DE69233241D1 - Prüfkopfmanipulator - Google Patents

Prüfkopfmanipulator

Info

Publication number
DE69233241D1
DE69233241D1 DE69233241T DE69233241T DE69233241D1 DE 69233241 D1 DE69233241 D1 DE 69233241D1 DE 69233241 T DE69233241 T DE 69233241T DE 69233241 T DE69233241 T DE 69233241T DE 69233241 D1 DE69233241 D1 DE 69233241D1
Authority
DE
Germany
Prior art keywords
test head
head manipulator
manipulator
test
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69233241T
Other languages
English (en)
Other versions
DE69233241T2 (de
Inventor
Alyn R Holt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
InTest Corp
Original Assignee
InTest IP Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by InTest IP Corp filed Critical InTest IP Corp
Publication of DE69233241D1 publication Critical patent/DE69233241D1/de
Application granted granted Critical
Publication of DE69233241T2 publication Critical patent/DE69233241T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25—Movable or adjustable work or tool supports
    • B23Q1/44—Movable or adjustable work or tool supports using particular mechanisms
    • B23Q1/48—Movable or adjustable work or tool supports using particular mechanisms with sliding pairs and rotating pairs
    • B23Q1/4828—Movable or adjustable work or tool supports using particular mechanisms with sliding pairs and rotating pairs a single rotating pair followed parallelly by a single sliding pair
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/10—Programme-controlled manipulators characterised by positioning means for manipulator elements
    • B25J9/1005—Programme-controlled manipulators characterised by positioning means for manipulator elements comprising adjusting means
    • B25J9/101—Programme-controlled manipulators characterised by positioning means for manipulator elements comprising adjusting means using limit-switches, -stops

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Manipulator (AREA)
DE69233241T 1991-07-22 1992-07-15 Prüfkopfmanipulator Expired - Fee Related DE69233241T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/734,192 US5241870A (en) 1991-07-22 1991-07-22 Test head manipulator
US734192 1991-07-22

Publications (2)

Publication Number Publication Date
DE69233241D1 true DE69233241D1 (de) 2003-12-04
DE69233241T2 DE69233241T2 (de) 2004-05-27

Family

ID=24950681

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69233241T Expired - Fee Related DE69233241T2 (de) 1991-07-22 1992-07-15 Prüfkopfmanipulator
DE69229985T Expired - Fee Related DE69229985T2 (de) 1991-07-22 1992-07-15 Prüfkopfmanipulator

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69229985T Expired - Fee Related DE69229985T2 (de) 1991-07-22 1992-07-15 Prüfkopfmanipulator

Country Status (7)

Country Link
US (2) US5241870A (de)
EP (2) EP0526996B1 (de)
JP (1) JP3391473B2 (de)
KR (1) KR100240476B1 (de)
DE (2) DE69233241T2 (de)
MY (2) MY125577A (de)
SG (2) SG70050A1 (de)

Families Citing this family (57)

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US5440943A (en) * 1993-09-15 1995-08-15 Intest Corporation Electronic test head manipulator
US5600258A (en) * 1993-09-15 1997-02-04 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
WO1996006714A1 (de) * 1994-08-30 1996-03-07 Hydrostress Ag Ständer für eine steinbearbeitungsmaschine, insbesondere eine kernbohrmaschine
US5982182A (en) * 1994-09-01 1999-11-09 Chiu; Michael A. Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
KR960019641A (ko) * 1994-11-24 1996-06-17 오우라 히로시 테스트·헤드 접속 장치를 장비한 반도체 시험 장치
WO1996026446A1 (en) * 1995-02-23 1996-08-29 Aesop, Inc. Manipulator for automatic test equipment test head
US5912555A (en) * 1995-04-10 1999-06-15 Tokyo Electron Limited Probe apparatus
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
US5656942A (en) * 1995-07-21 1997-08-12 Electroglas, Inc. Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane
US5756908A (en) * 1996-07-15 1998-05-26 Framatome Technologies, Inc. Probe positioner
DE19718398B4 (de) * 1997-04-30 2006-02-02 Heigl, Helmuth, Dr.-Ing. Handhabungsvorrichtung
US6023173A (en) * 1997-04-30 2000-02-08 Credence Systems Corporation Manipulator with expanded range of motion
US5821440A (en) * 1997-04-30 1998-10-13 Credence Systems Corporation Cable tray assembly for testing device
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US6000290A (en) * 1997-11-12 1999-12-14 Rosemount Analytical Inc. Quick-connect industrial process sensor
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
US6271658B1 (en) 1998-10-19 2001-08-07 St Assembly Test Services Pte, Ltd. Universal Docking System
US6888343B1 (en) * 1999-01-13 2005-05-03 Intest Ip Corporation Test head manipulator
US6310486B1 (en) 1999-10-01 2001-10-30 Teradyne, Inc. Integrated test cell
MY138984A (en) * 2000-03-01 2009-08-28 Intest Corp Vertical counter balanced test head manipulator
US6396257B1 (en) * 2000-04-26 2002-05-28 Credence Systems Corporation Test head manipulator for semiconductor tester with manual assist for vertical test head movement
US6408500B1 (en) * 2000-09-15 2002-06-25 James Orsillo Method of retrofitting a probe station
KR20030032030A (ko) * 2000-09-20 2003-04-23 인테스트 아이피 코포레이션 전자테스트 헤드 포지셔너
AU2002355083A1 (en) * 2001-07-16 2003-03-03 Intest Ip Corp. Test head docking system and method
US6766996B1 (en) 2001-07-16 2004-07-27 Reid-Ashman Manufacturing, Inc. Manipulator
KR100583949B1 (ko) * 2002-01-07 2006-05-26 삼성전자주식회사 웨이퍼 프로빙 장치 및 테스트 헤드 도킹 제어방법
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
KR20040106344A (ko) * 2002-04-15 2004-12-17 인테스트 아이피 코포레이션 테스트 헤드 포지셔너 시스템
US6717432B2 (en) * 2002-04-16 2004-04-06 Teradyne, Inc. Single axis manipulator with controlled compliance
US6867578B1 (en) * 2002-09-03 2005-03-15 Credence Systems Corporation Semiconductor integrated circuit tester with pivoting interface unit
ITTO20020783A1 (it) * 2002-09-06 2004-03-07 Spea Spa Dispositivo di posizionamento di una testa elettronica
DE20214629U1 (de) * 2002-09-20 2002-11-21 Esmo Ag Verschiebbare Befestigungsplatte
US20040197180A1 (en) * 2003-02-04 2004-10-07 Sausen Earl William Fall protected test-head manipulator
EP1947466B1 (de) 2003-08-06 2012-07-04 inTEST Corporation Testkopfpositionierungssystem
JP2005091041A (ja) 2003-09-12 2005-04-07 Advantest Corp 半導体試験装置
DE102004008487B4 (de) * 2004-02-20 2007-01-04 Heigl, Helmuth, Dr. Handhabungsvorrichtung zum Positionieren eines Testkopfs
US7042239B1 (en) 2004-06-25 2006-05-09 Credence Systems Corporation Arrangement for manual disengagement of a device interface board from a personal tester
US7301326B1 (en) * 2004-07-13 2007-11-27 Intest Corporation Modular interface
US7312604B2 (en) * 2005-07-29 2007-12-25 Nextest Systems Corporation Portable manipulator for stackable semiconductor test system
US8607935B2 (en) 2005-12-20 2013-12-17 Intuitive Surgical Operations, Inc. Guide systems for laminated spring assemblies
TWI439709B (zh) 2006-12-29 2014-06-01 Intest Corp 用於使負載沿平移軸線平移之操縱器與負載定位系統
EP2104862B1 (de) * 2006-12-29 2012-08-08 inTEST Corporation System und verfahren zur testkopfpositionierung
US7758295B2 (en) * 2007-05-09 2010-07-20 Datatronics Technology, Inc. Handling device and method for the same
US7802764B2 (en) * 2007-05-14 2010-09-28 Leinen Chris M Adjustable wheeled IV stand
US8212578B1 (en) 2008-03-17 2012-07-03 Intest Corporation Test head positioner system
DE102008044756A1 (de) * 2008-08-28 2010-03-04 Esmo Ag Manipulator
KR100939224B1 (ko) 2009-04-07 2010-02-01 주식회사 일성에프에이 전자부품의 고온테스트용 지그
CN101870102B (zh) * 2009-04-25 2013-12-11 鸿富锦精密工业（深圳）有限公司 码垛机器人
US9682484B2 (en) * 2009-07-24 2017-06-20 GM Global Technology Operations LLC Counterbalance mechanism for end-effector configuration and method of use
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
EP2732298A1 (de) 2011-07-12 2014-05-21 Intest Corporation Verfahren und vorrichtung zum andocken eines testkopfes an einem peripheriegerät
TWI553763B (zh) * 2014-01-23 2016-10-11 先進科技新加坡有限公司 拾取電子器件進行測試的測試分選機及其方位改變裝置
CN104034922B (zh) * 2014-06-10 2017-02-01 同济大学 一种用于轮毂电机及轮边电机的台架试验夹持装置
US10978262B2 (en) * 2017-10-20 2021-04-13 Otis Elevator Company Reach tool for use in low voltage applications
CN108453788B (zh) * 2018-04-20 2020-07-10 华中科技大学 一种可换向的机械臂重力矩平衡装置
US10933525B2 (en) * 2018-07-04 2021-03-02 Fanuc Corporation Horizontal articulated robot

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US1638086A (en) * 1925-02-07 1927-08-09 Ray L Carter Adjustable support for routing machines
US3040434A (en) * 1958-01-31 1962-06-26 Roman S Yarosz Rotatable work table
US3128887A (en) * 1960-02-25 1964-04-14 Mechanical manipulators for the displacement of
US3262593A (en) * 1963-07-10 1966-07-26 Gen Mills Inc Wall-mounted support structure
US3269681A (en) * 1965-01-27 1966-08-30 Wakeem R Azim Adjustable support apparatus
US3727873A (en) * 1971-07-19 1973-04-17 J Hill Adjustable crane seat
US3884365A (en) * 1974-03-19 1975-05-20 Thomson Ind Inc Workpiece manipulator
US4062455A (en) * 1976-11-22 1977-12-13 Flatau Carl R Remote manipulator
US4132318A (en) * 1976-12-30 1979-01-02 International Business Machines Corporation Asymmetric six-degree-of-freedom force-transducer system for a computer-controlled manipulator system
EP0001686B1 (de) * 1977-10-20 1981-11-04 Imperial Chemical Industries Plc Industrieller Manipulator zum dicht gegeneinander Stapeln von Gegenständen und Stapelnverfahren unter Verwendung des Manipulators
JPS571116Y2 (de) * 1978-01-31 1982-01-08
JPS5548598A (en) * 1978-09-29 1980-04-07 Fujitsu Fanuc Ltd Load reducing device of industrial robot
DE2852821B1 (de) * 1978-12-07 1980-04-30 Walter Reis Maschinenbau, 8753 Obernburg Manipulator
FR2461556A1 (fr) * 1979-07-18 1981-02-06 Bretagne Atel Chantiers Bras de manipulation a distance
DE7921541U1 (de) * 1979-07-27 1979-10-31 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Instrumentenbasis fuer optische geraete
US4345847A (en) * 1979-12-19 1982-08-24 Technicare Corporation Automatic brake sequencing for overhead support arm assemblies
GB2074337B (en) * 1980-04-15 1983-11-16 Univ Technology Adjustable support for an optical or other instrument
US4588346A (en) * 1982-08-25 1986-05-13 Intest Corporation Positioner for maintaining an object in a substantially weightless condition
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US4866998A (en) * 1985-09-20 1989-09-19 Temple University Of The Commonwealth System Of Higher Education Medical examination table with probe holder
US4744552A (en) * 1986-05-20 1988-05-17 Glendo Corporation Craftsman's jewelry support tool
EP0308348B1 (de) * 1987-09-17 1993-02-10 Schlumberger Industries Prüfkopfmanipulator für das automatische Prüfen
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JP2881865B2 (ja) * 1989-11-24 1999-04-12 日本電気株式会社 フライング・プローブ・ヘッド

Also Published As

Publication number Publication date
KR100240476B1 (ko) 2000-01-15
MY125577A (en) 2006-08-30
MY114024A (en) 2002-07-31
EP0526996A3 (en) 1993-07-07
DE69233241T2 (de) 2004-05-27
SG70050A1 (en) 2000-01-25
EP0526996B1 (de) 1999-09-15
EP0916955A3 (de) 1999-09-15
US5450766A (en) 1995-09-19
US5241870A (en) 1993-09-07
JPH06226681A (ja) 1994-08-16
SG45172A1 (en) 1998-01-16
JP3391473B2 (ja) 2003-03-31
DE69229985T2 (de) 2000-04-20
EP0916955A2 (de) 1999-05-19
DE69229985D1 (de) 1999-10-21
EP0916955B1 (de) 2003-10-29
EP0526996A2 (de) 1993-02-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee