DE69127836D1 - Spektralanalysator zur gleichzeitigen Anzeige von Breit- und Schmalbandübertragungscharakteristiken - Google Patents

Spektralanalysator zur gleichzeitigen Anzeige von Breit- und Schmalbandübertragungscharakteristiken

Info

Publication number
DE69127836D1
DE69127836D1 DE69127836T DE69127836T DE69127836D1 DE 69127836 D1 DE69127836 D1 DE 69127836D1 DE 69127836 T DE69127836 T DE 69127836T DE 69127836 T DE69127836 T DE 69127836T DE 69127836 D1 DE69127836 D1 DE 69127836D1
Authority
DE
Germany
Prior art keywords
broadband
transmission characteristics
spectrum analyzer
simultaneous display
narrowband transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69127836T
Other languages
English (en)
Other versions
DE69127836T2 (de
Inventor
Aiichi Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Publication of DE69127836D1 publication Critical patent/DE69127836D1/de
Application granted granted Critical
Publication of DE69127836T2 publication Critical patent/DE69127836T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/18—Spectrum analysis; Fourier analysis with provision for recording frequency spectrum

Landscapes

  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE69127836T 1990-01-25 1991-01-23 Spektralanalysator zur gleichzeitigen Anzeige von Breit- und Schmalbandübertragungscharakteristiken Expired - Fee Related DE69127836T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015434A JP2891497B2 (ja) 1990-01-25 1990-01-25 スペクトラムアナライザ

Publications (2)

Publication Number Publication Date
DE69127836D1 true DE69127836D1 (de) 1997-11-13
DE69127836T2 DE69127836T2 (de) 1998-05-20

Family

ID=11888694

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69127836T Expired - Fee Related DE69127836T2 (de) 1990-01-25 1991-01-23 Spektralanalysator zur gleichzeitigen Anzeige von Breit- und Schmalbandübertragungscharakteristiken

Country Status (4)

Country Link
US (1) US5075618A (de)
EP (1) EP0439157B1 (de)
JP (1) JP2891497B2 (de)
DE (1) DE69127836T2 (de)

Families Citing this family (40)

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JP3184832B2 (ja) * 1990-03-30 2001-07-09 アンリツ株式会社 精細な波形観測を簡易に実現する波形表示装置
US5579463A (en) * 1990-03-30 1996-11-26 Anritsu Corporation Waveform display apparatus of frequency sweep type for facilitating display of a high definition waveform
DE4027956A1 (de) * 1990-09-04 1992-03-05 Rohde & Schwarz Verfahren zum messen und darstellen von frequenzabhaengigen messparametern eines messobjektes
US5210483A (en) * 1990-09-29 1993-05-11 Anritsu Corporation Burst signal spectrum measuring system with stepwise sweeping
US5394185A (en) * 1993-01-08 1995-02-28 Tektronix, Inc. In-service CATV HUM measurement technique
US6229316B1 (en) 1995-09-08 2001-05-08 Advantest Corporation Measuring method by spectrum analyzer
CA2162347C (en) 1995-11-07 2001-01-09 Gary Gunthorpe Method and apparatus for high-speed scanning of electromagnetic field levels
US5684508A (en) * 1995-11-21 1997-11-04 Fluke Corporation Method of displaying continuously acquired data as multiple traces on a fixed length display
US5898307A (en) * 1996-04-10 1999-04-27 Snap-On Technologies, Inc. Independent cursor control in dual-trace engine analyzer scope
US5949495A (en) * 1996-04-25 1999-09-07 Tektronix, Inc. Digital cursors for serial digital television waveform monitors
US6018246A (en) * 1997-10-17 2000-01-25 Hewlett-Packard Company Network analyzer measurement method for high dynamic range devices
US6356067B1 (en) * 1998-08-10 2002-03-12 Sony/Tektronix Corporation Wide band signal analyzer with wide band and narrow band signal processors
JP2002057651A (ja) * 2000-08-11 2002-02-22 Advantest Corp 多重信号の物理量表示装置、方法、記録媒体
US20030132944A1 (en) * 2001-10-03 2003-07-17 Sun Microsystems, Inc. User control of generalized semantic zooming
JP4064129B2 (ja) * 2002-03-14 2008-03-19 リーダー電子株式会社 波形表示における波形表示位置調整装置
US7302017B2 (en) * 2002-06-18 2007-11-27 General Dynamics C4 Systems, Inc. System and method for adaptive matched filter signal parameter measurement
JP4103134B2 (ja) * 2003-02-27 2008-06-18 横河電機株式会社 波形表示装置および波形表示方法
US7107165B2 (en) * 2003-11-19 2006-09-12 Agilent Technologies, Inc. Markers used in the calculation and display of band functions
JP4813774B2 (ja) * 2004-05-18 2011-11-09 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 周波数分析装置の表示方法
US7751470B2 (en) * 2005-02-07 2010-07-06 Tektronix, Inc. Time correlation of signal power to distortion characteristics
JP4647570B2 (ja) * 2006-10-04 2011-03-09 セコム株式会社 盗撮検出装置
JP5085105B2 (ja) * 2006-11-24 2012-11-28 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー シグナル・アナライザ
JP5220320B2 (ja) * 2007-01-22 2013-06-26 アンリツ株式会社 信号解析装置及び信号解析方法
JP2009186323A (ja) * 2008-02-06 2009-08-20 Advantest Corp 周波数特性測定装置
ES2341206B1 (es) * 2008-05-26 2011-05-03 Sistemas Integrados De Servicios De Telecontrol, S.L. Equipo y procedimiento de medida de señales de radio y/o television.
US8464171B2 (en) * 2009-06-26 2013-06-11 Eppendorf Ag Device for displaying a function chart
JP4929362B2 (ja) * 2010-02-12 2012-05-09 株式会社東芝 電子機器、画像表示システム、および画像表示方法
JP5632349B2 (ja) * 2011-10-26 2014-11-26 アンリツ株式会社 測定装置
JP5620356B2 (ja) * 2011-10-26 2014-11-05 アンリツ株式会社 測定装置
JP5620355B2 (ja) * 2011-10-26 2014-11-05 アンリツ株式会社 測定装置
JP5632348B2 (ja) * 2011-10-26 2014-11-26 アンリツ株式会社 測定装置
KR101489132B1 (ko) * 2012-05-17 2015-02-02 미쓰비시덴키 가부시키가이샤 서보 파라미터 조정 장치
US9207269B2 (en) * 2012-05-22 2015-12-08 Tektronix, Inc. Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument
EP2743709A1 (de) * 2012-12-11 2014-06-18 Tektronix Inc. Echtzeit-Spektrumanalysator mit Zoomanzeige
US9858240B2 (en) * 2012-12-13 2018-01-02 Tektronix, Inc. Automatic center frequency and span setting in a test and measurement instrument
CN103901274A (zh) * 2012-12-31 2014-07-02 特克特朗尼克公司 具有缩放显示的实时谱分析仪
US10712367B2 (en) * 2016-11-08 2020-07-14 Rohde & Schwarz Gmbh & Co. Kg Method for analyzing a signal as well as measurement and analyzing device
JP7074501B2 (ja) * 2018-02-27 2022-05-24 日置電機株式会社 波形表示装置および波形表示方法
CN110333071B (zh) * 2019-06-28 2021-09-10 华北电力大学 一种利用窄带倒谱变换的机械振动信号处理方法
CN117368571B (zh) * 2023-12-08 2024-03-01 深圳市鼎阳科技股份有限公司 一种实时频谱分析仪及其数据处理方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4264958A (en) * 1978-08-10 1981-04-28 Hewlett-Packard Company Video processor for a spectrum analyzer
US4321680A (en) * 1980-04-22 1982-03-23 Wavetek Rockland Inc. Spectrum analyzer with frequency band selection
JPS5995472A (ja) * 1982-11-25 1984-06-01 Sony Tektronix Corp 波形表示装置
JPH0769364B2 (ja) * 1987-03-06 1995-07-31 アンリツ株式会社 スペクトラムアナライザ
US4839582A (en) * 1987-07-01 1989-06-13 Anritsu Corporation Signal analyzer apparatus with automatic frequency measuring function
JP2577566B2 (ja) * 1987-07-01 1997-02-05 アンリツ株式会社 スペクトラムアナライザ
US4890236A (en) * 1988-04-01 1989-12-26 Hewlett-Packard Company Method and apparatus for aiding manual instrument settings by displaying estimates of future measurement results
US4975636A (en) * 1989-05-01 1990-12-04 Hewlett-Packard Company Method and apparatus for selecting and displaying a high resolution window from a main display

Also Published As

Publication number Publication date
JP2891497B2 (ja) 1999-05-17
EP0439157A2 (de) 1991-07-31
EP0439157A3 (en) 1992-05-13
US5075618A (en) 1991-12-24
EP0439157B1 (de) 1997-10-08
JPH03220464A (ja) 1991-09-27
DE69127836T2 (de) 1998-05-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee