ATE162618T1 - Verfahren und anordnung zum eichen der dickenmessanordnung des querprofils eines flächigen gutes - Google Patents

Verfahren und anordnung zum eichen der dickenmessanordnung des querprofils eines flächigen gutes

Info

Publication number
ATE162618T1
ATE162618T1 AT94470011T AT94470011T ATE162618T1 AT E162618 T1 ATE162618 T1 AT E162618T1 AT 94470011 T AT94470011 T AT 94470011T AT 94470011 T AT94470011 T AT 94470011T AT E162618 T1 ATE162618 T1 AT E162618T1
Authority
AT
Austria
Prior art keywords
calibration
arrangement
shims
thickness measuring
transverse profile
Prior art date
Application number
AT94470011T
Other languages
English (en)
Inventor
Jean-Jacques Campas
Original Assignee
Lorraine Laminage
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lorraine Laminage filed Critical Lorraine Laminage
Application granted granted Critical
Publication of ATE162618T1 publication Critical patent/ATE162618T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
AT94470011T 1993-04-26 1994-04-08 Verfahren und anordnung zum eichen der dickenmessanordnung des querprofils eines flächigen gutes ATE162618T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9305053A FR2704643B1 (fr) 1993-04-26 1993-04-26 Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.

Publications (1)

Publication Number Publication Date
ATE162618T1 true ATE162618T1 (de) 1998-02-15

Family

ID=9446557

Family Applications (1)

Application Number Title Priority Date Filing Date
AT94470011T ATE162618T1 (de) 1993-04-26 1994-04-08 Verfahren und anordnung zum eichen der dickenmessanordnung des querprofils eines flächigen gutes

Country Status (9)

Country Link
US (1) US5440386A (de)
EP (1) EP0622610B1 (de)
JP (1) JP3474922B2 (de)
KR (1) KR100319430B1 (de)
AT (1) ATE162618T1 (de)
CA (1) CA2122067C (de)
DE (1) DE69408023T2 (de)
ES (1) ES2111273T3 (de)
FR (1) FR2704643B1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2740561B1 (fr) * 1995-10-27 1997-12-19 Inst Francais Du Petrole Methode pour evaluer la variation d'intensite d'un rayonnement polychromatique ayant un spectre de frequence connu, apres traversee d'un corps absorbant
US5808736A (en) * 1996-09-24 1998-09-15 Phase Metrics, Inc. Thin film flying height calibration disk for calibrating flying height testers
US5777731A (en) * 1997-02-21 1998-07-07 The Goodyear Tire & Rubber Company Calibration of optical properties to measure depth of a liquid
FI991348A (fi) * 1999-06-11 2000-12-12 Valmet Automation Inc Menetelmä ja laitteisto paperirainan ominaisuuksien mittaamiseksi
FI112281B (fi) * 1999-06-11 2003-11-14 Metso Automation Oy Menetelmä ja laitteisto paperirainan ominaisuuksien mittaamiseksi
DE19950254C2 (de) 1999-10-18 2003-06-26 Ims Messsysteme Gmbh Verfahren zur Bestimmung eines Dickenquerprofils und des Dickenlängsprofils eines laufenden Materialbandes
JP3948965B2 (ja) * 2001-03-01 2007-07-25 株式会社東芝 多点計測厚み計
US7857619B2 (en) * 2005-02-26 2010-12-28 Yongqian Liu LED curing light having fresnel lenses
ZA200709372B (en) * 2005-04-13 2009-11-25 Lodox Systems Proprietary Ltd A calibration tool and a method of calibrating an imaging system
DE102005054589B4 (de) * 2005-11-14 2017-11-02 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Kalibriernormal
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich
CN101468366B (zh) * 2007-12-28 2010-10-13 中国科学院沈阳自动化研究所 一种钢料平整度控制方法及装置
JP2013096796A (ja) * 2011-10-31 2013-05-20 Yokogawa Electric Corp 放射線測定装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3942899A (en) * 1973-06-19 1976-03-09 Pfizer, Inc. Calibrating device for light scatter photometering instrument
JPS5847223A (ja) * 1981-09-17 1983-03-18 Ricoh Co Ltd 固体センサの感度補正方法
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具
FR2578643B1 (fr) * 1985-03-07 1990-03-09 Siderurgie Fse Inst Rech Ensemble de mesure du profil transversal d'epaisseur d'un produit
SU1369469A1 (ru) * 1985-09-03 1988-09-07 Предприятие П/Я Р-6348 Устройство дл поверки люксметров
JP2588441B2 (ja) * 1990-09-18 1997-03-05 二國機械工業株式会社 多点検出装置を構成する個別センサの特性補正方法

Also Published As

Publication number Publication date
US5440386A (en) 1995-08-08
CA2122067A1 (fr) 1994-10-27
DE69408023D1 (de) 1998-02-26
FR2704643B1 (fr) 1995-06-23
KR100319430B1 (ko) 2002-06-20
EP0622610B1 (de) 1998-01-21
JPH06313709A (ja) 1994-11-08
DE69408023T2 (de) 1998-08-20
CA2122067C (fr) 2003-07-01
ES2111273T3 (es) 1998-03-01
JP3474922B2 (ja) 2003-12-08
FR2704643A1 (fr) 1994-11-04
EP0622610A1 (de) 1994-11-02

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Legal Events

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