DE68923301D1 - Halbleiteranordnung mit einer dünnen isolierenden Schicht. - Google Patents
Halbleiteranordnung mit einer dünnen isolierenden Schicht.Info
- Publication number
- DE68923301D1 DE68923301D1 DE68923301T DE68923301T DE68923301D1 DE 68923301 D1 DE68923301 D1 DE 68923301D1 DE 68923301 T DE68923301 T DE 68923301T DE 68923301 T DE68923301 T DE 68923301T DE 68923301 D1 DE68923301 D1 DE 68923301D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor device
- insulating layer
- thin insulating
- thin
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53271—Conductive materials containing semiconductor material, e.g. polysilicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4916—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a silicon layer, e.g. polysilicon doped with boron, phosphorus or nitrogen
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
- H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3434688 | 1988-02-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE68923301D1 true DE68923301D1 (de) | 1995-08-10 |
Family
ID=12411576
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68923301T Expired - Lifetime DE68923301D1 (de) | 1988-02-17 | 1989-02-17 | Halbleiteranordnung mit einer dünnen isolierenden Schicht. |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0329569B1 (de) |
DE (1) | DE68923301D1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR960006880B1 (ko) * | 1990-05-24 | 1996-05-23 | 가부시키가이샤 도시바 | 반도체 기억장치 |
KR950008385B1 (ko) * | 1990-05-24 | 1995-07-28 | 삼성전자주식회사 | 반도체 소자의 워드라인 형성방법 |
JP2951082B2 (ja) * | 1991-10-24 | 1999-09-20 | 株式会社東芝 | 半導体記憶装置およびその製造方法 |
JPH07240390A (ja) * | 1994-02-28 | 1995-09-12 | Fujitsu Ltd | 半導体装置の製造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3728590A (en) * | 1971-04-21 | 1973-04-17 | Fairchild Camera Instr Co | Charge coupled devices with continuous resistor electrode |
US3897282A (en) * | 1972-10-17 | 1975-07-29 | Northern Electric Co | Method of forming silicon gate device structures with two or more gate levels |
US4222816A (en) * | 1978-12-26 | 1980-09-16 | International Business Machines Corporation | Method for reducing parasitic capacitance in integrated circuit structures |
-
1989
- 1989-02-17 DE DE68923301T patent/DE68923301D1/de not_active Expired - Lifetime
- 1989-02-17 EP EP89400463A patent/EP0329569B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0329569A3 (en) | 1990-07-11 |
EP0329569B1 (de) | 1995-07-05 |
EP0329569A2 (de) | 1989-08-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |