DE602007003470D1 - Monolithisch integrierte einkristalline mikromechanische elemente - Google Patents
Monolithisch integrierte einkristalline mikromechanische elementeInfo
- Publication number
- DE602007003470D1 DE602007003470D1 DE602007003470T DE602007003470T DE602007003470D1 DE 602007003470 D1 DE602007003470 D1 DE 602007003470D1 DE 602007003470 T DE602007003470 T DE 602007003470T DE 602007003470 T DE602007003470 T DE 602007003470T DE 602007003470 D1 DE602007003470 D1 DE 602007003470D1
- Authority
- DE
- Germany
- Prior art keywords
- porous
- domain
- sacrificial layer
- conducting property
- exposed surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910021426 porous silicon Inorganic materials 0.000 abstract 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 239000010409 thin film Substances 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00222—Integrating an electronic processing unit with a micromechanical structure
- B81C1/00246—Monolithic integration, i.e. micromechanical structure and electronic processing unit are integrated on the same substrate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/22—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring the force applied to control members, e.g. control members of vehicles, triggers
- G01L5/226—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring the force applied to control members, e.g. control members of vehicles, triggers to manipulators, e.g. the force due to gripping
- G01L5/228—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring the force applied to control members, e.g. control members of vehicles, triggers to manipulators, e.g. the force due to gripping using tactile array force sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0292—Sensors not provided for in B81B2201/0207 - B81B2201/0285
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0127—Diaphragms, i.e. structures separating two media that can control the passage from one medium to another; Membranes, i.e. diaphragms with filtering function
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/01—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS
- B81B2207/015—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS the micromechanical device and the control or processing electronics being integrated on the same substrate
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0111—Bulk micromachining
- B81C2201/0115—Porous silicon
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/07—Integrating an electronic processing unit with a micromechanical structure
- B81C2203/0707—Monolithic integration, i.e. the electronic processing unit is formed on or in the same substrate as the micromechanical structure
- B81C2203/0714—Forming the micromechanical structure with a CMOS process
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/07—Integrating an electronic processing unit with a micromechanical structure
- B81C2203/0707—Monolithic integration, i.e. the electronic processing unit is formed on or in the same substrate as the micromechanical structure
- B81C2203/0742—Interleave, i.e. simultaneously forming the micromechanical structure and the CMOS circuit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pressure Sensors (AREA)
- Micromachines (AREA)
- Silicon Compounds (AREA)
- Weting (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU0600488A HUP0600488A2 (en) | 2006-06-13 | 2006-06-13 | Method for producing micromechanical elements can be integrated into cmos technology, carrying monolith si and monolith sio produced by porous si micromanufacturing process |
PCT/HU2007/000053 WO2007144677A2 (en) | 2006-06-13 | 2007-06-13 | Cmos integrated process for fabricating monocrystalline silicon micromechanical elements by porous silicon micromachining and sensor chip comprising such element |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007003470D1 true DE602007003470D1 (de) | 2010-01-07 |
Family
ID=89986840
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007003470T Active DE602007003470D1 (de) | 2006-06-13 | 2007-06-13 | Monolithisch integrierte einkristalline mikromechanische elemente |
Country Status (6)
Country | Link |
---|---|
US (1) | US8115240B2 (de) |
EP (1) | EP2027058B1 (de) |
AT (1) | ATE449744T1 (de) |
DE (1) | DE602007003470D1 (de) |
HU (1) | HUP0600488A2 (de) |
WO (1) | WO2007144677A2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
HUP0600488A2 (en) * | 2006-06-13 | 2008-05-28 | Mta Mueszaki Fiz Es Anyagtudom | Method for producing micromechanical elements can be integrated into cmos technology, carrying monolith si and monolith sio produced by porous si micromanufacturing process |
TWI373450B (en) * | 2009-07-29 | 2012-10-01 | Pixart Imaging Inc | Microelectronic device and method for fabricating mems resonator thereof |
CN114377423A (zh) * | 2009-09-01 | 2022-04-22 | 蓝区技术有限公司 | 用于气体处理的系统和方法 |
DE102011081033B4 (de) * | 2011-08-16 | 2022-02-17 | Robert Bosch Gmbh | Verfahren zur Herstellung einer mikromechanischen Struktur und mikromechanische Struktur |
CN103644985A (zh) * | 2013-12-11 | 2014-03-19 | 江苏物联网研究发展中心 | 多量程cmos mems电容式压力传感器芯片 |
US10876986B2 (en) * | 2016-10-05 | 2020-12-29 | Hewlett-Packard Development Company, L.P. | Insulated sensors |
DE102017218883A1 (de) * | 2017-10-23 | 2019-04-25 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Mikroelektromechanisches Bauteil sowie ein Verfahren zu seiner Herstellung |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4745812A (en) * | 1987-03-25 | 1988-05-24 | The United States Of America As Represented By The Secretary Of The Army | Triaxial tactile sensor |
US5055838A (en) * | 1988-12-09 | 1991-10-08 | The Regents Of The University Of Michigan | Silicon tactile imaging array and method of making same |
US5237879A (en) * | 1991-10-11 | 1993-08-24 | At&T Bell Laboratories | Apparatus for dynamically varying the resolution of a tactile sensor array |
CA2203297A1 (en) * | 1991-12-13 | 1993-06-14 | American Telephone And Telegraph Company | Intelligent work surfaces |
US5760530A (en) * | 1992-12-22 | 1998-06-02 | The United States Of America As Represented By The Secretary Of The Air Force | Piezoelectric tactile sensor |
JP3399660B2 (ja) * | 1994-10-06 | 2003-04-21 | 株式会社東海理化電機製作所 | 表面型の加速度センサの製造方法 |
US5604144A (en) * | 1995-05-19 | 1997-02-18 | Kulite Semiconductor Products, Inc. | Method for fabricating active devices on a thin membrane structure using porous silicon or porous silicon carbide |
SG96541A1 (en) * | 1997-08-14 | 2003-06-16 | Inst Of Microelectronics | Design of a novel tactile sensor |
SG68002A1 (en) * | 1997-11-25 | 1999-10-19 | Inst Of Microelectronics Natio | Cmos compatible integrated pressure sensor |
DE10064494A1 (de) * | 2000-12-22 | 2002-07-04 | Bosch Gmbh Robert | Verfahren zur Herstellung eines Halbleiterbauelements sowie ein nach dem Verfahren hergestelltes Halbleiterbauelement, wobei das Halbleiterbauelement insbesondere eine bewegliche Masse aufweist |
US7521257B2 (en) * | 2003-02-11 | 2009-04-21 | The Board Of Regents Of The Nevada System Of Higher Education On Behalf Of The University Of Nevada, Reno | Chemical sensor with oscillating cantilevered probe and mechanical stop |
US7260980B2 (en) * | 2003-03-11 | 2007-08-28 | Adams Jesse D | Liquid cell and passivated probe for atomic force microscopy and chemical sensing |
WO2005001422A2 (en) * | 2003-06-06 | 2005-01-06 | The Board Of Trustees Of The University Of Illinois | Sensor chip and apparatus for tactile and/or flow |
US7694346B2 (en) * | 2004-10-01 | 2010-04-06 | Board Of Regents Of The Nevada System Of Higher Education On Behalf Of The University Of Nevada | Cantilevered probe detector with piezoelectric element |
FR2883372B1 (fr) * | 2005-03-17 | 2007-06-29 | Commissariat Energie Atomique | Dispositif de mesure de force par detection resistive a double pont de wheastone |
US8127623B2 (en) * | 2005-05-18 | 2012-03-06 | Pressure Profile Systems Inc. | Capacitive tactile tile sensor |
WO2007143123A2 (en) * | 2006-06-02 | 2007-12-13 | The Board Of Trustees Of The University Of Illinois | Micromachined artificial haircell |
HUP0600488A2 (en) * | 2006-06-13 | 2008-05-28 | Mta Mueszaki Fiz Es Anyagtudom | Method for producing micromechanical elements can be integrated into cmos technology, carrying monolith si and monolith sio produced by porous si micromanufacturing process |
-
2006
- 2006-06-13 HU HU0600488A patent/HUP0600488A2/hu unknown
-
2007
- 2007-06-13 AT AT07733870T patent/ATE449744T1/de not_active IP Right Cessation
- 2007-06-13 WO PCT/HU2007/000053 patent/WO2007144677A2/en active Application Filing
- 2007-06-13 EP EP07733870A patent/EP2027058B1/de not_active Not-in-force
- 2007-06-13 DE DE602007003470T patent/DE602007003470D1/de active Active
-
2008
- 2008-12-12 US US12/314,547 patent/US8115240B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP2027058B1 (de) | 2009-11-25 |
EP2027058A2 (de) | 2009-02-25 |
ATE449744T1 (de) | 2009-12-15 |
WO2007144677A2 (en) | 2007-12-21 |
HU0600488D0 (en) | 2006-08-28 |
WO2007144677A3 (en) | 2008-02-14 |
US8115240B2 (en) | 2012-02-14 |
US20090261387A1 (en) | 2009-10-22 |
HUP0600488A2 (en) | 2008-05-28 |
WO2007144677A8 (en) | 2008-04-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |