DE69304878D1 - Halbleiter-Messaufnehmer zur Messung einer physikalischen Grösse - Google Patents

Halbleiter-Messaufnehmer zur Messung einer physikalischen Grösse

Info

Publication number
DE69304878D1
DE69304878D1 DE69304878T DE69304878T DE69304878D1 DE 69304878 D1 DE69304878 D1 DE 69304878D1 DE 69304878 T DE69304878 T DE 69304878T DE 69304878 T DE69304878 T DE 69304878T DE 69304878 D1 DE69304878 D1 DE 69304878D1
Authority
DE
Germany
Prior art keywords
measuring
physical quantity
semiconductor sensor
semiconductor
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69304878T
Other languages
English (en)
Other versions
DE69304878T2 (de
Inventor
Keizo Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69304878D1 publication Critical patent/DE69304878D1/de
Publication of DE69304878T2 publication Critical patent/DE69304878T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/084—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pressure Sensors (AREA)
DE69304878T 1992-12-25 1993-12-22 Halbleitersensor zum Erfassen einer physikalischen Grösse Expired - Lifetime DE69304878T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4345743A JP2654602B2 (ja) 1992-12-25 1992-12-25 半導体力学量センサ

Publications (2)

Publication Number Publication Date
DE69304878D1 true DE69304878D1 (de) 1996-10-24
DE69304878T2 DE69304878T2 (de) 1997-02-20

Family

ID=18378673

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69304878T Expired - Lifetime DE69304878T2 (de) 1992-12-25 1993-12-22 Halbleitersensor zum Erfassen einer physikalischen Grösse

Country Status (5)

Country Link
US (1) US5431050A (de)
EP (1) EP0604212B1 (de)
JP (1) JP2654602B2 (de)
KR (1) KR0135591B1 (de)
DE (1) DE69304878T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69514343T2 (de) * 1994-11-23 2000-08-10 Koninkl Philips Electronics Nv Halbleitereinrichtung mit einer mikrokomponente, die eine starre und eine bewegliche elektrode aufweist
DE19547642A1 (de) * 1994-12-20 1996-06-27 Zexel Corp Beschleunigungssensor und Verfahren zu dessen Herstellung
US6373265B1 (en) * 1999-02-02 2002-04-16 Nitta Corporation Electrostatic capacitive touch sensor
EP1172657B1 (de) * 2000-07-10 2006-08-23 Infineon Technologies SensoNor AS Beschleunigungssensor
US6831765B2 (en) 2001-02-22 2004-12-14 Canon Kabushiki Kaisha Tiltable-body apparatus, and method of fabricating the same
US6761070B2 (en) * 2002-01-31 2004-07-13 Delphi Technologies, Inc. Microfabricated linear accelerometer
US20050235751A1 (en) * 2004-04-27 2005-10-27 Zarabadi Seyed R Dual-axis accelerometer
US7194376B2 (en) * 2004-04-27 2007-03-20 Delphi Technologies, Inc. Circuit and method of processing multiple-axis sensor output signals
US7250322B2 (en) * 2005-03-16 2007-07-31 Delphi Technologies, Inc. Method of making microsensor
US20060207327A1 (en) 2005-03-16 2006-09-21 Zarabadi Seyed R Linear accelerometer
US8499629B2 (en) * 2008-10-10 2013-08-06 Honeywell International Inc. Mounting system for torsional suspension of a MEMS device
DE102017204729B4 (de) * 2017-03-21 2019-01-10 Zf Friedrichshafen Ag Überlasterkennung bei einem Fahrwerksbauteil

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4598585A (en) * 1984-03-19 1986-07-08 The Charles Stark Draper Laboratory, Inc. Planar inertial sensor
US4699006A (en) * 1984-03-19 1987-10-13 The Charles Stark Draper Laboratory, Inc. Vibratory digital integrating accelerometer
GB8728442D0 (en) * 1987-12-04 1988-01-13 Russell M K Triaxial accelerometers
US5195371A (en) * 1988-01-13 1993-03-23 The Charles Stark Draper Laboratory, Inc. Semiconductor chip transducer
US5016072A (en) * 1988-01-13 1991-05-14 The Charles Stark Draper Laboratory, Inc. Semiconductor chip gyroscopic transducer
US5081867A (en) * 1988-09-30 1992-01-21 Nec Corporation Semiconductor sensor
US5092174A (en) * 1989-10-19 1992-03-03 Texas Instruments Incorporated Capacitance accelerometer
JP3010725B2 (ja) * 1990-11-01 2000-02-21 日産自動車株式会社 半導体加速度センサ
JP2773460B2 (ja) * 1991-03-05 1998-07-09 日本電気株式会社 半導体加速度センサ

Also Published As

Publication number Publication date
JP2654602B2 (ja) 1997-09-17
JPH06194378A (ja) 1994-07-15
DE69304878T2 (de) 1997-02-20
EP0604212A1 (de) 1994-06-29
KR940016778A (ko) 1994-07-25
EP0604212B1 (de) 1996-09-18
US5431050A (en) 1995-07-11
KR0135591B1 (ko) 1998-05-15

Similar Documents

Publication Publication Date Title
DE69205813D1 (de) Einrichtung zur Messung einer Verschiebung.
DE69000943D1 (de) Einrichtung zur messung einer relativen verlagerung.
DE59006145D1 (de) Interferometrischer Sensor zur Messung von Abstandsänderungen einer kleinen Fläche.
DE69525005D1 (de) Vorrichtung zur Messung einer Abkling-Charakteristik
DE69329068T2 (de) Sensorwiderstandmessschaltung
DE58903753D1 (de) Einrichtung zur messung einer stroemenden luftmenge.
DE842486T1 (de) Messung der robustheit einer klassifikation
DE69223006T2 (de) Gerät zur Messung der Tonerkonzentration
DE69121909D1 (de) Sensor zur Abtastung der Position
DE69412564D1 (de) Vorrichtung zur Messung einer Fahrzeugbewegung
DE69304001T2 (de) Messapparat zur Messung linearer Grössen
DE69304878D1 (de) Halbleiter-Messaufnehmer zur Messung einer physikalischen Grösse
DE69233357D1 (de) Vorrichtung zur Messung von Radkräften
DE69226419T2 (de) Gerät zur Messung der Oberflächenbeschaffung
DE59206419D1 (de) Einrichtung zur Messung einer Verformung eines Bauteils
DE69323860D1 (de) Vorrichtung zur Messung der Form einer Oberfläche
DE69017607T2 (de) Multiplex-Messvorrichtung mit einer Vielzahl von Sensoren.
DE58901369D1 (de) Induktive sensoranordnung und messanordnung zur ermittlung der relativlage einer sensoranordnung.
DE9303102U1 (de) Vorrichtung zur messung einer dreidimensionalen oberflaechenstruktur
DE69105119D1 (de) Einrichtung zur messung der absoluten position.
DE69204214T2 (de) Vorrichtung zur Messung einer Drehgeschwindigkeit.
DE69228500D1 (de) Vorrichtung zur Messung einer Nullvoltphase
DE69222053D1 (de) Opto-elektronische messskala
DE69210035T3 (de) System zur messung der verschiebung einer achse
DE69226256T2 (de) Verfahren zur messung der verschiebungsquantität

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: DENSO CORP., KARIYA, AICHI, JP