DE602008003051D1 - Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises - Google Patents

Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises

Info

Publication number
DE602008003051D1
DE602008003051D1 DE602008003051T DE602008003051T DE602008003051D1 DE 602008003051 D1 DE602008003051 D1 DE 602008003051D1 DE 602008003051 T DE602008003051 T DE 602008003051T DE 602008003051 T DE602008003051 T DE 602008003051T DE 602008003051 D1 DE602008003051 D1 DE 602008003051D1
Authority
DE
Germany
Prior art keywords
detection
electronic circuit
toggle switch
state fault
bistable toggle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602008003051T
Other languages
English (en)
Inventor
Frederic Bancel
David Hely
Nicolas Berard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Publication of DE602008003051D1 publication Critical patent/DE602008003051D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
    • G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
    • G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
    • G06F21/755—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation with measures against power attack
DE602008003051T 2007-05-18 2008-05-13 Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises Active DE602008003051D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0755126 2007-05-18

Publications (1)

Publication Number Publication Date
DE602008003051D1 true DE602008003051D1 (de) 2010-12-02

Family

ID=38698124

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602008003051T Active DE602008003051D1 (de) 2007-05-18 2008-05-13 Erkennung einer Zustandsstörung eines bistabilen Kippschalters eines elektronischen Schaltkreises

Country Status (3)

Country Link
US (1) US7768318B2 (de)
EP (1) EP1993057B1 (de)
DE (1) DE602008003051D1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2946787A1 (fr) * 2009-06-16 2010-12-17 St Microelectronics Rousset Procede de detection d'une attaque par injection de faute d'un dispositif de memoire, et dispositif de memoire correspondant
US9124413B2 (en) * 2011-10-26 2015-09-01 Qualcomm Incorporated Clock and data recovery for NFC transceivers
EP3084648B1 (de) * 2013-12-18 2019-06-12 NXP USA, Inc. Speicherelement mit einer überwachungsschaltung und entsprechendes verfahren
DE102013227165A1 (de) * 2013-12-27 2015-07-16 Siemens Aktiengesellschaft Überwachungsvorrichtung zur Überwachung eines Schaltkreises
US9523736B2 (en) 2014-06-19 2016-12-20 Nuvoton Technology Corporation Detection of fault injection attacks using high-fanout networks
US9397666B2 (en) 2014-07-22 2016-07-19 Winbond Electronics Corporation Fault protection for clock tree circuitry
US10013581B2 (en) 2014-10-07 2018-07-03 Nuvoton Technology Corporation Detection of fault injection attacks
FR3051599A1 (fr) 2016-05-17 2017-11-24 Stmicroelectronics Rousset Protection d'un circuit integre
DE102016118534A1 (de) * 2016-09-29 2018-03-29 Infineon Technologies Ag Schaltung und Verfahren zum Prüfen der Integrität eines Steuersignals
US11531785B2 (en) 2019-09-13 2022-12-20 Arizona Board Of Regents On Behalf Of Northern Arizona University PUF-based data integrity
US11321457B2 (en) 2019-09-16 2022-05-03 Nuvoton Technology Corporation Data-sampling integrity check by sampling using flip-flops with relative delay
US11244046B2 (en) 2019-09-16 2022-02-08 Nuvoton Technology Corporation Data-sampling integrity check using gated clock
US11366899B2 (en) 2020-02-18 2022-06-21 Nuvoton Technology Corporation Digital fault injection detector
DE112021003078T5 (de) * 2020-06-02 2023-03-16 Microchip Technology Incorporated Detektion von fehlerinjektionsereignissen an einem chip und zugehörige systeme, verfahren und vorrichtungen
US11783026B2 (en) * 2021-01-05 2023-10-10 Nuvoton Technology Corporation Processor with in-band fault-injection detection

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2859189B2 (ja) * 1995-12-27 1999-02-17 日本電気アイシーマイコンシステム株式会社 タイミングエラー検出回路
JP2002251227A (ja) * 2001-02-23 2002-09-06 Nec Microsystems Ltd クロック監視回路、データ処理装置、データ処理システム
FR2867325A1 (fr) 2004-03-02 2005-09-09 St Microelectronics Sa Dispositif de protection contre l'injection d'erreur dans un bloc logique asynchrone d'un module logique elementaire
JP4401236B2 (ja) * 2004-05-07 2010-01-20 富士通マイクロエレクトロニクス株式会社 信号検出回路および信号検出方法

Also Published As

Publication number Publication date
US20090315603A1 (en) 2009-12-24
EP1993057B1 (de) 2010-10-20
EP1993057A1 (de) 2008-11-19
US7768318B2 (en) 2010-08-03

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