DE69617628T2 - Varicapdiode und verfahren zur herstellung - Google Patents

Varicapdiode und verfahren zur herstellung

Info

Publication number
DE69617628T2
DE69617628T2 DE69617628T DE69617628T DE69617628T2 DE 69617628 T2 DE69617628 T2 DE 69617628T2 DE 69617628 T DE69617628 T DE 69617628T DE 69617628 T DE69617628 T DE 69617628T DE 69617628 T2 DE69617628 T2 DE 69617628T2
Authority
DE
Germany
Prior art keywords
production method
varicap diode
varicap
diode
production
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69617628T
Other languages
English (en)
Other versions
DE69617628D1 (de
Inventor
Roelof Huisman
Johannes Buyk
Wolfgang Bindke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE69617628D1 publication Critical patent/DE69617628D1/de
Application granted granted Critical
Publication of DE69617628T2 publication Critical patent/DE69617628T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66083Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H01L29/66174Capacitors with PN or Schottky junction, e.g. varactors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/92Capacitors with potential-jump barrier or surface barrier
    • H01L29/93Variable capacitance diodes, e.g. varactors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Recrystallisation Techniques (AREA)
DE69617628T 1995-09-18 1996-09-11 Varicapdiode und verfahren zur herstellung Expired - Lifetime DE69617628T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP95202519 1995-09-18
PCT/IB1996/000921 WO1997011498A1 (en) 1995-09-18 1996-09-11 A varicap diode and method of manufacturing a varicap diode

Publications (2)

Publication Number Publication Date
DE69617628D1 DE69617628D1 (de) 2002-01-17
DE69617628T2 true DE69617628T2 (de) 2002-08-14

Family

ID=8220643

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69617628T Expired - Lifetime DE69617628T2 (de) 1995-09-18 1996-09-11 Varicapdiode und verfahren zur herstellung

Country Status (7)

Country Link
US (1) US5854117A (de)
EP (1) EP0792525B1 (de)
JP (1) JPH10509563A (de)
KR (1) KR970707590A (de)
CN (1) CN1165586A (de)
DE (1) DE69617628T2 (de)
WO (1) WO1997011498A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE511721C2 (sv) * 1997-06-18 1999-11-15 Ericsson Telefon Ab L M Substrat för integrerade högfrekvenskretsar samt förfarande för substratframställning
ATE511701T1 (de) * 2000-03-03 2011-06-15 Nxp Bv Verfahren zur herstellung einer schottky varicap diode
EP1139434A3 (de) * 2000-03-29 2003-12-10 Tyco Electronics Corporation Variable Kapazitätsdiode mit hyperabruptem Übergangsprofil
US6995068B1 (en) * 2000-06-09 2006-02-07 Newport Fab, Llc Double-implant high performance varactor and method for manufacturing same
DE10032389A1 (de) * 2000-07-06 2002-01-17 Philips Corp Intellectual Pty Empfänger mit Kapazitätsvariationsdiode
US6521939B1 (en) 2000-09-29 2003-02-18 Chartered Semiconductor Manufacturing Ltd. High performance integrated varactor on silicon
US6933774B2 (en) * 2000-11-28 2005-08-23 Precision Dynamics Corporation Rectifying charge storage element with transistor
US6982452B2 (en) * 2000-11-28 2006-01-03 Precision Dynamics Corporation Rectifying charge storage element
US6924691B2 (en) * 2000-11-28 2005-08-02 Precision Dynamics Corporation Rectifying charge storage device with sensor
US6414543B1 (en) 2000-11-28 2002-07-02 Precision Dynamics Corporation Rectifying charge storage element
US7031182B2 (en) * 2000-11-28 2006-04-18 Beigel Michael L Rectifying charge storage memory circuit
US6924688B1 (en) 2000-11-28 2005-08-02 Precision Dynamics Corporation Rectifying charge storage device with antenna
US6835977B2 (en) * 2002-03-05 2004-12-28 United Microelectronics Corp. Variable capactor structure
US7204425B2 (en) * 2002-03-18 2007-04-17 Precision Dynamics Corporation Enhanced identification appliance
CN100353567C (zh) * 2003-11-19 2007-12-05 联华电子股份有限公司 制作可变电容的方法
CN100442542C (zh) * 2003-12-15 2008-12-10 松下电器产业株式会社 制造可变电容二极管的方法及可变电容二极管
WO2006022623A1 (en) * 2004-07-22 2006-03-02 Precision Dynamics Corporation Rectifying charge storage device with sensor
US7919382B2 (en) * 2008-09-09 2011-04-05 Freescale Semicondcutor, Inc. Methods for forming varactor diodes
CN101834134B (zh) * 2009-03-12 2012-03-21 中芯国际集成电路制造(上海)有限公司 提高金属-氧化物半导体变容二极管的品质因子的方法
DE102009059873A1 (de) 2009-12-21 2011-06-22 Epcos Ag, 81669 Varaktor und Verfahren zur Herstellung eines Varaktors
KR101138407B1 (ko) * 2010-03-15 2012-04-26 고려대학교 산학협력단 버랙터가 구비된 반도체 집적 회로, 및 그 제조 방법
RU2447541C1 (ru) * 2010-12-03 2012-04-10 Федеральное государственное унитарное предприятие "Научно-исследовательский институт микроприборов-К" Мдп-варикап
RU2569906C1 (ru) * 2014-08-26 2015-12-10 Акционерное общество "Научно-исследовательский институт микроприборов-К" (АО "НИИМП-К") Многоэлементный мдп варикап
KR102013867B1 (ko) 2015-08-05 2019-08-26 한국전자통신연구원 병렬 처리 장치 및 방법
RU2614663C1 (ru) * 2015-12-29 2017-03-28 Общество с ограниченной ответственностью "Лаборатория Микроприборов" Варикап и способ его изготовления
RU167582U1 (ru) * 2016-06-08 2017-01-10 Акционерное общество "Научно-исследовательский институт микроприборов-К" Свч мдп-варикап с переносом заряда
JP6299835B1 (ja) * 2016-10-07 2018-03-28 株式会社Sumco エピタキシャルシリコンウェーハおよびエピタキシャルシリコンウェーハの製造方法
RU192894U1 (ru) * 2019-07-09 2019-10-04 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" СВЧ МДП-варикап

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7513161A (nl) * 1975-11-11 1977-05-13 Philips Nv Werkwijze ter vervaardiging van een halfgeleider- inrichting, en inrichting vervaardigd volgens de werkwijze.
US4106953A (en) * 1976-12-28 1978-08-15 Motorola, Inc. Method of producing an ion implanted tuning diode
DE2833319C2 (de) * 1978-07-29 1982-10-07 Philips Patentverwaltung Gmbh, 2000 Hamburg Kapazitätsdiode
JPS5669869A (en) * 1979-11-09 1981-06-11 Toshiba Corp Manufacture of variable capacity diode
US4534806A (en) * 1979-12-03 1985-08-13 International Business Machines Corporation Method for manufacturing vertical PNP transistor with shallow emitter
US4656498A (en) * 1980-10-27 1987-04-07 Texas Instruments Incorporated Oxide-isolated integrated Schottky logic
JPS6057952A (ja) * 1983-09-09 1985-04-03 Toshiba Corp 半導体装置の製造方法
JPS6247166A (ja) * 1985-08-26 1987-02-28 Toshiba Corp 半導体装置の製造方法
JPS6459874A (en) * 1987-08-31 1989-03-07 Toko Inc Manufacture of variable-capacitance diode
US5197077A (en) * 1992-02-28 1993-03-23 Mcdonnell Douglas Corporation Low divergence laser

Also Published As

Publication number Publication date
DE69617628D1 (de) 2002-01-17
EP0792525A1 (de) 1997-09-03
WO1997011498A1 (en) 1997-03-27
EP0792525B1 (de) 2001-12-05
JPH10509563A (ja) 1998-09-14
KR970707590A (ko) 1997-12-01
US5854117A (en) 1998-12-29
CN1165586A (zh) 1997-11-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL