DE69013792T2 - Lichtwellentestsatz für ein Analysatorsystem mit einem RF-Netzwerk. - Google Patents
Lichtwellentestsatz für ein Analysatorsystem mit einem RF-Netzwerk.Info
- Publication number
- DE69013792T2 DE69013792T2 DE69013792T DE69013792T DE69013792T2 DE 69013792 T2 DE69013792 T2 DE 69013792T2 DE 69013792 T DE69013792 T DE 69013792T DE 69013792 T DE69013792 T DE 69013792T DE 69013792 T2 DE69013792 T2 DE 69013792T2
- Authority
- DE
- Germany
- Prior art keywords
- network
- test set
- analyzer system
- lightwave test
- lightwave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/391,337 US5028131A (en) | 1989-08-08 | 1989-08-08 | Lightwave test set for an RF network analyzer system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69013792D1 DE69013792D1 (de) | 1994-12-08 |
DE69013792T2 true DE69013792T2 (de) | 1995-05-18 |
Family
ID=23546201
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69013792T Expired - Fee Related DE69013792T2 (de) | 1989-08-08 | 1990-07-25 | Lichtwellentestsatz für ein Analysatorsystem mit einem RF-Netzwerk. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5028131A (de) |
EP (1) | EP0412357B1 (de) |
JP (1) | JPH0377043A (de) |
DE (1) | DE69013792T2 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5177630A (en) * | 1990-12-14 | 1993-01-05 | Westinghouse Electric Corp. | Method and apparatus for generating and transferring high speed data for high speed testing applications |
US5546325A (en) * | 1993-02-04 | 1996-08-13 | International Business Machines Corporation | Automated system, and corresponding method, for testing electro-optic modules |
US5535038A (en) * | 1994-06-17 | 1996-07-09 | Hinch; Stephen W. | Apparatus and method for determining extinction ratio of digital laser transmitters |
US5548538A (en) * | 1994-12-07 | 1996-08-20 | Wiltron Company | Internal automatic calibrator for vector network analyzers |
US5530367A (en) * | 1995-01-06 | 1996-06-25 | Fluke Corporaton | Pulse based cable attenuation measurement system |
US5818731A (en) * | 1995-08-29 | 1998-10-06 | Mittal; Gauri S. | Method and apparatus for measuring quality of frying/cooking oil/fat |
EP0926479B1 (de) | 1998-07-15 | 2001-10-10 | Agilent Technologies, Inc. (a Delaware corporation) | Messung optischer Verluste |
JP2009047690A (ja) * | 2007-08-14 | 2009-03-05 | Agilent Technol Inc | 異なるパスを選択するスイッチを備える、被試験デバイスを試験する試験デバイス |
US8508237B2 (en) * | 2007-12-20 | 2013-08-13 | Agilent Technologies, Inc. | Network analyzer calibrator having electrical and electrooptical components |
US7777497B2 (en) * | 2008-01-17 | 2010-08-17 | Com Dev International Ltd. | Method and system for tracking scattering parameter test system calibration |
JP5624021B2 (ja) | 2008-04-11 | 2014-11-12 | バード テクノロジーズ グループ インコーポレイテッド | 伝送装置電力モニタ |
JP2015124798A (ja) * | 2013-12-25 | 2015-07-06 | 三菱自動車工業株式会社 | 開閉弁 |
CN105606890B (zh) * | 2015-11-04 | 2018-05-25 | 中国电子科技集团公司第四十一研究所 | 一种光波元件频率响应特性参数测量装置 |
CN111735537B (zh) * | 2020-06-23 | 2022-05-03 | 电子科技大学 | 便携式开口谐振环加载贴片光敏电阻的光功率检测装置 |
CN112557363B (zh) * | 2020-12-07 | 2022-05-31 | 山西大学 | 一种基于飞秒激光调制相位的单粒子快速识别方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4816767A (en) * | 1984-01-09 | 1989-03-28 | Hewlett-Packard Company | Vector network analyzer with integral processor |
US4680538A (en) * | 1985-01-15 | 1987-07-14 | Cornell Research Foundation, Inc. | Millimeter wave vector network analyzer |
US4875859A (en) * | 1988-01-13 | 1989-10-24 | Hewlett-Packard Company | Method and apparatus for guiding a user during setup of a signal measurement system |
-
1989
- 1989-08-08 US US07/391,337 patent/US5028131A/en not_active Expired - Fee Related
-
1990
- 1990-07-25 DE DE69013792T patent/DE69013792T2/de not_active Expired - Fee Related
- 1990-07-25 EP EP90114254A patent/EP0412357B1/de not_active Expired - Lifetime
- 1990-08-08 JP JP2211459A patent/JPH0377043A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0412357A3 (en) | 1992-01-08 |
DE69013792D1 (de) | 1994-12-08 |
US5028131A (en) | 1991-07-02 |
EP0412357B1 (de) | 1994-11-02 |
JPH0377043A (ja) | 1991-04-02 |
EP0412357A2 (de) | 1991-02-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |