DE69205716T2 - Quanten-Faden-Laser. - Google Patents
Quanten-Faden-Laser.Info
- Publication number
- DE69205716T2 DE69205716T2 DE69205716T DE69205716T DE69205716T2 DE 69205716 T2 DE69205716 T2 DE 69205716T2 DE 69205716 T DE69205716 T DE 69205716T DE 69205716 T DE69205716 T DE 69205716T DE 69205716 T2 DE69205716 T2 DE 69205716T2
- Authority
- DE
- Germany
- Prior art keywords
- thread laser
- quantum
- quantum thread
- laser
- thread
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/341—Structures having reduced dimensionality, e.g. quantum wires
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
- H01S5/1228—DFB lasers with a complex coupled grating, e.g. gain or loss coupling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2054—Methods of obtaining the confinement
- H01S5/2059—Methods of obtaining the confinement by means of particular conductivity zones, e.g. obtained by particle bombardment or diffusion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2238—Buried stripe structure with a terraced structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/227—Buried mesa structure ; Striped active layer
- H01S5/2272—Buried mesa structure ; Striped active layer grown by a mask induced selective growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3064323A JP2799372B2 (ja) | 1991-03-28 | 1991-03-28 | 量子細線レーザ及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69205716D1 DE69205716D1 (de) | 1995-12-07 |
DE69205716T2 true DE69205716T2 (de) | 1996-05-02 |
Family
ID=13254918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69205716T Expired - Fee Related DE69205716T2 (de) | 1991-03-28 | 1992-03-27 | Quanten-Faden-Laser. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5280493A (de) |
EP (1) | EP0507516B1 (de) |
JP (1) | JP2799372B2 (de) |
DE (1) | DE69205716T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3257034B2 (ja) * | 1992-06-03 | 2002-02-18 | ソニー株式会社 | 化合物半導体装置とその製造方法 |
JPH06132608A (ja) * | 1992-10-20 | 1994-05-13 | Sony Corp | 半導体レーザ及びその製造方法 |
US5363394A (en) * | 1993-08-06 | 1994-11-08 | At&T Bell Laboratories | Quantum wire laser |
EP0665578B1 (de) * | 1993-11-25 | 2002-02-20 | Nippon Telegraph And Telephone Corporation | Halbleiterstruktur und Herstellungsverfahren |
KR970003750B1 (en) * | 1993-12-14 | 1997-03-21 | Korea Electronics Telecomm | Manufacture for quantum wire semiconductor laser diode |
US6039803A (en) * | 1996-06-28 | 2000-03-21 | Massachusetts Institute Of Technology | Utilization of miscut substrates to improve relaxed graded silicon-germanium and germanium layers on silicon |
JP3882539B2 (ja) * | 2000-07-18 | 2007-02-21 | ソニー株式会社 | 半導体発光素子およびその製造方法、並びに画像表示装置 |
KR100446615B1 (ko) | 2001-10-09 | 2004-09-04 | 삼성전자주식회사 | 반도체 레이저 다이오드 및 그 제조방법 |
DE10324264B4 (de) * | 2003-03-06 | 2007-01-18 | Universität Regensburg | Quantendrahtemitter mit Intersubbandübergängen |
JP4613304B2 (ja) * | 2004-09-07 | 2011-01-19 | 独立行政法人産業技術総合研究所 | 量子ナノ構造半導体レーザ |
JP2006190782A (ja) * | 2005-01-05 | 2006-07-20 | Fujitsu Ltd | 光半導体装置及びその製造方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60113488A (ja) * | 1983-11-24 | 1985-06-19 | Nec Corp | 1次元量子サイズ効果を有する素子の作製方法 |
JPS613487A (ja) * | 1984-06-15 | 1986-01-09 | Fujitsu Ltd | 量子細線レ−ザの作製方法 |
JPH0669110B2 (ja) * | 1985-03-04 | 1994-08-31 | 株式会社日立製作所 | 半導体レ−ザ装置 |
JPS62186584A (ja) * | 1986-02-12 | 1987-08-14 | Matsushita Electric Ind Co Ltd | 半導体素子の製造法 |
JPH0656907B2 (ja) * | 1986-03-31 | 1994-07-27 | 日本電信電話株式会社 | 半導体発光素子の製造法 |
JP2531655B2 (ja) * | 1987-01-16 | 1996-09-04 | 株式会社日立製作所 | 半導体装置 |
JPS6421986A (en) * | 1987-07-17 | 1989-01-25 | Nippon Telegraph & Telephone | Manufacture of quantum fine line laser diode of current-injection type having buried structure |
CA1315865C (en) * | 1988-02-09 | 1993-04-06 | Elyahou Kapon | Semiconductor super lattice heterostructure fabrication methods, structures and devices |
JPH0268482A (ja) * | 1988-08-31 | 1990-03-07 | Iseki & Co Ltd | 穀粒乾燥機の熱風発生装置 |
JP2687495B2 (ja) * | 1988-10-28 | 1997-12-08 | 日本電気株式会社 | 半導体レーザの製造方法 |
JPH03169091A (ja) * | 1989-11-28 | 1991-07-22 | Mitsubishi Electric Corp | 量子細線の製造方法 |
US5070510A (en) * | 1989-12-12 | 1991-12-03 | Sharp Kabushiki Kaisha | Semiconductor laser device |
-
1991
- 1991-03-28 JP JP3064323A patent/JP2799372B2/ja not_active Expired - Fee Related
-
1992
- 1992-03-27 US US07/859,587 patent/US5280493A/en not_active Expired - Lifetime
- 1992-03-27 DE DE69205716T patent/DE69205716T2/de not_active Expired - Fee Related
- 1992-03-27 EP EP92302707A patent/EP0507516B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69205716D1 (de) | 1995-12-07 |
JPH04299881A (ja) | 1992-10-23 |
EP0507516B1 (de) | 1995-11-02 |
EP0507516A1 (de) | 1992-10-07 |
US5280493A (en) | 1994-01-18 |
JP2799372B2 (ja) | 1998-09-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: PATENTANWAELTE MUELLER & HOFFMANN, 81667 MUENCHEN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: SHARP K.K., OSAKA, JP |
|
8339 | Ceased/non-payment of the annual fee |