DE69112479D1 - Test und Messinstrument mit digitaler Speicherung. - Google Patents

Test und Messinstrument mit digitaler Speicherung.

Info

Publication number
DE69112479D1
DE69112479D1 DE69112479T DE69112479T DE69112479D1 DE 69112479 D1 DE69112479 D1 DE 69112479D1 DE 69112479 T DE69112479 T DE 69112479T DE 69112479 T DE69112479 T DE 69112479T DE 69112479 D1 DE69112479 D1 DE 69112479D1
Authority
DE
Germany
Prior art keywords
test
measuring instrument
digital storage
digital
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69112479T
Other languages
English (en)
Other versions
DE69112479T2 (de
Inventor
Richard I Lane
Glenn Bateman
Josef L Mader
Ronald J Bremer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE69112479D1 publication Critical patent/DE69112479D1/de
Application granted granted Critical
Publication of DE69112479T2 publication Critical patent/DE69112479T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D7/00Indicating measured values
    • G01D7/02Indicating value of two or more variables simultaneously
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145Details of the optoelectronics or data analysis
DE69112479T 1990-04-25 1991-03-28 Test und Messinstrument mit digitaler Speicherung. Expired - Fee Related DE69112479T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/514,396 US5148230A (en) 1990-04-25 1990-04-25 Measurement apparatus having improved sample density using nested data acquisitions

Publications (2)

Publication Number Publication Date
DE69112479D1 true DE69112479D1 (de) 1995-10-05
DE69112479T2 DE69112479T2 (de) 1996-08-22

Family

ID=24046954

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69112479T Expired - Fee Related DE69112479T2 (de) 1990-04-25 1991-03-28 Test und Messinstrument mit digitaler Speicherung.

Country Status (4)

Country Link
US (1) US5148230A (de)
EP (1) EP0453817B1 (de)
JP (1) JP2704323B2 (de)
DE (1) DE69112479T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3206168B2 (ja) * 1992-12-29 2001-09-04 安藤電気株式会社 光パルス試験器
US5552881A (en) * 1994-03-17 1996-09-03 Teradyne, Inc. Method and apparatus for scanning a fiber optic network
DE60043666D1 (de) 1999-11-26 2010-02-25 Curvaceous Software Ltd Multivariabeles verfahren
US7298463B2 (en) * 2001-04-23 2007-11-20 Circadiant Systems, Inc. Automated system and method for optical measurement and testing
US7133125B2 (en) * 2001-04-23 2006-11-07 Circadiant Systems, Inc. Automated system and method for determining the sensitivity of optical components
GB0111215D0 (en) 2001-05-08 2001-06-27 Curvaceous Software Ltd Multi-variable process
JP5416383B2 (ja) * 2008-10-10 2014-02-12 アンリツ株式会社 光パルス試験器
JP5592872B2 (ja) * 2011-12-28 2014-09-17 アンリツ株式会社 光パルス試験方法及び光パルス試験装置
US9752955B2 (en) * 2014-07-31 2017-09-05 Ii-Vi Incorporated Edge propagating optical time domain reflectometer and method of using the same
US9341543B2 (en) * 2014-10-16 2016-05-17 Texas Instruments Incorporated Method and OTDR apparatus for optical cable defect location with reduced memory requirement
US11428604B2 (en) * 2019-12-06 2022-08-30 Christine Pons Compact optical time domain reflectometer with integrated time delay fiber waveguide

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5734286A (en) * 1980-08-11 1982-02-24 Canon Inc Information outputting device
JPS5830636A (ja) * 1981-08-18 1983-02-23 Fujitsu Ltd 光ファイバ・フォルトロケ−タの測定結果表示方式
US4439762A (en) * 1981-12-28 1984-03-27 Beckman Instruments, Inc. Graphics memory expansion system
JPS58219465A (ja) * 1982-06-15 1983-12-20 Toshiba Corp D/aコンバ−タ用試験装置
JPS60113158A (ja) * 1983-11-25 1985-06-19 Mitsubishi Electric Corp トレンドグラフ表示装置
JPS60194369A (ja) * 1984-03-15 1985-10-02 Sony Tektronix Corp 信号記憶装置
US4694244A (en) * 1986-02-21 1987-09-15 Hewlett Packard Company Apparatus for random repetitive sampling
JPS62247264A (ja) * 1986-04-21 1987-10-28 Hitachi Denshi Ltd 波形記憶装置
US4719416A (en) * 1986-11-10 1988-01-12 Hewlett Packard Company Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope
JPH0762642B2 (ja) * 1987-10-19 1995-07-05 アンリツ株式会社 光パルス試験器
JPH0721509B2 (ja) * 1988-08-09 1995-03-08 横河電機株式会社 デジタル波形表示装置

Also Published As

Publication number Publication date
EP0453817B1 (de) 1995-08-30
JP2704323B2 (ja) 1998-01-26
EP0453817A2 (de) 1991-10-30
EP0453817A3 (en) 1992-09-23
US5148230A (en) 1992-09-15
JPH05346369A (ja) 1993-12-27
DE69112479T2 (de) 1996-08-22

Similar Documents

Publication Publication Date Title
DE58900461D1 (de) Mehrkoordinatenmess- und pruefeinrichtung.
DE69103930D1 (de) Mess-Fühlerprobe.
DE3861463D1 (de) Messfuehler.
DE68915661D1 (de) Gerät mit kleinen Abmessungen zur Messung und Aufzeichnung der Beschleunigung.
DE69125136D1 (de) Messonde
DE69127036T2 (de) Halbleiter mit verbessertem Prüfmodus
DE69029933D1 (de) Abtast- und Halte-Schaltungsanordnung
DE69119057T2 (de) Sonden zur messung der kapazitanz
DE69228548T2 (de) Digitales füllstands-messsondensystem
DE69032155D1 (de) Digitaler Squid mit erweitertem dynamischem Messbereich
DE69114096T2 (de) Photoakustische Zelle und photoakustische Messeinrichtung.
DE69130755D1 (de) Prüfeinrichtung
DE3852946T2 (de) Immuno-Agglutinationsmessgerät.
DE69102163D1 (de) Tragbares Messinstrument mit Solarzellen.
DE69112479D1 (de) Test und Messinstrument mit digitaler Speicherung.
PT101228A (pt) Termometro clinico com indicacao digital e falada
DE69521805D1 (de) Messinstrument mit digitaler rückstelleinrichtung
DE68900525D1 (de) Waegevorrichtung mit dehnungsmessstreifen.
DE69211532D1 (de) Testsystem mit wechselfeldmessung
DE68908430T2 (de) Messgerät.
ATA30190A (de) Dichte-messeinrichtung
DE69408305T2 (de) Eich- und messinstrument
EP0362410A4 (en) Transition condition detector and measuring instrument utilizing the same
DE69102914D1 (de) Winkelmesseinrichtung und Verwendung derselben.
ATA58990A (de) Zeichen- und messgerät

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee