DE69333492D1 - Video-inspektionssystem mit multispektraler beleuchtung unter verwendung lichtemittierender dioden und methode zur multispektralen beleuchtung unter verwendung lichtemittierender dioden - Google Patents

Video-inspektionssystem mit multispektraler beleuchtung unter verwendung lichtemittierender dioden und methode zur multispektralen beleuchtung unter verwendung lichtemittierender dioden

Info

Publication number
DE69333492D1
DE69333492D1 DE69333492T DE69333492T DE69333492D1 DE 69333492 D1 DE69333492 D1 DE 69333492D1 DE 69333492 T DE69333492 T DE 69333492T DE 69333492 T DE69333492 T DE 69333492T DE 69333492 D1 DE69333492 D1 DE 69333492D1
Authority
DE
Germany
Prior art keywords
light
emitting diodes
multispectral lighting
multispectral
lighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69333492T
Other languages
English (en)
Other versions
DE69333492T2 (de
Inventor
W Cochran
E Triner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pressco Technology Inc
Original Assignee
Pressco Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pressco Technology Inc filed Critical Pressco Technology Inc
Publication of DE69333492D1 publication Critical patent/DE69333492D1/de
Application granted granted Critical
Publication of DE69333492T2 publication Critical patent/DE69333492T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N21/8903Optical details; Scanning details using a multiple detector array
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00Television systems
    • H04N7/18Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/181Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a plurality of remote sources
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00Television systems
    • H04N7/18Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/188Capturing isolated or intermittent images triggered by the occurrence of a predetermined event, e.g. an object reaching a predetermined position
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8835Adjustable illumination, e.g. software adjustable screen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8845Multiple wavelengths of illumination or detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's
    • G01N2201/0621Supply
DE69333492T 1992-12-14 1993-12-13 Video-inspektionssystem mit multispektraler beleuchtung unter verwendung lichtemittierender dioden und methode zur multispektralen beleuchtung unter verwendung lichtemittierender dioden Expired - Lifetime DE69333492T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US07/990,009 US5365084A (en) 1991-02-20 1992-12-14 Video inspection system employing multiple spectrum LED illumination
US990009 1992-12-14
PCT/US1993/012136 WO1994014053A1 (en) 1992-12-14 1993-12-13 Video inspection system employing multiple spectrum led illumination

Publications (2)

Publication Number Publication Date
DE69333492D1 true DE69333492D1 (de) 2004-05-27
DE69333492T2 DE69333492T2 (de) 2005-04-14

Family

ID=25535656

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69333492T Expired - Lifetime DE69333492T2 (de) 1992-12-14 1993-12-13 Video-inspektionssystem mit multispektraler beleuchtung unter verwendung lichtemittierender dioden und methode zur multispektralen beleuchtung unter verwendung lichtemittierender dioden

Country Status (6)

Country Link
US (1) US5365084A (de)
EP (2) EP1420244A3 (de)
JP (1) JPH08506891A (de)
AU (1) AU5801094A (de)
DE (1) DE69333492T2 (de)
WO (1) WO1994014053A1 (de)

Families Citing this family (103)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5668887A (en) * 1992-05-29 1997-09-16 Eastman Kodak Company Coating density analyzer and method using non-synchronous TDI camera
IES940593A2 (en) * 1994-07-25 1996-02-07 Oseney Ltd Optical inspection system
IL110596A0 (en) * 1994-08-09 1994-11-11 Fraier Israel Video imaging inspection system
US6122048A (en) * 1994-08-26 2000-09-19 Pressco Technology Inc. Integral field lens illumination for video inspection
US5729361A (en) * 1995-06-30 1998-03-17 Logitech, Inc. Color scanner using both variable led exposure time and photo detector output compensation
US5954206A (en) * 1995-07-25 1999-09-21 Oseney Limited Optical inspection system
KR0176661B1 (ko) * 1995-12-28 1999-05-15 김광호 납땜부 검사방법 및 검사장치
US5859924A (en) * 1996-07-12 1999-01-12 Robotic Vision Systems, Inc. Method and system for measuring object features
US6075883A (en) 1996-11-12 2000-06-13 Robotic Vision Systems, Inc. Method and system for imaging an object or pattern
US5949584A (en) * 1997-05-13 1999-09-07 Northeast Robotics Llc Wafer
US5923419A (en) * 1997-06-16 1999-07-13 Insight Control Systems International System and method for optical inspection of recessed surfaces
DE19725633C1 (de) * 1997-06-17 1998-12-17 Zentrum Fuer Neuroinformatik G Verfahren und Anordnung zur Analyse der Beschaffenheit einer Oberfläche
US6806659B1 (en) * 1997-08-26 2004-10-19 Color Kinetics, Incorporated Multicolored LED lighting method and apparatus
US7038398B1 (en) * 1997-08-26 2006-05-02 Color Kinetics, Incorporated Kinetic illumination system and methods
AU2003203584B2 (en) * 1997-08-26 2006-03-16 Philips Lighting North America Corporation Multicolored led lighting method and apparatus
US20030133292A1 (en) 1999-11-18 2003-07-17 Mueller George G. Methods and apparatus for generating and modulating white light illumination conditions
US5897195A (en) * 1997-12-09 1999-04-27 Optical Gaging, Products, Inc. Oblique led illuminator device
US6061125A (en) * 1998-01-27 2000-05-09 Insight Control Systems International Dual illumination apparatus for container inspection
DE19803694C1 (de) * 1998-01-30 1999-04-22 Kostal Leopold Gmbh & Co Kg Verfahren zum Detektieren von auf einer lichtdurchlässigen Scheibe befindlichen Objekten sowie Vorrichtung
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen
DE19831612A1 (de) * 1998-07-14 2000-01-20 Voith Sulzer Papiermasch Gmbh Meßsystem
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
US6384421B1 (en) 1999-10-07 2002-05-07 Logical Systems Incorporated Vision system for industrial parts
DE10057246A1 (de) * 1999-12-11 2001-07-12 Qualico Gmbh Infrarot-Nachweisvorrichtung für eine Vorrichtung zum Erfassen von Eigenschaften einer bewegten Papierbahn mit Polychromator und IR-Detektormatrix
EP1189052B1 (de) * 2000-06-28 2007-10-17 Robert Bosch Gmbh Vorrichtung zum bildlichen Erfassen von Stückgütern
US6850637B1 (en) * 2000-06-28 2005-02-01 Teradyne, Inc. Lighting arrangement for automated optical inspection system
IT1314910B1 (it) * 2000-07-26 2003-01-16 Eta Consulting S R L Metodo e strumento per la determinazione di angoli di distorsione intessuti o simili fermi o in movimento
US7042172B2 (en) * 2000-09-01 2006-05-09 Color Kinetics Incorporated Systems and methods for providing illumination in machine vision systems
AT4889U1 (de) 2000-11-07 2001-12-27 Binder Co Ag Diodenlichtquelle für eine zeilenkamera
WO2002048681A2 (en) * 2000-12-04 2002-06-20 Molecular Diagnostics, Inc. Cell transfer device
US6989272B1 (en) * 2001-03-06 2006-01-24 David Varon Apparatus and method for processing and testing a biological specimen
US6864498B2 (en) * 2001-05-11 2005-03-08 Orbotech Ltd. Optical inspection system employing a staring array scanner
US7009163B2 (en) * 2001-06-22 2006-03-07 Orbotech Ltd. High-sensitivity optical scanning using memory integration
WO2003021242A1 (en) * 2001-09-03 2003-03-13 Millennium Venture Holdings Ltd. Method and apparatus for inspecting the surface of workpieces
DE10252523A1 (de) * 2001-11-16 2003-07-03 Ccs Inc Beleuchtungsvorrichtung zur optischen Prüfung
DE10210831A1 (de) * 2002-03-12 2003-11-06 Zeiss Carl Optisches Bildaufnahme- und Bildauswertesystem
JP3839342B2 (ja) * 2002-04-11 2006-11-01 株式会社リコー 給紙装置及びそれを備えた画像形成装置
CN1653297B (zh) 2002-05-08 2010-09-29 佛森技术公司 高效固态光源及其使用和制造方法
AU2003248559A1 (en) * 2002-05-22 2003-12-12 Beth Israel Deaconess Medical Center Device for wavelength-selective imaging
US20040188644A1 (en) * 2002-09-17 2004-09-30 Quad/Tech, Inc. Method and apparatus for visually inspecting a substrate on a printing press
US20040150815A1 (en) * 2003-02-05 2004-08-05 Applied Vision Company, Llc Flaw detection in objects and surfaces
AU2003901632A0 (en) * 2003-04-03 2003-05-01 Commonwealth Scientific And Industrial Research Organisation Apparatus for measuring uniformity of a laminar material
US7521667B2 (en) 2003-06-23 2009-04-21 Advanced Optical Technologies, Llc Intelligent solid state lighting
US7145125B2 (en) * 2003-06-23 2006-12-05 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
US6995355B2 (en) 2003-06-23 2006-02-07 Advanced Optical Technologies, Llc Optical integrating chamber lighting using multiple color sources
US20070171649A1 (en) * 2003-06-23 2007-07-26 Advanced Optical Technologies, Llc Signage using a diffusion chamber
DE10330003B4 (de) * 2003-07-03 2007-03-08 Leica Microsystems Semiconductor Gmbh Vorrichtung, Verfahren und Computerprogramm zur Wafer-Inspektion
US6956337B2 (en) * 2003-08-01 2005-10-18 Directed Electronics, Inc. Temperature-to-color converter and conversion method
US7692773B2 (en) 2003-08-05 2010-04-06 Luminex Corporation Light emitting diode based measurement systems
DE102004020661A1 (de) * 2004-04-24 2005-11-17 Smiths Heimann Biometrics Gmbh Anordnung und Verfahren zum Prüfen von optischen Beugungsstrukturen auf Dokumenten
DE112005001294T5 (de) * 2004-06-04 2007-04-26 Tokyo Seimitsu Co., Ltd. Halbleiteroberflächenprüfungsvorrichtung sowie Beleuchtungsverfahren
US7423280B2 (en) 2004-08-09 2008-09-09 Quad/Tech, Inc. Web inspection module including contact image sensors
US7144131B2 (en) 2004-09-29 2006-12-05 Advanced Optical Technologies, Llc Optical system using LED coupled with phosphor-doped reflective materials
EP1653223B1 (de) * 2004-10-28 2010-06-09 Hewlett-Packard Development Company, L.P. Beleuchtung mittels einer Vielzahl von Lichtquellen
RU2007126795A (ru) * 2004-12-14 2009-01-27 Акцо Нобель Коатингс Интернэшнл Б.В. (Nl) Способ и устройство для анализа визуальных свойств поверхности
JP4800324B2 (ja) 2004-12-30 2011-10-26 フォーセン テクノロジー インク 露光装置
FR2881225B1 (fr) * 2005-01-21 2007-10-26 Cypher Science Sarl Appareil de detection portable permettant de detecter sur le terrain des elements marques par fluorescence
JP2008535407A (ja) * 2005-03-30 2008-08-28 デルタ・デザイン・インコーポレイテッド ライン走査カメラによる多元データ・マトリクス・スキャナのためのled照明システム
WO2006123421A1 (ja) * 2005-05-20 2006-11-23 Mega Trade Corp 照明装置
WO2006128317A1 (de) * 2005-06-03 2006-12-07 Elpatronic Ag Verfahren zur beleuchtung und beleuchtungsanordnung
FR2889404B1 (fr) * 2005-08-01 2009-03-27 Commissariat Energie Atomique Source lumineuse a deux longueurs d'onde et de puissance d'eclairement variable et utilisation d'une telle source lumineuse
US20070107801A1 (en) 2005-11-14 2007-05-17 Sidel And Pressco Technology Inc. Bottle filling machine with sensor and method thereof
US8017927B2 (en) 2005-12-16 2011-09-13 Honeywell International Inc. Apparatus, system, and method for print quality measurements using multiple adjustable sensors
US7688447B2 (en) * 2005-12-29 2010-03-30 Honeywell International Inc. Color sensor
EP1868366A1 (de) * 2006-06-16 2007-12-19 THOMSON Licensing Verfahren zur Steuerung eines TDI-CCD Bildsensors
US20080007936A1 (en) * 2006-07-05 2008-01-10 Jie Liu Organic illumination source and method for controlled illumination
US7339660B1 (en) * 2006-11-29 2008-03-04 Satake Usa, Inc. Illumination device for product examination
US7880156B2 (en) * 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography
US7684034B2 (en) * 2007-05-24 2010-03-23 Applied Vision Company, Llc Apparatus and methods for container inspection
US7667836B2 (en) * 2007-05-24 2010-02-23 Applied Vision Company, Llc Apparatus and methods for container inspection
US8014586B2 (en) * 2007-05-24 2011-09-06 Applied Vision Corporation Apparatus and methods for container inspection
US7800009B2 (en) * 2007-10-30 2010-09-21 Logical Systems Incorporated Air separator conveyor and vision system
JP5370953B2 (ja) * 2007-12-25 2013-12-18 独立行政法人 国立印刷局 印刷物の検査装置
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
US7891159B2 (en) * 2008-05-30 2011-02-22 Cryovac, Inc. Method for positioning a loaded bag in a vacuum chamber
FI122448B (fi) * 2008-07-23 2012-01-31 Labvision Technologies Ltd Oy Kuvantamisjärjestely
DE102009001026A1 (de) * 2009-02-20 2010-08-26 Voith Patent Gmbh Verfahren und Messvorrichtung zur optischen Erfassung und Auswertung einer Fasern beinhaltenden Bahn
US8325225B2 (en) * 2009-03-16 2012-12-04 PT Papertech, Inc Method and apparatus for a web inspection system
US8381581B2 (en) 2009-09-23 2013-02-26 Brooks Automation, Inc. Volumetric measurement
IT1396723B1 (it) 2009-11-04 2012-12-14 Sacmi Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.
US8401809B2 (en) 2010-07-12 2013-03-19 Honeywell International Inc. System and method for adjusting an on-line appearance sensor system
TWI426227B (zh) * 2010-12-30 2014-02-11 Ind Tech Res Inst 移動樣品之形貌的量測方法及其裝置
US8618929B2 (en) 2011-05-09 2013-12-31 Honeywell International Inc. Wireless conveyor belt condition monitoring system and related apparatus and method
US8922641B2 (en) 2011-06-29 2014-12-30 The Procter & Gamble Company System and method for inspecting components of hygienic articles
US9234843B2 (en) 2011-08-25 2016-01-12 Alliance For Sustainable Energy, Llc On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging
US10393563B2 (en) 2011-09-14 2019-08-27 Brooks Automation, Inc. Volumetric measurement
FI125320B (en) * 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
US20130226330A1 (en) * 2012-02-24 2013-08-29 Alliance For Sustainable Energy, Llc Optical techniques for monitoring continuous manufacturing of proton exchange membrane fuel cell components
WO2014009139A1 (de) * 2012-07-12 2014-01-16 Siemens Aktiengesellschaft Led-basierte spektrometersonde
CN105247857A (zh) 2013-04-22 2016-01-13 派拉斯科技术公司 盖分析技术
US9448115B2 (en) 2014-08-04 2016-09-20 Applied Vision Corporation Apparatus and methods for extracting topographic information from inspected objects
ITBO20150180A1 (it) 2015-04-14 2016-10-14 Sacmi Cooperativa Mecc Imola Soc Coop A R L Apparato e metodo di ispezione ottica di oggetti, in particolare coperchi metallici.
ES2757920T3 (es) 2015-04-14 2020-04-30 Sealed Air Corp Método de posicionamiento y sellado de una bolsa en una cámara de vacío, aparato de posicionamiento y sellado de bolsas
GB201601960D0 (en) * 2016-02-03 2016-03-16 Glaxosmithkline Biolog Sa Novel device
US10480935B2 (en) 2016-12-02 2019-11-19 Alliance For Sustainable Energy, Llc Thickness mapping using multispectral imaging
PL240873B1 (pl) * 2017-06-20 2022-06-20 Digital Care Spolka Z Ograniczona Odpowiedzialnoscia Urządzenie do optycznej detekcji wad lustrzanej powierzchni płaskich obiektów, zwłaszcza wyświetlaczy telefonów komórkowych i/lub smartfonów
US10502695B2 (en) 2017-08-16 2019-12-10 The Boeing Company Automated inspection of foreign materials, cracks and other surface anomalies
CN108535265A (zh) * 2018-04-10 2018-09-14 深圳市纳研科技有限公司 一种多角度打光装置及采集系统
EP4016058B1 (de) * 2020-12-16 2023-11-15 Zhejiang University Automatische sichtmaschine auf einer erkennungsvorrichtung für werkstücke mit komplexer gekrümmter oberfläche
DE102021109286A1 (de) * 2021-04-14 2022-10-20 Krones Aktiengesellschaft Verfahren und Vorrichtung zum Inspizieren von Behältnissen mit Feststellung einer Drehstellung eines Behältnisverschlusses
IT202100020195A1 (it) * 2021-07-28 2023-01-28 Spea Spa Dispositivo e metodo per analisi ottiche di una scheda elettronica
DE102022205760A1 (de) 2022-06-07 2023-12-07 Körber Technologies Gmbh Kamerasystem zur optischen Inspektion und Inspektionsverfahren

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3611069A (en) * 1969-11-12 1971-10-05 Gen Electric Multiple color light emitting diodes
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
GB2199135B (en) * 1986-12-10 1990-11-07 Plessey Co Plc Improvements relating to optical sensing arrangements
US4882498A (en) * 1987-10-09 1989-11-21 Pressco, Inc. Pulsed-array video inspection lighting system
US4922337B1 (en) * 1988-04-26 1994-05-03 Picker Int Inc Time delay and integration of images using a frame transfer ccd sensor
US4949172A (en) * 1988-09-26 1990-08-14 Picker International, Inc. Dual-mode TDI/raster-scan television camera system
US5040057A (en) * 1990-08-13 1991-08-13 Picker International, Inc. Multi-mode TDI/raster-scan television camera system
US4893223A (en) * 1989-01-10 1990-01-09 Northern Telecom Limited Illumination devices for inspection systems
US5021645A (en) * 1989-07-11 1991-06-04 Eaton Corporation Photoelectric color sensor for article sorting
US5072128A (en) * 1989-07-26 1991-12-10 Nikon Corporation Defect inspecting apparatus using multiple color light to detect defects
EP0498811B1 (de) * 1989-08-15 1997-04-09 Pressco Technology Inc. Beleuchtungsarray zur videoprüfung
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
JPH03269681A (ja) * 1990-03-19 1991-12-02 Sharp Corp 画像認識装置
EP0459489B1 (de) * 1990-05-30 1997-01-22 Dainippon Screen Mfg. Co., Ltd. Verfahren zum Lesen einer optischen Abbildung einer untersuchten Oberfläche und dafür einsetzbare Bildleseeinrichtung
US5087822A (en) * 1990-06-22 1992-02-11 Alcan International Limited Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
DE4115841B4 (de) * 1991-05-15 2004-11-04 Schölly Fiberoptic GmbH Vorrichtung zur optischen Kontrolle von Gegenständen

Also Published As

Publication number Publication date
EP1420244A2 (de) 2004-05-19
EP1420244A3 (de) 2005-09-14
EP0729572B1 (de) 2004-04-21
EP0729572A4 (de) 1997-08-13
AU5801094A (en) 1994-07-04
US5365084A (en) 1994-11-15
DE69333492T2 (de) 2005-04-14
JPH08506891A (ja) 1996-07-23
WO1994014053A1 (en) 1994-06-23
EP0729572A1 (de) 1996-09-04

Similar Documents

Publication Publication Date Title
DE69333492D1 (de) Video-inspektionssystem mit multispektraler beleuchtung unter verwendung lichtemittierender dioden und methode zur multispektralen beleuchtung unter verwendung lichtemittierender dioden
DE69332570D1 (de) Lichtquelle und Verfahren zur Montage lichtemittierender Dioden
DE69739601D1 (de) Weisslichtquelle mit lichtemittierenden Dioden
DE69322843D1 (de) Einzelsensor videobild-erzeugungs-system und -verfahren mit farbsequentieller beleuchtung von gegenständen
DE59406410D1 (de) Flugzeug mit einem Kühlsystem zur Kühlung von Lebensmitteln
DE69707590D1 (de) Leuchtdiodenanordnung und Verfahren zu ihrer Herstellung
DE69600617T2 (de) Vorrichtung mit Mikrofiltern zur Auswahl von Farben und Bildern
DE60330967D1 (de) Verfahren und systeme zum beleuchten von umgebungen
DE68913514T2 (de) Gegenstand mit veränderlicher lichtübertragung und verfahren zur herstellung.
DE69424858D1 (de) Bildprojektionsvorrichtung und lampensteuerungssystem zur verwendung darin
DE69418502D1 (de) Vorrichtung zur Hintergrund-Beleuchtung
DE69427029D1 (de) Verfaheren zur verbrennungsmotorsteuerung
DE50110162D1 (de) Beleuchtungsvorrichtung mit lichtemittierenden dioden (led), beleuchtungsverfahren und verfahren zur bildaufzeichnung mit derartiger led-beleuchtungsvorrichtung
DE69623443T2 (de) Vielfarbige lichtemissionsvorrichtung und verfahren zur herstellung derselben
DE69231309T2 (de) Methode und System zur Handschrifterkennung
DE19680872T1 (de) Blaulicht emittierendes Element und Verfahren zur Herstellung desselben
DE69217319D1 (de) Bildeditiersystem und Methode mit verbesserter Farbpaletteneditierung
DE69612888D1 (de) Techniken zur Regelung von entfernten Lampenlasten
DE69402379D1 (de) Einrichtung und Verfahren zur Beleuchtung von Lichtleitern und von der Umgebung
DE68914980D1 (de) Lichtausstrahlende anordnung und verfahren zur herstellung.
US6916103B2 (en) Illuminated guard rail
DE69328700T2 (de) Methode zur automatischen Fokussierung für Videokamera unter Berücksichtigung des Beleuchtungsflackerns
DE69314734D1 (de) Vorrichtung und Verfahren zur Herstellung von leichten Lebensmitteln
DE69602347T2 (de) Vorrichtung mit Mikrospiegeln und Mikrofiltern zur Auswahl von Farben und Abbildungen
DE69111842T2 (de) Optisches System zur Abtastung mit Lichtstrahlen.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition