DE69019412D1 - Absorptionsmikroskopie und/oder -spektroskopie mit Abtastmikroskopiesteuerung. - Google Patents
Absorptionsmikroskopie und/oder -spektroskopie mit Abtastmikroskopiesteuerung.Info
- Publication number
- DE69019412D1 DE69019412D1 DE69019412T DE69019412T DE69019412D1 DE 69019412 D1 DE69019412 D1 DE 69019412D1 DE 69019412 T DE69019412 T DE 69019412T DE 69019412 T DE69019412 T DE 69019412T DE 69019412 D1 DE69019412 D1 DE 69019412D1
- Authority
- DE
- Germany
- Prior art keywords
- microscopy
- spectroscopy
- absorption
- control
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/12—STS [Scanning Tunnelling Spectroscopy]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/867—Scanning thermal probe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Nanotechnology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/334,833 US4941753A (en) | 1989-04-07 | 1989-04-07 | Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69019412D1 true DE69019412D1 (de) | 1995-06-22 |
DE69019412T2 DE69019412T2 (de) | 1996-01-25 |
Family
ID=23309048
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69019412T Expired - Lifetime DE69019412T2 (de) | 1989-04-07 | 1990-02-12 | Absorptionsmikroskopie und/oder -spektroskopie mit Abtastmikroskopiesteuerung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4941753A (de) |
EP (1) | EP0391040B1 (de) |
JP (1) | JPH0795046B2 (de) |
DE (1) | DE69019412T2 (de) |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5293781A (en) * | 1987-11-09 | 1994-03-15 | California Institute Of Technology | Tunnel effect measuring systems and particle detectors |
US5265470A (en) * | 1987-11-09 | 1993-11-30 | California Institute Of Technology | Tunnel effect measuring systems and particle detectors |
US5304924A (en) * | 1989-03-29 | 1994-04-19 | Canon Kabushiki Kaisha | Edge detector |
US5185572A (en) * | 1989-09-28 | 1993-02-09 | Olympus Optical Co., Ltd. | Scanning tunneling potentio-spectroscopic microscope and a data detecting method |
US5289004A (en) * | 1990-03-27 | 1994-02-22 | Olympus Optical Co., Ltd. | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light |
DE69123866T2 (de) * | 1990-03-27 | 1997-06-26 | Olympus Optical Co., Ltd., Tokio/Tokyo | Rastertunnelmikroskop |
US5065103A (en) * | 1990-03-27 | 1991-11-12 | International Business Machines Corporation | Scanning capacitance - voltage microscopy |
US5060248A (en) * | 1990-06-29 | 1991-10-22 | General Electric Company | Scanning analysis and imaging system with modulated electro-magnetic energy source |
JP2802825B2 (ja) * | 1990-09-22 | 1998-09-24 | 大日本スクリーン製造 株式会社 | 半導体ウエハの電気測定装置 |
US5122739A (en) * | 1990-11-06 | 1992-06-16 | Texas Instruments Incorporated | STM-like device and method for measuring node voltages on integrated circuits |
US5237529A (en) * | 1991-02-01 | 1993-08-17 | Richard Spitzer | Microstructure array and activation system therefor |
US5274325A (en) * | 1991-03-18 | 1993-12-28 | Nippon Telegraph And Telephone Corporation | Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits |
US5239183A (en) * | 1991-04-30 | 1993-08-24 | Dainippon Screen Mfg. Co., Ltd. | Optical gap measuring device using frustrated internal reflection |
US5185594A (en) * | 1991-05-20 | 1993-02-09 | Furon Company | Temperature sensing cable device and method of making same |
US5658728A (en) * | 1991-06-19 | 1997-08-19 | Gosney, Jr.; William Milton | Templates for nucleic acid molecules |
US5196701A (en) * | 1991-07-31 | 1993-03-23 | International Business Machines Corporation | High-resolution detection of material property variations |
US5384507A (en) * | 1991-11-29 | 1995-01-24 | Hitachi Construction Machinery Co., Ltd. | Method of and device for driving piezo-electric elements and system for controlling micromotion mechanism |
US5198667A (en) * | 1991-12-20 | 1993-03-30 | The United States Of America As Represented By The Secretary Of The Navy | Method and apparatus for performing scanning tunneling optical absorption spectroscopy |
US5214389A (en) * | 1992-01-06 | 1993-05-25 | Motorola, Inc. | Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position |
US5262642A (en) * | 1992-02-26 | 1993-11-16 | Northwestern University | Scanning tunneling optical spectrometer |
US5248199A (en) * | 1992-03-02 | 1993-09-28 | Ta Instruments, Inc. | Method and apparatus for spatially resolved modulated differential analysis |
US5267471A (en) * | 1992-04-30 | 1993-12-07 | Ibm Corporation | Double cantilever sensor for atomic force microscope |
US5434842A (en) * | 1992-07-17 | 1995-07-18 | Biotechnology Research And Development Corporation | Reading and writing stored information by means of electrochemistry |
US5504366A (en) * | 1992-07-17 | 1996-04-02 | Biotechnology Research And Development Corp. | System for analyzing surfaces of samples |
WO1994002840A1 (en) * | 1992-07-17 | 1994-02-03 | The Penn State Research Foundation | System for detecting atomic or molecular spectra of a substance, and/or threshold phenomena associated with the same |
DE69332710T2 (de) * | 1992-07-17 | 2004-01-15 | Biotechnology Res & Dev | System zum feststellen von atom- oder molekularspektren und/oder damit verbundenen schwellenerscheinungen |
US5397896A (en) * | 1992-07-17 | 1995-03-14 | Penn State Research Foundation And Biotechnology Research And Development Corporation | Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra |
US5381101A (en) * | 1992-12-02 | 1995-01-10 | The Board Of Trustees Of The Leland Stanford Junior University | System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies |
US5517128A (en) * | 1993-01-05 | 1996-05-14 | Sentech Instruments Gmbh | Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning |
US5510614A (en) * | 1993-01-21 | 1996-04-23 | Hitachi, Ltd. | Solid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatus |
US5356218A (en) * | 1993-05-04 | 1994-10-18 | Motorola, Inc. | Probe for providing surface images |
US5406832A (en) * | 1993-07-02 | 1995-04-18 | Topometrix Corporation | Synchronous sampling scanning force microscope |
DE4324983C2 (de) * | 1993-07-26 | 1996-07-11 | Fraunhofer Ges Forschung | Akustisches Mikroskop |
KR950012094A (ko) * | 1993-10-04 | 1995-05-16 | 가나이 쯔또무 | 미소부 물성정보 측정장치 |
JP2806765B2 (ja) * | 1993-11-24 | 1998-09-30 | 日本電気株式会社 | 熱伝導率測定装置および測定方法 |
US5489774A (en) * | 1994-09-20 | 1996-02-06 | The Board Of Trustees Of The Leland Stanford University | Combined atomic force and near field scanning optical microscope with photosensitive cantilever |
FR2728682B1 (fr) * | 1994-12-26 | 1997-01-31 | Commissariat Energie Atomique | Dispositif d'essai d'un element d'optique soumis a un rayonnement |
US5609744A (en) * | 1995-03-16 | 1997-03-11 | International Business Machines Corporation | Assembly suitable for identifying a code sequence of a biomolecule in a gel embodiment |
US5624845A (en) * | 1995-03-16 | 1997-04-29 | International Business Machines Corporation | Assembly and a method suitable for identifying a code |
US5538898A (en) * | 1995-03-16 | 1996-07-23 | International Business Machines Corporation | Method suitable for identifying a code sequence of a biomolecule |
US5607568A (en) * | 1995-03-16 | 1997-03-04 | International Business Machines Corporation | Assembly suitable for identifying a code sequence of a biomolecule in a free-solution embodiment |
US5581082A (en) * | 1995-03-28 | 1996-12-03 | The Regents Of The University Of California | Combined scanning probe and scanning energy microscope |
DE69625292T2 (de) | 1995-08-04 | 2003-09-04 | International Business Machines Corp., Armonk | Interferometrischer Nahfeldapparat und Verfahren |
US5602820A (en) * | 1995-08-24 | 1997-02-11 | International Business Machines Corporation | Method and apparatus for mass data storage |
DE19635264C1 (de) * | 1996-08-30 | 1998-04-16 | Max Planck Gesellschaft | Thermoelektrische Mikrosonde |
US6260997B1 (en) * | 1997-10-28 | 2001-07-17 | Michael Claybourn | Method and apparatus for high spatial resolution spectroscopic microscopy |
US6185991B1 (en) * | 1998-02-17 | 2001-02-13 | Psia Corporation | Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode |
FR2817353B1 (fr) * | 2000-11-28 | 2003-01-03 | Commissariat Energie Atomique | Convertisseur courant/tension pour la mesure de faibles courants apte a fonctionner sous forte irradiation x ou y |
CN101769711B (zh) * | 2010-01-26 | 2012-09-05 | 重庆理工大学 | 一种基于隧道效应的接触式纳米位移传感器 |
CN104880576A (zh) * | 2015-06-02 | 2015-09-02 | 常州朗道科学仪器有限公司 | 一种将样品在低温下进行扫描探针显微测量的装置 |
US10876900B1 (en) * | 2018-08-02 | 2020-12-29 | Government Of The United States, As Represented By The Secretary Of The Air Force | Systems and methods for high-speed, spectroscopic, gas-phase thermometry |
WO2018218053A1 (en) * | 2017-05-24 | 2018-11-29 | Northwestern University | Devices and methods for rapid sample processing and analysis |
KR102414946B1 (ko) | 2020-06-02 | 2022-07-04 | 파크시스템스 주식회사 | 광원의 빔스팟을 검출하기 위한 방법 및 장치 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4084902A (en) * | 1976-07-26 | 1978-04-18 | Green James E | Method and apparatus for producing a suspension of biological cells on a substrate |
CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
JPS60177539A (ja) * | 1984-02-24 | 1985-09-11 | Hitachi Ltd | 走査型電子顕微鏡 |
DE3572030D1 (en) * | 1985-03-07 | 1989-09-07 | Ibm | Scanning tunneling microscope |
JPH071687B2 (ja) * | 1985-12-13 | 1995-01-11 | 株式会社日立製作所 | 走査トンネル顕微鏡 |
US4747698A (en) * | 1986-04-30 | 1988-05-31 | International Business Machines Corp. | Scanning thermal profiler |
JPS6366838A (ja) * | 1986-09-05 | 1988-03-25 | Nec Corp | 走査型トンネル顕微鏡 |
DE3772563D1 (de) * | 1987-06-22 | 1991-10-02 | Ibm | Verfahren zur oberflaechenuntersuchung mit nanometer- und pikosekundenaufloesung sowie laserabgetastetes rastertunnelmikroskop zur durchfuehrung des verfahrens. |
JPS643502A (en) * | 1987-06-25 | 1989-01-09 | Seiko Instr & Electronics | Scanning type tunnel microscope |
US4841148A (en) * | 1988-03-21 | 1989-06-20 | The Board Of Trustees Of The University Of Illinois | Variable temperature scanning tunneling microscope |
JP2777147B2 (ja) * | 1988-09-06 | 1998-07-16 | 株式会社東芝 | 表面分析装置 |
-
1989
- 1989-04-07 US US07/334,833 patent/US4941753A/en not_active Expired - Lifetime
-
1990
- 1990-02-12 DE DE69019412T patent/DE69019412T2/de not_active Expired - Lifetime
- 1990-02-12 EP EP90102666A patent/EP0391040B1/de not_active Expired - Lifetime
- 1990-04-05 JP JP2089293A patent/JPH0795046B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69019412T2 (de) | 1996-01-25 |
US4941753A (en) | 1990-07-17 |
JPH0795046B2 (ja) | 1995-10-11 |
EP0391040A3 (de) | 1991-07-24 |
JPH02287246A (ja) | 1990-11-27 |
EP0391040A2 (de) | 1990-10-10 |
EP0391040B1 (de) | 1995-05-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69019412D1 (de) | Absorptionsmikroskopie und/oder -spektroskopie mit Abtastmikroskopiesteuerung. | |
DE69026780D1 (de) | Rastermikroskop und Rastermechanismus dafür | |
DE59004453D1 (de) | Farbstoffmischung und deren Verwendung. | |
DE69016181D1 (de) | Elektrochromische Lösungen und Vorrichtungen mit solchen Lösungen. | |
DE3885920D1 (de) | Vinylsilylalkoxy-arylbenzotriazol-Verbindungen und UV absorbierende Zusammensetzung mit ihnen. | |
DE68908473D1 (de) | Optischer teil, optische anordnung und drehbarer kodierer mit diesem teil. | |
DE69011428D1 (de) | Optoelektronische Anordnung und Herstellungsverfahren dafür. | |
DE69418805D1 (de) | Farbstrahlkopf und Farbstrahlaufzeichnungsgerät damit versehen | |
DE69425905D1 (de) | Spinndüse und deren Verwendung | |
DE68900346D1 (de) | Pedikelschraube mit offenem joch. | |
DE69000467D1 (de) | Bis-aza-bicyclische anxiolytica und antidepressiva. | |
DE69218148D1 (de) | Laserabtastmikroskop mit Photokoppler und Detektor | |
DE69014357D1 (de) | Fahrzeug-Steuervorrichtung und Steuerverfahren. | |
DE69017253D1 (de) | Ebene Lichtquelle und Beleuchtungsvorrichtung unter Verwendung derselben. | |
DE68901238D1 (de) | Schiebedach mit zumindest zwei steuerbaren deckelteilen. | |
DE68905724D1 (de) | Fahrzeugtuerverriegelung und aehnliche betaetigungseinrichtungen. | |
DE69010141D1 (de) | Lager und Lageranordnung. | |
DE3784390D1 (de) | Zusammensetzung und analytisches element mit stabilisiertem peroxydase. | |
DE69008619D1 (de) | Integrierte Steurungsvorrichtung für eine Fahrzeugtür und Tür mit einer solchen Vorrichtung. | |
DE69010550D1 (de) | Sauerstoffabsorbtion. | |
DE68924520D1 (de) | Brille mit abmontierbaren funktionellen und dekorativen Elementen. | |
DE68919717D1 (de) | Organisches Material mit nichtlinearen optischen Eigenschaften und Vorrichtung mit nichtlinearen optischen Eigenschaften. | |
DE68924460D1 (de) | Laserabtastmikroskop und Anwendungsverfahren. | |
DE58902290D1 (de) | Sauerstoffabsorptionsmittel und verwendung desselben. | |
ATE97424T1 (de) | Modifizierte polydextrose und deren herstellung. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8330 | Complete disclaimer |