DE60301365D1 - Optischer Verschiebungsdetektor - Google Patents

Optischer Verschiebungsdetektor

Info

Publication number
DE60301365D1
DE60301365D1 DE60301365T DE60301365T DE60301365D1 DE 60301365 D1 DE60301365 D1 DE 60301365D1 DE 60301365 T DE60301365 T DE 60301365T DE 60301365 T DE60301365 T DE 60301365T DE 60301365 D1 DE60301365 D1 DE 60301365D1
Authority
DE
Germany
Prior art keywords
displacement detector
optical displacement
optical
detector
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60301365T
Other languages
English (en)
Other versions
DE60301365T2 (de
Inventor
Ko Ishizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE60301365D1 publication Critical patent/DE60301365D1/de
Application granted granted Critical
Publication of DE60301365T2 publication Critical patent/DE60301365T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G01D5/38—Forming the light into pulses by diffraction gratings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optical Transform (AREA)
DE60301365T 2002-04-12 2003-03-28 Optischer Verschiebungsdetektor Expired - Lifetime DE60301365T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002110564A JP3977126B2 (ja) 2002-04-12 2002-04-12 変位情報検出装置
JP2002110564 2002-04-12

Publications (2)

Publication Number Publication Date
DE60301365D1 true DE60301365D1 (de) 2005-09-29
DE60301365T2 DE60301365T2 (de) 2006-01-19

Family

ID=28449984

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60301365T Expired - Lifetime DE60301365T2 (de) 2002-04-12 2003-03-28 Optischer Verschiebungsdetektor

Country Status (6)

Country Link
US (1) US6958469B2 (de)
EP (1) EP1353153B1 (de)
JP (1) JP3977126B2 (de)
KR (1) KR100509322B1 (de)
CN (1) CN1181311C (de)
DE (1) DE60301365T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004212243A (ja) * 2003-01-06 2004-07-29 Canon Inc 格子干渉型光学式エンコーダ
US7397987B2 (en) * 2004-05-06 2008-07-08 California Institute Of Technology Resonantly enhanced grating coupler
US7332709B2 (en) * 2004-12-13 2008-02-19 Nikon Corporation Photoelectric encoder
CN100365390C (zh) * 2005-10-14 2008-01-30 清华大学 用于开关式数字位移传感器的计数器式栅格带
DE102006038992A1 (de) * 2006-08-21 2008-03-13 Carl Zeiss Smt Ag Anordnung aus zwei miteinander verbundenen Körpern
DE102008008873A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
JP2009236499A (ja) * 2008-03-25 2009-10-15 Keyence Corp 接触式変位計
JP5188229B2 (ja) * 2008-03-25 2013-04-24 株式会社キーエンス 接触式変位計
US8717560B2 (en) 2010-05-04 2014-05-06 University Of Maine System Board Of Trustees Ring grating spectrometer
JP5517753B2 (ja) * 2010-06-03 2014-06-11 キヤノン株式会社 干渉計測装置
DE102011081879A1 (de) * 2010-11-03 2012-05-03 Dr. Johannes Heidenhain Gmbh Optische Winkelmesseinrichtung
DE102010063253A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
TWI592637B (zh) 2014-11-21 2017-07-21 財團法人工業技術研究院 光學編碼器
CN106403821A (zh) * 2015-07-27 2017-02-15 中国科学院苏州纳米技术与纳米仿生研究所 一种位移传感器及其使用、制作方法和一种干涉仪
JP7118809B2 (ja) * 2018-08-27 2022-08-16 キヤノン株式会社 位置検出装置およびこれを備えた装置、位置検出方法およびコンピュータプログラム
CN109631976A (zh) * 2019-01-07 2019-04-16 武汉海达数云技术有限公司 圆光栅角度误差补偿方法及装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3633574A1 (de) * 1986-10-02 1988-04-14 Heidenhain Gmbh Dr Johannes Lichtelektrische winkelmesseinrichtung
JPH025127A (ja) 1988-06-24 1990-01-10 Nec Corp 一桁ｂｃｄコード累積加算回路
JP3082516B2 (ja) * 1993-05-31 2000-08-28 キヤノン株式会社 光学式変位センサおよび該光学式変位センサを用いた駆動システム
JPH08210814A (ja) * 1994-10-12 1996-08-20 Canon Inc 光学式変位測定装置
CN1151361C (zh) * 1996-05-20 2004-05-26 松下电器产业株式会社 光学编码器及位置检测方法
US6635863B1 (en) * 1999-08-06 2003-10-21 Mitutoyo Corporation Optical encoder
JP4846909B2 (ja) * 2000-02-15 2011-12-28 キヤノン株式会社 光学式エンコーダ及び回折格子の変位測定方法

Also Published As

Publication number Publication date
EP1353153A1 (de) 2003-10-15
JP3977126B2 (ja) 2007-09-19
US20030193017A1 (en) 2003-10-16
CN1451942A (zh) 2003-10-29
US6958469B2 (en) 2005-10-25
KR100509322B1 (ko) 2005-08-22
CN1181311C (zh) 2004-12-22
EP1353153B1 (de) 2005-08-24
KR20030081182A (ko) 2003-10-17
DE60301365T2 (de) 2006-01-19
JP2003302259A (ja) 2003-10-24

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Legal Events

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