DE69019477T2 - Anordnung zum Nachweis einer Lichtintensitätsänderung. - Google Patents
Anordnung zum Nachweis einer Lichtintensitätsänderung.Info
- Publication number
- DE69019477T2 DE69019477T2 DE69019477T DE69019477T DE69019477T2 DE 69019477 T2 DE69019477 T2 DE 69019477T2 DE 69019477 T DE69019477 T DE 69019477T DE 69019477 T DE69019477 T DE 69019477T DE 69019477 T2 DE69019477 T2 DE 69019477T2
- Authority
- DE
- Germany
- Prior art keywords
- detected
- intensity
- change
- light intensity
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1311249A JP2556910B2 (ja) | 1989-11-30 | 1989-11-30 | 光強度変化検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69019477D1 DE69019477D1 (de) | 1995-06-22 |
DE69019477T2 true DE69019477T2 (de) | 1996-01-18 |
Family
ID=18014885
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69019477T Expired - Fee Related DE69019477T2 (de) | 1989-11-30 | 1990-11-28 | Anordnung zum Nachweis einer Lichtintensitätsänderung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5153667A (de) |
EP (1) | EP0430661B1 (de) |
JP (1) | JP2556910B2 (de) |
AT (1) | ATE122793T1 (de) |
DE (1) | DE69019477T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3170588B2 (ja) * | 1992-10-08 | 2001-05-28 | 日本オプネクスト株式会社 | 光受信器の試験方法 |
EP0702236A3 (de) * | 1994-09-19 | 1996-06-05 | Hamamatsu Photonics Kk | Spannungsmesssystem |
JP3352543B2 (ja) * | 1994-09-29 | 2002-12-03 | 浜松ホトニクス株式会社 | 電圧測定装置 |
JP3670071B2 (ja) * | 1996-01-08 | 2005-07-13 | 浜松ホトニクス株式会社 | 電界測定装置 |
TW318209B (en) * | 1996-05-10 | 1997-10-21 | Schlumberger Technologies Inc | Laser voltage probe methods and apparatus |
US5905577A (en) * | 1997-03-15 | 1999-05-18 | Schlumberger Technologies, Inc. | Dual-laser voltage probing of IC's |
JPH11316245A (ja) * | 1998-05-01 | 1999-11-16 | Ando Electric Co Ltd | 電気光学サンプリングオシロスコープ |
US6392746B1 (en) * | 1999-08-26 | 2002-05-21 | Rifocs Corporation | Electronic fiberoptic power and wavelength measuring instrument |
DE10324478B3 (de) * | 2003-05-30 | 2004-12-09 | Leica Microsystems Heidelberg Gmbh | Vorrichtung zum Ermitteln der Lichtleistung eines Lichtstrahles und Scanmikroskop |
US7791739B2 (en) * | 2004-04-20 | 2010-09-07 | Lockheed Martin Corporation | System and method to enable eye-safe laser ultrasound detection |
ATE512375T1 (de) * | 2007-07-13 | 2011-06-15 | Ezono Ag | Optoelektrischer ultraschallsensor und -system |
JP6283507B2 (ja) * | 2013-11-29 | 2018-02-21 | 浜松ホトニクス株式会社 | 半導体デバイス計測装置及び半導体デバイス計測方法 |
EP3234500A4 (de) | 2014-12-19 | 2018-07-04 | University of Utah Research Foundation | Interferometriesystem und zugehörige verfahren |
EP3475649A4 (de) | 2016-06-23 | 2020-04-22 | University of Utah Research Foundation | Interferometriesystem und zugehörige verfahren |
US11162781B2 (en) | 2016-06-23 | 2021-11-02 | University Of Utah Research Foundation | Interferometry systems and methods |
CN109541991B (zh) * | 2018-10-26 | 2020-09-01 | 中国科学院长春光学精密机械与物理研究所 | 一种共振式电磁音叉斩光器自动增益控制系统 |
CN109541990B (zh) * | 2018-10-26 | 2020-09-01 | 中国科学院长春光学精密机械与物理研究所 | 一种共振式电磁音叉斩光器自动增益控制方法 |
CN111238773A (zh) * | 2020-01-20 | 2020-06-05 | 中国科学院上海光学精密机械研究所 | 高分辨激光输出功率变化量监测装置与方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3675022A (en) * | 1970-05-21 | 1972-07-04 | Atomic Energy Commission | Kerr cell system for modulating a laser beam |
US3994590A (en) * | 1975-04-29 | 1976-11-30 | Martini Raymond G Di | Discrete frequency colorimeter |
US4171909A (en) * | 1977-03-25 | 1979-10-23 | Miles Laboratories, Inc. | Apparatus for measuring light intensities |
US4334781A (en) * | 1979-06-08 | 1982-06-15 | Tokyo Shibaura Denki Kabushiki Kaisha | Optical sensing system |
JPS5737277A (en) * | 1980-08-18 | 1982-03-01 | Hitachi Ltd | Measuring device for magnetic field |
JPS57196165A (en) * | 1981-05-28 | 1982-12-02 | Iwatsu Electric Co Ltd | Light intensity modulation measuring device |
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
US4632518A (en) * | 1984-07-31 | 1986-12-30 | Hughes Aircraft Company | Phase insensitive optical logic gate device |
KR860004321A (ko) * | 1984-11-20 | 1986-06-20 | 윤영석 | C0₂레이저(Laser)를 이용한 미러(Mirror)의 반사율 측정장치 |
JPH0731112B2 (ja) * | 1986-08-11 | 1995-04-10 | 株式会社日立製作所 | 粒子状物質の検出方法およびその装置 |
JP2571385B2 (ja) * | 1987-05-31 | 1997-01-16 | 浜松ホトニクス株式会社 | 電圧検出装置 |
JPS63308572A (ja) * | 1987-06-10 | 1988-12-15 | Hamamatsu Photonics Kk | 電圧検出装置 |
JPH0830720B2 (ja) * | 1987-06-30 | 1996-03-27 | 浜松ホトニクス株式会社 | 電圧検出装置 |
JP3175935B2 (ja) * | 1987-09-30 | 2001-06-11 | 株式会社東芝 | 光ファイバ応用センサ |
-
1989
- 1989-11-30 JP JP1311249A patent/JP2556910B2/ja not_active Expired - Fee Related
-
1990
- 1990-11-26 US US07/617,615 patent/US5153667A/en not_active Expired - Lifetime
- 1990-11-28 DE DE69019477T patent/DE69019477T2/de not_active Expired - Fee Related
- 1990-11-28 AT AT90312916T patent/ATE122793T1/de active
- 1990-11-28 EP EP90312916A patent/EP0430661B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH03170874A (ja) | 1991-07-24 |
DE69019477D1 (de) | 1995-06-22 |
ATE122793T1 (de) | 1995-06-15 |
US5153667A (en) | 1992-10-06 |
EP0430661B1 (de) | 1995-05-17 |
EP0430661A3 (en) | 1992-04-08 |
EP0430661A2 (de) | 1991-06-05 |
JP2556910B2 (ja) | 1996-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |