ATE175776T1 - Vorrichtung zur messung des brechungsindex - Google Patents

Vorrichtung zur messung des brechungsindex

Info

Publication number
ATE175776T1
ATE175776T1 AT94931647T AT94931647T ATE175776T1 AT E175776 T1 ATE175776 T1 AT E175776T1 AT 94931647 T AT94931647 T AT 94931647T AT 94931647 T AT94931647 T AT 94931647T AT E175776 T1 ATE175776 T1 AT E175776T1
Authority
AT
Austria
Prior art keywords
pct
transparent object
region
date
measuring
Prior art date
Application number
AT94931647T
Other languages
English (en)
Inventor
David Alan Svendsen
Original Assignee
David Alan Svendsen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by David Alan Svendsen filed Critical David Alan Svendsen
Application granted granted Critical
Publication of ATE175776T1 publication Critical patent/ATE175776T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/412Index profiling of optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
AT94931647T 1993-11-08 1994-11-03 Vorrichtung zur messung des brechungsindex ATE175776T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9322936A GB2283566B (en) 1993-11-08 1993-11-08 Apparatus for measuring refractive index

Publications (1)

Publication Number Publication Date
ATE175776T1 true ATE175776T1 (de) 1999-01-15

Family

ID=10744789

Family Applications (1)

Application Number Title Priority Date Filing Date
AT94931647T ATE175776T1 (de) 1993-11-08 1994-11-03 Vorrichtung zur messung des brechungsindex

Country Status (8)

Country Link
US (1) US5633708A (de)
EP (1) EP0728302B1 (de)
JP (1) JPH09504875A (de)
AT (1) ATE175776T1 (de)
AU (1) AU8064994A (de)
DE (1) DE69416001T2 (de)
GB (1) GB2283566B (de)
WO (1) WO1995013529A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11128264A (ja) * 1997-10-24 1999-05-18 Nidek Co Ltd アブレーションレ−ト測定装置及びこれを備えるアブレーション装置
US6381025B1 (en) 1999-08-19 2002-04-30 Texas Tech University Interferometric detection system and method
JP2003315208A (ja) * 2000-10-20 2003-11-06 Kazumasa Sasaki 光ファイバ母材の内部屈折率測定法及び測定装置
WO2002059579A1 (en) 2001-01-25 2002-08-01 Texas Tech University Universal detector for biological and chemical separations or assays using plastic microfluidic devices
WO2002071038A1 (en) * 2001-03-05 2002-09-12 Omniguide Communications Optical waveguide monitoring
DE10141544A1 (de) * 2001-08-24 2003-03-13 Eppendorf Ag Vorrichtung zur Behandlung von Flüssigkeiten und Verfahren zum Betreiben der Vorrichtung
US20040251435A1 (en) 2003-04-07 2004-12-16 Noboru Sawayama Optical sensor and image forming apparatus
DE602005004417T2 (de) * 2004-06-16 2008-08-21 Norbert Beyrard Vorrichtung zur bestimmung eines brechungsindex in einer grossen anzahl von punkten einer physischen umgebung, beispielsweise einem teil eines menschlichen oder tierischen körpers
FR2883974B1 (fr) * 2005-04-01 2007-06-08 Norbert Beyrard Dispositif pour determiner un indice de refraction en un grand nombre de points d'un milieu physique, par exemple une partier du corps d'un etre humain ou d'un animal
WO2009039466A1 (en) 2007-09-20 2009-03-26 Vanderbilt University Free solution measurement of molecular interactions by backscattering interferometry
JP4639244B2 (ja) * 2008-04-28 2011-02-23 株式会社リコー 光学センサ及び画像形成装置
JP4732482B2 (ja) * 2008-04-28 2011-07-27 株式会社リコー 光学センサ及び画像形成装置
WO2011156713A1 (en) 2010-06-11 2011-12-15 Vanderbilt University Multiplexed interferometric detection system and method
US8542353B2 (en) 2010-09-30 2013-09-24 Precision Energy Services, Inc. Refractive index sensor for fluid analysis
US8411262B2 (en) 2010-09-30 2013-04-02 Precision Energy Services, Inc. Downhole gas breakout sensor
JP5510667B2 (ja) * 2010-10-12 2014-06-04 パルステック工業株式会社 透光性管状物体の厚さ測定装置
JP5532439B2 (ja) * 2011-01-25 2014-06-25 株式会社リコー 光学センサ及び画像形成装置
US9562853B2 (en) 2011-02-22 2017-02-07 Vanderbilt University Nonaqueous backscattering interferometric methods
JP5382038B2 (ja) * 2011-03-23 2014-01-08 パルステック工業株式会社 透光性管状物体の厚さ測定装置
US9273949B2 (en) 2012-05-11 2016-03-01 Vanderbilt University Backscattering interferometric methods
JP2018506715A (ja) 2015-01-23 2018-03-08 ヴァンダービルト ユニバーシティー 堅固なインターフェロメーター及びその使用方法
WO2017132483A1 (en) 2016-01-29 2017-08-03 Vanderbilt University Free-solution response function interferometry
DE102018126002B4 (de) * 2018-10-19 2020-10-08 Leica Microsystems Cms Gmbh Verfahren und Mikroskop zur Bestimmung des Brechungsindex eines optischen Mediums
CN111880080B (zh) * 2020-07-31 2023-11-24 苏州猎奇智能设备有限公司 一种芯片光电测试机构及其测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3879128A (en) * 1973-08-15 1975-04-22 Bell Telephone Labor Inc Method and apparatus for measuring the refractive index and diameter of optical fibers
IT1155284B (it) * 1982-02-10 1987-01-28 Cselt Centro Studi Lab Telecom Procedimento e apparecchiatura per la misura dell'indice di rifrazione e dello spessore di materiali trasparenti
GB8826643D0 (en) * 1988-11-15 1988-12-21 York Technology Ltd Measurement of refractive index

Also Published As

Publication number Publication date
JPH09504875A (ja) 1997-05-13
EP0728302A1 (de) 1996-08-28
AU8064994A (en) 1995-05-29
EP0728302B1 (de) 1999-01-13
GB9322936D0 (en) 1994-01-05
DE69416001T2 (de) 1999-08-19
GB2283566B (en) 1997-09-17
WO1995013529A1 (en) 1995-05-18
US5633708A (en) 1997-05-27
GB2283566A (en) 1995-05-10
DE69416001D1 (de) 1999-02-25

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