DE602008001685D1 - In-Situ-STEM-Probenherstellung - Google Patents

In-Situ-STEM-Probenherstellung

Info

Publication number
DE602008001685D1
DE602008001685D1 DE602008001685T DE602008001685T DE602008001685D1 DE 602008001685 D1 DE602008001685 D1 DE 602008001685D1 DE 602008001685 T DE602008001685 T DE 602008001685T DE 602008001685 T DE602008001685 T DE 602008001685T DE 602008001685 D1 DE602008001685 D1 DE 602008001685D1
Authority
DE
Germany
Prior art keywords
sample
stem
sample preparation
fib
tem sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602008001685T
Other languages
English (en)
Inventor
Liang Hong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FEI Co
Original Assignee
FEI Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39708954&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE602008001685(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by FEI Co filed Critical FEI Co
Publication of DE602008001685D1 publication Critical patent/DE602008001685D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
    • H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching
    • H01J37/3056—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching for microworking, e.g. etching of gratings, trimming of electrical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/3174—Etching microareas
    • H01J2237/31745—Etching microareas for preparing specimen to be viewed in microscopes or analyzed in microanalysers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602008001685T 2007-06-01 2008-05-30 In-Situ-STEM-Probenherstellung Active DE602008001685D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/809,715 US8835845B2 (en) 2007-06-01 2007-06-01 In-situ STEM sample preparation

Publications (1)

Publication Number Publication Date
DE602008001685D1 true DE602008001685D1 (de) 2010-08-19

Family

ID=39708954

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602008001685T Active DE602008001685D1 (de) 2007-06-01 2008-05-30 In-Situ-STEM-Probenherstellung

Country Status (5)

Country Link
US (1) US8835845B2 (de)
EP (1) EP1998356B1 (de)
JP (1) JP5090255B2 (de)
AT (1) ATE473512T1 (de)
DE (1) DE602008001685D1 (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4533306B2 (ja) * 2005-12-06 2010-09-01 株式会社日立ハイテクノロジーズ 半導体ウェハ検査方法及び欠陥レビュー装置
JP5127148B2 (ja) * 2006-03-16 2013-01-23 株式会社日立ハイテクノロジーズ イオンビーム加工装置
DE102007026847A1 (de) * 2007-06-06 2008-12-11 Carl Zeiss Nts Gmbh Teilchenstrahlgerät und Verfahren zur Anwendung bei einem Teilchenstrahlgerät
WO2009114112A2 (en) 2008-03-08 2009-09-17 Omniprobe, Inc. Method and apparatus for precursor delivery system for irradiation beam instruments
WO2010014252A2 (en) * 2008-08-01 2010-02-04 Omniprobe, Inc. Grid holder for stem analysis in a charged particle instrument
JP5302595B2 (ja) * 2008-08-06 2013-10-02 株式会社日立ハイテクノロジーズ 傾斜観察方法および観察装置
DE102008052006B4 (de) * 2008-10-10 2018-12-20 3D-Micromac Ag Verfahren und Vorrichtung zur Herstellung von Proben für die Transmissionselektronenmikroskopie
EP2367195B1 (de) * 2008-10-31 2014-03-12 FEI Company Messung der Probendicke und Endpunkbestimmung
JP5103422B2 (ja) * 2009-02-27 2012-12-19 株式会社日立ハイテクノロジーズ 荷電粒子ビーム装置
US20110017922A1 (en) * 2009-07-24 2011-01-27 Omniprobe, Inc. Variable-tilt tem specimen holder for charged-particle beam instruments
CN101988909B (zh) * 2009-08-06 2012-03-07 中芯国际集成电路制造(上海)有限公司 低k介电材料的失效分析方法
JP2011187267A (ja) * 2010-03-08 2011-09-22 Jeol Ltd 試料ホルダ及びマルチビームシステム
DE102010024625A1 (de) * 2010-06-22 2011-12-22 Carl Zeiss Nts Gmbh Verfahren zum Bearbeiten eines Objekts
JP5386453B2 (ja) * 2010-08-24 2014-01-15 株式会社日立ハイテクノロジーズ 荷電粒子線装置および試料観察方法
DE102011002583B9 (de) * 2011-01-12 2018-06-28 Carl Zeiss Microscopy Gmbh Teilchenstrahlgerät und Verfahren zur Bearbeitung und/oder Analyse einer Probe
WO2012103534A1 (en) * 2011-01-28 2012-08-02 Fei Company Tem sample preparation
DE102011006588A1 (de) * 2011-03-31 2012-10-04 Carl Zeiss Nts Gmbh Teilchenstrahlgerät mit Detektoranordnung
US8912490B2 (en) 2011-06-03 2014-12-16 Fei Company Method for preparing samples for imaging
US8859963B2 (en) 2011-06-03 2014-10-14 Fei Company Methods for preparing thin samples for TEM imaging
US8604446B2 (en) 2011-08-08 2013-12-10 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of The University Of Oregon Devices and methods for cryo lift-out with in situ probe
WO2013082496A1 (en) 2011-12-01 2013-06-06 Fei Company High throughput tem preparation processes and hardware for backside thinning of cross-sectional view lamella
DE102012202519A1 (de) * 2012-02-17 2013-08-22 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtungen zur Präparation mikroskopischer Proben mit Hilfe von gepulstem Licht
US8884247B2 (en) * 2012-09-25 2014-11-11 Fei Company System and method for ex situ analysis of a substrate
DE102012020478A1 (de) * 2012-10-18 2014-05-08 Carl Zeiss Microscopy Gmbh Teilchenstrahlsystem und Verfahren zum Bearbeiten einer TEM-Probe
EP2765591B1 (de) * 2013-02-08 2016-07-13 FEI Company Probenvorbereitungshalter
CZ2013547A3 (cs) * 2013-07-11 2014-11-19 Tescan Orsay Holding, A.S. Způsob opracovávání vzorku v zařízení se dvěma nebo více částicovými svazky a zařízení k jeho provádění
JP6453580B2 (ja) * 2013-08-14 2019-01-16 エフ・イ−・アイ・カンパニー 試料調製中におけるｔｅｍ試料からのプローブの分離
EP2899744A1 (de) * 2014-01-24 2015-07-29 Carl Zeiss Microscopy GmbH Verfahren zur Herstellung und Analyse eines Objekts und Teilchenstrahlvorrichtung zur Durchführung des Verfahrens
CN104091745B (zh) * 2014-07-18 2016-06-01 镇江乐华电子科技有限公司 一种集成tem荧光屏和stem探测器的一体化结构
JP6346034B2 (ja) * 2014-08-29 2018-06-20 日本電子株式会社 ３次元像構築方法、画像処理装置、および電子顕微鏡
US20160189929A1 (en) * 2014-10-29 2016-06-30 Omniprobe, Inc. Rapid tem sample preparation method with backside fib milling
EP3038131A1 (de) 2014-12-22 2016-06-29 FEI Company Verbesserter Probenhalter für Ladungsträgerteilchenmikroskop
US9978560B2 (en) 2016-06-30 2018-05-22 International Business Machines Corporation System and method for performing nano beam diffraction analysis
DE102017212020B3 (de) 2017-07-13 2018-05-30 Carl Zeiss Microscopy Gmbh Verfahren zur In-situ-Präparation und zum Transfer mikroskopischer Proben, Computerprogrammprodukt sowie mikroskopische Probe
US10453646B2 (en) * 2017-09-06 2019-10-22 Fei Company Tomography-assisted TEM prep with requested intervention automation workflow
CN109839517B (zh) * 2017-11-28 2023-10-10 中国科学院金属研究所 扫描或聚焦离子束电镜连接透射电镜样品杆的转换装置
DE102018108974B3 (de) * 2018-04-16 2019-05-09 Carl Zeiss Microscopy Gmbh Verfahren zum Herstellen einer TEM-Probe
CN109461640B (zh) * 2018-11-30 2024-03-22 中国科学院金属研究所 透射、扫描和聚焦离子束电镜通用样品杆及转接装置
CN112577982A (zh) * 2020-12-09 2021-03-30 广州添利电子科技有限公司 一种pcb表面处理金属薄层质量分析方法
TWI782719B (zh) * 2021-09-28 2022-11-01 汎銓科技股份有限公司 一種製備掃描電容顯微鏡試片的方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5435850A (en) 1993-09-17 1995-07-25 Fei Company Gas injection system
US5851413A (en) 1996-06-19 1998-12-22 Micrion Corporation Gas delivery systems for particle beam processing
US6841788B1 (en) * 2000-08-03 2005-01-11 Ascend Instruments, Inc. Transmission electron microscope sample preparation
JP4178741B2 (ja) * 2000-11-02 2008-11-12 株式会社日立製作所 荷電粒子線装置および試料作製装置
JP2004071486A (ja) * 2002-08-09 2004-03-04 Seiko Instruments Inc 集束荷電粒子ビーム装置
NL1022426C2 (nl) * 2003-01-17 2004-07-26 Fei Co Werkwijze voor het vervaardigen en transmissief bestralen van een preparaat alsmede deeltjes optisch systeem.
EP1473560B1 (de) 2003-04-28 2006-09-20 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Vorrichtung und Verfahren zur Untersuchung einer Probe eines Prüfkörpers mittels Elektronenstrahls
JP2006114225A (ja) * 2004-10-12 2006-04-27 Hitachi High-Technologies Corp 荷電粒子線装置
JP4664041B2 (ja) * 2004-10-27 2011-04-06 株式会社日立ハイテクノロジーズ 荷電粒子ビーム装置及び試料作製方法
JP5020483B2 (ja) 2005-07-08 2012-09-05 株式会社日立ハイテクノロジーズ 荷電粒子線装置
US7423263B2 (en) * 2006-06-23 2008-09-09 Fei Company Planar view sample preparation
WO2008051937A2 (en) 2006-10-20 2008-05-02 Fei Company Method for creating s/tem sample and sample structure
US7834315B2 (en) * 2007-04-23 2010-11-16 Omniprobe, Inc. Method for STEM sample inspection in a charged particle beam instrument

Also Published As

Publication number Publication date
JP2009014709A (ja) 2009-01-22
EP1998356B1 (de) 2010-07-07
US20080296498A1 (en) 2008-12-04
US8835845B2 (en) 2014-09-16
JP5090255B2 (ja) 2012-12-05
ATE473512T1 (de) 2010-07-15
EP1998356A2 (de) 2008-12-03
EP1998356A3 (de) 2009-03-11

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