DE69636471D1 - Flache Bildaufnahmevorrichtung mit gemeinsamer gemusterter Elektrode - Google Patents

Flache Bildaufnahmevorrichtung mit gemeinsamer gemusterter Elektrode

Info

Publication number
DE69636471D1
DE69636471D1 DE69636471T DE69636471T DE69636471D1 DE 69636471 D1 DE69636471 D1 DE 69636471D1 DE 69636471 T DE69636471 T DE 69636471T DE 69636471 T DE69636471 T DE 69636471T DE 69636471 D1 DE69636471 D1 DE 69636471D1
Authority
DE
Germany
Prior art keywords
imaging device
patterned electrode
flat imaging
common patterned
common
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69636471T
Other languages
English (en)
Other versions
DE69636471T2 (de
Inventor
George Edward Possin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Application granted granted Critical
Publication of DE69636471D1 publication Critical patent/DE69636471D1/de
Publication of DE69636471T2 publication Critical patent/DE69636471T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures

Landscapes

  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Radiography Using Non-Light Waves (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
DE69636471T 1995-12-21 1996-12-17 Flache Bildaufnahmevorrichtung mit gemeinsamer gemusterter Elektrode Expired - Fee Related DE69636471T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/576,324 US5648654A (en) 1995-12-21 1995-12-21 Flat panel imaging device with patterned common electrode
US576324 1995-12-21

Publications (2)

Publication Number Publication Date
DE69636471D1 true DE69636471D1 (de) 2006-10-05
DE69636471T2 DE69636471T2 (de) 2007-03-15

Family

ID=24303952

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69636471T Expired - Fee Related DE69636471T2 (de) 1995-12-21 1996-12-17 Flache Bildaufnahmevorrichtung mit gemeinsamer gemusterter Elektrode

Country Status (4)

Country Link
US (1) US5648654A (de)
EP (1) EP0780903B1 (de)
JP (1) JP4022276B2 (de)
DE (1) DE69636471T2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0183761B1 (ko) * 1995-11-29 1999-03-20 김광호 고체촬상소자 및 그 제조방법
US5777355A (en) * 1996-12-23 1998-07-07 General Electric Company Radiation imager with discontinuous dielectric
US5859463A (en) * 1996-12-23 1999-01-12 General Electric Company Photosensitive imager contact pad structure
US6037609A (en) 1997-01-17 2000-03-14 General Electric Company Corrosion resistant imager
JP4011734B2 (ja) 1998-06-02 2007-11-21 キヤノン株式会社 ２次元光センサ、それを用いた放射線検出装置及び放射線診断システム
US6266391B1 (en) * 1999-08-31 2001-07-24 General Electric Company Artifact compensation system for matrix-addressed x-ray imaging panel
US6404851B1 (en) 2000-03-30 2002-06-11 General Electric Company Method and apparatus for automatic exposure control using localized capacitive coupling in a matrix-addressed imaging panel
AU2002249846A1 (en) * 2000-11-10 2002-08-12 Hologic, Inc. Photoconductive imaging panel with externally controlled conductivity
US6777685B2 (en) * 2002-04-03 2004-08-17 General Electric Company Imaging array and methods for fabricating same
US6740884B2 (en) * 2002-04-03 2004-05-25 General Electric Company Imaging array and methods for fabricating same
US6559506B1 (en) 2002-04-03 2003-05-06 General Electric Company Imaging array and methods for fabricating same
US6933528B2 (en) * 2002-04-04 2005-08-23 Nec Lcd Technologies, Ltd. In-plane switching mode active matrix type liquid crystal display device and method of fabricating the same
US6944265B2 (en) * 2002-11-25 2005-09-13 Ge Medical Systems Global Technology Company, Llc Image pasting using geometry measurement and a flat-panel detector
JP4376522B2 (ja) * 2003-01-24 2009-12-02 シャープ株式会社 電磁波検出器
US6895076B2 (en) * 2003-06-03 2005-05-17 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for multiple image acquisition on a digital detector
US20040246355A1 (en) * 2003-06-06 2004-12-09 Ji Ung Lee Storage capacitor array for a solid state radiation imager
US7145152B2 (en) * 2003-10-14 2006-12-05 General Electric Company Storage capacitor design for a solid state imager
US6982176B2 (en) * 2003-10-30 2006-01-03 General Electric Company Method for monitoring production of pixel detectors and detectors produced thereby
US7256403B2 (en) 2004-09-30 2007-08-14 General Electric Company Photodiode for imaging system and method of making
US7207741B2 (en) * 2004-09-30 2007-04-24 Reliance Electric Technologies, Llc Bushing system for power transmission products
US8430563B2 (en) * 2009-12-22 2013-04-30 Real Time Imaging Technologies, Llc Dental fluoroscopic imaging system
TWI464715B (zh) * 2010-06-17 2014-12-11 Au Optronics Corp 畫素陣列及具有此畫素陣列的顯示面板
JP2013172101A (ja) * 2012-02-22 2013-09-02 Fujifilm Corp 放射線検出器、放射線画像撮影装置、及び放射線画像撮影システム
EP3244800A1 (de) 2015-01-12 2017-11-22 Real Time Imaging Technologies, LLC Niedrigdosiertes röntgenbildgebungssystem

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4873516A (en) * 1987-06-01 1989-10-10 General Electric Company Method and system for eliminating cross-talk in thin film transistor matrix addressed liquid crystal displays
JPH02223927A (ja) * 1989-02-27 1990-09-06 Hitachi Ltd 液晶表示パネル
US5121214A (en) * 1990-06-29 1992-06-09 The United States Of America As Represented By The United States Department Of Energy Method for eliminating artifacts in CCD imagers
US5273910A (en) * 1990-08-08 1993-12-28 Minnesota Mining And Manufacturing Company Method of making a solid state electromagnetic radiation detector
US5187369A (en) * 1990-10-01 1993-02-16 General Electric Company High sensitivity, high resolution, solid state x-ray imaging device with barrier layer
EP0523784A1 (de) * 1991-07-15 1993-01-20 Philips Electronics Uk Limited Bildgebender Detektor und Methode seiner Herstellung

Also Published As

Publication number Publication date
DE69636471T2 (de) 2007-03-15
EP0780903A2 (de) 1997-06-25
EP0780903B1 (de) 2006-08-23
JP4022276B2 (ja) 2007-12-12
EP0780903A3 (de) 1998-08-26
US5648654A (en) 1997-07-15
JPH09247533A (ja) 1997-09-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee