DE69409299D1 - Lichtquelle-Vorrichtung für Bildverarbeitungsgerät - Google Patents
Lichtquelle-Vorrichtung für BildverarbeitungsgerätInfo
- Publication number
- DE69409299D1 DE69409299D1 DE69409299T DE69409299T DE69409299D1 DE 69409299 D1 DE69409299 D1 DE 69409299D1 DE 69409299 T DE69409299 T DE 69409299T DE 69409299 T DE69409299 T DE 69409299T DE 69409299 D1 DE69409299 D1 DE 69409299D1
- Authority
- DE
- Germany
- Prior art keywords
- light source
- image processing
- processing device
- source device
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
- G01R31/71—Testing of solder joints
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0817—Monitoring of soldering processes
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Non-Portable Lighting Devices Or Systems Thereof (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5197927A JPH0727510A (ja) | 1993-07-15 | 1993-07-15 | 画像処理装置の光源装置及び基準マークの検出方法 |
JP14605194A JP3548601B2 (ja) | 1994-06-28 | 1994-06-28 | 画像処理装置の光源装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69409299D1 true DE69409299D1 (de) | 1998-05-07 |
DE69409299T2 DE69409299T2 (de) | 1998-07-23 |
Family
ID=26476994
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69409299T Expired - Fee Related DE69409299T2 (de) | 1993-07-15 | 1994-07-14 | Lichtquelle-Vorrichtung für Bildverarbeitungsgerät |
Country Status (7)
Country | Link |
---|---|
US (1) | US5457492A (de) |
EP (1) | EP0634892B1 (de) |
KR (1) | KR100269731B1 (de) |
DE (1) | DE69409299T2 (de) |
HK (1) | HK1008460A1 (de) |
SG (1) | SG47836A1 (de) |
TW (1) | TW364717U (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5758942A (en) * | 1995-12-18 | 1998-06-02 | Micron Technology, Inc. | Mechanical vision system using selective wavelength and brightness illumination |
JP3704157B2 (ja) * | 1996-02-19 | 2005-10-05 | アセンブレオン ネムローゼ フェンノートシャップ | 電子部品検出用散乱前景照明を具える装置、及びそのような検出装置を設けられた部品取り付け機械 |
IE80676B1 (en) * | 1996-08-02 | 1998-11-18 | M V Research Limited | A measurement system |
GB2316168B (en) * | 1996-08-06 | 2000-04-12 | M V Research Limited | A measurement system |
US6022124A (en) | 1997-08-19 | 2000-02-08 | Ppt Vision, Inc. | Machine-vision ring-reflector illumination system and method |
JP3471201B2 (ja) * | 1997-09-05 | 2003-12-02 | 株式会社東芝 | 撮像モジュール、および撮像装置 |
US6095661A (en) * | 1998-03-19 | 2000-08-01 | Ppt Vision, Inc. | Method and apparatus for an L.E.D. flashlight |
US7740371B1 (en) | 1998-03-19 | 2010-06-22 | Charles A. Lemaire | Method and apparatus for pulsed L.E.D. illumination for a camera |
DE19851119C2 (de) * | 1998-11-06 | 2001-05-31 | Byk Gulden Lomberg Chem Fab | Behälter und Vorrichtung zur Blindung der Verabreichung von nicht festen pharmazeutischen Darreichungsformen bei der klinischen Prüfung |
JP4147505B2 (ja) | 1999-01-28 | 2008-09-10 | 富士機械製造株式会社 | 保持ヘッド |
US6788411B1 (en) | 1999-07-08 | 2004-09-07 | Ppt Vision, Inc. | Method and apparatus for adjusting illumination angle |
DE10009571A1 (de) * | 2000-02-29 | 2001-09-06 | Vision Components Ges Fuer Bil | Verfahren und Vorrichtung zum Justieren einer Kamera |
JP4288553B2 (ja) * | 2000-07-25 | 2009-07-01 | 富士フイルム株式会社 | カメラのストロボ装置 |
DE10197043T1 (de) * | 2000-12-15 | 2003-11-13 | Cyberoptics Corp | Kamera mit verbessertem Illuminator |
DE10128324A1 (de) * | 2001-06-12 | 2003-01-09 | Matsushita Electric Works Europe Ag | Gerät zur optischen Prüfung des Inhalts von Blisterpackungen |
US6788406B2 (en) | 2001-11-02 | 2004-09-07 | Delaware Capital Formation, Inc. | Device and methods of inspecting soldered connections |
DE10162270B4 (de) * | 2001-12-18 | 2004-05-13 | Siemens Ag | Optische Sensorvorrichtung |
JP4122187B2 (ja) * | 2002-08-08 | 2008-07-23 | 松下電器産業株式会社 | 照明装置、及びこれを備えた認識装置並びに部品実装装置 |
US20080062424A1 (en) * | 2006-09-07 | 2008-03-13 | Mark Richard Shires | Compact Ringlight |
DE102007043609B4 (de) | 2007-09-13 | 2014-05-28 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Integrierte Beleuchtungsvorrichtung für einen optischen Codeleser |
TWI380296B (en) * | 2008-07-10 | 2012-12-21 | Sunplus Mmedia Inc | Optical head that can be easily assembled |
US8284305B2 (en) | 2008-11-26 | 2012-10-09 | Parata Systems, Llc | System and method for acquiring images |
TW201423089A (zh) * | 2012-12-12 | 2014-06-16 | Utechzone Co Ltd | 檢測裝置 |
CN103438821B (zh) * | 2013-09-11 | 2015-12-02 | 凯龙蓝烽新材料科技有限公司 | 一种蜂窝陶瓷载体透光检测装置及方法 |
JP2017167222A (ja) * | 2016-03-14 | 2017-09-21 | マイクロネット株式会社 | 顕微鏡用照明装置、顕微鏡用照明装置を備える顕微鏡、顕微鏡用照明装置を備える顕微鏡システム |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4028728A (en) * | 1976-04-02 | 1977-06-07 | Western Electric Company, Inc. | Method of and video system for identifying different light-reflective surface areas on articles |
JPS61293657A (ja) * | 1985-06-21 | 1986-12-24 | Matsushita Electric Works Ltd | 半田付け外観検査方法 |
JPH0810196B2 (ja) * | 1989-11-17 | 1996-01-31 | 松下電器産業株式会社 | はんだ外観検査装置 |
EP0459489B1 (de) * | 1990-05-30 | 1997-01-22 | Dainippon Screen Mfg. Co., Ltd. | Verfahren zum Lesen einer optischen Abbildung einer untersuchten Oberfläche und dafür einsetzbare Bildleseeinrichtung |
JP2969401B2 (ja) * | 1991-10-29 | 1999-11-02 | 株式会社新川 | ボンデイングワイヤ検査装置 |
-
1994
- 1994-07-12 KR KR1019940016706A patent/KR100269731B1/ko not_active IP Right Cessation
- 1994-07-13 TW TW086218432U patent/TW364717U/zh unknown
- 1994-07-14 EP EP94111009A patent/EP0634892B1/de not_active Expired - Lifetime
- 1994-07-14 DE DE69409299T patent/DE69409299T2/de not_active Expired - Fee Related
- 1994-07-14 SG SG1996004623A patent/SG47836A1/en unknown
- 1994-07-15 US US08/275,539 patent/US5457492A/en not_active Expired - Fee Related
-
1998
- 1998-07-20 HK HK98109294A patent/HK1008460A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
HK1008460A1 (en) | 1999-05-07 |
KR100269731B1 (ko) | 2000-10-16 |
EP0634892A1 (de) | 1995-01-18 |
DE69409299T2 (de) | 1998-07-23 |
US5457492A (en) | 1995-10-10 |
EP0634892B1 (de) | 1998-04-01 |
SG47836A1 (en) | 1998-04-17 |
TW364717U (en) | 1999-07-11 |
KR960016562A (ko) | 1996-05-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |