ATE122793T1 - Anordnung zum nachweis einer lichtintensitätsänderung. - Google Patents

Anordnung zum nachweis einer lichtintensitätsänderung.

Info

Publication number
ATE122793T1
ATE122793T1 AT90312916T AT90312916T ATE122793T1 AT E122793 T1 ATE122793 T1 AT E122793T1 AT 90312916 T AT90312916 T AT 90312916T AT 90312916 T AT90312916 T AT 90312916T AT E122793 T1 ATE122793 T1 AT E122793T1
Authority
AT
Austria
Prior art keywords
detected
intensity
change
light intensity
signal
Prior art date
Application number
AT90312916T
Other languages
English (en)
Inventor
Shinichiro Aoshima
Hironori Takahashi
Yutaka Tsuchiya
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Application granted granted Critical
Publication of ATE122793T1 publication Critical patent/ATE122793T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
AT90312916T 1989-11-30 1990-11-28 Anordnung zum nachweis einer lichtintensitätsänderung. ATE122793T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1311249A JP2556910B2 (ja) 1989-11-30 1989-11-30 光強度変化検出装置

Publications (1)

Publication Number Publication Date
ATE122793T1 true ATE122793T1 (de) 1995-06-15

Family

ID=18014885

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90312916T ATE122793T1 (de) 1989-11-30 1990-11-28 Anordnung zum nachweis einer lichtintensitätsänderung.

Country Status (5)

Country Link
US (1) US5153667A (de)
EP (1) EP0430661B1 (de)
JP (1) JP2556910B2 (de)
AT (1) ATE122793T1 (de)
DE (1) DE69019477T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3170588B2 (ja) * 1992-10-08 2001-05-28 日本オプネクスト株式会社 光受信器の試験方法
EP0702236A3 (de) * 1994-09-19 1996-06-05 Hamamatsu Photonics Kk Spannungsmesssystem
JP3352543B2 (ja) * 1994-09-29 2002-12-03 浜松ホトニクス株式会社 電圧測定装置
JP3670071B2 (ja) * 1996-01-08 2005-07-13 浜松ホトニクス株式会社 電界測定装置
TW318209B (en) * 1996-05-10 1997-10-21 Schlumberger Technologies Inc Laser voltage probe methods and apparatus
US5905577A (en) * 1997-03-15 1999-05-18 Schlumberger Technologies, Inc. Dual-laser voltage probing of IC's
JPH11316245A (ja) * 1998-05-01 1999-11-16 Ando Electric Co Ltd 電気光学サンプリングオシロスコープ
US6392746B1 (en) * 1999-08-26 2002-05-21 Rifocs Corporation Electronic fiberoptic power and wavelength measuring instrument
DE10324478B3 (de) * 2003-05-30 2004-12-09 Leica Microsystems Heidelberg Gmbh Vorrichtung zum Ermitteln der Lichtleistung eines Lichtstrahles und Scanmikroskop
US7791739B2 (en) * 2004-04-20 2010-09-07 Lockheed Martin Corporation System and method to enable eye-safe laser ultrasound detection
ATE512375T1 (de) * 2007-07-13 2011-06-15 Ezono Ag Optoelektrischer ultraschallsensor und -system
JP6283507B2 (ja) * 2013-11-29 2018-02-21 浜松ホトニクス株式会社 半導体デバイス計測装置及び半導体デバイス計測方法
EP3234500A4 (de) 2014-12-19 2018-07-04 University of Utah Research Foundation Interferometriesystem und zugehörige verfahren
EP3475649A4 (de) 2016-06-23 2020-04-22 University of Utah Research Foundation Interferometriesystem und zugehörige verfahren
US11162781B2 (en) 2016-06-23 2021-11-02 University Of Utah Research Foundation Interferometry systems and methods
CN109541991B (zh) * 2018-10-26 2020-09-01 中国科学院长春光学精密机械与物理研究所 一种共振式电磁音叉斩光器自动增益控制系统
CN109541990B (zh) * 2018-10-26 2020-09-01 中国科学院长春光学精密机械与物理研究所 一种共振式电磁音叉斩光器自动增益控制方法
CN111238773A (zh) * 2020-01-20 2020-06-05 中国科学院上海光学精密机械研究所 高分辨激光输出功率变化量监测装置与方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3675022A (en) * 1970-05-21 1972-07-04 Atomic Energy Commission Kerr cell system for modulating a laser beam
US3994590A (en) * 1975-04-29 1976-11-30 Martini Raymond G Di Discrete frequency colorimeter
US4171909A (en) * 1977-03-25 1979-10-23 Miles Laboratories, Inc. Apparatus for measuring light intensities
US4334781A (en) * 1979-06-08 1982-06-15 Tokyo Shibaura Denki Kabushiki Kaisha Optical sensing system
JPS5737277A (en) * 1980-08-18 1982-03-01 Hitachi Ltd Measuring device for magnetic field
JPS57196165A (en) * 1981-05-28 1982-12-02 Iwatsu Electric Co Ltd Light intensity modulation measuring device
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4632518A (en) * 1984-07-31 1986-12-30 Hughes Aircraft Company Phase insensitive optical logic gate device
KR860004321A (ko) * 1984-11-20 1986-06-20 윤영석 C0₂레이저(Laser)를 이용한 미러(Mirror)의 반사율 측정장치
JPH0731112B2 (ja) * 1986-08-11 1995-04-10 株式会社日立製作所 粒子状物質の検出方法およびその装置
JP2571385B2 (ja) * 1987-05-31 1997-01-16 浜松ホトニクス株式会社 電圧検出装置
JPS63308572A (ja) * 1987-06-10 1988-12-15 Hamamatsu Photonics Kk 電圧検出装置
JPH0830720B2 (ja) * 1987-06-30 1996-03-27 浜松ホトニクス株式会社 電圧検出装置
JP3175935B2 (ja) * 1987-09-30 2001-06-11 株式会社東芝 光ファイバ応用センサ

Also Published As

Publication number Publication date
DE69019477T2 (de) 1996-01-18
JPH03170874A (ja) 1991-07-24
DE69019477D1 (de) 1995-06-22
US5153667A (en) 1992-10-06
EP0430661B1 (de) 1995-05-17
EP0430661A3 (en) 1992-04-08
EP0430661A2 (de) 1991-06-05
JP2556910B2 (ja) 1996-11-27

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