DE69010280D1 - Verfahren zur Inspektion einer Düse zur Herstellung einer Wabenstruktur. - Google Patents

Verfahren zur Inspektion einer Düse zur Herstellung einer Wabenstruktur.

Info

Publication number
DE69010280D1
DE69010280D1 DE69010280T DE69010280T DE69010280D1 DE 69010280 D1 DE69010280 D1 DE 69010280D1 DE 69010280 T DE69010280 T DE 69010280T DE 69010280 T DE69010280 T DE 69010280T DE 69010280 D1 DE69010280 D1 DE 69010280D1
Authority
DE
Germany
Prior art keywords
inspecting
nozzle
manufacturing
honeycomb structure
honeycomb
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69010280T
Other languages
English (en)
Other versions
DE69010280T2 (de
Inventor
Mitsuaki Watanabe
Masayoshi Nakane
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Publication of DE69010280D1 publication Critical patent/DE69010280D1/de
Application granted granted Critical
Publication of DE69010280T2 publication Critical patent/DE69010280T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/1768—Method using an image detector and processing of image signal using photographic film

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Press-Shaping Or Shaping Using Conveyers (AREA)
DE69010280T 1989-03-01 1990-02-27 Verfahren zur Inspektion einer Düse zur Herstellung einer Wabenstruktur. Expired - Lifetime DE69010280T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1049598A JPH0612253B2 (ja) 1989-03-01 1989-03-01 ハニカム成形用口金の検査方法

Publications (2)

Publication Number Publication Date
DE69010280D1 true DE69010280D1 (de) 1994-08-04
DE69010280T2 DE69010280T2 (de) 1995-01-19

Family

ID=12835667

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69010280T Expired - Lifetime DE69010280T2 (de) 1989-03-01 1990-02-27 Verfahren zur Inspektion einer Düse zur Herstellung einer Wabenstruktur.

Country Status (4)

Country Link
US (1) US4988887A (de)
EP (1) EP0400777B1 (de)
JP (1) JPH0612253B2 (de)
DE (1) DE69010280T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07113523B2 (ja) * 1990-06-19 1995-12-06 日本碍子株式会社 ハニカムの表面粗度測定法及びそれに用いる表面粗度測定用測定子
US5463462A (en) * 1993-03-31 1995-10-31 Ngk Insulators, Ltd. Method of and apparatus for inspecting honeycomb-shaped object having plural through holes
DE19648272A1 (de) * 1996-11-21 1998-05-28 Emitec Emissionstechnologie Verfahren und Vorrichtung zur Bestimmung einer Zelldichte eines Wabenkörpers, insbesondere für einen Abgaskatalysator
US7701570B2 (en) * 2005-12-12 2010-04-20 Corning Incorporated Collimated light method and system for detecting defects in honeycombs
JP2008139184A (ja) * 2006-12-04 2008-06-19 Denso Corp 微小間隙溝保有物体の検査方法及びその物体の修正方法
JP7206234B2 (ja) * 2020-03-30 2023-01-17 日本碍子株式会社 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置
CN116642829A (zh) * 2023-07-26 2023-08-25 合肥金星智控科技股份有限公司 一种钢管端面检测装置及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3264481A (en) * 1963-07-12 1966-08-02 Fmc Corp Method and apparatus for inspecting spinnerets
JPS52114717A (en) * 1976-03-19 1977-09-26 Asahi Chem Ind Co Ltd Spinneret holders equipped with spinneret inspection device
US4145714A (en) * 1978-02-27 1979-03-20 Robert W. MacDonald Television flaw detector for inspecting the wall surface of a hole through a circuit board
JPS58117440A (ja) * 1982-01-05 1983-07-13 Nec Corp プリント回路板のスル−ホ−ル自動検査装置
US4560273A (en) * 1982-11-30 1985-12-24 Fujitsu Limited Method and apparatus for inspecting plated through holes in printed circuit boards
US4707132A (en) * 1985-08-05 1987-11-17 Dutton G Wayne Process for sensing defects on a smooth cylindrical interior surface in tubing
JP2522666B2 (ja) * 1987-03-10 1996-08-07 日本セメント株式会社 アルミナ・シリカ系焼結体の製造方法
US4806774A (en) * 1987-06-08 1989-02-21 Insystems, Inc. Inspection system for array of microcircuit dies having redundant circuit patterns

Also Published As

Publication number Publication date
EP0400777A2 (de) 1990-12-05
DE69010280T2 (de) 1995-01-19
JPH02228513A (ja) 1990-09-11
JPH0612253B2 (ja) 1994-02-16
EP0400777B1 (de) 1994-06-29
US4988887A (en) 1991-01-29
EP0400777A3 (de) 1991-09-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition