DE69331547T2 - Bildformattierung für ein mustererzeugungsgerät - Google Patents

Bildformattierung für ein mustererzeugungsgerät

Info

Publication number
DE69331547T2
DE69331547T2 DE69331547T DE69331547T DE69331547T2 DE 69331547 T2 DE69331547 T2 DE 69331547T2 DE 69331547 T DE69331547 T DE 69331547T DE 69331547 T DE69331547 T DE 69331547T DE 69331547 T2 DE69331547 T2 DE 69331547T2
Authority
DE
Germany
Prior art keywords
generation device
pattern generation
image formatting
formatting
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69331547T
Other languages
English (en)
Other versions
DE69331547D1 (de
Inventor
L Teitzel
J Jolley
B Campbell
K George
John Wipfli
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of DE69331547D1 publication Critical patent/DE69331547D1/de
Application granted granted Critical
Publication of DE69331547T2 publication Critical patent/DE69331547T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70383Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
    • G03F7/704Scanned exposure beam, e.g. raster-, rotary- and vector scanning
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/70508Data handling in all parts of the microlithographic apparatus, e.g. handling pattern data for addressable masks or data transfer to or from different components within the exposure apparatus
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/002D [Two Dimensional] image generation
    • G06T11/20Drawing from basic elements, e.g. lines or circles
    • G06T11/203Drawing of straight lines or curves
DE69331547T 1992-11-02 1993-10-22 Bildformattierung für ein mustererzeugungsgerät Expired - Lifetime DE69331547T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US97029392A 1992-11-02 1992-11-02
PCT/US1993/010137 WO1994010633A1 (en) 1992-11-02 1993-10-22 Rasterizer for a pattern generation apparatus

Publications (2)

Publication Number Publication Date
DE69331547D1 DE69331547D1 (de) 2002-03-21
DE69331547T2 true DE69331547T2 (de) 2003-04-24

Family

ID=25516715

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69331547T Expired - Lifetime DE69331547T2 (de) 1992-11-02 1993-10-22 Bildformattierung für ein mustererzeugungsgerät

Country Status (8)

Country Link
US (1) US5533170A (de)
EP (1) EP0664033B1 (de)
JP (1) JP3331339B2 (de)
KR (1) KR100310279B1 (de)
AU (1) AU5410294A (de)
CA (1) CA2148121A1 (de)
DE (1) DE69331547T2 (de)
WO (1) WO1994010633A1 (de)

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JP2887572B2 (ja) * 1995-04-07 1999-04-26 富士ゼロックス株式会社 画像出力装置および画像処理方法
SE509062C2 (sv) 1997-02-28 1998-11-30 Micronic Laser Systems Ab Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster
US6786420B1 (en) 1997-07-15 2004-09-07 Silverbrook Research Pty. Ltd. Data distribution mechanism in the form of ink dots on cards
US6618117B2 (en) 1997-07-12 2003-09-09 Silverbrook Research Pty Ltd Image sensing apparatus including a microcontroller
US6690419B1 (en) 1997-07-15 2004-02-10 Silverbrook Research Pty Ltd Utilising eye detection methods for image processing in a digital image camera
US6624848B1 (en) 1997-07-15 2003-09-23 Silverbrook Research Pty Ltd Cascading image modification using multiple digital cameras incorporating image processing
US6879341B1 (en) 1997-07-15 2005-04-12 Silverbrook Research Pty Ltd Digital camera system containing a VLIW vector processor
US7110024B1 (en) 1997-07-15 2006-09-19 Silverbrook Research Pty Ltd Digital camera system having motion deblurring means
US6948794B2 (en) 1997-07-15 2005-09-27 Silverbrook Reserach Pty Ltd Printhead re-capping assembly for a print and demand digital camera system
SE9800665D0 (sv) * 1998-03-02 1998-03-02 Micronic Laser Systems Ab Improved method for projection printing using a micromirror SLM
WO2000004494A1 (en) * 1998-07-17 2000-01-27 Intergraph Corporation Graphics processing system with multiple strip breakers
AUPP702098A0 (en) 1998-11-09 1998-12-03 Silverbrook Research Pty Ltd Image creation method and apparatus (ART73)
US6377265B1 (en) 1999-02-12 2002-04-23 Creative Technology, Ltd. Digital differential analyzer
AUPQ056099A0 (en) * 1999-05-25 1999-06-17 Silverbrook Research Pty Ltd A method and apparatus (pprint01)
SE516914C2 (sv) * 1999-09-09 2002-03-19 Micronic Laser Systems Ab Metoder och rastrerare för högpresterande mönstergenerering
SE516347C2 (sv) * 1999-11-17 2001-12-17 Micronic Laser Systems Ab Laserskanningssystem och metod för mikrolitografisk skrivning
US6819450B1 (en) 2000-03-28 2004-11-16 Applied Materials, Inc. Enhanced edge resolution and critical dimension linearity in lithography
US6724002B2 (en) 2001-01-31 2004-04-20 Applied Materials, Inc. Multiple electron beam lithography system with multiple beam modulated laser illumination
US7034963B2 (en) * 2001-07-11 2006-04-25 Applied Materials, Inc. Method for adjusting edges of grayscale pixel-map images
US7420710B2 (en) * 2001-07-11 2008-09-02 Applied Materials, Inc. Optical proximity correction in raster scan printing based on grayscale manipulation of the bitmap
US6812474B2 (en) 2001-07-13 2004-11-02 Applied Materials, Inc. Pattern generation method and apparatus using cached cells of hierarchical data
JP4324645B2 (ja) * 2001-08-21 2009-09-02 株式会社オーク製作所 多重露光描画装置および多重露光描画方法
US7302111B2 (en) * 2001-09-12 2007-11-27 Micronic Laser Systems A.B. Graphics engine for high precision lithography
JP2005502914A (ja) * 2001-09-12 2005-01-27 マイクロニック レーザー システムズ アクチボラゲット Slmを用いて改善された方法と装置
US6618185B2 (en) 2001-11-28 2003-09-09 Micronic Laser Systems Ab Defective pixel compensation method
US7106490B2 (en) * 2001-12-14 2006-09-12 Micronic Laser Systems Ab Methods and systems for improved boundary contrast
SE0200864D0 (sv) 2002-03-21 2002-03-21 Micronic Laser Systems Ab Method and apparatus for printing large data flows
US7167185B1 (en) 2002-03-22 2007-01-23 Kla- Tencor Technologies Corporation Visualization of photomask databases
US7345782B2 (en) * 2002-05-13 2008-03-18 Texas Instruments Incorporated Efficient implementation of raster operations flow
KR20050086953A (ko) * 2003-01-15 2005-08-30 마이크로닉 레이저 시스템즈 에이비 결함 픽셀을 탐지하는 방법
JP4068081B2 (ja) 2004-05-26 2008-03-26 株式会社日立ハイテクノロジーズ 荷電粒子線描画装置
US7407252B2 (en) 2004-07-01 2008-08-05 Applied Materials, Inc. Area based optical proximity correction in raster scan printing
US7529421B2 (en) 2004-07-01 2009-05-05 Applied Materials, Inc. Optical proximity correction in raster scan printing based on corner matching templates
US7278129B2 (en) * 2004-09-09 2007-10-02 Micronic Laser Systems Ab Healing algorithm
US7425713B2 (en) * 2005-01-14 2008-09-16 Arradiance, Inc. Synchronous raster scanning lithographic system
US7965373B2 (en) * 2005-06-28 2011-06-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method utilizing a datapath having a balanced calculation load
JP4617210B2 (ja) * 2005-07-13 2011-01-19 日立ビアメカニクス株式会社 描画装置及びそれを搭載した露光装置
JP4661854B2 (ja) * 2007-11-09 2011-03-30 株式会社デンソー 検査システム及びプログラム
JP5134944B2 (ja) * 2007-12-27 2013-01-30 株式会社ニューフレアテクノロジー 描画装置及び描画方法
US20100142838A1 (en) * 2008-12-05 2010-06-10 Micronic Laser Systems Ab Gradient assisted image resampling in micro-lithographic printing
US8539395B2 (en) 2010-03-05 2013-09-17 Micronic Laser Systems Ab Method and apparatus for merging multiple geometrical pixel images and generating a single modulator pixel image
US8473877B2 (en) * 2011-09-06 2013-06-25 Taiwan Semiconductor Manufacturing Company, Ltd. Striping methodology for maskless lithography
JP2013135194A (ja) 2011-12-27 2013-07-08 Canon Inc 描画装置及び物品の製造方法
US10169906B2 (en) 2013-03-29 2019-01-01 Advanced Micro Devices, Inc. Hybrid render with deferred primitive batch binning
US10957094B2 (en) * 2013-03-29 2021-03-23 Advanced Micro Devices, Inc. Hybrid render with preferred primitive batch binning and sorting
US20160284044A1 (en) * 2015-03-24 2016-09-29 Applied Materials, Inc. Low-latency high bandwidth data path
US10410831B2 (en) 2015-05-12 2019-09-10 Ims Nanofabrication Gmbh Multi-beam writing using inclined exposure stripes
US10325756B2 (en) 2016-06-13 2019-06-18 Ims Nanofabrication Gmbh Method for compensating pattern placement errors caused by variation of pattern exposure density in a multi-beam writer
US10325757B2 (en) * 2017-01-27 2019-06-18 Ims Nanofabrication Gmbh Advanced dose-level quantization of multibeam-writers
US10522329B2 (en) 2017-08-25 2019-12-31 Ims Nanofabrication Gmbh Dose-related feature reshaping in an exposure pattern to be exposed in a multi beam writing apparatus
US11569064B2 (en) 2017-09-18 2023-01-31 Ims Nanofabrication Gmbh Method for irradiating a target using restricted placement grids
US10651010B2 (en) 2018-01-09 2020-05-12 Ims Nanofabrication Gmbh Non-linear dose- and blur-dependent edge placement correction
US10840054B2 (en) 2018-01-30 2020-11-17 Ims Nanofabrication Gmbh Charged-particle source and method for cleaning a charged-particle source using back-sputtering
US11099482B2 (en) 2019-05-03 2021-08-24 Ims Nanofabrication Gmbh Adapting the duration of exposure slots in multi-beam writers
KR20210132599A (ko) 2020-04-24 2021-11-04 아이엠에스 나노패브릭케이션 게엠베하 대전 입자 소스

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US4796038A (en) * 1985-07-24 1989-01-03 Ateq Corporation Laser pattern generation apparatus
IE852259L (en) * 1985-09-13 1987-03-13 Scottish & Newcastle Breweries A method and apparatus for constructing, storing and¹displaying characters
US4806921A (en) * 1985-10-04 1989-02-21 Ateq Corporation Rasterizer for pattern generator
US4949280A (en) * 1988-05-10 1990-08-14 Battelle Memorial Institute Parallel processor-based raster graphics system architecture
US4958303A (en) * 1988-05-12 1990-09-18 Digital Equipment Corporation Apparatus for exchanging pixel data among pixel processors
US4956650A (en) * 1988-08-26 1990-09-11 Ateq Corporation Pattern generation system
US5103101A (en) * 1991-03-04 1992-04-07 Etec Systems, Inc. Multiphase printing for E-beam lithography

Also Published As

Publication number Publication date
JPH08505003A (ja) 1996-05-28
DE69331547D1 (de) 2002-03-21
EP0664033A4 (de) 1995-11-08
EP0664033B1 (de) 2002-02-06
KR100310279B1 (ko) 2001-12-17
AU5410294A (en) 1994-05-24
US5533170A (en) 1996-07-02
EP0664033A1 (de) 1995-07-26
JP3331339B2 (ja) 2002-10-07
CA2148121A1 (en) 1994-05-11
WO1994010633A1 (en) 1994-05-11
KR950704759A (ko) 1995-11-20

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Legal Events

Date Code Title Description
8332 No legal effect for de
8327 Change in the person/name/address of the patent owner

Owner name: APPLIED MATERIALS, INC. (N.D.GES.D. STAATES DELAWA

8328 Change in the person/name/address of the agent

Free format text: ZENZ, HELBER, HOSBACH & PARTNER, 45128 ESSEN

8370 Indication of lapse of patent is to be deleted
8364 No opposition during term of opposition