DE69320623T2 - Mikropolarimeter, Mikrosensorsystem und Methode zum charakterisieren Dünner Filme - Google Patents
Mikropolarimeter, Mikrosensorsystem und Methode zum charakterisieren Dünner FilmeInfo
- Publication number
- DE69320623T2 DE69320623T2 DE69320623T DE69320623T DE69320623T2 DE 69320623 T2 DE69320623 T2 DE 69320623T2 DE 69320623 T DE69320623 T DE 69320623T DE 69320623 T DE69320623 T DE 69320623T DE 69320623 T2 DE69320623 T2 DE 69320623T2
- Authority
- DE
- Germany
- Prior art keywords
- micropolarimeter
- thin films
- microsensor system
- characterizing thin
- characterizing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93110277A EP0632256B1 (de) | 1993-06-28 | 1993-06-28 | Mikropolarimeter, Mikrosensorsystem und Methode zum charakterisieren Dünner Filme |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69320623D1 DE69320623D1 (de) | 1998-10-01 |
DE69320623T2 true DE69320623T2 (de) | 1999-04-15 |
Family
ID=8213014
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69320623T Expired - Fee Related DE69320623T2 (de) | 1993-06-28 | 1993-06-28 | Mikropolarimeter, Mikrosensorsystem und Methode zum charakterisieren Dünner Filme |
Country Status (3)
Country | Link |
---|---|
US (1) | US5502567A (de) |
EP (1) | EP0632256B1 (de) |
DE (1) | DE69320623T2 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10236999B3 (de) * | 2002-08-13 | 2004-02-05 | Kiepenheuer-Institut für Sonnenphysik Stiftung des öffentlichen Rechts des Landes Baden-Württemberg | Vorrichtung zur Untersuchung von polarisiertem Licht |
DE102013200394A1 (de) * | 2013-01-14 | 2014-07-17 | Carl Zeiss Smt Gmbh | Polarisationsmessvorrichtung, Lithographieanlage, Messanordnung, und Verfahren zur Polarisationsmessung |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19537706A1 (de) * | 1995-10-11 | 1997-04-17 | Lorenz Diener | Verfahren und Vorrichtung zur störunempfindlichen analogen Echtzeitpolarimetrie |
DE19621512A1 (de) * | 1996-05-29 | 1997-12-04 | Univ Schiller Jena | Verfahren und Anordnung zur Auswertung des wellenlängenabhängigen Polarisationszustandes einer Strahlung |
DE19707926A1 (de) * | 1997-02-27 | 1998-09-03 | Gunther Dr Elender | Abbildendes Mikro-Ellipsometer |
EP1002221B1 (de) * | 1997-08-06 | 2003-07-02 | INSTITUT FÜR MIKROTECHNIK MAINZ GmbH | Mikropolarimeter |
DE19751817A1 (de) * | 1997-11-21 | 1999-05-27 | Kalle Pentaplast Gmbh | Verfahren zur kontinuierlichen Steuerung des Schrumpfes einer amorphen Folie und eine Anordnung hierfür |
DE19816974C1 (de) * | 1998-04-17 | 2000-01-13 | Nanophotonics Ag | Verfahren und Vorrichtung zur automatischen relativen Justierung von Proben bezüglich eines Ellipsometers |
EP0950881A3 (de) * | 1998-04-17 | 2000-08-16 | NanoPhotonics AG | Verfahren und Vorrichtung zur automatischen relativen Justierung von Proben bezüglich eines Ellipsometers |
DE19842364C1 (de) * | 1998-09-16 | 2000-04-06 | Nanophotonics Ag | Mikropolarimeter und Ellipsometer |
WO2001055671A1 (en) * | 2000-01-31 | 2001-08-02 | Therma-Wave, Inc. | Fiber-filtered laser system for use in measuring thin film thicknesses |
US6515744B2 (en) * | 2001-02-08 | 2003-02-04 | Therma-Wave, Inc. | Small spot ellipsometer |
DE10146945A1 (de) * | 2001-09-24 | 2003-04-10 | Zeiss Carl Jena Gmbh | Meßanordnung und Meßverfahren |
DE10146944A1 (de) * | 2001-09-24 | 2003-04-10 | Zeiss Carl Jena Gmbh | Meßanordnung |
US6674532B2 (en) | 2001-11-02 | 2004-01-06 | Vandelden Jay S. | Interferometric polarization interrogating filter assembly and method |
US7064828B1 (en) | 2001-12-19 | 2006-06-20 | Nanometrics Incorporated | Pulsed spectroscopy with spatially variable polarization modulation element |
US6798513B2 (en) * | 2002-04-11 | 2004-09-28 | Nanophotonics Ab | Measuring module |
US6891609B2 (en) * | 2002-04-11 | 2005-05-10 | Nanophotonics Ag | Measurement box with module for measuring wafer characteristics |
DE10217028C1 (de) * | 2002-04-11 | 2003-11-20 | Nanophotonics Ag | Meßmodul für Waferfertigungsanlagen |
US7079249B2 (en) | 2002-06-21 | 2006-07-18 | Therma-Wave, Inc. | Modulated reflectance measurement system with fiber laser technology |
US7061613B1 (en) | 2004-01-13 | 2006-06-13 | Nanometrics Incorporated | Polarizing beam splitter and dual detector calibration of metrology device having a spatial phase modulation |
DE102010023605B4 (de) * | 2010-06-12 | 2015-08-20 | Wenglor Sensoric Gmbh | Lichtschranke |
CN102261955A (zh) * | 2011-05-03 | 2011-11-30 | 杭州电子科技大学 | 一种光束偏振光谱特性检测方法 |
JP6981967B2 (ja) | 2015-08-31 | 2021-12-17 | ジェンテュイティ・リミテッド・ライアビリティ・カンパニーGentuity, LLC | 撮像プローブおよびデリバリデバイスを含む撮像システム |
EP3841736A4 (de) * | 2018-09-17 | 2022-05-18 | Gentuity LLC | Bildgebungssystem mit optischem pfad |
KR20230003886A (ko) * | 2021-06-30 | 2023-01-06 | 삼성전자주식회사 | 광학 계측 설비, 그를 이용한 광학 계측 방법 및 그를 이용한 반도체 장치의 제조 방법 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE456897C (de) * | 1925-02-17 | 1928-06-19 | Johann Wickeland | Zugsicherung mittels Scheinwerfer und Spiegelreflektoren |
DE1951920A1 (de) * | 1969-10-15 | 1971-04-22 | Siemens Ag | Anordnung zur Bestimmung der Schwingungsebene einer polarisierten Lichtstrahlung |
GB1352839A (en) * | 1970-07-31 | 1974-05-15 | Nat Res Dev | Methods of and apparatus for effecting optical measurement and analysis |
US3880524A (en) * | 1973-06-25 | 1975-04-29 | Ibm | Automatic ellipsometer |
US4158506A (en) * | 1977-11-15 | 1979-06-19 | The United States Of America As Represented By The Secretary Of The Army | Automatic determination of the polarization state of nanosecond laser pulses |
US4286843A (en) * | 1979-05-14 | 1981-09-01 | Reytblatt Zinovy V | Polariscope and filter therefor |
US4585348A (en) * | 1981-09-28 | 1986-04-29 | International Business Machines Corporation | Ultra-fast photometric instrument |
NL8502988A (nl) * | 1985-11-01 | 1987-06-01 | Philips Nv | Halfgeleidende radieele fotodetector, en inrichting bevattende een dergelijke detector. |
US5329357A (en) * | 1986-03-06 | 1994-07-12 | Sopra-Societe De Production Et De Recherches Appliquees | Spectroscopic ellipsometry apparatus including an optical fiber |
US4904085A (en) * | 1988-05-04 | 1990-02-27 | Simmonds Precision Products, Inc. | Polarimetric fiber optic sensor testing apparatus |
US4906844A (en) * | 1988-08-12 | 1990-03-06 | Rockwell International Corporation | Phase sensitive optical monitor for thin film deposition |
US4944579A (en) * | 1989-05-31 | 1990-07-31 | Grumman Aerospace Corporation | Detection system for circularly polarized radiation |
EP0456897A1 (de) * | 1990-05-15 | 1991-11-21 | Siemens Aktiengesellschaft | Messanordnung für die Röntgenfluoreszenzanalyse |
US5131752A (en) * | 1990-06-28 | 1992-07-21 | Tamarack Scientific Co., Inc. | Method for film thickness endpoint control |
US5357342A (en) * | 1992-12-30 | 1994-10-18 | The United States Of America As Represented By The United States Department Of Energy | Process and apparatus for measuring degree of polarization and angle of major axis of polarized beam of light |
JPH06229909A (ja) * | 1993-01-30 | 1994-08-19 | New Oji Paper Co Ltd | 偏光二色性測定装置 |
-
1993
- 1993-06-28 DE DE69320623T patent/DE69320623T2/de not_active Expired - Fee Related
- 1993-06-28 EP EP93110277A patent/EP0632256B1/de not_active Expired - Lifetime
-
1994
- 1994-06-28 US US08/268,149 patent/US5502567A/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10236999B3 (de) * | 2002-08-13 | 2004-02-05 | Kiepenheuer-Institut für Sonnenphysik Stiftung des öffentlichen Rechts des Landes Baden-Württemberg | Vorrichtung zur Untersuchung von polarisiertem Licht |
DE102013200394A1 (de) * | 2013-01-14 | 2014-07-17 | Carl Zeiss Smt Gmbh | Polarisationsmessvorrichtung, Lithographieanlage, Messanordnung, und Verfahren zur Polarisationsmessung |
Also Published As
Publication number | Publication date |
---|---|
EP0632256A1 (de) | 1995-01-04 |
EP0632256B1 (de) | 1998-08-26 |
DE69320623D1 (de) | 1998-10-01 |
US5502567A (en) | 1996-03-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NANOPHOTONICS AG, 55129 MAINZ, DE |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: INTERNATIONAL BUSINESS MACHINES CORP., ARMONK, N.Y Owner name: NANOPHOTONICS AG, 55129 MAINZ, DE |
|
8339 | Ceased/non-payment of the annual fee |