DE60316990D1 - LSI-Testanordnung und Testverfahren - Google Patents
LSI-Testanordnung und TestverfahrenInfo
- Publication number
- DE60316990D1 DE60316990D1 DE60316990T DE60316990T DE60316990D1 DE 60316990 D1 DE60316990 D1 DE 60316990D1 DE 60316990 T DE60316990 T DE 60316990T DE 60316990 T DE60316990 T DE 60316990T DE 60316990 D1 DE60316990 D1 DE 60316990D1
- Authority
- DE
- Germany
- Prior art keywords
- test
- lsi
- arrangement
- procedure
- test procedure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003034858A JP2003307543A (ja) | 2002-02-14 | 2003-02-13 | Lsi検査装置及び検査手法 |
JP2003034858 | 2003-02-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60316990D1 true DE60316990D1 (de) | 2007-11-29 |
DE60316990T2 DE60316990T2 (de) | 2008-02-07 |
Family
ID=32677602
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60309128T Expired - Lifetime DE60309128T2 (de) | 2003-02-13 | 2003-08-11 | LSI-Testanordnung |
DE60316990T Expired - Lifetime DE60316990T2 (de) | 2003-02-13 | 2003-08-11 | LSI-Testanordnung und Testverfahren |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60309128T Expired - Lifetime DE60309128T2 (de) | 2003-02-13 | 2003-08-11 | LSI-Testanordnung |
Country Status (4)
Country | Link |
---|---|
US (1) | US7251761B2 (de) |
EP (2) | EP1574868B1 (de) |
CN (1) | CN1320368C (de) |
DE (2) | DE60309128T2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60309128T2 (de) * | 2003-02-13 | 2007-02-01 | Matsushita Electric Industrial Co., Ltd., Kadoma | LSI-Testanordnung |
JP2005337740A (ja) * | 2004-05-24 | 2005-12-08 | Matsushita Electric Ind Co Ltd | 高速インターフェース回路検査モジュール、高速インターフェース回路検査対象モジュールおよび高速インターフェース回路検査方法 |
JP2006252006A (ja) * | 2005-03-09 | 2006-09-21 | Seiko Epson Corp | デバッグシステム、半導体集積回路装置、マイクロコンピュータ及び電子機器 |
WO2007113940A1 (ja) * | 2006-04-04 | 2007-10-11 | Panasonic Corporation | 半導体検査装置 |
JP2009198446A (ja) * | 2008-02-25 | 2009-09-03 | Nec Electronics Corp | 半導体装置及びそのテスト方法 |
TWI490691B (zh) * | 2008-08-29 | 2015-07-01 | Mstar Semiconductor Inc | 晶片測試裝置及其測試方法 |
CN102184130A (zh) * | 2010-11-24 | 2011-09-14 | 北京天融信科技有限公司 | 一种芯片流水线的测试方法和装置 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US99992A (en) * | 1870-02-15 | Improvement in motive-power apparatus | ||
US3733587A (en) * | 1971-05-10 | 1973-05-15 | Westinghouse Electric Corp | Universal buffer interface for computer controlled test systems |
JPS61204744A (ja) * | 1985-02-05 | 1986-09-10 | Hitachi Ltd | 診断機能を有するram内蔵lsiおよびその診断方法 |
US4760335A (en) * | 1985-07-30 | 1988-07-26 | Westinghouse Electric Corp. | Large scale integrated circuit test system |
JPS63315971A (ja) | 1987-06-19 | 1988-12-23 | Advantest Corp | Icテストシステム |
JPS643744A (en) * | 1987-06-26 | 1989-01-09 | Hitachi Ltd | Lsi test method |
CA2002344C (en) | 1989-03-29 | 2000-03-28 | John C. Eidson | Measurement system control using real-time clocks and data buffers |
JPH04155278A (ja) * | 1990-10-18 | 1992-05-28 | Nec Corp | Lsiテスタ |
US5416784A (en) * | 1991-10-28 | 1995-05-16 | Sequoia Semiconductor | Built-in self-test flip-flop with asynchronous input |
JPH07128405A (ja) | 1993-10-29 | 1995-05-19 | Hitachi Ltd | Lsiテストボード |
JPH0828405A (ja) * | 1994-07-12 | 1996-01-30 | Kubota Corp | 直接噴射式ディーゼルエンジン |
EP0886784B1 (de) | 1996-12-13 | 2005-04-06 | Koninklijke Philips Electronics N.V. | Integrierte schaltung mit einer ersten und zweiten taktdomäne und prüfvorrichtung für eine solche schaltung |
JP2953435B2 (ja) | 1997-06-09 | 1999-09-27 | 日本電気株式会社 | 遅延テスト方法および該遅延テスト方法に使用するフリップフロップ |
JP2000162277A (ja) * | 1998-11-25 | 2000-06-16 | Mitsubishi Electric Corp | 半導体集積回路 |
JP4204685B2 (ja) * | 1999-01-19 | 2009-01-07 | 株式会社ルネサステクノロジ | 同期型半導体記憶装置 |
US6324485B1 (en) * | 1999-01-26 | 2001-11-27 | Newmillennia Solutions, Inc. | Application specific automated test equipment system for testing integrated circuit devices in a native environment |
US6665816B1 (en) * | 1999-10-01 | 2003-12-16 | Stmicroelectronics Limited | Data shift register |
JP3434762B2 (ja) * | 1999-12-27 | 2003-08-11 | エヌイーシーマイクロシステム株式会社 | 半導体集積回路 |
TW580578B (en) * | 2000-10-03 | 2004-03-21 | Concord Idea Corp | System and method for testing integrated circuit devices |
JP2002196846A (ja) * | 2000-12-26 | 2002-07-12 | Mitsubishi Electric Corp | Lsiのリーク電流低減方法 |
US6782501B2 (en) * | 2001-01-23 | 2004-08-24 | Cadence Design Systems, Inc. | System for reducing test data volume in the testing of logic products |
JP3633881B2 (ja) | 2001-05-17 | 2005-03-30 | 松下電器産業株式会社 | 半導体装置及びそのacスペック検査方法 |
DE60309128T2 (de) * | 2003-02-13 | 2007-02-01 | Matsushita Electric Industrial Co., Ltd., Kadoma | LSI-Testanordnung |
-
2003
- 2003-08-11 DE DE60309128T patent/DE60309128T2/de not_active Expired - Lifetime
- 2003-08-11 EP EP05012906A patent/EP1574868B1/de not_active Expired - Fee Related
- 2003-08-11 DE DE60316990T patent/DE60316990T2/de not_active Expired - Lifetime
- 2003-08-11 EP EP03018260A patent/EP1447672B1/de not_active Expired - Fee Related
- 2003-08-11 US US10/637,663 patent/US7251761B2/en not_active Expired - Fee Related
- 2003-08-12 CN CNB031278574A patent/CN1320368C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1574868B1 (de) | 2007-10-17 |
DE60316990T2 (de) | 2008-02-07 |
DE60309128T2 (de) | 2007-02-01 |
EP1447672B1 (de) | 2006-10-18 |
DE60309128D1 (de) | 2006-11-30 |
US20040160237A1 (en) | 2004-08-19 |
US7251761B2 (en) | 2007-07-31 |
EP1574868A1 (de) | 2005-09-14 |
EP1447672A1 (de) | 2004-08-18 |
CN1320368C (zh) | 2007-06-06 |
CN1521512A (zh) | 2004-08-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: PANASONIC CORP., KADOMA, OSAKA, JP |