DE69316136T2 - Halbleitermessaufnehmer mit Schaltung zur Feststellung von Fehlern - Google Patents

Halbleitermessaufnehmer mit Schaltung zur Feststellung von Fehlern

Info

Publication number
DE69316136T2
DE69316136T2 DE69316136T DE69316136T DE69316136T2 DE 69316136 T2 DE69316136 T2 DE 69316136T2 DE 69316136 T DE69316136 T DE 69316136T DE 69316136 T DE69316136 T DE 69316136T DE 69316136 T2 DE69316136 T2 DE 69316136T2
Authority
DE
Germany
Prior art keywords
circuit
semiconductor sensor
detecting faults
faults
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69316136T
Other languages
English (en)
Other versions
DE69316136D1 (de
Inventor
Yuji Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69316136D1 publication Critical patent/DE69316136D1/de
Publication of DE69316136T2 publication Critical patent/DE69316136T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L27/00—Testing or calibrating of apparatus for measuring fluid pressure
    • G01L27/007—Malfunction diagnosis, i.e. diagnosing a sensor defect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biomedical Technology (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE69316136T 1992-10-07 1993-10-06 Halbleitermessaufnehmer mit Schaltung zur Feststellung von Fehlern Expired - Fee Related DE69316136T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26829492 1992-10-07

Publications (2)

Publication Number Publication Date
DE69316136D1 DE69316136D1 (de) 1998-02-12
DE69316136T2 true DE69316136T2 (de) 1998-05-14

Family

ID=17456534

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69316136T Expired - Fee Related DE69316136T2 (de) 1992-10-07 1993-10-06 Halbleitermessaufnehmer mit Schaltung zur Feststellung von Fehlern

Country Status (3)

Country Link
US (1) US5440234A (de)
EP (1) EP0592205B1 (de)
DE (1) DE69316136T2 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3482210B2 (ja) * 1994-05-30 2003-12-22 長野計器株式会社 残圧センサ及び残圧センサ監視装置
FR2732133B1 (fr) * 1995-03-21 1997-04-25 Sgs Thomson Microelectronics Detecteur de coherence d'informations contenues dans un circuit integre
US5942900A (en) * 1996-12-17 1999-08-24 Lexmark International, Inc. Method of fault detection in ink jet printhead heater chips
DE19806753A1 (de) * 1998-02-18 1999-09-02 Telefunken Microelectron Sensormodul
IT1305490B1 (it) * 1998-06-26 2001-05-09 Braun Carex Spa B Dispositivo perfezionato per la misura di precisione di grandezze emetodo di verifica di buon funzionamento del dispositivo
US5959537A (en) * 1998-07-09 1999-09-28 Mcgraw-Edison Company Variable trip fault indicator
US6118278A (en) * 1998-08-18 2000-09-12 Hewlett-Packard Company Short circuit detection in particular for a measuring bridge
US6422088B1 (en) 1999-09-24 2002-07-23 Denso Corporation Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus
US6177875B1 (en) * 1999-09-28 2001-01-23 Rockwell Technologies, Llc Simple voltage window sensing circuit
US6433554B1 (en) * 1999-12-20 2002-08-13 Texas Instruments Incorporated Method and apparatus for in-range fault detection of condition responsive sensor
JP2003214967A (ja) * 2002-01-22 2003-07-30 Hitachi Unisia Automotive Ltd ブリッジ回路型検出素子
US6765391B2 (en) 2002-10-22 2004-07-20 Texas Instruments Incorporated Low cost asic architecture for safety critical applications monitoring an applied stimulus
JP2005049097A (ja) * 2003-07-29 2005-02-24 Alps Electric Co Ltd 故障検出回路
DE102004056133B4 (de) * 2004-02-20 2007-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke
JP4749132B2 (ja) * 2005-11-21 2011-08-17 富士通セミコンダクター株式会社 センサ検出装置及びセンサ
US7609158B2 (en) * 2006-10-26 2009-10-27 Cooper Technologies Company Electrical power system control communications network
US7715002B2 (en) * 2007-01-23 2010-05-11 Bionorica Ag Method for classifying scientific materials such as silicate materials, polymer materials and/or nanomaterials
US8594956B2 (en) * 2007-11-02 2013-11-26 Cooper Technologies Company Power line energy harvesting power supply
US7930141B2 (en) 2007-11-02 2011-04-19 Cooper Technologies Company Communicating faulted circuit indicator apparatus and method of use thereof
US9383394B2 (en) * 2007-11-02 2016-07-05 Cooper Technologies Company Overhead communicating device
US8067946B2 (en) * 2007-11-02 2011-11-29 Cooper Technologies Company Method for repairing a transmission line in an electrical power distribution system
US20090231764A1 (en) * 2008-03-14 2009-09-17 Cooper Technologies Company Capacitor Bank Monitor and Method of use Thereof
JP5517777B2 (ja) * 2010-06-25 2014-06-11 日立オートモティブシステムズ株式会社 ブリッジ回路の断線検出回路および断線検出手段を有するシステム
EP2603804A1 (de) 2010-08-10 2013-06-19 Cooper Technologies Company Vorrichtung zur montage einer overhead-überwachungsvorrichtung
CN204154738U (zh) * 2012-04-20 2015-02-11 松下知识产权经营株式会社 惯性力传感器
JP6049488B2 (ja) * 2013-02-14 2016-12-21 エスアイアイ・セミコンダクタ株式会社 センサ回路
US9379556B2 (en) 2013-03-14 2016-06-28 Cooper Technologies Company Systems and methods for energy harvesting and current and voltage measurements
US9322732B2 (en) * 2014-01-17 2016-04-26 Hamilton Sundstrand Corporation Strain gauge pressure sensor circuit with sensor disconnect detection
CN104880143B (zh) * 2015-05-28 2017-12-26 西北工业大学 一种桥式电阻应变传感器多模态故障检测装置
JP2021018075A (ja) * 2019-07-17 2021-02-15 株式会社デンソー センサ装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3818330A (en) * 1972-08-17 1974-06-18 Hitachi Ltd Device having a bridge circuit for detecting faults in an electric network
US4250829A (en) * 1978-05-30 1981-02-17 Brunswick Corporation Vapor detector for marine propulsion apparatus
JPS63132171A (ja) * 1986-11-21 1988-06-04 Nippon Denso Co Ltd 半導体式加速度検出装置
US4956631A (en) * 1989-03-20 1990-09-11 Mitsubishi Denki Kabushiki Kaisha Fault detector for vehicle safety system
JPH0742878Y2 (ja) * 1989-04-14 1995-10-04 日本精工株式会社 乗員保護装置の故障検出装置
JPH03253440A (ja) * 1990-03-01 1991-11-12 Zexel Corp 車両安全装置のための制御システム
JPH0818529B2 (ja) * 1990-11-20 1996-02-28 三菱電機株式会社 乗員保護装置の故障検出装置

Also Published As

Publication number Publication date
EP0592205A1 (de) 1994-04-13
EP0592205B1 (de) 1998-01-07
US5440234A (en) 1995-08-08
DE69316136D1 (de) 1998-02-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee