US4875859A

US4875859A - Method and apparatus for guiding a user during setup of a signal measurement system

Info

Publication number: US4875859A
Application number: US07/143,775
Authority: US
Inventors: Roger W. Wong; Hugo Vifian; Michael G. Hart
Original assignee: Hewlett Packard Co
Current assignee: Agilent Technologies Inc
Priority date: 1988-01-13
Filing date: 1988-01-13
Publication date: 1989-10-24
Anticipated expiration: 2008-01-13
Also published as: EP0324600A1; JPH01214772A

Abstract

A signal measurement system with softkey menus for guiding a user in selecting a desired test setup, including selection and connection of the device to be tested, as well as selecting calibration measurement and test measurement for the device. In response to a given softkey selection, the signal measurement system prompts the user with a set of displayed textual instructions and pictorial diagrams via a user interface to step the user through setup, calibration, and measurement processes. Preferably, a signal processing unit (or analyzer) included in the signal measurement system incorporates the user interface in firmware to guide and aid the user in connecting the device to be tested to the signal measurement system for the desired test, and leading the user through calibration and measurement processes. The analyzer preferably displays the softkey menus, instructional text displays, and pictorial block diagram displays on a cathode ray tube included in the analyzer to guide the user. The displaying of sequential user instructions and diagrams facilitates proper configuration of connections for calibration of the signal measurement system, as well as connections for measurements of the characteristics of devices to be tested.

Description

BACKGROUND OF THE INVENTION

This invention relates to electronic test instruments and, more particularly, to electronic instrumentation for signal measurement. Specifically, the invention is directed to aiding a user to set up electronic test instruments for performing various signal measurements.

An exemplary use of the invention is i the field of optical and electrical measurements in connection with fiber optic systems. With higher bit rates and wider-band modulations becoming prevalent in fiber optic systems, the designers and manufacturers of these systems and associated components need to be able to characterize performance more thoroughly and more precisely than ha been the case with lower transmission bandwidths. Many new fiber optic systems now operate at speeds of 500 MBPS and higher, which are equivalent to RF and low microwave frequencies. In addition, even though optical fiber cable is correctly classified as a low-loss medium, a fiber optic system can, in fact, have significant losses that must be identified if they are to be minimized. Accordingly, the measurements performed to characterize such a system have proliferated.

Various lightwave component test systems have been developed to meet these measurement needs. However, the complexities of configuring, calibrating, and operating these test systems for performing the desired test measurements have dramatically escalated. This has required periodic retraining of personnel, increased test setup time, and resulted in errors due to improper test setup, calibration, and/or operation by the user.

SUMMARY OF THE INVENTION

One embodiment of the present invention provides a method and apparatus for guiding a user during setup of a signal measurement system, such as a lightwave component measurement system for characterizing performance of fiber optic systems and associated components. System guidance of the-user in accordance with the invention facilitates measuring the modulation response of elements used in conjunction with fiber optic systems. These include not only the optical and electrical components, but also electro-optical (E/O) and opto-electrical (O/E) converters; i.e., the transmitters and receivers.

The preferred embodiment of the invention provides a user of the signal measurement system with softkey menus for selecting a desired test setup, including measurement selection and connection of the device to be tested, as well as selecting calibration measurement and test measurement for the device. In response to a given softkey selection, the signal measurement system prompts the user with a set of displayed textual instructions and pictorial diagrams via a user interface to step the user through setup, calibration, and measurement processes. Preferably, a signal processing unit (or analyzer) included in the signal measurement system incorporates the user interface in firmware to guide and aid the user in connecting the device to be tested to the signal measurement system for the desired test, and leading the user through calibration and measurement processes. The analyzer preferably displays the softkey menus, instructional text displays, and pictorial block diagram displays to guide the user on a cathode ray tube included in the analyzer. The displaying of sequential user instructions and diagrams facilitates proper configuration of connections for calibration of the signal measurement system, as well as connections for measurements of the characteristics of devices to be tested.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other features of the invention and the concomitant advantages will be better understood and appreciated by persons skilled in the field to which the invention pertains in view of the following description given in conjunction with the accompanying drawings. In the drawings:

FIG. 1 is a block diagram of a signal measurement system incorporating guidance of the user in accordance with one embodiment of the invention;

FIG. 2, comprising FIGS. 2A-2TT, illustrates displays provided by the signal measurement system shown in FIG. 1 for guiding the user through the steps for setup of the signal measurement system, including aiding the user in calibration and measurement processes;

FIG. 3 is a general flow diagram of the user guidance method in accordance with one embodiment of the invention;

FIG. 4 is a detailed flowchart for selecting a measurement type in accordance with the flow diagram shown in FIG. 3;

FIG. 5 is a detailed flowchart for designating a device type in accordance with the flow diagram shown in FIG. 3;

FIG. 6 is a detailed flowchart for displaying a measurement configuration in accordance with the flow diagram shown in FIG. 3;

FIG. 7 is a detailed flowchart for setting sweep start and stop values in accordance with the flow diagram shown in FIG. 3;

FIG. 8 is a detailed flowchart for setting stimulus parameters in accordance with the flow diagram shown in FIG. 3;

FIG. 9 is a detailed flowchart for selecting a calibration type and defining standards in accordance with the flow diagram shown in FIG. 3;

FIG. 10 is a detailed flowchart for performing a calibration in accordance with the flow diagram shown in FIG. 3; and

FIG. 11 is a detailed flowchart for measuring a device under test (DUT) in accordance with the flow diagram shown in FIG. 3.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 shows an exemplary signal measurement system in the form of a lightwave component measurement system, generally indicated by the numeral 10. Its principal elements are a lightwave component analyzer 12, a lightwave source 14, and a lightwave receiver 16. All of the elements of the lightwave component measurement system 10, including the lightwave source 14 and the receiver 16, are extensively characterized to achieve high levels of precision in lightwave measurements. FIG. 1 also shows a device under test (DUT), for example, a spool of optical fiber cable, connected to the lightwave component measurement system 10.

The lightwave component analyzer 12 preferably comprises essentially a 3 GHz vector network analyzer, for example, an HP 8753 vector network analyzer available from Hewlett-Packard Company, Network Measurements Division, Santa Rosa, Calif., specifically tailored for lightwave measurements. It provides 300 kHz to 3 GHz test signals used to modulate either a single-mode or multi-mode lightwave source 14 preferably operating at 1300 nm.

The electro-optical characteristics of the lightwave source 14 and the lightwave receiver 16 in a test setup have to be sensitive, stable, and repeatable. Also, their modulation bandwidths need to be wider than that of the DUT.

The lightwave source 14 provides a modulation signal source which preferably generates a high-stability, 1 Hz-resolution synthesized signal that can be swept from 300 kHz to 3 GHz. The intensity-modulated light signal from the lightwave source 14 is then applied to the DUT.

The lightwave receiver 16 demodulates the modulated light signal for processing in the lightwave component analyzer 12. The transmission and reflection characteristics of the DUT are then displayed, preferably on a cathode ray tube (CRT) 18 included in the lightwave component analyzer 12, either as a function of the RF modulation frequency or as a function of RF power or distance.

The lightwave receiver 16 is a high-stability, high-resolution precision receiver with 100 dB dynamic range which allows measurements over a wide dynamic range and enables the lightwave component measurement system 10 to operate with an optical sensitivity of -40 dBm. The lightwave receiver 16 operates with both singe-mode and multi-mode optical fiber cables. Its optical detector is preferably a PIN photodiode. The lightwave receiver 16 has a modulation bandwidth that preferably extends to 3 GHz, with ±4 dB flatness to 2 GHz, rolling off to -14 dB at 3 GHz. Minimum detectable optical signal (for modulations up to 2 GHz) is -40 dBm, and the typical optical dynamic range exceeds 40 dB. The 3 GHz modulation bandwidths of the lightwave source 14 and the lightwave receiver 16 provide ample margin for typical tests.

The lightwave component measurement system 10 is operable to perform various measurements. Although the present invention is not directed to these measurements per se, a general understanding of various types of measurements that can be performed will aid an understanding of the operation of guiding the user in accordance with the invention.

Typical optical components are optical fiber cable, modulators, and passive devices, such as switches, splitters, combiners, and attenuators. The input and output signals for testing these devices are light, and the key parameters measured are attenuation versus modulation frequency, modulation bandwidth, delay, modal pulse dispersion, electrical length, and location of discontinuities. For optical components (such as optical fiber cables, couplers, and connectors), the lightwave component measurement system 10 can measure such parameters as optical insertion loss, optical reflections, modulation bandwidth, pulse dispersion, and fiber length. In addition, multiple reflections can be resolved in time and distance with very high resolution.

The modulation transfer characteristics of electro-optical transmitters (E/O) and opto-electrical receivers (O/E) can also be measured. For example, the responsivity of a PIN diode or laser diode can be measured, not only at one modulation frequency, but also as a function of modulation frequency from 300 kHz to 3 GHz. Additionally, modulated input power can be swept up to 25 dB to characterize the sensitivity or compression point of a source or receiver or determine it's optimum operating condition.

Representative E/O devices are optical modulators and sources (such as laser diodes and LEDs). Examples of O/E devices are PIN or avalanche photodiode detectors in optical receivers. The key parameters for these devices are the same for both types, except that the independent and dependent variables are reversed; e.g., for E/O devices, optical power out is measured as a function of electrical (RF) drive, whereas RF power out as a function of optical drive is measured for 0/E devices. When the lightwave component measurement system 10 is used to characterize an E/O or O/E device, the initial calibration reference is established because both the lightwave source 14 and the lightwave receiver 16 are known. The DUT then is measured when it replaces its calibrated counterpart in the measurement setup. Typical measurements for these devices are sensitivity (including the compression point and the noise threshold/floor), as well as responsivity versus power or modulating frequency.

The RF (or electrical) elements of the fiber optic system under test can also be characterized using the lightwave component measurement system 10. Examples of RF devices are amplifiers, filters, and cables used in a fiber optic system. The RF measurements include bandwidth, insertion loss/gain, phase, group delay, and complex impedance.

Electrical measurements can be performed on such RF components as amplifiers, filters, and optical fiber cables, or a complete fiber optic repeater (comprising an optical transmitter, optical fiber cable, and optical receiver). Typical measurements include loss/gain versus modulation frequency or power level, modulation bandwidth, modulation phase shift or phase delay, distortion (e.g., group delay or deviation from linear phase), complex impedance (magnitude and phase), and electrical length (including discontinuity location).

In accordance with the invention, the lightwave component measurement system 10 incorporates guidance of the user to provide operating ease. Firmware resident in memory in the lightwave component measurement system 10 generates displays to provide for guided measurement setups which allow even first-time users to configure the lightwave component measurement system for various types of tests. Displayed textual instructions and graphics lead the user through such measurements as transmission versus frequency, reflection versus frequency, and transmission versus power. There also are menus for formatting, scaling, and plotting measurements.

In accordance with the invention, the signal processing unit (or lightwave component analyzer 12) included in the lightwave component measurement system 10 incorporates in firmware a set of encoded softkey menus, instructional text displays, and pictorial block diagram displays which guide and aid the user while connecting the DUT for a desired test, as well as during the calibration and measurement processes. Code for generating user selections, instructions, and diagrams is embedded as a portion of the instrument mainframe firmware. Hence, the invention provides a user interface where text and graphics are combined and programmed into the firmware of the lightwave component analyzer 12 to allow the user greater ease in setting up and executing the calibration and measurement processes associated with the test protocol.

Considered in more detail, the lightwave component analyzer 12 has programmed into it read only memory (ROM) firmware a combination of text and graphics which are displayed to make the lightwave component measurement system 10 easy to operate and use. The text and graphics show the user how to set up the lightwave component measurement system 10 states and basic measurements easily and quickly. This feature is hereafter referred to as "guided setup."

Guided setup is an instrument user interface feature to assist a user in quickly and easily connecting the DUT for a desired test and making a calibration or measurement. Guided setup is implemented as a series of softkey menus, textual displays, and pictorial displays which guide the user in configuring the lightwave component measurement system 10 and setting basic instrument parameters in order to perform a specified test measurement.

The user is guided through the guided setup procedure by depressing softkeys. A set of softkey labels (softkey menu) is presented on the display of the lightwave component analyzer 12 by the firmware for each step in the guided setup series. Instructions for each menu are also preferably presented on the display of the lightwave component analyzer 12. Once a measurement is performed, the user is also preferably presented with choices for formatting and displaying the measurement, as well as storing the instrument state resulting from the guided setup.

FIG. 2 illustrates various screens that are presented to the user in accordance with the invention. Also shown in FIG. 2 is the flow of the user interface which enhances the ease of use of the lightwave component measurement system 10. FIG. 2 actually depicts various guided measurement CRT displays generated by the lightwave component analyzer 12.

As shown in FIG. 2A, the analyzer 12 displays a softkey menu when the analyzer is turned on. Two softkey selections are available, namely, "GUIDED SETUP" and "NORMAL OPERATION." The user depresses the "NORMAL OPERATION" softkey to have access to all of the features of the lightwave component measurement system 10 in any sequence desired by the user. Conversely, the user depresses the "GUIDED SETUP" softkey for help if he or she wishes to check the connections for the test setup and/or to be led through a series of steps for setting basic parameters for operation of the lightwave component measurement system 10.

When the "GUIDED SETUP" softkey is depressed, the analyzer 12 enters a guided setup mode by calling guided setup routines stored in the ROM of the analyzer. FIG. 3 is a generalized flow diagram of the guided setup method in accordance with one embodiment of the invention.

Considered in more detail, FIGS. 4-11 are flowcharts of the guided setup method in accordance with the invention. The following pages contain a copy of the firmware code. The numerals shown in FIGS. 4-11 are implemented by the correspondingly numbered lines of code which appear on the following pages. ##SPC1## ##SPC2## ##SPC3## ##SPC4## ##SPC5##

As shown in FIG. 3, when the "GUIDED SETUP" softkey is depressed, the guided setup mode begins by directing the user to select the type of measurement desired, as indicated by the numeral 100. The analyzer 12 directs the user to select the type of measurement desired by calling and executing a select measurement type subroutine 100, as shown in more detail in FIG. 4.

The select measurement type subroutine 100 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 102. These softkey labels can be "BANDWIDTH," "REFLECTION," and "GAIN COMPRESS'N," as shown in FIG. 2B. "CONTINUE" and "NORMAL OPERATION" softkeys are also preferably displayed in order to enable the user to proceed with the guided setup mode or exit to normal operation, respectively.

Also, the analyzer 12 displays a block diagram of each of the measurement choices, as indicated by the numeral 104 shown in FIG. 4. Representative block diagrams for bandwidth, reflection, and gain compression measurements are shown in FIG. 2B.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 106 shown in FIG. 4. For example, the instruction in connection with selecting the measurement type can be "SELECT TYPE OF MEASUREMENT," as shown in FIG. 2B.

Preferably, the analyzer 12 is given a predetermined set of default conditions, including a measurement type default condition. Accordingly, when the select measurement type subroutine 100 is executed, the analyzer 12 preferably defaults to the bandwidth measurement, and draws a box around the diagram of this measurement type, as indicated by the numeral 108, to show the default measurement.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 110, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 112. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 114.

On the other hand, if the user has depressed a softkey, as indicated by the step 110, the analyzer 12 determines whether or not the user has depressed a measurement selection softkey, as indicated by the numeral 116. If so, the analyzer 12 draws a box around the diagram of the selected measurement type, as indicated by the step 108.

If the user has depressed a softkey other than a measurement selection softkey, the analyzer 12 determines whether or not to continue with the guided setup mode, as indicated by the numeral 118. On the one hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 118, the analyzer 12 calls a select device type subroutine, as indicated by the numeral 120.

On the other hand, if the user depresses the "NORMAL OPERATION" softkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 126. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 124, and await depression of an allowed softkey.

If the user completes the select measurement type subroutine 100 by depressing the "CONTINUE" softkey after selecting a measurement type, as indicated by the step 118 shown in FIG. 4, the analyzer 12 directs the user to designate the type of device under test by calling and executing the select device type subroutine 200, as indicated by the numeral 200 shown in FIG. 3. The select device type subroutine 200 is shown in more detail in FIG. 5.

The select device type subroutine 200 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 202. These softkey labels can be "O/O," "O/E," "E/O," "E/E," "1-PORT OPTICAL," and "1-PORT ELECTRICAL," as shown in FIGS. 2C and 2D. "CONTINUE" and "PRIOR MENU" softkeys are also preferably displayed in order to enable the user to proceed with the guided setup mode or return to the previous menu for the select measurement type subroutine 100, respectively.

Also, the analyzer 12 displays a block diagram of each of the device type choices, as indicated by the numeral 204 shown in FIG. 5. Representative block diagrams for O/O, O/E, E/O, E/E, one-port optical, and one-port electrical devices are shown in FIGS. 2C and 2D.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 206 shown in FIG. 5. For example, the instruction in connection with selecting the device type can be "SELECT TYPE OF DEVICE UNDER TEST," as shown in FIGS. 2C and 2D.

Preferably, the analyzer 12 is given a predetermined set of default conditions, including a device type default condition. Accordingly, when the select device type subroutine 200 is executed, the analyzer 12 preferably defaults to an O/O type device measurement, and draws a box around the diagram of the O/O device type, as indicated by the numeral 208, to show the default device type.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 210, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 212. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 214.

On the other hand, if the user has depressed a softkey, as indicated by the step 210, the analyzer 12 determines whether or not the user has depressed a device type selection softkey, as indicated by the numeral 216. If so, the analyzer 12 draws a box around the diagram of selected device type, as indicated by the step 208.

If the user has depressed a softkey other than a device type selection softkey, the analyzer 12 determines whether or not to continue with the guided setup mode, as indicated by the numeral 218. On the one hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 218, the analyzer 12 calls a display measurement configuration subroutine, as indicated by the numeral 220.

On the other hand, if the user depresses the "PRIOR MENU" softkey, the analyzer 12 recalls the select measurement type subroutine 100, as indicated by the numeral 226. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 224, and await depression of an allowed softkey.

If the user completes the select device type subroutine 200 by depressing the "CONTINUE" softkey after selecting a device type, as indicated by the step 218 shown in FIG. 5, the analyzer 12 directs the user to make various optical and/or electrical connections for performing the selected measurement on the specified DUT by calling and executing the display measurement configuration subroutine 300, as indicated by the numeral 300 shown in FIG. 3. The display measurement configuration subroutine 300 is shown in more detail in FIG. 6.

The display measurement configuration subroutine 300 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 302. "CONTINUE" and "PRIOR MENU" softkeys are preferably displayed in order to enable the user to proceed with the guided setup mode or return to the previous menu for the select device type subroutine 200, respectively.

Also, the analyzer 12 displays a block diagram of the optical and/or electrical connections to effect the selected measurement for the specified device type, as indicated by the numeral 304 shown in FIG. 6. Representative block diagrams for the respective selectable measurements for the various device types appear in FIGS. 2E-2P.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 306 shown in FIG. 6. For example, the instruction in conjunction with exhibiting the connections for performing a selected measurement on a specified device type can be "CONFIGURE MEASUREMENT AS SHOWN BELOW" and "MAKE NECESSARY DC CONNECTIONS," as shown in FIGS. 2E-2P.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 308, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 310. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 312.

On the other hand, if the user has depressed a softkey, as indicated by the step 308, the analyzer 12 determines whether or not the user has depressed the "CONTINUE" softkey, as indicated by the numeral 314. On the one hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 314, the analyzer 12 calls and automatically executes a preset parameters subroutine, as indicated by the numeral 322, and then calls a set sweep start and stop subroutine, as indicated by the numeral 324.

On the other hand, if the user depresses the "PRIOR MENU" softkey, the analyzer 12 recalls the select device type subroutine 200, as indicated by the numeral 318. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 320, and await depression of an allowed softkey.

The preset parameters subroutine called and executed at the step 322 shown in FIG. 6 enters various default values for the parameters associated with the selected measurement on the specified device type. These are the parametric values used by the analyzer 12 during actual testing, unless the user intervenes.

When the user depresses the "CONTINUE" softkey, as indicated by the step 314 shown in FIG. 6, the analyzer 12 calls the set sweep start and stop subroutine 400, as indicated by the numeral 400 shown in FIG. 3. The set sweep start and stop subroutine 400 is shown in more detail in FIG. 7.

The set sweep start and stop subroutine 400 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 402. These softkey labels can be "START" and "STOP," as shown in FIG. 2Q for O/O, O/E, E/O, and one-port optical swept frequency type measurements and FIG. 2R for E/E and one-port electrical swept frequency type measurements, or "START POWER" and "STOP POWER," as shown in FIG. 2S for swept power type measurements. "CONTINUE" and "PRIOR MENU" softkeys are also preferably displayed in order to enable the user to proceed with the guided setup mode or return to the previous menu for the display measurement configuration subroutine 300, respectively.

Representative screens displayed at the beginning of the set sweep start and stop subroutine 400 appear in FIGS. 2Q-2S. The analyzer 12 then sweeps and takes data using the respective default values for the sweep start and stop parameters, as indicated by the numeral 404 shown in FIG. 7, and displays the data trace and graticule, as indicated by the numeral 406.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 408 shown in FIG. 7. For example, the instruction in connection with selecting the sweep start and stop parameters can be "SET RF MODULATION START FREQUENCY AND STOP FREQUENCY," as shown in FIG. 2Q; "SET RF START FREQUENCY AND STOP FREQUENCY," as shown in FIG. 2R; or "SET START POWER AND STOP POWER" and "POWER AT R, A, B INPUTS MUST BE LESS THAN 0 dBm," as shown in FIG. 2S.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 410, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 412. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 414.

On the other hand, if the user has depressed a softkey, as indicated by the step 410, the analyzer 12 determines whether or not the user has depressed the "START" or "STOP" softkey, or the "START POWER" or "STOP POWER" softkey, as the case may be, as indicated by the numeral 416. If so, the analyzer 12 enables the user to enter a substitute sweep start and/or stop parametric value, and displays the entered value(s), as indicated by the numeral 418.

If the user has depressed a softkey other than the "START" or "STOP" softkey, or the "START POWER" or "STOP POWER" softkey, as the case may be, the analyzer 12 determines whether or not to continue with the guided setup mode, as indicated by the numeral 420. On the one hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 420, the analyzer 12 calls a set stimulus parameters subroutine, as indicated by the numeral 428.

On the other hand, if the user depresses the "PRIOR MENU" softkey, the analyzer 12 recalls the display measurement configuration subroutine 300, as indicated by the numeral 424. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 426, and await depression of an allowed softkey.

When the user depresses the "CONTINUE" softkey, as indicated by the step 420 shown in FIG. 7, the analyzer 12 calls the set stimulus parameters subroutine 500, as indicated by the numeral 500 shown in FIG. 3. The set stimulus parameters subroutine 500 is shown in more detail in FIG. 8.

The set stimulus parameters subroutine 500 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 502. These softkey labels can be "SWEEP TIME," "SOURCE POWER," and "SWEEP TYPE," as shown in FIG. 2T for swept frequency type measurements. Depression of the "SWEEP TYPE" softkey provides an additional softkey menu, as shown in FIG. 2U, which includes "LIN FREQ" and "LOG FREQ" softkeys. In the case of swept power type measurements, the softkey labels can alternatively be "SWEEP TIME" and "CW FREQUENCY," as shown in FIG. 2V. "CONTINUE" and "PRIOR MENU" softkeys are also preferably displayed in order to enable the user to proceed with the guided setup mode or return to the previous menu for the set sweep start and stop subroutine 400, respectively.

Representative screens displayed at the beginning of the set stimulus parameters subroutine appear in FIGS. 2T-2V. The analyzer 12 then sweeps and takes data using the respective default values for the stimulus parameters, as indicated by the numeral 504 shown in FIG. 8, and displays the data trace and graticule, as indicated by the numeral 506.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 508 shown in FIG. 8. For example, the instruction in connection with selecting the sweep time can be "SET SWEEP TIME," as shown in FIGS. 2T and 2V. Other instructions displayed in connection with directing the user to set the remaining stimulus parameters appear in FIGS. 2T-2V.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 510, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 512. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 514.

On the other hand, if the user has depressed a softkey, as indicated by the step 510, the analyzer 12 determines whether or not the user has depressed one of the stimulus parameter softkeys, as indicated by the numeral 516. If so, the analyzer 12 enables the user to enter a substitute stimulus parametric value, and displays the entered value(s), as indicated by the numeral 518.

If the user has depressed a softkey other than one of the stimulus parameter softkeys, the analyzer 12 determines whether or not to continue with the guided setup mode, as indicated by the numeral 520. On the one hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 520, the analyzer 12 calls a select calibration type and define standards subroutine, as indicated by the numeral 528.

On the other hand, if the user depresses the "PRIOR MENU" softkey, the analyzer 12 recalls the set sweep start and stop subroutine 400, as indicated by the numeral 524. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 526, and await depression of an allowed softkey.

When the user depresses the "CONTINUE" softkey, as indicated by the step 520 shown in FIG. 8, the analyzer 12 calls the set calibration type and define standards subroutine 600, as indicated by the numeral 600 shown in FIG. 3. The set calibration type and define standards subroutine 600 is shown in more detail in FIG. 9.

The set calibration type and define standards subroutine 600 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 602. In the case of O/O, E/E, one-port optical, and one-port electrical devices, these softkey labels can be "CAL TYPE: NONE," "RESPONSE," and "CAL KIT," as shown in FIG. 2W. In the case of O/E and E/O devices, the softkey labels can alternatively be "CAL TYPE: NONE," "RESPONSE," and "CAL STD," as shown in FIG. 2X. If a previous calibration has been performed, an additional "DONE: RESPONSE" softkey appears, as shown in FIG. 2X. Depression of the "CAL KIT" softkey shown in FIG. 2W, or the "CAL STD" softkey shown in FIG. 2X, provides an additional softkey menu, as shown in one of the FIGS. 2Y-2II. The particular softkey menu that is displayed is automatically determined by the analyzer 12 based on the selected type of measurement and the type of DUT. The softkey menus shown in FIGS. 2Y-2II enable selection and/or definition of a calibration standard. The softkey menu shown in FIG. 2Y enables selection of a calibration standard for an O/O device. The softkey menus shown in FIGS. 2Z-2CC enable selection and definition of a calibration standard for an O/E device. The softkey menus shown in FIGS. 2DD-2GG enable selection and definition of a calibration standard for an E/O device. The softkey menu shown in FIG. 2HH enables selection of a calibration standard for an E/E device, and a similar softkey menu enables selection of a calibration standard for a one-port electrical device. Finally, the softkey menu shown in FIG. 2II enables selection and definition of a calibration standard for a one-port optical device. "CONTINUE" and "PRIOR MENU" softkeys are also preferably displayed in order to enable the user to proceed with the guided setup mode or return to the previous menu for the set stimulus parameters subroutine 500, respectively.

Representative screens displayed at the beginning of the select calibration type and define standards subroutine appear in FIGS. 2W-2II. The analyzer 12 then sweeps and takes data using no calibration, as indicated by the numeral 604 shown in FIG. 9, and displays the data trace and graticule, as indicated by the numeral 606.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 608 shown in FIG. 9. For example, the instructions in connection with selecting the calibration type and defining standards can include "SELECT CALIBRATION TYPE," as shown in FIGS. 2W and 2X. Other instructions displayed in connection with directing the user to select and define calibration standards appear in Figs. 2W-2II.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 610, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 612. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 614.

On the other hand, if the user has depressed a softkey, as indicated by the step 610, the analyzer 12 determines whether or not the user has depressed one of the calibration selection or definition softkeys, as indicated by the numeral 616. If so, the analyzer 12 sets the calibration type or standard definition, as indicated by the numeral 618.

If the user has depressed a softkey other than one of the calibration selection or definition softkeys, the analyzer 12 determines whether or not to continue with the guided setup mode, as indicated by the numeral 620. On the one hand, if the user depresses the "DONE: RESPONSE" softkey, as indicated by the numeral 634, the analyzer 12 calls a measure device subroutine and proceeds directly to test the DUT, as indicated by the numeral 632. On the other hand, if the user depresses the "CONTINUE" softkey, as indicated by the step 620, the analyzer 12 determines whether or not the user has depressed the "CAL TYPE: NONE" softkey, as indicated by the numeral 628. On the one hand, if a specified calibration has been requested, as indicated by the numeral 616, the analyzer 12 calls a perform calibration subroutine, as indicated by the numeral 630. On the other hand, if no calibration has been requested, the analyzer 12 calls the measure device subroutine and proceeds directly to test the DUT, as indicated by the numeral 632.

If, however, the user has depressed the "PRIOR MENU" softkey, as indicated by the numeral 622, the analyzer 12 recalls the set stimulus parameters subroutine 500, as indicated by the numeral 624. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 626, and await depression of an allowed softkey.

If the user has requested that a calibration be performed, when the user depresses the "CONTINUE" softkey, as indicated by the step 620 shown in FIG. 9, the analyzer 12 calls the perform calibration subroutine 700, as indicated by the numeral 700 shown in FIG. 3. The perform calibration subroutine 700 is shown in more detail in FIG. 10.

The perform calibration subroutine 700 causes the analyzer 12 to display a new softkey menu and labels the softkeys, as indicated by the numeral 702. In the case of a transmission type measurement, these softkey labels can be "THRU" plus "DONE: RESPONSE," as shown in FIG. 2JJ; "RECEIVER" plus "DONE: RESPONSE," as shown in FIG. 2KK; or "SOURCE" plus "DONE: RESPONSE," as shown in FIG. 2LL. In the case of a reflection type measurement, the softkey labels can be "REFLECTOR" and "FRESNEL" plus "DONE: RESPONSE," as shown in FIG. 2MM; or "SHORT" and "OPEN" plus "DONE: RESPONSE," as shown in FIG. 2NN. The softkey menu for an E/E device is similar to the one for the O/O device shown in FIG. 2JJ. The particular softkey menu that is displayed is automatically determined by the analyzer 12 based on the selected type of measurement, as well as the type of DUT. The softkey menus for a transmission type measurement and a reflection type measurement for each type of device, except an E/E device, are shown in FIGS. 2JJ-2NN, the softkey menu for an E/E device being similar to the one for an O/O device. A "PRIOR MENU" softkey is also preferably displayed in order to enable the user to return to the previous menu for the select calibration type and define standards subroutine 600.

Representative screens displayed at the beginning of the perform calibration subroutine appear in FIGS. 2JJ-2NN. The analyzer 12 then sweeps and takes data using calibration values, if any, as indicated by the numeral 704 shown in FIG. 10, and displays the data trace and graticule, as indicated by the numeral 706.

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 708 shown in FIG. 10. The various instructions in connection with performing a calibration include "REMOVE DEVICE UNDER TEST," as shown in FIGS. 2JJ-2LL. Other instructions displayed in connection with directing the user to perform a calibration appear in FIGS. 2JJ-2NN.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 710, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 712. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 714.

On the other hand, if the user has selected a calibration standard, as indicated by the numeral 716, the analyzer 12 measures the standard, as indicated by the numeral 718. If the user has not selected a calibration standard, as indicated by the step 716, the analyzer 12 determines whether or not the user has depressed the "DONE: RESPONSE" softkey, as indicated by the numeral 720.

If the user has depressed the "DONE: RESPONSE" softkey, as indicated by the step 720, the analyzer 12 determines whether or not the calibration standard has been measured, as indicated by the numeral 728. If not, the analyzer 12 awaits measurement of the calibration standard, as indicated by the step 718. If the calibration standard has been measured, as indicated by the step 728, the analyzer accesses error correction values based on the measured calibration standard, as indicated by the numeral 730, and calls a measure device subroutine, as indicated by the numeral 732.

On the other hand, if the user has depressed the "PRIOR MENU" softkey, as indicated by the numeral 722, the analyzer 12 recalls the select calibration type and define standards subroutine 600, as indicated by the numeral 724. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 726, and await depression of an allowed softkey.

If the user has decided to directly measure the DUT, as indicated by the step 632 shown in FIG. 9, or after a calibration has been performed, as indicated by the step 718 shown in FIG. 10, the analyzer 12 calls the measure device subroutine 800, as indicated by the numeral 800 shown in FIG. 3. The measure device subroutine 800 is shown in more detail in FIG. 11.

The measure device subroutine 800 causes the analyzer 12 to display softkey menu and labels the softkeys, as indicated by the numeral 802. These softkey labels can be "FORMAT," "SCALE REF," "COPY," and "SAVE," as shown in FIGS. 200 and 2PP. Depression of the "FORMAT," "SCALE REF," "COPY," or "SAVE" softkey shown in FIGS. 200 and 2PP provides an additional softkey menu, as shown in FIGS. 2QQ-2TT. The particular softkey menu that is displayed is automatically determined by the analyzer Depression of the "FORMAT" softkey shown in FIGS. 2OO and 2PP provides an additional softkey menu, as shown in FIG. 2QQ, which enables the user to tailor the data display based on selection of a desired format. Depression of the "SCALE REF" softkey shown in Figs. 2OO and 2PP. provides an additional softkey menu, as shown in FIG. 2RR, which enables the user to tailor the data display based on selection of a scale setting. Depression of the "COPY" softkey shown in FIGS. 2OO and 2PP provides an additional softkey menu, as shown in FIG. 2SS, which enables the user to print and plot data. Finally, depression of the "SAVE" softkey shown in Figs. 2OO and 2PP provides an additional softkey menu, as shown in FIG. 2TT, which enables the user to save setup parameters in a file resident in the memory of the analyzer 12. "GUIDED SETUP," "NORMAL OPERATION," and "PRIOR MENU" softkeys are also preferably displayed in order to enable the user to recall the select measurement type subroutine 100, exit the guided setup mode and return to normal operation, or return to the previous menu for the select calibration type and define standards subroutine 600, respectively.

Representative screens displayed at the beginning of the measure device subroutine appear in FIGS. 2OO and 2PP. The analyzer 12 then sweeps and takes data using calibration values, if any, as indicated by the numeral 804 shown in FIG. 11, and displays the data trace and graticule, indicated by the numeral 806

The analyzer 12 additionally displays textual instructions to the user, as indicated by the numeral 808 shown in FIG. 11. For example, the instructions in connection with measuring the DUT can be "RECONNECT TEST DEVICE," as shown in FIG. 2PP. Other instructions displayed in connection with directing the user to perform a measurement of the characteristics of the DUT appear in FIGS. 200 and 2PP.

The analyzer 12 determines whether or not a softkey is depressed, as indicated by the numeral 810, or, alternatively, whether or not a hardkey is depressed, as indicated by the numeral 812. On the one hand, if the user has depressed a hardkey, the analyzer 12 exits the guided setup mode and proceeds to normal operation, as indicated by the numeral 814.

On the other hand, if the user has depressed a formatting, scaling, copying, or saving softkey, as indicated by the step 816, the analyzer 12 sets the appropriate data display factors or data handling and output functions, as indicated by the numeral 818. The analyzer 12 next determines whether or not the user has depressed the "GUIDED SETUP" softkey, as indicated by the numeral 820.

If the user depresses the "GUIDED SETUP" softkey, as indicated by the step 820, the analyzer 12 calls the select measurement type subroutine 100, as indicated by the numeral 828. On the other hand, if the user depresses the "PRIOR MENU" softkey, as indicated by the numeral 822, the analyzer 12 recalls the select calibration type and define standards subroutine 600, as indicated by the numeral 824. Any softkey actuation other than a specifically mentioned one causes the analyzer 12 to inform the user that an invalid key has been depressed, as indicated by the numeral 826, and await depression of an allowed softkey.

The foregoing description is offered primarily for purposes of illustration. It will be readily apparent to those skilled in the art that numerous modifications and variations not mentioned above can still be made without departing from the spirit and scope of the invention as claimed below.

Claims

What is claimed is:

1. A method for guiding a user during initiation of a measurement on a device by a signal measurement system, comprising the steps of:

providing a device physically connectable to the signal measurement system; and

providing signal measurement system guided assistance to a user of the signal measurement system for at least one measurement, including instructions to the user for selecting the at least one measurement and instructing the user how to physically connect the device to the signal measurement system for performing the selected measurement.

2. The method of claim 1, further comprising the steps of providing a menu of selectable measurements, responding to a given menu selection by the user, and prompting the user with a set of displayed textural instructions and pictorial diagrams via a user interface to step the user through setup and measurement processes.

3. The method of claim 2, further comprising the step of displaying softkey menus, instructional text displays, and pictorial block diagram displays to guide the user on a cathode ray tube incorporated in signal processing means included in the signal measurement system.

4. The method of claim 1 wherein a signal processing means included in the signal measurement system incorporates firmware to guide and aid the user in physically connecting the device to the signal measurement system for the selected measurement, and leading the user through setup and measurement processes.

5. The method of claim 1, further comprising the step of providing the user of the signal measurement system with a menu for selecting calibration measurement for the device.

6. The method of claim 1, further comprising the step of providing the user of the signal measurement system with a menu for selecting a type of device to be measured.

7. The method of claim 1 wherein the signal measurement system is a lightwave component measurement system for characterizing performance of fiber optic systems and associated components.

8. The method of claim 1, further comprising the steps of:

providing means actuable by the user for selecting normal operation of the signal measurement system and, alternatively, for selecting guided assistance to the user for performing a measurement; and

activating the signal measurement system guided assistance in response to user selection of guided assistance.

9. The method of claim 1, further comprising the step of providing signal measurement system guided assistance for setting stimulus parameters for the measurement dependent upon the selected measurement to be performed.

10. The method of claim 1, further comprising the steps of:

providing a menu of a plurality of selectable measurements;

responding to selection by the user of a measurement for displaying how to physically connect the device only for the selected measurement;

displaying available calibration standards applicable only to the selected measurement;

responding to selection by the user of a calibration standard and physical connection of a calibration device for preforming a calibration to provide error correction factors; and

performing a measurement on a device substituted for the calibration device, the measurement incorporating the error correction factors.

11. In a method of operation of a signal measurement system, the improvement comprising the additional steps of:

providing at least one device physically connectable to the signal measurement system; and

displaying sequential user instructions and diagrams to facilitate proper configuration of physical connections for calibration of the signal measurement system, as well as physical connections for measurements of the characteristics of the device.

12. A signal measurement system incorporating guidance of a user during initiation of a measurement on a device physically connectable to the signal measurement system, comprising:

means for providing signal measurement system guided assistance to the user of the signal measurement system for at least one measurement, including instructions to the user for selecting the at least one measurement and instructing the user how to physically connect the device to the signal measurement system for performing the selected measurement.

13. The signal measurement system of claim 12, further comprising means for selecting a measurement type.

14. The signal measurement system of claim 12, further comprising means for selecting a device type.

15. The signal measurement system of claim 12, further comprising means for displaying a measurement configuration.

16. The signal measurement system of claim 12, further comprising means for setting sweep start and stop values.

17. The signal measurement system of claim 12, further comprising means for setting stimulus parameters.

18. The signal measurement system of claim 12, further comprising means for selecting a calibration type and defining standards.

19. The signal measurement system of claim 12, further comprising means for performing a calibration.

20. The signal measurement system of claim 12, further comprising means for measurement a device under test.