the sample to be tested is fixed to the sample fixing device by the upper chuck 21, and the other end is connected to the connecting member 19 through the lower chuck 22; the force value sensor 18 is fixed under the heat insulating plate 20 through the connecting member 19 Connected to the lower collet 22.
  • a plurality of testable force value detecting stations can be set, and each of the detecting stations corresponds to one force value sensor 18, and the plurality of samples can be simultaneously tested for the value of the stretching force.
  • the invention discloses a horizontal film thermal stretching tester, as shown in FIG. 7 , comprising: a base, a high temperature chamber and a device for detecting the expansion ratio of the material in the first embodiment;
  • the base is fixed horizontally, and the high temperature cavity is fixed on the base, and can move back and forth in the left and right direction;
  • the fixture to be tested is provided in the form of a U-shaped frame 23, and the top end of the U-shaped frame 23 is provided with a crossbar for fixing the sample to be tested; one side of the U-shaped frame 23 is connected to the inner side of a side wall of the base.
  • the high temperature chamber is moved to the right to completely cover the U-shaped frame 23.
  • the laser displacement sensor is fixed on the outer side of the side wall through the heat insulating plate, so that the laser displacement sensor is always outside the high temperature chamber to avoid high temperature. The effect on detection accuracy.

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Abstract

一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪，包括：试样固定装置，用于将待测试样（5）的一端固定，另一端自由下垂；非接触式位移检测装置，采用非接触的测量方式，通过捕捉待测试样（5）设定位置处的位置变化，得出待测试样（5）的伸缩形变量。有益效果：测量装置及方法提高了检测精度；待测试样（5）一端无约束，接近于自由伸缩，更能反应待测试样（5）加热或遇冷时真实的伸缩性能；采用非接触式的测量方式，能实时检测待测试样（5）在特定环境下的伸缩变化，掌握材料在特定环境下的伸缩特性。

Description

一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪 技术领域
本发明涉及材料伸缩率检测技术领域，尤其涉及一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪。
背景技术
由于不同的材料自身的特性，各行各业中都或多或少存在着材料因为环境影响而导致外形伸缩变化的情况。而材料自身的此种变化对工作及生产过程的影响是极大的。为了对此种特性加以利用或规避，因此需要对材料本身的伸缩率进行了解和掌握。
检测材料试样伸缩率的方法有很多，可以通过尺规直接测量，也可采用位移传感器进行测量。众所周知，尺规的测量方法误差极大，而且在某些高温、高湿等特殊的工况条件下无法用尺规实时测量试样的伸缩变化。
普通位移传感器要求有一定的拉力驱动，才能正常测量，因此，普通位移传感器在进行测量时，需要与待测试样进行接触，试样收缩产生一定的拉力，从而测量得到伸缩量。
现有的检测材料伸缩率的方法往往采用接触式测量方式，测量时检测元件与试样接触。对于常规的伸缩力值较大的薄膜类材料，与外部测量元件接触测试时，接触件之间的摩擦力不足以影响试样本身的伸缩力，因此，该种材料可以采用接触式测量方式进行测量。但是，对于伸缩力值特别小的薄膜类材料，其伸缩力值往往不足以驱动普通位移传感器正常工作；因此，如果采用传统的接触式的测量方式，测量时检测元件与试样接触，会干扰试样本身的伸缩膨胀特性，无法准确检测出材料的伸缩率。
另外，由于试样所处的环境特殊，比如高温、低温，或高压、高湿等所有可能引起材料伸缩、膨胀的环境，都比较特殊，而传感器处于特殊环境下，检测精度、寿命等都会受影响。
因此，对于一些伸缩力值较小且工作环境特殊的薄膜类材料，目前尚没有有效的测量方法来对其伸缩率进行检测。
发明内容
本发明的目的是解决上述问题，本发明提出了一种检测材料伸缩率的装置、方法以及薄膜热缩测试仪，填补了目前无法检测小伸缩力值的薄膜材料伸缩率的市场空白，极大地提高了检测精度。
为了实现上述目的，本发明采用如下技术方案：
本发明公开了一种检测材料伸缩率的装置，包括：试样固定装置，用于将待测试样的一端固定，另一端自由下垂；
非接触式位移检测装置，采用非接触的测量方式，通过捕捉待测试样设定位置处的位置变化，得出待测试样的伸缩形变量。
进一步地，所述非接触式位移检测装置包括：激光位移传感器；所述激光位移传感器直接或通过连接件与试样固定装置连接。
进一步地，所述非接触式位移检测装置还包括：反射板，所述反射板固定在待测试样上需要反射激光的位置；当试样材质不反射激光，或试样反射激光的面积过小时，设置反射板辅助试样反射激光。
进一步地，所述非接触式位移检测装置包括：光幕传感器和记位板；所述光幕传感器固定在试样固定装置上，所述记位板固定在待测试样上。
进一步地，所述非接触式位移检测装置包括：高频相机，所述高频相机固定在试样固定装置的一侧壁上；在试样固定装置的另一侧壁上与所述高频相机相对的位置设置幕板；在待测试样上设置记位板或记位标识。
进一步地，所述试样固定装置上设有多个待测试样固定位，每一个待测试样固定位对应一个非接触式位移检测装置。
进一步地，所述试样固定装置与非接触式位移测量装置之间设有隔热板。
本发明还公开了一种检测材料伸缩率的方法，包括：
待测试样一端固定，另一端自由下垂；
在预先设定的环境下，采用非接触的测量方式，通过捕捉待测试样设定位置处的位置变化，得出待测试样的伸缩形变量。
本发明进一步公开了一种薄膜热缩测试仪，包括：底座、高温腔以及上述的任一种检测材料伸缩率的装置；
所述检测材料伸缩率的装置和高温腔分别直接或通过连接件固定在底座上， 所述高温腔与底座可移动连接。
进一步地，还包括：至少一个伸缩力值检测装置，所述伸缩力值检测装置包括：设置在试样固定装置上的伸缩力值检测工位以及用于检测待测试样伸缩力值的力值传感器；
或者；
所述伸缩力值检测装置包括：力值传感器，所述力值传感器固定到隔热板上。
本发明有益效果：
本发明的测量装置及方法填补了目前无法检测小伸缩力值材料伸缩率的市场空白、提高了检测精度。
待测试样一端无约束，接近于自由伸缩，更能反应试样加热或遇冷时真实的伸缩性能。
采用非接触式的测量方式，能实时检测试样的伸缩变化，掌握材料在特定环境下的伸缩特性。
说明书附图
图1为本发明激光位移传感器测量伸缩量的装置结构示意图；
图2为本发明激光位移传感器测量伸缩量的装置实施例二结构示意图；
图3为本发明光幕传感器测量伸缩量的装置结构示意图；
图4为本发明相机成像或录像测量伸缩量的装置结构示意图；
图5为本发明薄膜热伸缩测试仪器侧视示意图；
图6为本发明薄膜热伸缩测试仪器主视示意图；
图7为本发明卧式薄膜热伸缩测试仪器示意图；
其中，1.底座，2.固定架，3.横杆，4.胶布，5.试样，6.反射板或者记位板，7.激光位移传感器，8.螺钉，9.螺杆，10.螺母，11.左夹头，12.右夹头，13.发射器，14.接收器，15.高频相机，16.幕板,17.高温腔，18.力值传感器，19.连接件，20.隔热板，21.上夹头，22.下夹头，23.U型框。
具体实施方式
下面结合附图和具体实施例对本发明作进一步介绍。
应该指出，以下详细说明都是例示性的，旨在对本申请提供进一步的说明。除非另有指明，本发明使用的所有技术和科学术语具有与本申请所属技术领域的普通技术人员通常理解的相同含义。
实施例一
本实施例公开了一种检测材料伸缩率的装置，如图1所示，包括：待测试样固定装置和非接触式测量装置；
本实施例中，非接触式测量装置为激光位移传感器7，待测试样5一端固定，另一端自由悬垂。
激光位移传感器发出激光被待测试样反射回来，据此计算激光位移传感器与反射点的距离；根据伸缩前后分别测量得到的激光位移传感器与反射点之间的距离，得出待测试样的伸缩量，进而求得伸缩率。
需要说明的是，如果待测试样本身是透明的材料或者是不能够反射激光的材料的时，在待测试样5的自由下垂端的末端设置反射板6，反射板6的质量微乎其微，因此，对于待测试样的自由下垂端的状态影响可以忽略不计。反射板6正对激光位移传感器7的一面为反射面。
待测试样固定装置包括：固定架2和底座1，固定架2安装于底座1上；固定架2的顶部设有用于固定待测试样5的横杆3；待测试样5一端采用通过耐高温胶布4粘接固定的方式固定到横杆3上，通过粘贴的方式固定待测试样5，结构简单，待测试样5进入高温腔内时，与待测试样5连接的相关组件不会吸取高温腔热量，引起高温腔的温度波动。
作为一种优选的实施方式，激光位移传感器7固定于底座1上正对待测试样5的位置。该种实施方式下，激光位移传感器7通过螺钉8固定于底座1的下端面。这样，在待测试样进入高温腔时，由于底座的隔温效果，对激光位移传感器7起到一定的隔温作用，避免高温影响激光位移传感器7的检测精度；或者，在激光位移传感器和底座之间设置隔热板，同样能够起到隔温效果。
此时，反射板6的反射面正对激光位移传感器7，并且，反射板6的反射面与待测试样的最底端平齐。
为了使激光发射器7发出的激光能够成功到达发射板6，将底座设置成透光 的材料或者在底座上设置能够使得激光顺利穿过的孔。
作为另外一种实施方式，激光位移传感器7可以固定在待测试样的上方，正对待测试样的位置。
此时，反射板6的反射面正对激光位移传感器7，并且，反射板6的反射面与待测试样的最底端平齐。激光束从上方照射到反射板并返回，从而记录试样的位移变化量。
作为再一种实施方式，激光位移传感器7还可以固定于固定架2的其中一侧壁上正对待测试样5的位置，此时，反射板6的反射面正对激光位移传感器7；这样激光束可以直接到达反射板。或者，不用反射板，直接在待测试样的设定位置增加反射标记，起到反射激光的作用。
作为另外一种实施方式，待测试样固定装置包括：矩形固定架2，待测试样5固定到矩形固定架2的横杆3处，激光位移传感器7固定到矩形固定架2上正对待测试样5的位置。
作为优选的实施方式，横杆3可从待测试样5固定架2上取下，以方便固定待测试样5，然后再放回待测试样5固定架2。
同样的，激光位移传感器7可以固定在矩形固定架2的底端，或者固定在矩形固定架2的其中一侧壁上，或者直接固定在待测试样上方的某结构上，具体实现的方式与前面的介绍相同，在此不再赘述。
需要说明的是，待测试样固定装置上可以设置多个待测试样伸缩率检测工位，相应的，每一个检测工位对应一个激光位移传感器，这样就可以同时对多个待测试样进行检测，提高了检测效率。
上述装置的使用方法如下：
将待测试样5一端固定于横杆3上，另一端与反射板6相粘接，并自由下垂。
对待测试样5伸缩率进行检测时，反射板6随着试样5的伸缩位置发生变化，激光位移传感器7发出激光，待测试样5上反射板6部分将激光反射，根据激光反射的位置，将反射板6产生的位置变化时时记录，并通过计算得出反射板6的位置变化量，进而得出试样5的伸缩量与伸缩率。
实施例二
如图2所示，在实施例一的基础上，待测试样5一端通过固定试样5的夹具固定到横杆3上。固定试样5的夹具分为左夹头11和右夹头12，右夹头12上固定螺杆9，螺杆9穿过左夹头11的通孔，被左夹头11另一侧的螺母10拧紧。将待测试样5置于左右夹头12之间，螺母10拧紧左右夹头12便可固定夹持试样5。
除了待测试样5的固定方式以外，其余结构与实施例一相同，在此不再赘述。
实施例三
本实施例公开了一种检测材料伸缩率的装置，如图3所示，包括：待测试样固定装置和非接触式测量装置；
本实施例中，非接触式测量装置选用光幕传感器，光幕传感器为红外传感器，所述红外传感器包括红外发射器13、红外接收器14，红外发射器13包括多个红外发射管，红外接收器14包括多个红外接收管。
待测试样固定装置包括底座1，光幕传感器固定于底座1上；待测试样5悬挂于红外发射器13与红外接收器14之间；将待测试样5一端直接固定到光幕传感器上，另一端与记位板6相粘接，并自由下垂。
需要说明的是，待测试样固定装置上可以设置多个待测试样伸缩率检测工位，相应的，每一个检测工位对应一个光幕传感器，这样就可以同时对多个待测试样进行检测，提高了检测效率。
上述装置的使用方法如下：
检测试样5伸缩率时，记位板6随着试样5的伸缩位置发生变化，所受记位板6遮挡的部分激光束也随之发生改变，光幕传感器记录激光束位置变化情况，计算得出记位板6变化量，进而得出试样5的伸缩量与伸缩率。
实施例四
本实施例公开了一种检测材料伸缩率的装置，如图4所示。包括：待测试样固定装置和非接触式测量装置；
本实施例中，非接触式测量装置为高频相机15，待测试样5一端固定，另一端自由悬垂，并且，在待测试样5的自由下垂端的末端设置记位板6，记位板6与待测试样5的最下端面平齐。
待测试样固定装置包括：固定架2和底座1，固定架2安装于底座1上；固定架2的顶部设有用于固定待测试样5的横杆3；待测试样5一端采用通过耐高温胶布4粘接固定的方式固定到横杆3上，或者，待测试样5一端也可以通过实施例二中所述的固定试样5的夹具固定到横杆3上。
作为另外一种实施方式，待测试样固定装置包括：矩形固定架2，待测试样5固定到矩形固定架2的横杆3处，高频相机15固定到矩形固定架2其中一侧壁上正对试样5的位置，在矩形固定架2的另一侧壁上与高频相机15相对的位置设置幕板16；在待测试样自由下垂端的末端设置记位板6，记位板6的底边与待测试样的底端平齐。
作为优选的实施方式，横杆3可从待测试样5固定架2上取下，以方便固定待测试样5，然后再放回待测试样5固定架2。
需要说明的是，待测试样固定装置上可以设置多个待测试样伸缩率检测工位，相应的，每一个检测工位对应一个高频相机15，这样就可以同时对多个待测试样进行检测，提高了检测效率。
上述装置的使用方法如下：
检测试样5伸缩率时，记位板随着试样5的伸缩位置发生变化，高频相机15按一定频率拍照采集图像信息，然后对图像信息进行分析处理，计算出记位板6的位置变化情况，进而得出试样5的伸缩量与伸缩率。
作为另外一种实施方式，在幕板16上设有刻度，这样能够直接读出记位板6的位移变化量。
实施例五
本发明公开了一种薄膜热伸缩测试仪，如图5和图6所示，包括：底座、高温腔以及实施例一中的检测材料伸缩率的装置；
待测试样固定装置固定到底座上，其中，激光位移传感器通过隔热板与待测试样固定装置连接。
高温腔也安装到底座上，可沿竖直方向做往复运动；进行检测时，将高温腔17向下移动，罩住待测试样固定装置；检测完成后，将高温腔17上移。
作为另外一种实施方式，在待测试样固定装置上设置待测试样伸缩力值检测 工位，通过力值传感器18对待测试样的伸缩力值进行检测。
待测试样一端通过上夹头21固定到待测试样固定装置上，另一端通过下夹头22与连接件19连接；力值传感器18固定在隔热板20的下方，通过连接件19与下夹头22连接。
需要说明的是，待测试样伸缩力值检测工位可以设置多个，每一个检测工位对应一个力值传感器18，可以同时对多个试样进行伸缩力值检测。
实施例六
本发明公开了一种卧式薄膜热伸缩测试仪，如图7所示，包括：底座、高温腔以及实施例一中的检测材料伸缩率的装置；
底座呈卧式固定，高温腔固定在底座上，能够沿左右方向来回移动；
待测试样固定装置设置成U型框23的形式，U型框23的顶端设置用于固定待测试样的横杆；U型框23的一侧与底座的一侧壁的内侧连接，进行伸缩率检测时，高温腔向右移动能够完全罩住U型框23，激光位移传感器通过隔热板固定在所述侧壁的外侧，保证激光位移传感器始终处于高温腔的外面，以避免高温对于检测精度的影响。
上述虽然结合附图对本发明的具体实施方式进行了描述，但并非对本发明保护范围的限制，所属领域技术人员应该明白，在本发明的技术方案的基础上，本领域技术人员不需要付出创造性劳动即可做出的各种修改或变形仍在本发明的保护范围以内。

Claims (10)

  1. 一种检测材料伸缩率的装置，其特征在于，包括：试样固定装置，用于将待测试样的一端固定，另一端自由下垂；
    非接触式位移检测装置，采用非接触的测量方式，通过捕捉待测试样设定位置处的位置变化，得出待测试样的伸缩形变量。
  2. 如权利要求1所述的一种检测材料伸缩率的装置，其特征在于，所述非接触式位移检测装置包括：激光位移传感器；所述激光位移传感器直接或通过连接件与试样固定装置连接。
  3. 如权利要求2所述的一种检测材料伸缩率的装置，其特征在于，所述非接触式位移检测装置还包括：反射板，所述反射板固定在待测试样上需要反射激光的位置。
  4. 如权利要求1所述的一种检测材料伸缩率的装置，其特征在于，所述非接触式位移检测装置包括：光幕传感器和记位板；所述光幕传感器固定在试样固定装置上，所述记位板固定在待测试样上。
  5. 如权利要求1所述的一种检测材料伸缩率的装置，其特征在于，所述非接触式位移检测装置包括：高频相机，所述高频相机固定在试样固定装置的一侧壁上；在试样固定装置的另一侧壁上与所述高频相机相对的位置设置幕板；在待测试样上设置记位板或记位标识。
  6. 如权利要求1所述的一种检测材料伸缩率的装置，其特征在于，所述试样固定装置上设有多个待测试样固定位，每一个待测试样固定位对应一个非接触式位移检测装置。
  7. 如权利要求1所述的一种检测材料伸缩率的装置，其特征在于，所述试样固定装置与非接触式位移测量装置之间设有隔热板。
  8. 一种检测材料伸缩率的方法，其特征在于，包括：
    待测试样一端固定，另一端自由下垂；
    在预先设定的环境下，采用非接触的测量方式，通过捕捉待测试样设定位置处的位置变化，得出待测试样的伸缩形变量。
  9. 一种薄膜热缩测试仪，其特征在于，包括：底座、高温腔以及权利要求1-7所述的任一种检测材料伸缩率的装置；
    所述检测材料伸缩率的装置和高温腔分别直接或通过连接件固定在底座上， 所述高温腔与底座可移动连接。
  10. 如权利要求9所述的一种薄膜热缩测试仪，其特征在于，还包括：至少一个伸缩力值检测装置，所述伸缩力值检测装置包括：设置在试样固定装置上的伸缩力值检测工位以及用于检测待测试样伸缩力值的力值传感器；
    或者；
    所述伸缩力值检测装置包括：力值传感器，所述力值传感器固定到隔热板上。
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848120A (zh) * 2021-09-30 2021-12-28 浙江律通复合材料有限公司 复合材料收缩率测试设备
CN115993427A (zh) * 2023-02-16 2023-04-21 江苏亨通高压海缆有限公司 一种阻水带测试装置、系统及测试方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2312043B (en) * 1996-04-12 2000-07-05 Beta Instr Co Thickness measuring device
CN103499603A (zh) * 2013-09-27 2014-01-08 大连理工大学 非接触式高温热物理性能参数测量装置及方法
CN104155333A (zh) * 2014-07-01 2014-11-19 中国电子科技集团公司第二十三研究所 一种电线电缆线膨胀系数测量装置及测量方法
CN204612671U (zh) * 2014-11-12 2015-09-02 核工业理化工程研究院 一种光学薄膜元件热变形的检测光路
CN105865934A (zh) * 2016-05-05 2016-08-17 河北地质大学 杨氏模量测量装置及其测量方法
CN205786124U (zh) * 2016-05-27 2016-12-07 江苏鑫丰塑业有限公司 一种塑料热延伸测试装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2312043B (en) * 1996-04-12 2000-07-05 Beta Instr Co Thickness measuring device
CN103499603A (zh) * 2013-09-27 2014-01-08 大连理工大学 非接触式高温热物理性能参数测量装置及方法
CN104155333A (zh) * 2014-07-01 2014-11-19 中国电子科技集团公司第二十三研究所 一种电线电缆线膨胀系数测量装置及测量方法
CN204612671U (zh) * 2014-11-12 2015-09-02 核工业理化工程研究院 一种光学薄膜元件热变形的检测光路
CN105865934A (zh) * 2016-05-05 2016-08-17 河北地质大学 杨氏模量测量装置及其测量方法
CN205786124U (zh) * 2016-05-27 2016-12-07 江苏鑫丰塑业有限公司 一种塑料热延伸测试装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848120A (zh) * 2021-09-30 2021-12-28 浙江律通复合材料有限公司 复合材料收缩率测试设备
CN113848120B (zh) * 2021-09-30 2023-03-31 浙江律通复合材料有限公司 复合材料收缩率测试设备
CN115993427A (zh) * 2023-02-16 2023-04-21 江苏亨通高压海缆有限公司 一种阻水带测试装置、系统及测试方法
CN115993427B (zh) * 2023-02-16 2024-04-26 江苏亨通高压海缆有限公司 一种阻水带测试装置、系统及测试方法

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