DE69525005D1 - Vorrichtung zur Messung einer Abkling-Charakteristik - Google Patents

Vorrichtung zur Messung einer Abkling-Charakteristik

Info

Publication number
DE69525005D1
DE69525005D1 DE69525005T DE69525005T DE69525005D1 DE 69525005 D1 DE69525005 D1 DE 69525005D1 DE 69525005 T DE69525005 T DE 69525005T DE 69525005 T DE69525005 T DE 69525005T DE 69525005 D1 DE69525005 D1 DE 69525005D1
Authority
DE
Germany
Prior art keywords
measuring
decay characteristic
decay
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69525005T
Other languages
English (en)
Other versions
DE69525005T2 (de
Inventor
Akira Takeshima
Musubu Koishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE69525005D1 publication Critical patent/DE69525005D1/de
Publication of DE69525005T2 publication Critical patent/DE69525005T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69525005T 1994-09-19 1995-09-19 Vorrichtung zur Messung einer Abkling-Charakteristik Expired - Fee Related DE69525005T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22362894A JP3364333B2 (ja) 1994-09-19 1994-09-19 減衰特性測定装置

Publications (2)

Publication Number Publication Date
DE69525005D1 true DE69525005D1 (de) 2002-02-21
DE69525005T2 DE69525005T2 (de) 2002-06-27

Family

ID=16801192

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69525005T Expired - Fee Related DE69525005T2 (de) 1994-09-19 1995-09-19 Vorrichtung zur Messung einer Abkling-Charakteristik

Country Status (4)

Country Link
US (1) US5548124A (de)
EP (1) EP0702226B1 (de)
JP (1) JP3364333B2 (de)
DE (1) DE69525005T2 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5757013A (en) * 1995-12-06 1998-05-26 American Research Corporation Of Virginia Fluorescence decay measurement by calculation of inner product
US5825018A (en) * 1996-01-11 1998-10-20 Northeastern University Optical lock-in detection technique for coherent detection applications
US5994707A (en) * 1997-03-18 1999-11-30 Physical Optics Corporation Modular fiber optic fluorometer and method of use thereof
EP0988517A4 (de) * 1997-06-10 2003-03-19 Calspan Corp Nachweis chemisch aktiver materialien mit hilfe eines saugfähigen polymers und eines fluoreszenznachweismittels
US5955737A (en) * 1997-10-27 1999-09-21 Systems & Processes Engineering Corporation Chemometric analysis for extraction of individual fluorescence spectrum and lifetimes from a target mixture
US6055451A (en) 1997-12-12 2000-04-25 Spectrx, Inc. Apparatus and method for determining tissue characteristics
US6528801B1 (en) * 1998-11-04 2003-03-04 The Research Foundation Of State University Of New York Method and apparatus for detecting radiation
US6300638B1 (en) 1998-11-12 2001-10-09 Calspan Srl Corporation Modular probe for total internal reflection fluorescence spectroscopy
US6157037A (en) * 1998-12-04 2000-12-05 Photosense, Llc Sensing device and method for measuring emission time delay during irradiation of targeted samples
WO2001092859A1 (en) * 2000-06-02 2001-12-06 Medicometrics Aps Method and system for classifying a biological sample
JP4459390B2 (ja) * 2000-06-08 2010-04-28 浜松ホトニクス株式会社 蛍光測定方法、蛍光測定装置及びそれを用いた試料評価装置
US6534774B2 (en) * 2000-09-08 2003-03-18 Mitsubishi Materials Silicon Corporation Method and apparatus for evaluating the quality of a semiconductor substrate
ES2392395T3 (es) * 2001-03-01 2012-12-10 Sicpa Holding Sa Detector mejorado de características de luminiscencia
ATE501432T1 (de) 2003-09-29 2011-03-15 Photosense L L C Frequenzdomänenlumineszenzinstrumentierung
US7391512B2 (en) * 2004-12-22 2008-06-24 Avago Technologies General Ip Pte. Ltd. Integrated optoelectronic system for measuring fluorescence or luminescence emission decay
JP5119523B2 (ja) * 2005-01-12 2013-01-16 独立行政法人情報通信研究機構 近傍電磁界測定装置
WO2006088047A1 (ja) * 2005-02-15 2006-08-24 Mitsui Engineering & Shipbuilding Co., Ltd. 蛍光検出装置及び蛍光検出方法
JP5093795B2 (ja) * 2007-01-11 2012-12-12 株式会社フジクラ 蛍光寿命測定装置及び成膜装置、蛍光寿命測定方法
US7733470B2 (en) * 2007-06-26 2010-06-08 Photon Technology International, Inc. Method and apparatus for real-time measurement and calculation of a fluorescent lifetime
KR100885927B1 (ko) * 2007-10-16 2009-02-26 광주과학기술원 형광수명 측정 방법 및 장치
DE102008018475A1 (de) * 2008-04-11 2009-10-15 Carl Zeiss Ag Vorrichtung und Verfahren zur Lumineszenzmessung
DE102008033214A1 (de) 2008-07-15 2010-01-21 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren zur optischen Bestimmung einer Messgröße eines Messmediums
JP4564567B2 (ja) * 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP4564566B2 (ja) * 2009-02-13 2010-10-20 三井造船株式会社 蛍光検出装置及び蛍光検出方法
JP5654509B2 (ja) * 2012-03-12 2015-01-14 三井造船株式会社 蛍光検出装置及び蛍光検出方法
US20140160476A1 (en) * 2012-12-07 2014-06-12 Massachusetts Institute Of Technology Method and Apparatus for Performing Spectral Classification
US9157793B2 (en) * 2012-12-28 2015-10-13 Halliburton Energy Services, Inc. Pulse width modulation of continuum sources for determination of chemical composition
CN111208107B (zh) * 2020-02-23 2023-06-20 江苏省农业科学院 一种溶解氧测量装置及传感膜最适激发条件的判定方法
US11754979B2 (en) 2021-06-05 2023-09-12 ColdQuanta, Inc. Atomic clock with atom-trap enhanced oscillator regulation
DE102022122092A1 (de) * 2022-08-31 2024-02-29 Pyroscience Gmbh Referenz-Messung

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4716363A (en) * 1987-05-08 1987-12-29 Hewlett-Packard Company Exponential decay time constant measurement using frequency of offset phase-locked loop: system and method
US5196709A (en) * 1991-05-03 1993-03-23 University Of Maryland Systems Fluorometry method and apparatus using a semiconductor laser diode as a light source
US5323008A (en) * 1992-03-23 1994-06-21 Diatron Corporation Fluorometer detection system
US5323010A (en) * 1992-12-01 1994-06-21 I.S.S. (Usa) Inc. Time resolved optical array detectors and CCD cameras for frequency domain fluorometry and/or phosphorimetry
JP3307723B2 (ja) * 1993-07-27 2002-07-24 浜松ホトニクス株式会社 位相差検出方法、位相差検出回路、および位相差検出装置
JP3307730B2 (ja) * 1993-08-30 2002-07-24 浜松ホトニクス株式会社 光学測定装置
JP2758556B2 (ja) * 1993-10-20 1998-05-28 浜松ホトニクス株式会社 光信号検出装置
US5593854A (en) * 1994-02-16 1997-01-14 Becton Dickinson And Company Data analysis method for use with fluorescent bacterial sensors

Also Published As

Publication number Publication date
EP0702226B1 (de) 2002-01-16
US5548124A (en) 1996-08-20
JP3364333B2 (ja) 2003-01-08
EP0702226A2 (de) 1996-03-20
DE69525005T2 (de) 2002-06-27
JPH0886753A (ja) 1996-04-02
EP0702226A3 (de) 1996-06-26

Similar Documents

Publication Publication Date Title
DE69525005D1 (de) Vorrichtung zur Messung einer Abkling-Charakteristik
DE59302704D1 (de) Vorrichtung zur messung eines massestromes
DE69723894D1 (de) Vorrichtung zur Messung von Strahlungen mit einem Katheter
DE69319504T2 (de) Vorrichtung zur Inspektion einer Komponente
DE69531925D1 (de) Vorrichtung zur Messung einer Eigenschaft eines Fluides
DE69205813T2 (de) Einrichtung zur Messung einer Verschiebung.
DE69332365D1 (de) Vorrichtung zur Messung von Fluoreszenz
DE69217443D1 (de) Gerät zur Gebrauchsanalyse einer Frankiermaschine
DE59409256D1 (de) Vorrichtung zur Distanzmessung
DE69511276T2 (de) Vorrichtung zur messung von schwerefeldern
DE69223207T2 (de) Verfahren und Vorrichtung zur Messung einer Verlagerung
DE58903753D1 (de) Einrichtung zur messung einer stroemenden luftmenge.
DE69502707D1 (de) Vorrichtung zur messung eines hautflecks
DE69412564D1 (de) Vorrichtung zur Messung einer Fahrzeugbewegung
DE59706968D1 (de) Einrichtung zur positionierung einer messsonde
DE69732597D1 (de) Verfahren zur Messung einer spektralen Antwort
DE69215852D1 (de) Vorrichtung zur Messung der Kraft an der Schnur zur Verwendung in einer Ballenpresse
DE59701422D1 (de) Messvorrichtung zur ermittlung einer borkonzentration
DE69121974D1 (de) Vorrichtung zur Messung des Neutronenflusses
DE9303102U1 (de) Vorrichtung zur messung einer dreidimensionalen oberflaechenstruktur
DE68927600D1 (de) Verfahren und Vorrichtung zur Messung einer Senkung
DE69211042T2 (de) Vorrichtung zur Messung einer optischen Wellenform
DE69031895T2 (de) Vorrichtung zur Kontrolle einer Oberfläche
DE59409519D1 (de) Einrichtung zur Messung kleiner Zeitintervalle
DE69228500T2 (de) Vorrichtung zur Messung einer Nullvoltphase

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee