DE69015714D1 - Verbindungs-Prüfsystem. - Google Patents
Verbindungs-Prüfsystem.Info
- Publication number
- DE69015714D1 DE69015714D1 DE69015714T DE69015714T DE69015714D1 DE 69015714 D1 DE69015714 D1 DE 69015714D1 DE 69015714 T DE69015714 T DE 69015714T DE 69015714 T DE69015714 T DE 69015714T DE 69015714 D1 DE69015714 D1 DE 69015714D1
- Authority
- DE
- Germany
- Prior art keywords
- test system
- connection test
- connection
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/368,438 US5043931A (en) | 1989-06-19 | 1989-06-19 | Wrap test system and method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69015714D1 true DE69015714D1 (de) | 1995-02-16 |
DE69015714T2 DE69015714T2 (de) | 1995-06-29 |
Family
ID=23451210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69015714T Expired - Fee Related DE69015714T2 (de) | 1989-06-19 | 1990-06-07 | Verbindungs-Prüfsystem. |
Country Status (7)
Country | Link |
---|---|
US (1) | US5043931A (de) |
EP (1) | EP0407036B1 (de) |
JP (1) | JPH0726991B2 (de) |
AR (1) | AR246626A1 (de) |
BR (1) | BR9002866A (de) |
DE (1) | DE69015714T2 (de) |
PE (1) | PE13291A1 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0787193A (ja) * | 1993-09-09 | 1995-03-31 | Fujitsu Ltd | 加入者系試験方法 |
US5787114A (en) * | 1996-01-17 | 1998-07-28 | Lsi Logic Corporation | Loop-back test system and method |
US5781544A (en) * | 1996-01-17 | 1998-07-14 | Lsi Logic Corporation | Method for interleaving network traffic over serial lines |
US5956370A (en) * | 1996-01-17 | 1999-09-21 | Lsi Logic Corporation | Wrap-back test system and method |
US5781038A (en) * | 1996-02-05 | 1998-07-14 | Lsi Logic Corporation | High speed phase locked loop test method and means |
US5790563A (en) * | 1996-02-05 | 1998-08-04 | Lsi Logic Corp. | Self test of core with unpredictable latency |
US5896426A (en) * | 1996-02-05 | 1999-04-20 | Lsi Logic Corporation | Programmable synchronization character |
JP2003085122A (ja) * | 2001-09-13 | 2003-03-20 | Nec Corp | コンピュータシステムおよびスイッチコネクタ |
KR100607196B1 (ko) * | 2004-07-05 | 2006-08-01 | 삼성전자주식회사 | 반도체 메모리 장치 및 이 장치의 테스트 방법 |
WO2008076100A1 (en) * | 2006-12-18 | 2008-06-26 | Thomson Licensing | Self-testing device component |
US7596651B2 (en) * | 2007-05-29 | 2009-09-29 | International Business Machines Corporation | Multi-character adapter card |
JP5137689B2 (ja) * | 2008-05-26 | 2013-02-06 | キヤノン株式会社 | 画像形成装置 |
US9251346B2 (en) * | 2013-02-27 | 2016-02-02 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Preventing propagation of hardware viruses in a computing system |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3692966A (en) * | 1970-07-22 | 1972-09-19 | Cooke Eng Co The | Multi-circuit patch plug and jack |
US3816813A (en) * | 1972-01-24 | 1974-06-11 | Spacetac Inc | Automatic converter tester |
US4256936A (en) * | 1976-01-19 | 1981-03-17 | Dynatech Laboratories, Inc. | Electrical jack and patch cord assemblies |
US4266292A (en) * | 1978-11-20 | 1981-05-05 | Wescom Switching, Inc. | Method and apparatus for testing analog-to-digital and digital-to-analog code converters |
US4277831A (en) * | 1979-05-18 | 1981-07-07 | Honeywell Information Systems Inc. | Computer aided wire wrap operator check system |
DE3015139A1 (de) * | 1980-04-19 | 1981-10-22 | Ackermann Albert Gmbh Co | Funktionssteckverbinder |
US4583075A (en) * | 1980-11-07 | 1986-04-15 | Fairchild Camera And Instrument Corporation | Method and apparatus for analyzing an analog-to-digital converter with a nonideal digital-to-analog converter |
US4335373A (en) * | 1980-11-07 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for analyzing a digital-to-analog converter with a nonideal analog-to-digital converter |
US4419656A (en) * | 1980-11-07 | 1983-12-06 | Fairchild Camera & Instrument Corp. | Method and apparatus for digital converter testing |
US4514806A (en) * | 1982-09-30 | 1985-04-30 | Honeywell Information Systems Inc. | High speed link controller wraparound test logic |
US4548447A (en) * | 1984-04-05 | 1985-10-22 | Magnetic Controls Company | Electrical jack |
US4593270A (en) * | 1984-06-19 | 1986-06-03 | Burr-Brown Corporation | Successive approximation analog to digital converter |
US4677581A (en) * | 1985-05-30 | 1987-06-30 | Allied Corporation | Multichannel, self-calibrating, analog input/output apparatus for generating and measuring DC stimuli |
US4688234A (en) * | 1985-06-21 | 1987-08-18 | Robinton Products, Inc. | Apparatus and method for producing a signal-to-noise ratio figure of merit for digitally encoded-data |
US4758781A (en) * | 1985-12-06 | 1988-07-19 | Hitachi, Ltd. | DA converter testing system |
DE8708764U1 (de) * | 1987-06-24 | 1987-10-01 | Buntenbach, Helmut, 5067 Kuerten, De | |
US4812752A (en) * | 1987-10-19 | 1989-03-14 | Allied-Signal Inc. | Open finder |
US4772948A (en) * | 1987-10-26 | 1988-09-20 | Tektronix, Inc. | Method of low cost self-test in a video display system system |
US4780755A (en) * | 1987-10-26 | 1988-10-25 | Tektronix, Inc. | Frame buffer self-test |
-
1989
- 1989-06-19 US US07/368,438 patent/US5043931A/en not_active Expired - Fee Related
-
1990
- 1990-06-07 DE DE69015714T patent/DE69015714T2/de not_active Expired - Fee Related
- 1990-06-07 EP EP90306209A patent/EP0407036B1/de not_active Expired - Lifetime
- 1990-06-13 AR AR90317102A patent/AR246626A1/es active
- 1990-06-18 PE PE1990170883A patent/PE13291A1/es unknown
- 1990-06-18 BR BR909002866A patent/BR9002866A/pt unknown
- 1990-06-19 JP JP2158855A patent/JPH0726991B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
PE13291A1 (es) | 1991-04-11 |
JPH0331770A (ja) | 1991-02-12 |
BR9002866A (pt) | 1991-08-20 |
AR246626A1 (es) | 1994-08-31 |
EP0407036A2 (de) | 1991-01-09 |
EP0407036A3 (en) | 1992-03-04 |
JPH0726991B2 (ja) | 1995-03-29 |
US5043931A (en) | 1991-08-27 |
EP0407036B1 (de) | 1995-01-04 |
DE69015714T2 (de) | 1995-06-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |