DE69514851D1 - Interatomares Messverfahren - Google Patents
Interatomares MessverfahrenInfo
- Publication number
- DE69514851D1 DE69514851D1 DE69514851T DE69514851T DE69514851D1 DE 69514851 D1 DE69514851 D1 DE 69514851D1 DE 69514851 T DE69514851 T DE 69514851T DE 69514851 T DE69514851 T DE 69514851T DE 69514851 D1 DE69514851 D1 DE 69514851D1
- Authority
- DE
- Germany
- Prior art keywords
- interatomic
- measurement method
- measurement
- interatomic measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/04—Display or data processing devices
- G01Q30/06—Display or data processing devices for error compensation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/85—Scanning probe control process
- Y10S977/851—Particular movement or positioning of scanning tip
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US21605794A | 1994-03-22 | 1994-03-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69514851D1 true DE69514851D1 (de) | 2000-03-09 |
DE69514851T2 DE69514851T2 (de) | 2000-10-12 |
Family
ID=22805495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69514851T Expired - Lifetime DE69514851T2 (de) | 1994-03-22 | 1995-03-21 | Interatomares Messverfahren |
Country Status (6)
Country | Link |
---|---|
US (1) | US5589686A (de) |
EP (1) | EP0674170B1 (de) |
JP (1) | JP2983876B2 (de) |
KR (1) | KR100407202B1 (de) |
DE (1) | DE69514851T2 (de) |
TW (1) | TW275130B (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4432304C2 (de) * | 1994-09-10 | 1996-10-17 | Forschungszentrum Juelich Gmbh | Verfahren zum Scannen einer Probenoberfläche mit einer Rastersonde eines Rastersondenmikroskops |
JP3581475B2 (ja) * | 1995-02-13 | 2004-10-27 | キヤノン株式会社 | 情報処理装置 |
US5744799A (en) * | 1996-05-20 | 1998-04-28 | Ohara; Tetsuo | Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
JP2960013B2 (ja) * | 1996-07-29 | 1999-10-06 | 慧 清野 | 移動物体の検出用目盛及びこれを用いた移動物体の検出装置 |
US6518570B1 (en) * | 1998-04-03 | 2003-02-11 | Brookhaven Science Associates | Sensing mode atomic force microscope |
US6079254A (en) * | 1998-05-04 | 2000-06-27 | International Business Machines Corporation | Scanning force microscope with automatic surface engagement and improved amplitude demodulation |
US6169281B1 (en) | 1998-07-29 | 2001-01-02 | International Business Machines Corporation | Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions |
US6639686B1 (en) * | 2000-04-13 | 2003-10-28 | Nanowave, Inc. | Method of and apparatus for real-time continual nanometer scale position measurement by beam probing as by laser beams and the like of atomic and other undulating surfaces such as gratings or the like relatively moving with respect to the probing beams |
US7414250B1 (en) | 2004-11-30 | 2008-08-19 | Northwestern University | Cryogenic variable temperature vacuum scanning tunneling microscope |
KR20060070960A (ko) * | 2004-12-21 | 2006-06-26 | 엘지전자 주식회사 | 위치센서를 포함하는 원자력현미경을 이용한 나노정보저장 장치 |
US7430484B2 (en) * | 2006-03-31 | 2008-09-30 | Tetsuo Ohara | Signal processing method and apparatus for use in real-time subnanometer scale position measurements with the aid of probing sensors and beams scanning periodically undulating surfaces such as gratings and diffraction patterns generated thereby, and the like |
JP2008191062A (ja) * | 2007-02-07 | 2008-08-21 | Jeol Ltd | 走査型プローブ顕微鏡 |
FR2959823B1 (fr) * | 2010-05-07 | 2013-05-17 | Centre Nat Rech Scient | Microscope a force atomique fonctionnant en mode circulaire, dispositif permettant sa mise en oeuvre et procede de mesure |
CN101949957B (zh) * | 2010-09-10 | 2013-04-17 | 东华大学 | 一种采用半导体纳米线作为探针精确移动纳米线的方法 |
CN102354391B (zh) * | 2011-09-26 | 2013-07-24 | 武汉理工大学 | 基于全向搜索机制变异函数的最优遥感尺度选择方法 |
WO2015085316A1 (en) * | 2013-12-07 | 2015-06-11 | Bruker Nano, Inc. | Force measurement with real-time baseline determination |
US10041856B2 (en) * | 2016-03-01 | 2018-08-07 | Cleveland Electric Laboratories Company | Method and apparatus for measuring physical displacement |
US11079405B1 (en) * | 2020-05-05 | 2021-08-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for detecting ferroelectric signal |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
US4618767A (en) * | 1985-03-22 | 1986-10-21 | International Business Machines Corporation | Low-energy scanning transmission electron microscope |
USRE33387E (en) * | 1985-11-26 | 1990-10-16 | International Business Machines Corporation | Atomic force microscope and method for imaging surfaces with atomic resolution |
EP0646913B1 (de) * | 1987-08-25 | 1999-01-13 | Canon Kabushiki Kaisha | Tunnelstromkodierer |
US4823004A (en) * | 1987-11-24 | 1989-04-18 | California Institute Of Technology | Tunnel and field effect carrier ballistics |
DE69002503T2 (de) * | 1989-03-29 | 1994-03-03 | Canon Kk | Kantendetektor. |
JP2775464B2 (ja) * | 1989-04-27 | 1998-07-16 | キヤノン株式会社 | 位置検出装置 |
JP2686645B2 (ja) * | 1989-05-08 | 1997-12-08 | キヤノン株式会社 | 走査型トンネル電流検出装置 |
JP3132567B2 (ja) * | 1989-11-08 | 2001-02-05 | 株式会社日立製作所 | 走査型探針顕微装置 |
US5085070A (en) * | 1990-02-07 | 1992-02-04 | At&T Bell Laboratories | Capacitive force-balance system for measuring small forces and pressures |
US5171992A (en) * | 1990-10-31 | 1992-12-15 | International Business Machines Corporation | Nanometer scale probe for an atomic force microscope, and method for making same |
JPH05151925A (ja) * | 1991-11-26 | 1993-06-18 | Jeol Ltd | 表面分析装置 |
JP3000500B2 (ja) * | 1992-09-02 | 2000-01-17 | セイコーインスツルメンツ株式会社 | 原子間力顕微鏡 |
US5426302A (en) * | 1993-04-28 | 1995-06-20 | Board Of Regents, University Of Texas | Optically guided macroscopic-scan-range/nanometer resolution probing system |
US5406832A (en) * | 1993-07-02 | 1995-04-18 | Topometrix Corporation | Synchronous sampling scanning force microscope |
-
1995
- 1995-03-20 JP JP7085935A patent/JP2983876B2/ja not_active Expired - Fee Related
- 1995-03-21 EP EP95301891A patent/EP0674170B1/de not_active Expired - Lifetime
- 1995-03-21 DE DE69514851T patent/DE69514851T2/de not_active Expired - Lifetime
- 1995-03-22 KR KR1019950006032A patent/KR100407202B1/ko not_active IP Right Cessation
- 1995-04-08 TW TW084103373A patent/TW275130B/zh not_active IP Right Cessation
-
1996
- 1996-01-19 US US08/588,651 patent/US5589686A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69514851T2 (de) | 2000-10-12 |
EP0674170B1 (de) | 2000-02-02 |
TW275130B (de) | 1996-05-01 |
US5589686A (en) | 1996-12-31 |
EP0674170A1 (de) | 1995-09-27 |
KR100407202B1 (ko) | 2004-03-18 |
KR950034391A (ko) | 1995-12-28 |
JPH0882522A (ja) | 1996-03-26 |
JP2983876B2 (ja) | 1999-11-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee | ||
8370 | Indication of lapse of patent is to be deleted |