DE69112479D1 - Test und Messinstrument mit digitaler Speicherung. - Google Patents
Test und Messinstrument mit digitaler Speicherung.Info
- Publication number
- DE69112479D1 DE69112479D1 DE69112479T DE69112479T DE69112479D1 DE 69112479 D1 DE69112479 D1 DE 69112479D1 DE 69112479 T DE69112479 T DE 69112479T DE 69112479 T DE69112479 T DE 69112479T DE 69112479 D1 DE69112479 D1 DE 69112479D1
- Authority
- DE
- Germany
- Prior art keywords
- test
- measuring instrument
- digital storage
- digital
- storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D7/00—Indicating measured values
- G01D7/02—Indicating value of two or more variables simultaneously
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
- G01M11/3145—Details of the optoelectronics or data analysis
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/514,396 US5148230A (en) | 1990-04-25 | 1990-04-25 | Measurement apparatus having improved sample density using nested data acquisitions |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69112479D1 true DE69112479D1 (de) | 1995-10-05 |
DE69112479T2 DE69112479T2 (de) | 1996-08-22 |
Family
ID=24046954
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69112479T Expired - Fee Related DE69112479T2 (de) | 1990-04-25 | 1991-03-28 | Test und Messinstrument mit digitaler Speicherung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5148230A (de) |
EP (1) | EP0453817B1 (de) |
JP (1) | JP2704323B2 (de) |
DE (1) | DE69112479T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3206168B2 (ja) * | 1992-12-29 | 2001-09-04 | 安藤電気株式会社 | 光パルス試験器 |
US5552881A (en) * | 1994-03-17 | 1996-09-03 | Teradyne, Inc. | Method and apparatus for scanning a fiber optic network |
DE60043666D1 (de) | 1999-11-26 | 2010-02-25 | Curvaceous Software Ltd | Multivariabeles verfahren |
US7298463B2 (en) * | 2001-04-23 | 2007-11-20 | Circadiant Systems, Inc. | Automated system and method for optical measurement and testing |
US7133125B2 (en) * | 2001-04-23 | 2006-11-07 | Circadiant Systems, Inc. | Automated system and method for determining the sensitivity of optical components |
GB0111215D0 (en) | 2001-05-08 | 2001-06-27 | Curvaceous Software Ltd | Multi-variable process |
JP5416383B2 (ja) * | 2008-10-10 | 2014-02-12 | アンリツ株式会社 | 光パルス試験器 |
JP5592872B2 (ja) * | 2011-12-28 | 2014-09-17 | アンリツ株式会社 | 光パルス試験方法及び光パルス試験装置 |
US9752955B2 (en) * | 2014-07-31 | 2017-09-05 | Ii-Vi Incorporated | Edge propagating optical time domain reflectometer and method of using the same |
US9341543B2 (en) * | 2014-10-16 | 2016-05-17 | Texas Instruments Incorporated | Method and OTDR apparatus for optical cable defect location with reduced memory requirement |
US11428604B2 (en) * | 2019-12-06 | 2022-08-30 | Christine Pons | Compact optical time domain reflectometer with integrated time delay fiber waveguide |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5734286A (en) * | 1980-08-11 | 1982-02-24 | Canon Inc | Information outputting device |
JPS5830636A (ja) * | 1981-08-18 | 1983-02-23 | Fujitsu Ltd | 光ファイバ・フォルトロケ−タの測定結果表示方式 |
US4439762A (en) * | 1981-12-28 | 1984-03-27 | Beckman Instruments, Inc. | Graphics memory expansion system |
JPS58219465A (ja) * | 1982-06-15 | 1983-12-20 | Toshiba Corp | D/aコンバ−タ用試験装置 |
JPS60113158A (ja) * | 1983-11-25 | 1985-06-19 | Mitsubishi Electric Corp | トレンドグラフ表示装置 |
JPS60194369A (ja) * | 1984-03-15 | 1985-10-02 | Sony Tektronix Corp | 信号記憶装置 |
US4694244A (en) * | 1986-02-21 | 1987-09-15 | Hewlett Packard Company | Apparatus for random repetitive sampling |
JPS62247264A (ja) * | 1986-04-21 | 1987-10-28 | Hitachi Denshi Ltd | 波形記憶装置 |
US4719416A (en) * | 1986-11-10 | 1988-01-12 | Hewlett Packard Company | Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope |
JPH0762642B2 (ja) * | 1987-10-19 | 1995-07-05 | アンリツ株式会社 | 光パルス試験器 |
JPH0721509B2 (ja) * | 1988-08-09 | 1995-03-08 | 横河電機株式会社 | デジタル波形表示装置 |
-
1990
- 1990-04-25 US US07/514,396 patent/US5148230A/en not_active Expired - Fee Related
-
1991
- 1991-03-28 EP EP91105030A patent/EP0453817B1/de not_active Expired - Lifetime
- 1991-03-28 DE DE69112479T patent/DE69112479T2/de not_active Expired - Fee Related
- 1991-04-25 JP JP3122529A patent/JP2704323B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0453817B1 (de) | 1995-08-30 |
JP2704323B2 (ja) | 1998-01-26 |
EP0453817A2 (de) | 1991-10-30 |
EP0453817A3 (en) | 1992-09-23 |
US5148230A (en) | 1992-09-15 |
JPH05346369A (ja) | 1993-12-27 |
DE69112479T2 (de) | 1996-08-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |