DE60043666D1 - Multivariabeles verfahren - Google Patents

Multivariabeles verfahren

Info

Publication number
DE60043666D1
DE60043666D1 DE60043666T DE60043666T DE60043666D1 DE 60043666 D1 DE60043666 D1 DE 60043666D1 DE 60043666 T DE60043666 T DE 60043666T DE 60043666 T DE60043666 T DE 60043666T DE 60043666 D1 DE60043666 D1 DE 60043666D1
Authority
DE
Germany
Prior art keywords
values
variables
variable
hulls
displayed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60043666T
Other languages
English (en)
Inventor
Robin William Brooks
John Gavin Wilson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Process Plant Computing Ltd
Original Assignee
Curvaceous Software Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB9928113.1A external-priority patent/GB9928113D0/en
Priority claimed from GB0015649A external-priority patent/GB0015649D0/en
Application filed by Curvaceous Software Ltd filed Critical Curvaceous Software Ltd
Application granted granted Critical
Publication of DE60043666D1 publication Critical patent/DE60043666D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D7/00—Indicating measured values
    • G01D7/02—Indicating value of two or more variables simultaneously
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/35—Nc in input of data, input till input file format
    • G05B2219/35507—Spider, radar, parallel axes, multivariate plot

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Logic Circuits (AREA)
  • Separation By Low-Temperature Treatments (AREA)
  • Massaging Devices (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Electrotherapy Devices (AREA)
  • Indicating Measured Values (AREA)
  • Complex Calculations (AREA)
  • User Interface Of Digital Computer (AREA)
  • Paper (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
DE60043666T 1999-11-26 2000-11-27 Multivariabeles verfahren Expired - Lifetime DE60043666D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB9928113.1A GB9928113D0 (en) 1999-11-26 1999-11-26 Multi-Variable processes
GB0015649A GB0015649D0 (en) 2000-06-28 2000-06-28 Multi-variable processes
PCT/GB2000/004506 WO2001038831A1 (en) 1999-11-26 2000-11-27 Multi-variable processes

Publications (1)

Publication Number Publication Date
DE60043666D1 true DE60043666D1 (de) 2010-02-25

Family

ID=26244548

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60043666T Expired - Lifetime DE60043666D1 (de) 1999-11-26 2000-11-27 Multivariabeles verfahren

Country Status (10)

Country Link
US (1) US6879325B1 (de)
EP (1) EP1234162B1 (de)
JP (1) JP4819273B2 (de)
AT (1) ATE454612T1 (de)
AU (1) AU1714301A (de)
CA (1) CA2392380C (de)
DE (1) DE60043666D1 (de)
DK (1) DK1234162T3 (de)
GB (1) GB2363647B (de)
WO (1) WO2001038831A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0111215D0 (en) * 2001-05-08 2001-06-27 Curvaceous Software Ltd Multi-variable process
CA2449475A1 (en) * 2001-06-15 2002-12-27 Analog Design Automation Inc. Method and system for design selection by interactive visualization
GB0211836D0 (en) * 2002-05-23 2002-07-03 Curvaceous Software Ltd Multi-variable processes
FI115669B (fi) * 2002-10-09 2005-06-15 Stora Enso Oyj Menetelmä ja näyttöjärjestelmä paperi- tai kartonkikoneella valmistettavan tuotteen laadun vaihdon valvomiseksi
GB0320670D0 (en) 2003-09-04 2003-10-01 Curvaceous Software Ltd Multi-variable operations
GB0515726D0 (en) 2005-07-30 2005-09-07 Curvaceous Software Ltd Multi-variable operations
US8487930B2 (en) * 2006-03-10 2013-07-16 Honeywell International Inc. Process monitoring using multivariate data
US20080104529A1 (en) * 2006-10-31 2008-05-01 International Business Machines Corporation Draggable legends for sql driven graphs
GB0717991D0 (en) 2007-09-15 2007-10-24 Curvaceous Software Ltd Multi-variable operations
US10510117B1 (en) * 2015-03-23 2019-12-17 Scottrade, Inc. High performance stock screener visualization technology using parallel coordinates graphs
US10360249B2 (en) * 2015-04-10 2019-07-23 Trendminder N.V. System and method for creation and detection of process fingerprints for monitoring in a process plant
JP6532762B2 (ja) * 2015-06-02 2019-06-19 株式会社東芝 情報生成システム、装置、方法、及びプログラム

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62247264A (ja) * 1986-04-21 1987-10-28 Hitachi Denshi Ltd 波形記憶装置
US5148230A (en) 1990-04-25 1992-09-15 Tektronix, Inc. Measurement apparatus having improved sample density using nested data acquisitions
US5228119A (en) * 1990-09-28 1993-07-13 Temple University Multi-dimensional graphing in two-dimensional space
JP2732711B2 (ja) * 1990-12-20 1998-03-30 株式会社日立製作所 多次元情報表示方法および装置
JP3128390B2 (ja) * 1993-04-16 2001-01-29 株式会社山本製作所 穀粒乾燥機における穀粒水分値の表示装置
US5450326A (en) * 1994-07-06 1995-09-12 Harris Corporation Graphical display discriminant factor indicator for anomaly identification in semiconductor manufacture batch process
US5546516A (en) * 1994-12-14 1996-08-13 International Business Machines Corporation System and method for visually querying a data set exhibited in a parallel coordinate system
EP0753283A1 (de) * 1995-07-14 1997-01-15 Hewlett-Packard Company Verfahren und Gerät zum Vergleich eines Musters mit einer Referenz unter Verwendung eines sternförmigen Diagrammes
JPH10171520A (ja) * 1996-12-06 1998-06-26 F F C:Kk 多角形領域内外判定方法および装置
JPH11167416A (ja) * 1997-12-05 1999-06-22 Toshiba Corp プラント監視制御装置
US5917500A (en) * 1998-01-05 1999-06-29 N-Dimensional Visualization, Llc Intellectual structure for visualization of n-dimensional space utilizing a parallel coordinate system
CA2236063C (en) * 1998-04-28 2005-07-12 Ibm Canada Limited-Ibm Canada Limitee Multi-variable graphical interface and method
US6587108B1 (en) * 1999-07-01 2003-07-01 Honeywell Inc. Multivariable process matrix display and methods regarding same

Also Published As

Publication number Publication date
AU1714301A (en) 2001-06-04
CA2392380A1 (en) 2001-05-31
JP2003515231A (ja) 2003-04-22
GB0028852D0 (en) 2001-01-10
WO2001038831A1 (en) 2001-05-31
EP1234162A1 (de) 2002-08-28
DK1234162T3 (da) 2010-03-29
JP4819273B2 (ja) 2011-11-24
ATE454612T1 (de) 2010-01-15
EP1234162B1 (de) 2010-01-06
GB2363647A (en) 2002-01-02
CA2392380C (en) 2011-02-08
US6879325B1 (en) 2005-04-12
GB2363647B (en) 2003-01-22

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: CURVACEOUS SOFTWARE LTD., PINNER, MIDDLESEX, GB

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PROCESS PLANT COMPUTING LTD., PINNER, MIDDLESE, GB