IT1396723B1 - Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. - Google Patents

Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.

Info

Publication number
IT1396723B1
IT1396723B1 ITRM2009A000567A ITRM20090567A IT1396723B1 IT 1396723 B1 IT1396723 B1 IT 1396723B1 IT RM2009A000567 A ITRM2009A000567 A IT RM2009A000567A IT RM20090567 A ITRM20090567 A IT RM20090567A IT 1396723 B1 IT1396723 B1 IT 1396723B1
Authority
IT
Italy
Prior art keywords
defects
examined
detection
elements
particular metallic
Prior art date
Application number
ITRM2009A000567A
Other languages
English (en)
Inventor
Massimo Balducci
Original Assignee
Sacmi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sacmi filed Critical Sacmi
Priority to ITRM2009A000567A priority Critical patent/IT1396723B1/it
Priority to EP10790679.4A priority patent/EP2496933B1/en
Priority to US13/508,038 priority patent/US8792094B2/en
Priority to CN201080049544.7A priority patent/CN102725625B/zh
Priority to PCT/IT2010/000427 priority patent/WO2011055397A1/en
Priority to KR1020127009330A priority patent/KR101844079B1/ko
Publication of ITRM20090567A1 publication Critical patent/ITRM20090567A1/it
Application granted granted Critical
Publication of IT1396723B1 publication Critical patent/IT1396723B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"
    • G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/909—Investigating the presence of flaws or contamination in a container or its contents in opaque containers or opaque container parts, e.g. cans, tins, caps, labels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
    • G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ITRM2009A000567A 2009-11-04 2009-11-04 Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo. IT1396723B1 (it)

Priority Applications (6)

Application Number Priority Date Filing Date Title
ITRM2009A000567A IT1396723B1 (it) 2009-11-04 2009-11-04 Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.
EP10790679.4A EP2496933B1 (en) 2009-11-04 2010-10-25 Apparatus, system and method for detecting defects of metallic lids
US13/508,038 US8792094B2 (en) 2009-11-04 2010-10-25 Apparatus, system and method for detecting defects of metallic lids
CN201080049544.7A CN102725625B (zh) 2009-11-04 2010-10-25 用于检测金属盖的缺陷的设备、系统和方法
PCT/IT2010/000427 WO2011055397A1 (en) 2009-11-04 2010-10-25 Apparatus, system and method for detecting defects of metallic lids
KR1020127009330A KR101844079B1 (ko) 2009-11-04 2010-10-25 금속 뚜껑의 결함을 검출하는 장치, 시스템 그리고 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITRM2009A000567A IT1396723B1 (it) 2009-11-04 2009-11-04 Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.

Publications (2)

Publication Number Publication Date
ITRM20090567A1 ITRM20090567A1 (it) 2011-05-05
IT1396723B1 true IT1396723B1 (it) 2012-12-14

Family

ID=42235580

Family Applications (1)

Application Number Title Priority Date Filing Date
ITRM2009A000567A IT1396723B1 (it) 2009-11-04 2009-11-04 Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.

Country Status (6)

Country Link
US (1) US8792094B2 (it)
EP (1) EP2496933B1 (it)
KR (1) KR101844079B1 (it)
CN (1) CN102725625B (it)
IT (1) IT1396723B1 (it)
WO (1) WO2011055397A1 (it)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20121299A1 (it) * 2012-07-25 2014-01-26 Mondial Marmi S R L Apparato per acquisire una pluralita' di immagini superficiali di almeno un corpo e relativo metodo
CN103076336A (zh) * 2012-12-28 2013-05-01 罗炳军 一种物体表面质量检测仪
JP2015055569A (ja) * 2013-09-12 2015-03-23 株式会社Ｆｄｋエンジニアリング 画像外観検査装置
ITBO20150180A1 (it) * 2015-04-14 2016-10-14 Sacmi Cooperativa Mecc Imola Soc Coop A R L Apparato e metodo di ispezione ottica di oggetti, in particolare coperchi metallici.
ITBO20150203A1 (it) * 2015-04-21 2016-10-21 Sacmi Apparato e metodo di ispezione ottica di preforme.
DE102015008409A1 (de) * 2015-07-02 2017-01-05 Eisenmann Se Anlage zur optischen Überprüfung von Oberflächenbereichen von Gegenständen
KR20170046918A (ko) * 2015-10-22 2017-05-04 (주)테크윙 물품 검사용 촬영기
CN105891218A (zh) * 2016-05-09 2016-08-24 成都慧信实验设备有限公司 检测电子元件表面缺陷的装置
JP6622679B2 (ja) * 2016-10-26 2019-12-18 川崎重工業株式会社 サークルスクラッチ検査装置
IT201800002782A1 (it) * 2018-02-16 2019-08-16 Salva Daniel Oscar Sistema di analisi dimensionale di difetti
CN109870463B (zh) * 2019-04-09 2020-01-14 深圳市阿赛姆电子有限公司 一种电子芯片故障检测装置
US11282187B2 (en) 2019-08-19 2022-03-22 Ricoh Company, Ltd. Inspection system, inspection apparatus, and method using multiple angle illumination
CN112540454B (zh) * 2020-11-11 2022-08-02 中国航发贵州黎阳航空动力有限公司 一种晶粒取向成像图的获取方法
CN114264658B (zh) * 2021-03-12 2024-01-26 青岛昇瑞光电科技有限公司 Led芯片检测装置及设备
CN113390890A (zh) * 2021-06-18 2021-09-14 杭州思元智能科技有限公司 一种基于多角度光路照明的电子元件外观检测装置
DE102021210370A1 (de) * 2021-09-17 2023-03-23 QUISS Qualitäts-Inspektionssysteme und Service GmbH Vorrichtung und Verfahren zum automatischen Überwachen von Getränke- und Lebensmitteldosen-Deckeln
IT202200006344A1 (it) 2022-03-31 2023-10-01 Antares Vision S P A Sistema di ispezione di oggetti
CN115954291B (zh) * 2023-03-04 2023-11-14 天合光能(宿迁)光电有限公司 一种TOPCon结构光伏电池板的裂纹监测系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0498811B1 (en) * 1989-08-15 1997-04-09 Pressco Technology Inc. Engineered video inspection lighting array
US5365084A (en) 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
JPH11295047A (ja) * 1998-04-06 1999-10-29 Omron Corp 照明装置
EP1455179A1 (en) * 2003-03-07 2004-09-08 MV Research Limited A machine vision inspection system and method
JP4139743B2 (ja) * 2003-06-12 2008-08-27 日本軽金属株式会社 アルミニウムにおける非金属介在物の測定装置
DE102004034160A1 (de) 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
CN2867100Y (zh) * 2005-07-13 2007-02-07 王锦峰 在线光源发生装置
JP2008216180A (ja) 2007-03-07 2008-09-18 Omron Corp 表面状態検査方法および表面状態検査装置
JP2009192544A (ja) 2009-06-01 2009-08-27 Hitachi Chem Co Ltd 分光装置及び全反射ラマン分光装置

Also Published As

Publication number Publication date
EP2496933B1 (en) 2020-02-19
WO2011055397A1 (en) 2011-05-12
US8792094B2 (en) 2014-07-29
KR20120109473A (ko) 2012-10-08
WO2011055397A4 (en) 2011-06-30
CN102725625A (zh) 2012-10-10
KR101844079B1 (ko) 2018-05-14
CN102725625B (zh) 2015-05-06
EP2496933A1 (en) 2012-09-12
ITRM20090567A1 (it) 2011-05-05
US20120268733A1 (en) 2012-10-25

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