DE69334181D1 - Verbesserter partikelsensor und vorrichtung zum nachweis eines teilchens - Google Patents
Verbesserter partikelsensor und vorrichtung zum nachweis eines teilchensInfo
- Publication number
- DE69334181D1 DE69334181D1 DE69334181T DE69334181T DE69334181D1 DE 69334181 D1 DE69334181 D1 DE 69334181D1 DE 69334181 T DE69334181 T DE 69334181T DE 69334181 T DE69334181 T DE 69334181T DE 69334181 D1 DE69334181 D1 DE 69334181D1
- Authority
- DE
- Germany
- Prior art keywords
- particle
- detecting
- improved
- sensor
- particle sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 title 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
- G01N2021/6469—Cavity, e.g. ellipsoid
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12657093A | 1993-09-27 | 1993-09-27 | |
US126570 | 1993-09-27 | ||
PCT/US1993/011886 WO1995009354A1 (en) | 1993-09-27 | 1993-12-06 | Improved particle sensor and method for assaying a particle |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69334181D1 true DE69334181D1 (de) | 2007-12-20 |
DE69334181T2 DE69334181T2 (de) | 2008-08-21 |
Family
ID=22425549
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69334181T Expired - Lifetime DE69334181T2 (de) | 1993-09-27 | 1993-12-06 | Verbesserter partikelsensor und vorrichtung zum nachweis eines teilchens |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0723654B1 (de) |
JP (1) | JP3436539B2 (de) |
DE (1) | DE69334181T2 (de) |
WO (1) | WO1995009354A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004006754A2 (en) | 2002-07-16 | 2004-01-22 | Research Electro-Optics, Inc. | Method for noise cancellation by spectral flattening of laser output in a multi-line-laser instrument |
US7079243B2 (en) | 2002-07-16 | 2006-07-18 | Research Electro-Optics, Inc. | Method of noise cancellation in an unpolarized-laser instrument |
US7023620B1 (en) | 2003-07-03 | 2006-04-04 | Research Electro-Optics, Inc. | Beam array pitch controller |
US20120120385A1 (en) * | 2006-06-27 | 2012-05-17 | Jian-Ping Jiang | Pathogen detection by simultaneous size/fluorescence measurement |
DE102012211992A1 (de) * | 2012-07-10 | 2014-01-30 | Siemens Aktiengesellschaft | Anordnung für die laserbasierte Partikeldetektion |
JP2015227805A (ja) * | 2014-05-30 | 2015-12-17 | アズビル株式会社 | 液中粒子検出装置及び液中粒子の検出方法 |
JP6676066B2 (ja) | 2015-11-05 | 2020-04-08 | ギガフォトン株式会社 | 極端紫外光生成装置 |
EP3392648B1 (de) * | 2015-12-14 | 2020-10-07 | Mitsubishi Electric Corporation | Vorrichtung zur erkennung kleinster objekte |
JP2017116287A (ja) | 2015-12-21 | 2017-06-29 | パナソニックIpマネジメント株式会社 | 粒子検出センサ |
KR102380173B1 (ko) * | 2017-04-14 | 2022-03-29 | 엘지이노텍 주식회사 | 입자 센싱 장치 |
DE102017211429A1 (de) * | 2017-07-05 | 2019-01-10 | Robert Bosch Gmbh | Partikelsensor |
CN109238473B (zh) * | 2018-11-02 | 2020-08-11 | 汕头大学 | 一种红外图像阵列传感器灰尘干扰进行校准的装置与方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3614231A (en) * | 1968-02-12 | 1971-10-19 | Coulter Electronics | Optical aerosol counter |
US3946239A (en) * | 1975-01-24 | 1976-03-23 | The United States Of America As Represented By The United Energy Research And Development Administration | Ellipsoidal cell flow system |
US4140395A (en) * | 1976-12-07 | 1979-02-20 | Environmental Systems Corporation | Electro-optical method and system for in situ measurements of particle size and distribution |
SE428972B (sv) * | 1979-03-07 | 1983-08-01 | Svenska Utvecklings Ab | Anordning for detektering av forekommande av svevande, fasta eller vetskeformade partiklar i en gas |
GB8726305D0 (en) * | 1987-11-10 | 1987-12-16 | Secr Defence | Portable particle analysers |
JPH0739994B2 (ja) * | 1988-10-12 | 1995-05-01 | 三菱電機株式会社 | 微細粒子測定装置 |
US5282151A (en) * | 1991-02-28 | 1994-01-25 | Particle Measuring Systems, Inc. | Submicron diameter particle detection utilizing high density array |
-
1993
- 1993-12-06 EP EP94903515A patent/EP0723654B1/de not_active Expired - Lifetime
- 1993-12-06 WO PCT/US1993/011886 patent/WO1995009354A1/en active IP Right Grant
- 1993-12-06 JP JP51041294A patent/JP3436539B2/ja not_active Expired - Lifetime
- 1993-12-06 DE DE69334181T patent/DE69334181T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0723654A1 (de) | 1996-07-31 |
JPH09502254A (ja) | 1997-03-04 |
WO1995009354A1 (en) | 1995-04-06 |
JP3436539B2 (ja) | 2003-08-11 |
DE69334181T2 (de) | 2008-08-21 |
EP0723654B1 (de) | 2007-11-07 |
EP0723654A4 (de) | 1998-05-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |