DE69015406T2 - Vorrichtung zur Erfassung von Mikroverschiebungen, Piezo-Stellantrieb unter Verwendung der Vorrichtung und Abtastmikroskop unter Verwendung des Piezo-Stellantriebes. - Google Patents

Vorrichtung zur Erfassung von Mikroverschiebungen, Piezo-Stellantrieb unter Verwendung der Vorrichtung und Abtastmikroskop unter Verwendung des Piezo-Stellantriebes.

Info

Publication number
DE69015406T2
DE69015406T2 DE69015406T DE69015406T DE69015406T2 DE 69015406 T2 DE69015406 T2 DE 69015406T2 DE 69015406 T DE69015406 T DE 69015406T DE 69015406 T DE69015406 T DE 69015406T DE 69015406 T2 DE69015406 T2 DE 69015406T2
Authority
DE
Germany
Prior art keywords
piezo actuator
scanning microscope
detecting micro
micro displacements
displacements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69015406T
Other languages
English (en)
Other versions
DE69015406D1 (de
Inventor
Tsugiko Takase
Hideo Adachi
Takao Okada
Hisanari Shimazu
Hideo Tomabechi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE69015406D1 publication Critical patent/DE69015406D1/de
Application granted granted Critical
Publication of DE69015406T2 publication Critical patent/DE69015406T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/861—Scanning tunneling probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner
DE69015406T 1989-04-07 1990-04-06 Vorrichtung zur Erfassung von Mikroverschiebungen, Piezo-Stellantrieb unter Verwendung der Vorrichtung und Abtastmikroskop unter Verwendung des Piezo-Stellantriebes. Expired - Fee Related DE69015406T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8873189 1989-04-07

Publications (2)

Publication Number Publication Date
DE69015406D1 DE69015406D1 (de) 1995-02-09
DE69015406T2 true DE69015406T2 (de) 1995-08-03

Family

ID=13951063

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69015406T Expired - Fee Related DE69015406T2 (de) 1989-04-07 1990-04-06 Vorrichtung zur Erfassung von Mikroverschiebungen, Piezo-Stellantrieb unter Verwendung der Vorrichtung und Abtastmikroskop unter Verwendung des Piezo-Stellantriebes.

Country Status (4)

Country Link
US (1) US4987303A (de)
EP (1) EP0391429B1 (de)
JP (1) JPH0348102A (de)
DE (1) DE69015406T2 (de)

Families Citing this family (30)

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Publication number Priority date Publication date Assignee Title
EP0646913B1 (de) * 1987-08-25 1999-01-13 Canon Kabushiki Kaisha Tunnelstromkodierer
JP2834173B2 (ja) * 1989-02-17 1998-12-09 株式会社日立製作所 走査型トンネル音響顕微鏡
JPH04263142A (ja) * 1990-02-08 1992-09-18 Canon Inc プローブユニット、これを用いた情報処理装置及び情報処理方法
US5092163A (en) * 1990-06-27 1992-03-03 Young Russell D Precision small scale force sensor
JP2945090B2 (ja) * 1990-07-09 1999-09-06 キヤノン株式会社 エンコーダ
US5193383A (en) * 1990-07-11 1993-03-16 The United States Of America As Represented By The Secretary Of The Navy Mechanical and surface force nanoprobe
JPH0758193B2 (ja) * 1990-09-14 1995-06-21 三菱電機株式会社 原子間力顕微鏡の微動走査機構
US5193384A (en) * 1990-09-26 1993-03-16 The Charles Stark Draper Laboratory, Inc. Edge detecting system and method
US5186041A (en) * 1990-11-28 1993-02-16 International Business Machines Corporation Microprobe-based CD measurement tool
US5103094A (en) * 1991-05-02 1992-04-07 Wyko Corporation Compact temperature-compensated tube-type scanning probe with large scan range
US5173605A (en) * 1991-05-02 1992-12-22 Wyko Corporation Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control
US5319960A (en) * 1992-03-06 1994-06-14 Topometrix Scanning force microscope
US5179499A (en) * 1992-04-14 1993-01-12 Cornell Research Foundation, Inc. Multi-dimensional precision micro-actuator
US5394757A (en) * 1992-06-25 1995-03-07 Thiokol Corporation Multiple stylus probe attachment and methods
US5260572A (en) * 1992-08-13 1993-11-09 Wyko Corporation Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning
JPH07140503A (ja) * 1993-11-16 1995-06-02 Hitachi Ltd 微小変位発生装置
US5481189A (en) * 1994-02-07 1996-01-02 The United States Of America As Represented By The Secretary Of The Navy Electron tunneling magnetic field sensor with constant tunneling current maintained between tunneling tip and rotatable magnet
US5723981A (en) * 1994-08-29 1998-03-03 Imec Vzw Method for measuring the electrical potential in a semiconductor element
US6091248A (en) * 1994-08-29 2000-07-18 Imec Vzw Method for measuring the electrical potential in a semiconductor element
US5550483A (en) * 1994-11-18 1996-08-27 International Business Machines High speed test probe positioning system
US5773824A (en) * 1997-04-23 1998-06-30 International Business Machines Corporation Method for improving measurement accuracy using active lateral scanning control of a probe
US5801381A (en) * 1997-05-21 1998-09-01 International Business Machines Corporation Method for protecting a probe tip using active lateral scanning control
DE19923462C1 (de) * 1999-04-20 2000-11-16 Physik Instr Pi Gmbh & Co Positioniervorrichtung
JP2003092061A (ja) * 2001-09-17 2003-03-28 Canon Inc 電圧印加装置、電子源の製造装置及び製造方法
US7180662B2 (en) * 2004-04-12 2007-02-20 Applied Scientific Instrumentation Inc. Stage assembly and method for optical microscope including Z-axis stage and piezoelectric actuator for rectilinear translation of Z stage
US7111504B2 (en) * 2004-09-30 2006-09-26 Lucent Technologies Inc. Atomic force microscope
US8544324B2 (en) * 2007-08-24 2013-10-01 Pilsne Research Co., L.L.C. Quantum tunnelling sensor device and method
US9068952B2 (en) * 2009-09-02 2015-06-30 Kla-Tencor Corporation Method and apparatus for producing and measuring dynamically focussed, steered, and shaped oblique laser illumination for spinning wafer inspection system
WO2013148204A1 (en) * 2012-03-27 2013-10-03 Syed Amanulla Syed Asif Microscope objective mechanical testing instrument
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2715830A (en) * 1952-07-12 1955-08-23 Gen Motors Corp Specimen for calibrating surface roughness measuring apparatus
US4560924A (en) * 1983-07-22 1985-12-24 Magnetic Peripherals Inc. Flatness measuring apparatus
US4724318A (en) * 1985-11-26 1988-02-09 International Business Machines Corporation Atomic force microscope and method for imaging surfaces with atomic resolution
US4798989A (en) * 1986-09-26 1989-01-17 Research Development Corporation Scanning tunneling microscope installed in electron microscope
JPS63304103A (ja) * 1987-06-05 1988-12-12 Hitachi Ltd 走査表面顕微鏡
EP0309236B1 (de) * 1987-09-24 1994-07-06 Canon Kabushiki Kaisha Mikrosonde, deren Herstellung und elektronisches Gerät, das diese Mikrosonde gebraucht

Also Published As

Publication number Publication date
DE69015406D1 (de) 1995-02-09
US4987303A (en) 1991-01-22
EP0391429A3 (de) 1992-07-01
EP0391429A2 (de) 1990-10-10
JPH0348102A (ja) 1991-03-01
EP0391429B1 (de) 1994-12-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee