DE69416001D1 - Vorrichtung zur messung des brechungsindex - Google Patents

Vorrichtung zur messung des brechungsindex

Info

Publication number
DE69416001D1
DE69416001D1 DE69416001T DE69416001T DE69416001D1 DE 69416001 D1 DE69416001 D1 DE 69416001D1 DE 69416001 T DE69416001 T DE 69416001T DE 69416001 T DE69416001 T DE 69416001T DE 69416001 D1 DE69416001 D1 DE 69416001D1
Authority
DE
Germany
Prior art keywords
pct
transparent object
region
date
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69416001T
Other languages
English (en)
Other versions
DE69416001T2 (de
Inventor
David Alan Svendsen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE69416001D1 publication Critical patent/DE69416001D1/de
Application granted granted Critical
Publication of DE69416001T2 publication Critical patent/DE69416001T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/412—Index profiling of optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
DE69416001T 1993-11-08 1994-11-03 Vorrichtung zur messung des brechungsindex Expired - Fee Related DE69416001T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9322936A GB2283566B (en) 1993-11-08 1993-11-08 Apparatus for measuring refractive index
PCT/GB1994/002412 WO1995013529A1 (en) 1993-11-08 1994-11-03 Apparatus for measuring refractive index

Publications (2)

Publication Number Publication Date
DE69416001D1 true DE69416001D1 (de) 1999-02-25
DE69416001T2 DE69416001T2 (de) 1999-08-19

Family

ID=10744789

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69416001T Expired - Fee Related DE69416001T2 (de) 1993-11-08 1994-11-03 Vorrichtung zur messung des brechungsindex

Country Status (8)

Country Link
US (1) US5633708A (de)
EP (1) EP0728302B1 (de)
JP (1) JPH09504875A (de)
AT (1) ATE175776T1 (de)
AU (1) AU8064994A (de)
DE (1) DE69416001T2 (de)
GB (1) GB2283566B (de)
WO (1) WO1995013529A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11128264A (ja) * 1997-10-24 1999-05-18 Nidek Co Ltd アブレーションレ−ト測定装置及びこれを備えるアブレーション装置
US6381025B1 (en) 1999-08-19 2002-04-30 Texas Tech University Interferometric detection system and method
JP2003315208A (ja) * 2000-10-20 2003-11-06 Kazumasa Sasaki 光ファイバ母材の内部屈折率測定法及び測定装置
WO2002059579A1 (en) 2001-01-25 2002-08-01 Texas Tech University Universal detector for biological and chemical separations or assays using plastic microfluidic devices
US6816243B2 (en) * 2001-03-05 2004-11-09 Omniguide Communications Optical waveguide monitoring
DE10141544A1 (de) * 2001-08-24 2003-03-13 Eppendorf Ag Vorrichtung zur Behandlung von Flüssigkeiten und Verfahren zum Betreiben der Vorrichtung
US20040251435A1 (en) 2003-04-07 2004-12-16 Noboru Sawayama Optical sensor and image forming apparatus
FR2883974B1 (fr) * 2005-04-01 2007-06-08 Norbert Beyrard Dispositif pour determiner un indice de refraction en un grand nombre de points d'un milieu physique, par exemple une partier du corps d'un etre humain ou d'un animal
WO2006003311A1 (fr) * 2004-06-16 2006-01-12 Norbert Beyrard Dispositif pour determiner un indice de refraction en un grand nombre de points d’un milieu physique, par exemple une partie du corps d’un etre humain ou d’un animal
WO2009039466A1 (en) 2007-09-20 2009-03-26 Vanderbilt University Free solution measurement of molecular interactions by backscattering interferometry
JP4639244B2 (ja) * 2008-04-28 2011-02-23 株式会社リコー 光学センサ及び画像形成装置
JP4732482B2 (ja) * 2008-04-28 2011-07-27 株式会社リコー 光学センサ及び画像形成装置
US9638632B2 (en) 2010-06-11 2017-05-02 Vanderbilt University Multiplexed interferometric detection system and method
US8411262B2 (en) 2010-09-30 2013-04-02 Precision Energy Services, Inc. Downhole gas breakout sensor
US8542353B2 (en) 2010-09-30 2013-09-24 Precision Energy Services, Inc. Refractive index sensor for fluid analysis
JP5510667B2 (ja) * 2010-10-12 2014-06-04 パルステック工業株式会社 透光性管状物体の厚さ測定装置
JP5532439B2 (ja) * 2011-01-25 2014-06-25 株式会社リコー 光学センサ及び画像形成装置
US9562853B2 (en) 2011-02-22 2017-02-07 Vanderbilt University Nonaqueous backscattering interferometric methods
JP5382038B2 (ja) * 2011-03-23 2014-01-08 パルステック工業株式会社 透光性管状物体の厚さ測定装置
US9273949B2 (en) 2012-05-11 2016-03-01 Vanderbilt University Backscattering interferometric methods
JP2018506715A (ja) 2015-01-23 2018-03-08 ヴァンダービルト ユニバーシティー 堅固なインターフェロメーター及びその使用方法
WO2017132483A1 (en) 2016-01-29 2017-08-03 Vanderbilt University Free-solution response function interferometry
DE102018126002B4 (de) * 2018-10-19 2020-10-08 Leica Microsystems Cms Gmbh Verfahren und Mikroskop zur Bestimmung des Brechungsindex eines optischen Mediums
CN111880080B (zh) * 2020-07-31 2023-11-24 苏州猎奇智能设备有限公司 一种芯片光电测试机构及其测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3879128A (en) * 1973-08-15 1975-04-22 Bell Telephone Labor Inc Method and apparatus for measuring the refractive index and diameter of optical fibers
IT1155284B (it) * 1982-02-10 1987-01-28 Cselt Centro Studi Lab Telecom Procedimento e apparecchiatura per la misura dell'indice di rifrazione e dello spessore di materiali trasparenti
GB8826643D0 (en) * 1988-11-15 1988-12-21 York Technology Ltd Measurement of refractive index

Also Published As

Publication number Publication date
ATE175776T1 (de) 1999-01-15
US5633708A (en) 1997-05-27
GB2283566A (en) 1995-05-10
JPH09504875A (ja) 1997-05-13
EP0728302A1 (de) 1996-08-28
AU8064994A (en) 1995-05-29
EP0728302B1 (de) 1999-01-13
WO1995013529A1 (en) 1995-05-18
GB9322936D0 (en) 1994-01-05
GB2283566B (en) 1997-09-17
DE69416001T2 (de) 1999-08-19

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee