DE69433701D1 - Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters - Google Patents
Gerät zur Prüfung der elektrischen Bauteile eines WechselrichtersInfo
- Publication number
- DE69433701D1 DE69433701D1 DE69433701T DE69433701T DE69433701D1 DE 69433701 D1 DE69433701 D1 DE 69433701D1 DE 69433701 T DE69433701 T DE 69433701T DE 69433701 T DE69433701 T DE 69433701T DE 69433701 D1 DE69433701 D1 DE 69433701D1
- Authority
- DE
- Germany
- Prior art keywords
- inverter
- testing
- electrical components
- electrical
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
- G01R31/42—AC power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Inverter Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5278241A JPH07128399A (ja) | 1993-11-08 | 1993-11-08 | インバータ回路の検査装置 |
JP27824193 | 1993-11-08 | ||
JP11274894A JP2865559B2 (ja) | 1994-05-26 | 1994-05-26 | トランジスタの検査方法 |
JP11274894 | 1994-05-26 | ||
JP22796594 | 1994-09-22 | ||
JP6227965A JP2962654B2 (ja) | 1994-09-22 | 1994-09-22 | 電解コンデンサの検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69433701D1 true DE69433701D1 (de) | 2004-05-13 |
DE69433701T2 DE69433701T2 (de) | 2005-03-17 |
Family
ID=27312327
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69433701T Expired - Fee Related DE69433701T2 (de) | 1993-11-08 | 1994-11-08 | Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters |
DE69428326T Expired - Fee Related DE69428326T2 (de) | 1993-11-08 | 1994-11-08 | Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69428326T Expired - Fee Related DE69428326T2 (de) | 1993-11-08 | 1994-11-08 | Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters |
Country Status (3)
Country | Link |
---|---|
US (3) | US5497095A (de) |
EP (3) | EP1326085A3 (de) |
DE (2) | DE69433701T2 (de) |
Families Citing this family (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0919003A (ja) * | 1995-06-27 | 1997-01-17 | Honda Motor Co Ltd | 電動車両におけるコンデンサの劣化判定装置 |
JP3704400B2 (ja) * | 1996-07-03 | 2005-10-12 | ファナック株式会社 | モータのインバータ駆動制御装置における異常診断方法 |
US5889685A (en) * | 1996-08-02 | 1999-03-30 | Cirrus Logic, Inc. | Method and apparatus for automatically characterizing short circuit current and power consumption in a digital circuit |
JP3137060B2 (ja) * | 1997-01-20 | 2001-02-19 | 株式会社村田製作所 | コンデンサの良否判別方法 |
DE19718041A1 (de) * | 1997-04-29 | 1998-11-12 | Daimler Benz Ag | Schaltungsanordnung und Verfahren zur Überprüfung der Kontaktierung eines Schalters oder Tasters |
JP3711360B2 (ja) * | 1999-02-10 | 2005-11-02 | ナストーア株式会社 | ダイオード不良検出装置 |
DE19922818A1 (de) * | 1999-05-19 | 2000-11-23 | Nokia Mobile Phones Ltd | Verfahren zur Überprüfung einer Auswerteschaltung |
US6191723B1 (en) * | 1999-07-22 | 2001-02-20 | Fluke Corporation | Fast capacitance measurement |
FR2797345B1 (fr) * | 1999-08-04 | 2002-03-29 | Univ Claude Bernard Lyon | Procede et dispositif pour determiner individuellement l'etat de vieillissement d'un condensateur |
FR2801681B1 (fr) * | 1999-11-30 | 2002-02-08 | Thomson Csf | Procede et dispositif de mesure de la temperature de composants hyperfrequence |
DE10216986A1 (de) * | 2002-04-16 | 2003-10-30 | Heidenhain Gmbh Dr Johannes | Verfahren zum Überprüfen eines Umrichters |
US6758547B2 (en) * | 2002-07-10 | 2004-07-06 | Lexmark International, Inc. | Method and apparatus for machine specific overcurrent detection |
FI116178B (fi) * | 2002-08-22 | 2005-09-30 | Abb Oy | Vaihtosuuntaajan lähtökuristinsovitelma |
KR100658242B1 (ko) * | 2003-03-17 | 2006-12-14 | 미쓰비시덴키 가부시키가이샤 | 인버터 장치 |
JP4397681B2 (ja) * | 2003-12-03 | 2010-01-13 | 株式会社ワコム | 位置指示器及び位置検出装置 |
JP2005295712A (ja) * | 2004-03-31 | 2005-10-20 | Sanyo Denki Co Ltd | インバータ装置の出力電流検出方法及び装置 |
US7148697B2 (en) * | 2004-06-04 | 2006-12-12 | Doljack Frank A | System and method for measuring electrical characteristics of a capacitor |
JP4797487B2 (ja) * | 2005-07-26 | 2011-10-19 | パナソニック株式会社 | 車両用電源装置 |
US7245180B2 (en) * | 2005-08-02 | 2007-07-17 | Sony Ericsson Mobile Communications Ab | Intelligent RF power control for wireless modem devices |
US7439753B2 (en) * | 2005-11-23 | 2008-10-21 | Zippy Technology Corp. | Inverter test device and a method thereof |
US8461849B1 (en) * | 2006-11-30 | 2013-06-11 | Electro Scientific Industries, Inc. | Multivariate predictive insulation resistance measurement |
KR20090029333A (ko) * | 2007-09-18 | 2009-03-23 | 삼성전자주식회사 | 평활용 전해콘덴서의 고장진단장치 및 그 방법 |
DE102007051004B4 (de) * | 2007-10-26 | 2010-04-08 | Continental Automotive Gmbh | Verfahren zur Vorrichtung zur Detektion und Lokalisierung von Fehlern in einem Umrichter und/oder einer elektrischen Maschine eines elektrischen Antriebs |
TW200951461A (en) * | 2008-03-19 | 2009-12-16 | Humo Lab Ltd | A method for inspecting insulation property of a capacitor |
ATE512451T1 (de) * | 2008-04-04 | 2011-06-15 | Abb Technology Ag | Mittelspannungsschutzschalter mit kondensatorbanküberwachung. |
ES2358135B2 (es) * | 2008-09-22 | 2012-03-20 | GAMESA INNOVATION & TECHNOLOGY, S.L. | Método de detección de fallos en un convertidor de frecuencia acoplado al generador de un aerogenerador. |
US7977963B2 (en) * | 2009-07-21 | 2011-07-12 | GM Global Technology Operations LLC | Methods, systems and apparatus for detecting abnormal operation of an inverter sub-module |
US8698505B2 (en) * | 2009-08-06 | 2014-04-15 | Yokogawa Electric Corporation | Measurement apparatus detecting consumption current of a display |
US8866499B2 (en) * | 2009-08-27 | 2014-10-21 | Analog Devices, Inc. | System and method for measuring capacitance |
CN101696999A (zh) * | 2009-10-16 | 2010-04-21 | 深圳华为通信技术有限公司 | 无线数据业务设备自诊断方法及系统 |
JP4911231B2 (ja) | 2010-02-15 | 2012-04-04 | 株式会社デンソー | 回転電機制御装置、および、これを用いた電動パワーステアリング装置 |
JP2012137341A (ja) | 2010-12-24 | 2012-07-19 | Toshiba Corp | 電子機器、及び同電子機器における蓄電器静電容量検出方法 |
KR101327591B1 (ko) | 2012-07-02 | 2013-11-12 | 엘에스산전 주식회사 | 인버터의 직류링크 커패시터 진단장치 |
US9927466B2 (en) | 2012-07-06 | 2018-03-27 | General Electric Company | System and method for controlling dynamic output impedance of an inverter |
ITMI20121191A1 (it) | 2012-07-06 | 2014-01-07 | Gen Electric | Sistemi, procedimenti, e dispositivi per la stima della capacita' di condensatori di potenza |
US9140746B2 (en) * | 2012-11-22 | 2015-09-22 | Hewlett-Packard Development Company, L.P. | Methods for diagnosing the condition of an electrical system |
DE102014202717B3 (de) * | 2014-02-14 | 2015-06-11 | Robert Bosch Gmbh | System zur Kapazitätsbestimmung eines Zwischenkreiskondensators und Verfahren zum Ansteuern eines Wechselrichters |
CN104865456B (zh) * | 2014-02-21 | 2018-06-19 | 广东易事特电源股份有限公司 | 一种电源系统的驱动信号的质量检测方法和装置 |
EP2940850A1 (de) * | 2014-04-29 | 2015-11-04 | ABB Technology AG | Verfahren zur Überwachung einer Gleichstromverbindungskapazität in Leistungswandlern |
CN104166083B (zh) * | 2014-08-14 | 2017-04-05 | 北京天诚同创电气有限公司 | Igbt 反向并联二极管的故障检测方法及装置 |
CN104267357A (zh) * | 2014-09-12 | 2015-01-07 | 中铝宁夏能源集团有限公司 | 一种可移动式户外逆变器检测系统 |
US10191021B2 (en) * | 2015-02-27 | 2019-01-29 | Deere & Company | Method for estimating a temperature of a transistor |
DE102015109285A1 (de) * | 2015-04-09 | 2016-10-13 | Weidmüller Interface GmbH & Co. KG | Elektrische Baugruppe sowie Messschaltung und Messverfahren zur Überwachung eines Bauelements der elektrischen Baugruppe |
JP6426783B2 (ja) * | 2017-03-14 | 2018-11-21 | ファナック株式会社 | パワー素子の異常検知機能を備えたモータ駆動装置 |
CN107271808B (zh) * | 2017-05-17 | 2019-06-11 | 浙江万里学院 | 基于红外热成像技术的多电平逆变器故障诊断方法 |
US10809307B2 (en) | 2017-09-26 | 2020-10-20 | E-Xteq Europe | Differential battery testers |
CN110208619B (zh) * | 2019-06-04 | 2021-03-09 | 龙源(北京)风电工程技术有限公司 | 风电场变桨用超级电容寿命估算方法及其系统和风电机组 |
KR20210040724A (ko) * | 2019-10-04 | 2021-04-14 | 주식회사 엘지화학 | 배터리 관리 장치 |
CN113176468B (zh) * | 2021-06-10 | 2022-09-13 | 阳光电源股份有限公司 | 一种逆变器检测方法及其应用装置 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2455543A (en) * | 1947-08-20 | 1948-12-07 | Franklin Transformer Mfg Compa | Capacitor testing instrument |
US2872644A (en) * | 1956-12-10 | 1959-02-03 | Reich Bernard | Measurement of transistor thermal resistance |
US2953748A (en) * | 1957-04-15 | 1960-09-20 | Texas Instruments Inc | Transistor testing |
US3504285A (en) * | 1968-03-22 | 1970-03-31 | Gen Motors Corp | Transistor protective circuit |
US3778713A (en) * | 1972-04-06 | 1973-12-11 | W Jamison | Transistor and diode tester |
JPS539542B2 (de) * | 1972-09-21 | 1978-04-06 | ||
US4243933A (en) * | 1978-09-20 | 1981-01-06 | Analogic Corporation | Capacitance measurement apparatus |
SU1196699A1 (ru) * | 1984-03-27 | 1985-12-07 | Всесоюзный научно-исследовательский институт радиовещательного приема и акустики им.А.С.Попова | Устройство дл измерени температуры перехода транзистора |
US4626952A (en) * | 1984-08-27 | 1986-12-02 | Mitsubishi Denki Kabushiki Kaisha | Protection apparatus for a transistor inverter |
US4795966A (en) * | 1986-05-02 | 1989-01-03 | Sencore, Inc. | Method and apparatus for measuring the equivalent series resistances of a capacitor |
DE3778094D1 (de) * | 1986-08-01 | 1992-05-14 | Siemens Ag | Verfahren und einrichtung zur erkennung der polaritaet gepolter kondensatoren. |
US4841458A (en) * | 1987-07-07 | 1989-06-20 | Honeywell, Incorporated | Analog to digital conversion by measuring the ratio of RC time constants |
JPH0670660B2 (ja) * | 1988-08-01 | 1994-09-07 | 株式会社日立製作所 | インバータ装置 |
US5073757A (en) * | 1988-09-23 | 1991-12-17 | John Fluke Mfg. Co., Inc. | Apparatus for and method of measuring capacitance of a capacitive element |
JPH03269268A (ja) * | 1990-03-19 | 1991-11-29 | Hitachi Ltd | コンデンサ劣化診断装置 |
JP2641816B2 (ja) * | 1991-07-23 | 1997-08-20 | 三菱電機株式会社 | 半導体集積回路の測定方法 |
JPH05215800A (ja) * | 1992-02-04 | 1993-08-24 | Toyota Autom Loom Works Ltd | コンデンサの劣化診断方法 |
US5294889A (en) * | 1992-03-27 | 1994-03-15 | Tandy Corporation | Battery operated capacitance measurement circuit |
KR940007718B1 (ko) * | 1992-12-01 | 1994-08-24 | 금성산전 주식회사 | 인-서킷(In-Circuit) 테스터의 캐패시터 역삽 검출회로 |
DE4421906C2 (de) * | 1994-06-24 | 1996-10-24 | Vdo Schindling | Verfahren und Schaltungsanordnung zur Messung des Widerstandes eines Widerstandssensors |
-
1994
- 1994-11-08 DE DE69433701T patent/DE69433701T2/de not_active Expired - Fee Related
- 1994-11-08 DE DE69428326T patent/DE69428326T2/de not_active Expired - Fee Related
- 1994-11-08 EP EP03076066A patent/EP1326085A3/de not_active Withdrawn
- 1994-11-08 EP EP94308219A patent/EP0652445B1/de not_active Expired - Lifetime
- 1994-11-08 EP EP00202365A patent/EP1046923B1/de not_active Expired - Lifetime
- 1994-11-08 US US08/337,479 patent/US5497095A/en not_active Expired - Lifetime
-
1996
- 1996-03-04 US US08/610,754 patent/US5694051A/en not_active Expired - Lifetime
- 1996-12-17 US US08/768,205 patent/US5798648A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1046923B1 (de) | 2004-04-07 |
EP0652445B1 (de) | 2001-09-19 |
EP1326085A2 (de) | 2003-07-09 |
DE69433701T2 (de) | 2005-03-17 |
DE69428326D1 (de) | 2001-10-25 |
EP1326085A3 (de) | 2007-11-14 |
EP0652445A3 (de) | 1996-03-27 |
EP0652445A2 (de) | 1995-05-10 |
US5798648A (en) | 1998-08-25 |
EP1046923A2 (de) | 2000-10-25 |
US5694051A (en) | 1997-12-02 |
US5497095A (en) | 1996-03-05 |
EP1046923A3 (de) | 2001-10-04 |
DE69428326T2 (de) | 2002-04-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |