DE69406942T2 - Abtastprüfungsschaltung mit schnellem übertragungsgateschalter - Google Patents

Abtastprüfungsschaltung mit schnellem übertragungsgateschalter

Info

Publication number
DE69406942T2
DE69406942T2 DE69406942T DE69406942T DE69406942T2 DE 69406942 T2 DE69406942 T2 DE 69406942T2 DE 69406942 T DE69406942 T DE 69406942T DE 69406942 T DE69406942 T DE 69406942T DE 69406942 T2 DE69406942 T2 DE 69406942T2
Authority
DE
Germany
Prior art keywords
test circuit
transmission gate
gate switch
scan test
fast transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69406942T
Other languages
English (en)
Other versions
DE69406942D1 (de
Inventor
Zwie Amitai
Mark Muegge
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quality Semiconductor Inc
Original Assignee
Quality Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quality Semiconductor Inc filed Critical Quality Semiconductor Inc
Publication of DE69406942D1 publication Critical patent/DE69406942D1/de
Application granted granted Critical
Publication of DE69406942T2 publication Critical patent/DE69406942T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69406942T 1993-09-16 1994-09-12 Abtastprüfungsschaltung mit schnellem übertragungsgateschalter Expired - Lifetime DE69406942T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12348193A 1993-09-16 1993-09-16
PCT/US1994/010312 WO1995008153A1 (en) 1993-09-16 1994-09-12 Scan test circuit using fast transmission gate switch

Publications (2)

Publication Number Publication Date
DE69406942D1 DE69406942D1 (de) 1998-01-02
DE69406942T2 true DE69406942T2 (de) 1998-03-19

Family

ID=22408920

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69406942T Expired - Lifetime DE69406942T2 (de) 1993-09-16 1994-09-12 Abtastprüfungsschaltung mit schnellem übertragungsgateschalter

Country Status (8)

Country Link
US (1) US5673277A (de)
EP (1) EP0719431B1 (de)
JP (1) JP3533451B2 (de)
KR (1) KR960705273A (de)
AU (1) AU693474B2 (de)
CA (1) CA2171307C (de)
DE (1) DE69406942T2 (de)
WO (1) WO1995008153A1 (de)

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US6289295B1 (en) * 1997-07-21 2001-09-11 Texas Instruments Incorporated Scannable circuits, systems, and methods implementing transistors having differing threshold voltages
US6070259A (en) * 1998-01-15 2000-05-30 Lsi Logic Corporation Dynamic logic element having non-invasive scan chain insertion
US6163864A (en) * 1998-06-10 2000-12-19 Compaq Computer Corporation Method for cost-effective production testing of input voltage levels of the forwarded clock interface of high performance integrated circuits
TW408340B (en) * 1998-06-26 2000-10-11 Nanya Plastics Corp Input buffer with high-voltage operation range
US6052019A (en) * 1998-10-29 2000-04-18 Pericom Semiconductor Corp. Undershoot-isolating MOS bus switch
US5963080A (en) * 1998-12-23 1999-10-05 Fairchild Semiconductor Corporation Undershoot hardened FET switch
US6484294B1 (en) * 1999-04-23 2002-11-19 Hitachi, Ltd. Semiconductor integrated circuit and method of designing the same
US6559703B1 (en) 2000-06-29 2003-05-06 Pericom Semiconductor Corp. Bi-directional undershoot-isolating bus switch with directional control
JP4272335B2 (ja) * 2000-07-26 2009-06-03 三菱電機株式会社 半導体集積回路
US6492798B2 (en) 2001-04-27 2002-12-10 Logicvision, Inc. Method and circuit for testing high frequency mixed signal circuits with low frequency signals
US20030226077A1 (en) * 2002-05-28 2003-12-04 International Business Machines Corporation Low power level-sensitive scan mechanism
US6885213B2 (en) * 2002-09-13 2005-04-26 Logicvision, Inc. Circuit and method for accurately applying a voltage to a node of an integrated circuit
CN108199701B (zh) * 2017-12-28 2021-05-07 清华大学 一种高速的cmos传输门开关电路

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US3325654A (en) * 1964-10-09 1967-06-13 Honeywell Inc Fet switching utilizing matching equivalent capacitive means
AU416965B2 (en) * 1968-06-17 1971-09-10 Philips Industries Limited An improved switching device
US3617771A (en) * 1969-07-03 1971-11-02 Computer Test Corp Differential switching system for switching low-level signals
DE2348765A1 (de) * 1973-09-28 1975-04-30 Bosch Gmbh Robert Schaltungsanordnung zum kurzschliessen eines verbrauchers
US4096399A (en) * 1977-03-28 1978-06-20 Bell Telephone Laboratories, Incorporated Crosspoint bias circuit arrangement
US4705759B1 (en) * 1978-10-13 1995-02-14 Int Rectifier Corp High power mosfet with low on-resistance and high breakdown voltage
US4245230A (en) * 1979-09-28 1981-01-13 Hughes Aircraft Company Resistive Schottky barrier gate microwave switch
US4445051A (en) * 1981-06-26 1984-04-24 Burroughs Corporation Field effect current mode logic gate
JPS5875922A (ja) * 1981-10-30 1983-05-07 Toshiba Corp 半導体スイツチ回路
US4502027A (en) * 1982-03-01 1985-02-26 Raytheon Company Bidirectional switch
US4477742A (en) * 1982-06-21 1984-10-16 Eaton Corporation Three terminal bidirectional drain to drain FET circuit
JPS59115616A (ja) * 1982-12-22 1984-07-04 Nec Corp 音声切替器
US4577125A (en) * 1983-12-22 1986-03-18 Advanced Micro Devices, Inc. Output voltage driver with transient active pull-down
US5038051A (en) * 1984-05-08 1991-08-06 The United States Of America As Represented By The Secretary Of The Navy Solid state modulator for microwave transmitters
US4716514A (en) * 1984-12-13 1987-12-29 Unitrode Corporation Synchronous power rectifier
US4628307A (en) * 1984-12-18 1986-12-09 International Business Machines Corp. FET switch for high frequency signals
US4814644A (en) * 1985-01-29 1989-03-21 K. Ushiku & Co. Basic circuitry particularly for construction of multivalued logic systems
US4656647A (en) * 1985-05-17 1987-04-07 William Hotine Pulsed bi-phase digital modulator system
JPS6215922A (ja) * 1985-07-15 1987-01-24 Hitachi Ltd スイツチ回路
US4719374A (en) * 1986-04-11 1988-01-12 Ampex Corporation Broadband electric field controlled switching circuit
JPH0690260B2 (ja) * 1986-05-30 1994-11-14 三菱電機株式会社 論理回路試験装置
US4704550A (en) * 1986-11-07 1987-11-03 American Telephone And Telegraph Company Method and apparatus for driving electrical circuits
JPS63238716A (ja) * 1986-11-14 1988-10-04 Nec Corp スイッチ回路
US4716398A (en) * 1987-02-26 1987-12-29 John Fluke Mfg. Co., Inc. Linearity control circuit for digital to analog converter
US5060037A (en) * 1987-04-03 1991-10-22 Texas Instruments Incorporated Output buffer with enhanced electrostatic discharge protection
SU1550617A2 (ru) * 1987-08-31 1990-03-15 Предприятие П/Я В-2168 Аналоговый ключ
US5182479A (en) * 1988-06-24 1993-01-26 U.S. Philips Corp. Gate circuit having increased voltage handling capability
US4959873A (en) * 1988-07-08 1990-09-25 The Marconi Company Limited Transmission line switch
US4963733A (en) * 1989-01-09 1990-10-16 Trj & Company Incremental encoder
US4983865A (en) * 1989-01-25 1991-01-08 Pacific Monolithics High speed switch matrix
US4933574A (en) * 1989-01-30 1990-06-12 Integrated Device Technology, Inc. BiCMOS output driver
JPH0758319B2 (ja) * 1989-02-07 1995-06-21 株式会社東芝 テスト容易化回路
US5012123A (en) * 1989-03-29 1991-04-30 Hittite Microwave, Inc. High-power rf switching system
US5107152A (en) * 1989-09-08 1992-04-21 Mia-Com, Inc. Control component for a three-electrode device
US5010261A (en) * 1989-12-08 1991-04-23 General Electric Company Lossless gate driver circuit for a high frequency converter
US5061903A (en) * 1990-02-27 1991-10-29 Grumman Aerospace Corporation High voltage modified cascode circuit
JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置
NL9002120A (nl) * 1990-09-28 1992-04-16 Nedap Nv Pulsdeactivator.
US5166604A (en) * 1990-11-13 1992-11-24 Altera Corporation Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
US5260948A (en) * 1991-03-13 1993-11-09 Ncr Corporation Bidirectional boundary-scan circuit
US5289062A (en) * 1991-03-18 1994-02-22 Quality Semiconductor, Inc. Fast transmission gate switch
JP3057814B2 (ja) * 1991-06-26 2000-07-04 日本電気株式会社 半導体集積回路
KR940006676B1 (ko) * 1991-10-14 1994-07-25 삼성전자 주식회사 시험회로를 내장한 기억용 반도체 집적회로

Also Published As

Publication number Publication date
EP0719431B1 (de) 1997-11-19
WO1995008153A1 (en) 1995-03-23
AU7686694A (en) 1995-04-03
AU693474B2 (en) 1998-07-02
CA2171307A1 (en) 1995-03-23
JP3533451B2 (ja) 2004-05-31
US5673277A (en) 1997-09-30
JPH09503053A (ja) 1997-03-25
EP0719431A1 (de) 1996-07-03
DE69406942D1 (de) 1998-01-02
KR960705273A (ko) 1996-10-09
CA2171307C (en) 2004-11-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition