DE69026780D1 - Rastermikroskop und Rastermechanismus dafür - Google Patents

Rastermikroskop und Rastermechanismus dafür

Info

Publication number
DE69026780D1
DE69026780D1 DE69026780T DE69026780T DE69026780D1 DE 69026780 D1 DE69026780 D1 DE 69026780D1 DE 69026780 T DE69026780 T DE 69026780T DE 69026780 T DE69026780 T DE 69026780T DE 69026780 D1 DE69026780 D1 DE 69026780D1
Authority
DE
Germany
Prior art keywords
scanning
mechanism therefor
microscope
scanning mechanism
scanning microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69026780T
Other languages
English (en)
Other versions
DE69026780T2 (de
Inventor
Osamu Iwasaki
Koji Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1309498A external-priority patent/JPH03168713A/ja
Priority claimed from JP3177890A external-priority patent/JPH03235909A/ja
Priority claimed from JP2143544A external-priority patent/JP2663195B2/ja
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Publication of DE69026780D1 publication Critical patent/DE69026780D1/de
Application granted granted Critical
Publication of DE69026780T2 publication Critical patent/DE69026780T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
DE69026780T 1989-09-22 1990-09-21 Rastermikroskop und Rastermechanismus dafür Expired - Fee Related DE69026780T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP24694689 1989-09-22
JP1309498A JPH03168713A (ja) 1989-11-29 1989-11-29 走査型顕微鏡
JP3177890A JPH03235909A (ja) 1990-02-13 1990-02-13 共焦点走査型顕微鏡
JP3177990 1990-02-13
JP9465490 1990-04-10
JP2143544A JP2663195B2 (ja) 1989-09-22 1990-06-01 共焦点走査型顕微鏡

Publications (2)

Publication Number Publication Date
DE69026780D1 true DE69026780D1 (de) 1996-06-05
DE69026780T2 DE69026780T2 (de) 1996-11-07

Family

ID=27549616

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69026780T Expired - Fee Related DE69026780T2 (de) 1989-09-22 1990-09-21 Rastermikroskop und Rastermechanismus dafür

Country Status (3)

Country Link
US (1) US5081350A (de)
EP (1) EP0418928B1 (de)
DE (1) DE69026780T2 (de)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH697814B1 (de) * 2001-01-26 2009-02-27 Tecan Trading Ag Optisches System und Verfahren zum Anregen und Messen von Fluoreszenz an oder in mit Fluoreszenzfarbstoffen behandelten Proben.
JP2613118B2 (ja) * 1990-04-10 1997-05-21 富士写真フイルム株式会社 共焦点走査型顕微鏡
JPH0540224A (ja) * 1990-07-26 1993-02-19 Fuji Photo Film Co Ltd 走査型顕微鏡
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
JPH04157415A (ja) * 1990-10-20 1992-05-29 Fuji Photo Film Co Ltd 共焦点走査型干渉顕微鏡
US5179276A (en) * 1991-03-27 1993-01-12 Fuji Photo Film Co., Ltd. Optical scanning type image pickup apparatus and optical scanning type microscope
US5218195A (en) * 1991-06-25 1993-06-08 Fuji Photo Film Co., Ltd. Scanning microscope, scanning width detecting device, and magnification indicating apparatus
JPH0527177A (ja) * 1991-07-25 1993-02-05 Fuji Photo Film Co Ltd 走査型顕微鏡
US5248876A (en) * 1992-04-21 1993-09-28 International Business Machines Corporation Tandem linear scanning confocal imaging system with focal volumes at different heights
WO1994010595A1 (en) * 1992-10-23 1994-05-11 Monash University Confocal microscope and endoscope
GB9302799D0 (en) * 1993-02-12 1993-03-31 Medical Res Council Detecting means for a scanning optical microscope
US5381224A (en) * 1993-08-30 1995-01-10 A. E. Dixon Scanning laser imaging system
US5548113A (en) * 1994-03-24 1996-08-20 Trustees Of Boston University Co-axial detection and illumination with shear force dithering in a near-field scanning optical microscope
US20050111089A1 (en) * 1994-07-15 2005-05-26 Baer Stephen C. Superresolving microscopy apparatus
TW280928B (de) * 1994-10-24 1996-07-11 At & T Corp
US5528050A (en) * 1995-07-24 1996-06-18 Molecular Dynamics, Inc. Compact scan head with multiple scanning modalities
DE19758748C2 (de) * 1997-01-27 2003-07-31 Zeiss Carl Jena Gmbh Laser-Scanning-Mikroskop
ATE398185T1 (de) * 1997-05-05 2008-07-15 Chemometec As Verfahren und system zur bestimmung von somazellen in milch
DE19834279C2 (de) * 1998-07-30 2002-09-26 Europ Lab Molekularbiolog Kompaktes Einzelobjektiv Theta-Mikroskop
US6294775B1 (en) * 1999-06-08 2001-09-25 University Of Washington Miniature image acquistion system using a scanning resonant waveguide
US6548796B1 (en) * 1999-06-23 2003-04-15 Regents Of The University Of Minnesota Confocal macroscope
US20040224421A1 (en) * 2000-06-15 2004-11-11 Deweerd Herman Bi-directional scanning method
WO2002010830A2 (en) * 2000-07-27 2002-02-07 Zetetic Institute Multiple-source arrays for confocal and near-field microscopy
US7151632B2 (en) * 2001-01-12 2006-12-19 University Of Rochester Apparatus for production of an inhomogeneously polarized optical beam for use in illumination and a method thereof
DE10120424B4 (de) * 2001-04-26 2004-08-05 Leica Microsystems Heidelberg Gmbh Scanmikroskop und Auskoppelelement
US7633033B2 (en) * 2004-01-09 2009-12-15 General Lasertronics Corporation Color sensing for laser decoating
US20050231717A1 (en) * 2004-04-16 2005-10-20 Industrial Technology Research Institute Fluorescence inspection spectrometer
US7139121B2 (en) * 2004-06-18 2006-11-21 Quickmate Company, Inc Projection microscope
US7190514B2 (en) * 2004-08-12 2007-03-13 Yokogawa Electric Corporation Confocal scanning microscope
US7680373B2 (en) * 2006-09-13 2010-03-16 University Of Washington Temperature adjustment in scanning beam devices
GB0621585D0 (en) * 2006-10-30 2006-12-06 Secretary Trade Ind Brit Confocal microscope
US7447415B2 (en) * 2006-12-15 2008-11-04 University Of Washington Attaching optical fibers to actuator tubes with beads acting as spacers and adhesives
US7738762B2 (en) * 2006-12-15 2010-06-15 University Of Washington Attaching optical fibers to actuator tubes with beads acting as spacers and adhesives
US8305432B2 (en) 2007-01-10 2012-11-06 University Of Washington Scanning beam device calibration
WO2008118365A1 (en) 2007-03-22 2008-10-02 General Lasertronics Corporation Methods for stripping and modifying surfaces with laser-induced ablation
US7583872B2 (en) * 2007-04-05 2009-09-01 University Of Washington Compact scanning fiber device
US7608842B2 (en) * 2007-04-26 2009-10-27 University Of Washington Driving scanning fiber devices with variable frequency drive signals
US20080281207A1 (en) * 2007-05-08 2008-11-13 University Of Washington Image acquisition through filtering in multiple endoscope systems
US20080281159A1 (en) * 2007-05-08 2008-11-13 University Of Washington Coordinating image acquisition among multiple endoscopes
US8212884B2 (en) * 2007-05-22 2012-07-03 University Of Washington Scanning beam device having different image acquisition modes
WO2009005840A1 (en) * 2007-07-05 2009-01-08 General Lasertronics Corporation Aperture adapters for laser-based coating removal end-effector
US8437587B2 (en) * 2007-07-25 2013-05-07 University Of Washington Actuating an optical fiber with a piezoelectric actuator and detecting voltages generated by the piezoelectric actuator
US7522813B1 (en) * 2007-10-04 2009-04-21 University Of Washington Reducing distortion in scanning fiber devices
US8411922B2 (en) * 2007-11-30 2013-04-02 University Of Washington Reducing noise in images acquired with a scanning beam device
US10112257B1 (en) 2010-07-09 2018-10-30 General Lasertronics Corporation Coating ablating apparatus with coating removal detection
US9895771B2 (en) 2012-02-28 2018-02-20 General Lasertronics Corporation Laser ablation for the environmentally beneficial removal of surface coatings
US10086597B2 (en) 2014-01-21 2018-10-02 General Lasertronics Corporation Laser film debonding method
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben
JP6677238B2 (ja) * 2017-04-13 2020-04-08 横河電機株式会社 共焦点スキャナ、及び共焦点顕微鏡
DE102020108333B3 (de) 2020-03-26 2021-07-15 Technische Universität Ilmenau Verfahren und Vorrichtung zur Kompensation von instationären Aberrationen bei der konfokalen Vermessung einer Probenoberfläche

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4736110A (en) * 1984-09-28 1988-04-05 Nippon Jidoseigyo, Ltd. Image pick-up apparatus
DE3447467A1 (de) * 1984-12-27 1986-07-03 United Kingdom Atomic Energy Authority, London Abtastmikroskop
JPH0682173B2 (ja) * 1986-03-19 1994-10-19 レーザーテック株式会社 透過型顕微鏡撮像装置
NL8700612A (nl) * 1987-03-13 1988-10-03 Tno Confocale laserscanning microscoop.
JPH0738046B2 (ja) * 1987-03-30 1995-04-26 新王子製紙株式会社 内部的構造を有する半透光性シート状試料の表面検査装置
JPS63306413A (ja) * 1987-06-09 1988-12-14 Olympus Optical Co Ltd 走査型光学顕微鏡
US5032720A (en) * 1988-04-21 1991-07-16 White John G Confocal imaging system
US5035476A (en) * 1990-06-15 1991-07-30 Hamamatsu Photonics K.K. Confocal laser scanning transmission microscope

Also Published As

Publication number Publication date
EP0418928A2 (de) 1991-03-27
DE69026780T2 (de) 1996-11-07
EP0418928B1 (de) 1996-05-01
EP0418928A3 (en) 1992-07-15
US5081350A (en) 1992-01-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FUJIFILM CORP., TOKIO/TOKYO, JP

8339 Ceased/non-payment of the annual fee