DE60332837D1 - Streifenmusterdiskriminator für einen interferometer mit streifendem einfall - Google Patents

Streifenmusterdiskriminator für einen interferometer mit streifendem einfall

Info

Publication number
DE60332837D1
DE60332837D1 DE60332837T DE60332837T DE60332837D1 DE 60332837 D1 DE60332837 D1 DE 60332837D1 DE 60332837 T DE60332837 T DE 60332837T DE 60332837 T DE60332837 T DE 60332837T DE 60332837 D1 DE60332837 D1 DE 60332837D1
Authority
DE
Germany
Prior art keywords
interferometer
strip pattern
pattern discriminator
striking
striking insertion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60332837T
Other languages
English (en)
Inventor
Christopher A Lee
Mark J Tronolone
Andrew W Kulawiec
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Corning Tropel Corp
Original Assignee
Corning Tropel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Tropel Corp filed Critical Corning Tropel Corp
Application granted granted Critical
Publication of DE60332837D1 publication Critical patent/DE60332837D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02022—Interferometers characterised by the beam path configuration contacting one object by grazing incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02025—Interference between three or more discrete surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02032—Interferometers characterised by the beam path configuration generating a spatial carrier frequency, e.g. by creating lateral or angular offset between reference and object beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE60332837T 2002-08-06 2003-07-28 Streifenmusterdiskriminator für einen interferometer mit streifendem einfall Expired - Lifetime DE60332837D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/213,608 US6757067B2 (en) 2002-08-06 2002-08-06 Fringe pattern discriminator for grazing incidence interferometer
PCT/US2003/023664 WO2004013565A2 (en) 2002-08-06 2003-07-28 Fringe pattern discriminator for grazing incidence interferometer

Publications (1)

Publication Number Publication Date
DE60332837D1 true DE60332837D1 (de) 2010-07-15

Family

ID=31494487

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60332837T Expired - Lifetime DE60332837D1 (de) 2002-08-06 2003-07-28 Streifenmusterdiskriminator für einen interferometer mit streifendem einfall

Country Status (8)

Country Link
US (1) US6757067B2 (de)
EP (1) EP1527317B1 (de)
JP (1) JP4181119B2 (de)
KR (1) KR100950351B1 (de)
CN (1) CN100523717C (de)
AU (1) AU2003254246A1 (de)
DE (1) DE60332837D1 (de)
WO (1) WO2004013565A2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005049317A (ja) * 2003-07-31 2005-02-24 Nidek Co Ltd 干渉計
JP5130513B2 (ja) * 2006-03-10 2013-01-30 国立大学法人 和歌山大学 ３次元変位ひずみ計測方法及び装置
FR2929402B1 (fr) * 2008-03-31 2012-07-13 Univ Troyes Technologie Spectrometre compact a echantillonage bidimensionnel.
JP5713545B2 (ja) * 2009-08-05 2015-05-07 株式会社ミツトヨ 斜入射干渉計
US8743375B2 (en) 2012-06-26 2014-06-03 Shenzhen China Star Optoelectronics Technology Co., Ltd. Parallelism measuring system and method thereof
CN102749044B (zh) * 2012-06-26 2015-06-24 深圳市华星光电技术有限公司 平行度检测系统及其方法
FR2997181B1 (fr) * 2012-10-18 2014-12-12 Msc & Sgcc Installation pour mesurer l'epaisseur de la paroi de recipients
US9316484B2 (en) * 2012-10-31 2016-04-19 Thomas Patrick Ryan Fringe shift measurement system having an optical phase mask with phase-shifted first and second halves
US9651358B2 (en) * 2013-08-19 2017-05-16 Corning Incorporated Grazing-incidence interferometer with dual-side measurement capability using a common image plane
TWI486550B (zh) * 2014-01-20 2015-06-01 Nat Univ Tsing Hua 厚度線上即時檢測之光學干涉裝置及其方法
US9500468B2 (en) 2014-08-25 2016-11-22 Board Of Trustees Of Michigan State University Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures
TWI601938B (zh) 2016-06-28 2017-10-11 國立清華大學 即時檢測全場厚度的光學裝置
CN106198397B (zh) * 2016-08-16 2020-01-03 京东方科技集团股份有限公司 一种光电检测装置、方法和光刻胶涂覆设备
CN109458959B (zh) * 2018-12-24 2020-12-04 南京理工大学 一种变倾角相移掠入射干涉仪测量装置及方法
JP7349655B2 (ja) * 2019-05-28 2023-09-25 パナソニックＩｐマネジメント株式会社 投射装置
CN112378476B (zh) * 2020-11-17 2022-10-04 哈尔滨工业大学 大长径比卧式罐容积多站三维激光扫描内测装置及方法
CN113155164B (zh) * 2021-03-29 2022-12-20 广州大学 基于虚拟参考干涉的灵敏度放大方法、装置、设备及介质
CN113188485B (zh) * 2021-05-06 2022-06-21 苏州天准科技股份有限公司 一种多工位智能表面waviness量检测系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4325637A (en) * 1980-06-02 1982-04-20 Tropel, Inc. Phase modulation of grazing incidence interferometer
US5532821A (en) * 1995-03-16 1996-07-02 Tropel Corporation Testing of recessed surfaces at grazing incidence
US5724137A (en) * 1996-06-27 1998-03-03 Tropel Corporation Fringe pattern discriminator for interferometer using diffraction gratings
US5777738A (en) * 1997-03-17 1998-07-07 Tropel Corporation Interferometric measurement of absolute dimensions of cylindrical surfaces at grazing incidence
US5923425A (en) * 1997-11-20 1999-07-13 Tropel Corporation Grazing incidence interferometry for measuring transparent plane-parallel plates
DE10121516A1 (de) * 2001-05-03 2002-11-07 Michael Kuechel Vorrichtung und Verfahren zur Verminderung der Wirkungen kohärenter Bildfehler in einem Interferometer

Also Published As

Publication number Publication date
JP2005534923A (ja) 2005-11-17
JP4181119B2 (ja) 2008-11-12
CN1692269A (zh) 2005-11-02
EP1527317A4 (de) 2009-01-14
WO2004013565A2 (en) 2004-02-12
US20040027579A1 (en) 2004-02-12
AU2003254246A8 (en) 2004-02-23
US6757067B2 (en) 2004-06-29
KR20050044901A (ko) 2005-05-13
EP1527317A2 (de) 2005-05-04
AU2003254246A1 (en) 2004-02-23
KR100950351B1 (ko) 2010-03-29
WO2004013565A3 (en) 2004-04-29
EP1527317B1 (de) 2010-06-02
CN100523717C (zh) 2009-08-05

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