DE69001386D1 - Hochempfindliches positionsmess-verfahren. - Google Patents
Hochempfindliches positionsmess-verfahren.Info
- Publication number
- DE69001386D1 DE69001386D1 DE9090108417T DE69001386T DE69001386D1 DE 69001386 D1 DE69001386 D1 DE 69001386D1 DE 9090108417 T DE9090108417 T DE 9090108417T DE 69001386 T DE69001386 T DE 69001386T DE 69001386 D1 DE69001386 D1 DE 69001386D1
- Authority
- DE
- Germany
- Prior art keywords
- measurement method
- position measurement
- highly sensitive
- sensitive position
- highly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000691 measurement method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/02—Monitoring the movement or position of the probe by optical means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Light Guides In General And Applications Therefor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/352,804 US5017010A (en) | 1989-05-16 | 1989-05-16 | High sensitivity position sensor and method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69001386D1 true DE69001386D1 (de) | 1993-05-27 |
DE69001386T2 DE69001386T2 (de) | 1993-10-28 |
Family
ID=23386561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE90108417T Expired - Fee Related DE69001386T2 (de) | 1989-05-16 | 1990-05-04 | Hochempfindliches Positionsmess-Verfahren. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5017010A (de) |
EP (1) | EP0398085B1 (de) |
JP (1) | JPH0663727B2 (de) |
DE (1) | DE69001386T2 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02187944A (ja) * | 1989-01-13 | 1990-07-24 | Sharp Corp | 再生装置 |
US5206702A (en) * | 1989-10-09 | 1993-04-27 | Olympus Optical Co., Ltd. | Technique for canceling the effect of external vibration on an atomic force microscope |
JP2679339B2 (ja) * | 1990-03-07 | 1997-11-19 | 松下電器産業株式会社 | 微小変位検出装置 |
JP2661314B2 (ja) * | 1990-03-07 | 1997-10-08 | 松下電器産業株式会社 | 形状測定装置及び形状測定方法 |
JP3000491B2 (ja) * | 1991-04-10 | 2000-01-17 | キヤノン株式会社 | カンチレバーユニット及びこれを用いた情報処理装置、原子間力顕微鏡、磁力顕微鏡 |
US5155361A (en) * | 1991-07-26 | 1992-10-13 | The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State University | Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
DE69309318T2 (de) * | 1992-01-10 | 1997-10-30 | Hitachi Ltd | Verfahren und Vorrichtung zum Beobachten einer Fläche |
US5280341A (en) * | 1992-02-27 | 1994-01-18 | International Business Machines Corporation | Feedback controlled differential fiber interferometer |
WO1993018525A1 (en) * | 1992-03-13 | 1993-09-16 | Park Scientific Instruments Corp. | Scanning probe microscope |
US5448399A (en) * | 1992-03-13 | 1995-09-05 | Park Scientific Instruments | Optical system for scanning microscope |
US5376790A (en) * | 1992-03-13 | 1994-12-27 | Park Scientific Instruments | Scanning probe microscope |
US5347854A (en) * | 1992-09-22 | 1994-09-20 | International Business Machines Corporation | Two dimensional profiling with a contact force atomic force microscope |
DE4310349C2 (de) * | 1993-03-30 | 2000-11-16 | Inst Mikrotechnik Mainz Gmbh | Sensorkopf und Verfahren zu seiner Herstellung |
US5440920A (en) * | 1994-02-03 | 1995-08-15 | Molecular Imaging Systems | Scanning force microscope with beam tracking lens |
US5866805A (en) * | 1994-05-19 | 1999-02-02 | Molecular Imaging Corporation Arizona Board Of Regents | Cantilevers for a magnetically driven atomic force microscope |
US5753814A (en) * | 1994-05-19 | 1998-05-19 | Molecular Imaging Corporation | Magnetically-oscillated probe microscope for operation in liquids |
US5515719A (en) * | 1994-05-19 | 1996-05-14 | Molecular Imaging Corporation | Controlled force microscope for operation in liquids |
US5513518A (en) * | 1994-05-19 | 1996-05-07 | Molecular Imaging Corporation | Magnetic modulation of force sensor for AC detection in an atomic force microscope |
WO1996028837A1 (en) * | 1995-03-10 | 1996-09-19 | Molecular Imaging Corporation | Hybrid control system for scanning probe microscopes |
US5825020A (en) * | 1996-09-06 | 1998-10-20 | The Regents Of The University Of California | Atomic force microscope for generating a small incident beam spot |
US5997735A (en) * | 1997-07-17 | 1999-12-07 | Gorton; Stuart Albert | Septic tank with downstream trickling filter |
US7551288B1 (en) * | 1997-10-28 | 2009-06-23 | Rockwell Automation Technologies, Inc. | System for monitoring bearing wear |
DE19825210C2 (de) * | 1998-04-23 | 2003-09-25 | Gsg Elektronik Gmbh | Schaltungsanordnung zur dynamischen Ansteuerung von keramischen Festkörperaktoren |
US6312166B1 (en) | 1998-11-25 | 2001-11-06 | Nuvonyx, Inc. | Laser diode arrays and systems including structures for permitting optical power measurement therefrom |
US6882429B1 (en) | 1999-07-20 | 2005-04-19 | California Institute Of Technology | Transverse optical fiber devices for optical sensing |
US6496265B1 (en) * | 2000-02-16 | 2002-12-17 | Airak, Inc. | Fiber optic sensors and methods therefor |
WO2001067122A2 (en) | 2000-03-09 | 2001-09-13 | The Johns Hopkins University | Force detected magnetic field gradiometer |
JP3874358B2 (ja) | 2002-08-14 | 2007-01-31 | スイスプローブ アーゲー | 片持ち梁および光共振器を備えたセンサ |
US20050018199A1 (en) * | 2003-07-24 | 2005-01-27 | Leblanc Philip R. | Fiber array interferometer for inspecting glass sheets |
DE10342331A1 (de) * | 2003-09-11 | 2005-05-04 | Surface Imaging Systems S I S | Verfahren sowie Messvorrichtung zum Messen der Positionsänderung eines beweglichen Messcantilevers |
EP1963816B1 (de) * | 2005-11-28 | 2017-05-17 | Vereniging voor Christelijk Hoger Onderwijs, Wetenschappelijk Onderzoek en Patiëntenzorg | Optische vorrichtung, einen biegebalken enthaltend, und deren herstellungsverfahren und anwendung |
JP2009216638A (ja) * | 2008-03-12 | 2009-09-24 | Nec Corp | 微小変位測定装置とその測定方法 |
GB2464151B (en) * | 2008-10-07 | 2012-09-26 | Gravitec Instr Ltd | Gradiometer for measuring gravitational and magnetic field gradients with improved sensor |
WO2010086798A1 (en) * | 2009-01-27 | 2010-08-05 | Insiava (Pty) Limited | Microchip-based moems and waveguide device |
WO2011038423A2 (en) * | 2009-06-15 | 2011-03-31 | Tshwane University Of Technology | Cmos moems sensor device |
US20160097183A1 (en) * | 2014-10-06 | 2016-04-07 | Caterpillar Inc. | System and method for monitoring position of machine implement |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4652744A (en) * | 1982-04-14 | 1987-03-24 | The Board Of Trustees Of The Leland Stanford Junior University | Fiber optic sensor for detecting very small displacements of a surface |
US4572670A (en) * | 1982-10-25 | 1986-02-25 | Rockwell International Corporation | Interferometric piezoelectric change of state monitor |
DE3311809A1 (de) * | 1983-03-31 | 1984-10-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Interferometrisches, eichbares fabry-perot-sensorsystem mit doppelbrechendem monomode-lichtwellenleiter |
JPS61219803A (ja) * | 1985-03-27 | 1986-09-30 | Nippon Kogaku Kk <Nikon> | 物理量測定装置 |
US4724318A (en) * | 1985-11-26 | 1988-02-09 | International Business Machines Corporation | Atomic force microscope and method for imaging surfaces with atomic resolution |
FR2613065B1 (fr) * | 1987-03-24 | 1991-07-26 | Electricite De France | Interferometre de michelson a fibres optiques et son application notamment a la mesure des temperatures |
-
1989
- 1989-05-16 US US07/352,804 patent/US5017010A/en not_active Expired - Fee Related
-
1990
- 1990-05-04 EP EP90108417A patent/EP0398085B1/de not_active Expired - Lifetime
- 1990-05-04 DE DE90108417T patent/DE69001386T2/de not_active Expired - Fee Related
- 1990-05-14 JP JP2121399A patent/JPH0663727B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69001386T2 (de) | 1993-10-28 |
JPH03191805A (ja) | 1991-08-21 |
EP0398085A1 (de) | 1990-11-22 |
US5017010A (en) | 1991-05-21 |
JPH0663727B2 (ja) | 1994-08-22 |
EP0398085B1 (de) | 1993-04-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |