DE69408023D1 - Verfahren und Anordnung zum Eichen der Dickenmessanordnung des Querprofils eines flächigen Gutes - Google Patents

Verfahren und Anordnung zum Eichen der Dickenmessanordnung des Querprofils eines flächigen Gutes

Info

Publication number
DE69408023D1
DE69408023D1 DE69408023T DE69408023T DE69408023D1 DE 69408023 D1 DE69408023 D1 DE 69408023D1 DE 69408023 T DE69408023 T DE 69408023T DE 69408023 T DE69408023 T DE 69408023T DE 69408023 D1 DE69408023 D1 DE 69408023D1
Authority
DE
Germany
Prior art keywords
arrangement
shims
calibration
calibrating
cross
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69408023T
Other languages
English (en)
Other versions
DE69408023T2 (de
Inventor
Jean-Jacques Campas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sollac SA
Original Assignee
Sollac SA
Lorraine de Laminage Continu SA SOLLAC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sollac SA, Lorraine de Laminage Continu SA SOLLAC filed Critical Sollac SA
Application granted granted Critical
Publication of DE69408023D1 publication Critical patent/DE69408023D1/de
Publication of DE69408023T2 publication Critical patent/DE69408023T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
DE69408023T 1993-04-26 1994-04-08 Verfahren und Anordnung zum Eichen der Dickenmessanordnung des Querprofils eines flächigen Gutes Expired - Lifetime DE69408023T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9305053A FR2704643B1 (fr) 1993-04-26 1993-04-26 Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.

Publications (2)

Publication Number Publication Date
DE69408023D1 true DE69408023D1 (de) 1998-02-26
DE69408023T2 DE69408023T2 (de) 1998-08-20

Family

ID=9446557

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69408023T Expired - Lifetime DE69408023T2 (de) 1993-04-26 1994-04-08 Verfahren und Anordnung zum Eichen der Dickenmessanordnung des Querprofils eines flächigen Gutes

Country Status (9)

Country Link
US (1) US5440386A (de)
EP (1) EP0622610B1 (de)
JP (1) JP3474922B2 (de)
KR (1) KR100319430B1 (de)
AT (1) ATE162618T1 (de)
CA (1) CA2122067C (de)
DE (1) DE69408023T2 (de)
ES (1) ES2111273T3 (de)
FR (1) FR2704643B1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2740561B1 (fr) * 1995-10-27 1997-12-19 Inst Francais Du Petrole Methode pour evaluer la variation d'intensite d'un rayonnement polychromatique ayant un spectre de frequence connu, apres traversee d'un corps absorbant
US5808736A (en) * 1996-09-24 1998-09-15 Phase Metrics, Inc. Thin film flying height calibration disk for calibrating flying height testers
US5777731A (en) * 1997-02-21 1998-07-07 The Goodyear Tire & Rubber Company Calibration of optical properties to measure depth of a liquid
FI112281B (fi) 1999-06-11 2003-11-14 Metso Automation Oy Menetelmä ja laitteisto paperirainan ominaisuuksien mittaamiseksi
FI991348A (fi) * 1999-06-11 2000-12-12 Valmet Automation Inc Menetelmä ja laitteisto paperirainan ominaisuuksien mittaamiseksi
DE19950254C2 (de) * 1999-10-18 2003-06-26 Ims Messsysteme Gmbh Verfahren zur Bestimmung eines Dickenquerprofils und des Dickenlängsprofils eines laufenden Materialbandes
JP3948965B2 (ja) * 2001-03-01 2007-07-25 株式会社東芝 多点計測厚み計
US7857619B2 (en) * 2005-02-26 2010-12-28 Yongqian Liu LED curing light having fresnel lenses
US20090147925A1 (en) * 2005-04-13 2009-06-11 Lodox Systems (Proprietary) Limited Calibration tool and a method of calibrating an imaging system
DE102005054589B4 (de) * 2005-11-14 2017-11-02 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Kalibriernormal
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich
CN101468366B (zh) * 2007-12-28 2010-10-13 中国科学院沈阳自动化研究所 一种钢料平整度控制方法及装置
JP2013096796A (ja) * 2011-10-31 2013-05-20 Yokogawa Electric Corp 放射線測定装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3942899A (en) * 1973-06-19 1976-03-09 Pfizer, Inc. Calibrating device for light scatter photometering instrument
JPS5847223A (ja) * 1981-09-17 1983-03-18 Ricoh Co Ltd 固体センサの感度補正方法
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具
FR2578643B1 (fr) * 1985-03-07 1990-03-09 Siderurgie Fse Inst Rech Ensemble de mesure du profil transversal d'epaisseur d'un produit
SU1369469A1 (ru) * 1985-09-03 1988-09-07 Предприятие П/Я Р-6348 Устройство дл поверки люксметров
JP2588441B2 (ja) * 1990-09-18 1997-03-05 二國機械工業株式会社 多点検出装置を構成する個別センサの特性補正方法

Also Published As

Publication number Publication date
KR100319430B1 (ko) 2002-06-20
ATE162618T1 (de) 1998-02-15
DE69408023T2 (de) 1998-08-20
CA2122067C (fr) 2003-07-01
CA2122067A1 (fr) 1994-10-27
EP0622610A1 (de) 1994-11-02
ES2111273T3 (es) 1998-03-01
US5440386A (en) 1995-08-08
EP0622610B1 (de) 1998-01-21
FR2704643A1 (fr) 1994-11-04
JP3474922B2 (ja) 2003-12-08
JPH06313709A (ja) 1994-11-08
FR2704643B1 (fr) 1995-06-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: HAFT - KARAKATSANIS PATENTANWALTSKANZLEI, 80802 MU