DE69321663D1 - Hierarchisches Verbindungsverfahren, -gerät und -protokoll - Google Patents

Hierarchisches Verbindungsverfahren, -gerät und -protokoll

Info

Publication number
DE69321663D1
DE69321663D1 DE69321663T DE69321663T DE69321663D1 DE 69321663 D1 DE69321663 D1 DE 69321663D1 DE 69321663 T DE69321663 T DE 69321663T DE 69321663 T DE69321663 T DE 69321663T DE 69321663 D1 DE69321663 D1 DE 69321663D1
Authority
DE
Germany
Prior art keywords
serial bus
protocol
bus master
circuitry
primary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69321663T
Other languages
English (en)
Other versions
DE69321663T2 (de
Inventor
Lee D Whetsel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69321663D1 publication Critical patent/DE69321663D1/de
Application granted granted Critical
Publication of DE69321663T2 publication Critical patent/DE69321663T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31722—Addressing or selecting of test units, e.g. transmission protocols for selecting test units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G01R31/318508—Board Level Test, e.g. P1500 Standard
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/4068—Electrical coupling
    • G06F13/4072—Drivers or receivers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/409—Mechanical coupling
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • G06F13/4291—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus using a clocked protocol
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Information Transfer Systems (AREA)
  • Small-Scale Networks (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Computer And Data Communications (AREA)
  • Communication Control (AREA)
DE1993621663 1992-06-17 1993-06-14 Hierarchisches Verbindungsverfahren, -gerät und -protokoll Expired - Lifetime DE69321663T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US90080592A 1992-06-17 1992-06-17
US90080692A 1992-06-17 1992-06-17
US90070892A 1992-06-17 1992-06-17

Publications (2)

Publication Number Publication Date
DE69321663D1 true DE69321663D1 (de) 1998-11-26
DE69321663T2 DE69321663T2 (de) 1999-05-06

Family

ID=27420586

Family Applications (2)

Application Number Title Priority Date Filing Date
DE1993621663 Expired - Lifetime DE69321663T2 (de) 1992-06-17 1993-06-14 Hierarchisches Verbindungsverfahren, -gerät und -protokoll
DE1993633479 Expired - Lifetime DE69333479T2 (de) 1992-06-17 1993-06-14 Hierarchisches Verbindungsverfahren und -gerät

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE1993633479 Expired - Lifetime DE69333479T2 (de) 1992-06-17 1993-06-14 Hierarchisches Verbindungsverfahren und -gerät

Country Status (3)

Country Link
EP (3) EP0578386B1 (de)
JP (1) JP3444623B2 (de)
DE (2) DE69321663T2 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
FR2737782B1 (fr) * 1995-08-11 1997-10-31 Deroux Dauphin Patrice Systeme electronique testable
US5659552A (en) * 1995-10-17 1997-08-19 Lucent Technologies Inc. Method and apparatus for verifying test information on a backplane test bus
US5852617A (en) * 1995-12-08 1998-12-22 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with Jtag logic mounted thereon
EP0813151A4 (de) * 1995-12-27 1999-03-31 Koken Kk Steuervorrichtung
EP0826974B1 (de) * 1996-08-30 2005-10-19 Texas Instruments Incorporated Vorrichtung zur Prüfung von integrierten Schaltungen
FR2776157A1 (fr) * 1998-03-16 1999-09-17 Castor Technologies Protocole et structure de bus local, et module d'interface mettant en oeuvre ce protocole
KR20010064761A (ko) * 1999-12-18 2001-07-11 서평원 유에이알티 인터페이스 장치 및 방법
KR100422129B1 (ko) * 2000-06-12 2004-03-10 엘지전자 주식회사 회로시스템에서 오동작여부 진단을 위한 경로를안정화하는 백플레인 장치
KR100479508B1 (ko) * 2000-12-27 2005-03-25 엘지전자 주식회사 하나의 통신 포트를 이용한 다른 보드와 통신하기 위한통신 제어장치
US7185251B2 (en) * 2002-05-29 2007-02-27 Freescale Semiconductor, Inc. Method and apparatus for affecting a portion of an integrated circuit
US7409612B2 (en) * 2003-02-10 2008-08-05 Nxp B.V. Testing of integrated circuits
JP2006518040A (ja) * 2003-02-18 2006-08-03 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 電子回路試験
US7493433B2 (en) 2004-10-29 2009-02-17 International Business Machines Corporation System, method and storage medium for providing an inter-integrated circuit (I2C) slave with read/write access to random access memory
JP2008092523A (ja) * 2006-10-05 2008-04-17 Nec Corp データ転送装置及びデータ処理方法
CN102567156A (zh) * 2010-12-31 2012-07-11 鸿富锦精密工业（深圳）有限公司 服务器硬盘背板测试装置
CN103091626B (zh) * 2011-11-04 2015-07-15 深圳迈瑞生物医疗电子股份有限公司 Jtag测试链路及其超声诊断仪
US20170017558A1 (en) * 2015-07-17 2017-01-19 Qualcomm Incorporated Non-intrusive probe for double data rate interface
FR3042053B1 (fr) 2015-10-05 2018-03-23 Airbus Operations Systeme avionique d'un aeronef comportant des unites remplacables en ligne pouvant echanger des messages entre elles et dispositif de surveillance d'un tel systeme avionique
JP7327029B2 (ja) 2019-09-19 2023-08-16 京セラドキュメントソリューションズ株式会社 画像形成装置、データ通信方法
CN110907857B (zh) * 2019-12-10 2022-05-13 上海国微思尔芯技术股份有限公司 一种基于fpga的连接器自动检测方法
CN114153637B (zh) * 2020-08-17 2025-07-08 昆达电脑科技(昆山)有限公司 伺服系统
CN112612264A (zh) * 2020-12-22 2021-04-06 北京时代民芯科技有限公司 一种can总线控制器中串口自测试方法
CN116578515A (zh) * 2023-03-31 2023-08-11 上海矽力杰微电子技术有限公司 单线串行通讯方法以及通讯设备
CN116820867B (zh) * 2023-08-29 2023-12-15 腾讯科技（深圳）有限公司 一种芯片调试方法、装置及芯片

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2253888A (en) * 1987-07-23 1989-03-01 Face Technologies, Inc. Communication processor for personal computer
US4912633A (en) * 1988-10-24 1990-03-27 Ncr Corporation Hierarchical multiple bus computer architecture
DE69031676T2 (de) * 1989-08-09 1998-03-12 Texas Instruments Inc Architektur des Abtastpfads eines Systems
JP3118266B2 (ja) * 1990-03-06 2000-12-18 ゼロックス コーポレイション 同期セグメントバスとバス通信方法
US5659773A (en) * 1990-11-14 1997-08-19 International Business Machines Corporation Personal computer with input/output subsystem

Also Published As

Publication number Publication date
EP0855654A2 (de) 1998-07-29
DE69321663T2 (de) 1999-05-06
EP1434058A2 (de) 2004-06-30
JPH0787161A (ja) 1995-03-31
DE69333479D1 (de) 2004-05-13
EP0855654B1 (de) 2004-04-07
JP3444623B2 (ja) 2003-09-08
EP0578386A2 (de) 1994-01-12
EP1434058A3 (de) 2010-05-19
EP0855654A3 (de) 2000-10-04
DE69333479T2 (de) 2005-03-24
EP0578386A3 (de) 1994-03-09
EP0578386B1 (de) 1998-10-21

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Legal Events

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8364 No opposition during term of opposition