DE602006019024D1 - Vorrichtung zur Messung von Magnetsignalen - Google Patents

Vorrichtung zur Messung von Magnetsignalen

Info

Publication number
DE602006019024D1
DE602006019024D1 DE602006019024T DE602006019024T DE602006019024D1 DE 602006019024 D1 DE602006019024 D1 DE 602006019024D1 DE 602006019024 T DE602006019024 T DE 602006019024T DE 602006019024 T DE602006019024 T DE 602006019024T DE 602006019024 D1 DE602006019024 D1 DE 602006019024D1
Authority
DE
Germany
Prior art keywords
magnetic signals
measuring magnetic
measuring
signals
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006019024T
Other languages
German (de)
English (en)
Inventor
Daisuke Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of DE602006019024D1 publication Critical patent/DE602006019024D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/025—Compensating stray fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0047—Housings or packaging of magnetic sensors ; Holders

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Measuring Magnetic Variables (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
DE602006019024T 2005-06-10 2006-06-06 Vorrichtung zur Messung von Magnetsignalen Active DE602006019024D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005170300A JP4671770B2 (ja) 2005-06-10 2005-06-10 磁場計測装置

Publications (1)

Publication Number Publication Date
DE602006019024D1 true DE602006019024D1 (de) 2011-02-03

Family

ID=36949628

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006019024T Active DE602006019024D1 (de) 2005-06-10 2006-06-06 Vorrichtung zur Messung von Magnetsignalen

Country Status (5)

Country Link
US (1) US7259570B1 (enExample)
EP (1) EP1731917B1 (enExample)
JP (1) JP4671770B2 (enExample)
CN (1) CN100554991C (enExample)
DE (1) DE602006019024D1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5165963B2 (ja) * 2007-08-14 2013-03-21 新科實業有限公司 磁気センサ及びその製造方法
JP4990194B2 (ja) * 2008-03-07 2012-08-01 株式会社神戸製鋼所 磁石位置測定方法
JP2013077698A (ja) * 2011-09-30 2013-04-25 Seiko Epson Corp 磁気シールド
CN103033786B (zh) * 2011-10-08 2015-07-08 中国科学院空间科学与应用研究中心 一种三轴矢量磁强计正交校准方法及装置
CN103472271B (zh) * 2012-06-08 2016-05-18 中国科学院空间科学与应用研究中心 一种低频波段磁屏蔽筒
CN102743167B (zh) * 2012-07-06 2013-10-23 重庆金山科技（集团）有限公司 用于磁感应成像系统的集成屏蔽线圈传感器
CN104880680B (zh) * 2014-02-28 2017-12-05 中国科学院上海微系统与信息技术研究所 超导量子干涉器磁传感系统
JP6430201B2 (ja) * 2014-09-30 2018-11-28 株式会社東芝 センサ
CN104739411B (zh) * 2015-04-01 2017-04-05 南京医科大学 一种使用磁传感器对磁性目标进行检测定位的方法
CN106291007B (zh) * 2015-06-02 2019-07-30 中国科学院物理研究所 一种磁屏蔽装置
CN105301549B (zh) * 2015-11-25 2018-10-12 广西电网有限责任公司电力科学研究院 一种利用三维磁场测试电流互感器磁屏蔽的方法及系统
US10507317B2 (en) 2015-12-31 2019-12-17 St Jude Medical International Holding S.À R.L. Connector shield for sensor enabled medical devices
GB2576579A (en) * 2018-08-24 2020-02-26 Magnetic Shields Ltd Magnetic shield device
CN110703164B (zh) * 2019-10-18 2024-05-14 中国原子能科学研究院 一种回旋加速器的磁屏蔽磁场测量装置
CN110702999B (zh) * 2019-11-21 2022-03-01 中国工程物理研究院应用电子学研究所 一种强电磁脉冲屏蔽效能测试系统及方法
CN110907867B (zh) * 2019-12-13 2022-03-22 中国人民解放军国防科技大学 一种用于巨磁阻抗传感器的磁聚焦装置及巨磁阻抗传感器
CN111624537B (zh) * 2020-07-22 2022-11-04 北京航空航天大学杭州创新研究院 一种生物细胞物理特性测试装置及其测试方法
CN113040775A (zh) * 2021-03-22 2021-06-29 漫迪医疗仪器（上海）有限公司 生物磁探测装置、方法、存储介质及控制终端

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0697696A (ja) 1992-07-24 1994-04-08 Dowa Mining Co Ltd 超電導磁気シールド体
JPH09214166A (ja) 1996-01-29 1997-08-15 Sumitomo Electric Ind Ltd 磁気シールド
JPH11128193A (ja) 1997-10-29 1999-05-18 Hitachi Ltd 生体磁気計測装置
KR100238446B1 (ko) * 1997-11-20 2000-01-15 정선종 회전형 결합 전송 선로 셀
JP3518502B2 (ja) 2000-10-19 2004-04-12 株式会社日立製作所 生体磁場計測装置
JP3454246B2 (ja) * 2000-10-30 2003-10-06 株式会社日立製作所 磁場計測装置
CN2457615Y (zh) * 2000-11-17 2001-10-31 中国人民解放军海军装备部驻重庆地区军事代表局 三轴磁传感器综合参数测试装置
JP2003339659A (ja) * 2002-05-23 2003-12-02 Hitachi Ltd 超電導磁気シールド装置
JP4110950B2 (ja) 2002-11-29 2008-07-02 株式会社日立製作所 磁気シールド装置及び生体磁場計測装置
JP3642061B2 (ja) * 2003-05-19 2005-04-27 株式会社日立製作所 磁場計測装置
JP3699967B2 (ja) 2003-10-31 2005-09-28 株式会社日立製作所 生体磁場計測装置
JP4520904B2 (ja) 2005-06-03 2010-08-11 株式会社日立製作所 生体磁場計測装置

Also Published As

Publication number Publication date
EP1731917B1 (en) 2010-12-22
CN1877354A (zh) 2006-12-13
JP4671770B2 (ja) 2011-04-20
CN100554991C (zh) 2009-10-28
EP1731917A3 (en) 2010-03-10
JP2006340937A (ja) 2006-12-21
US7259570B1 (en) 2007-08-21
EP1731917A2 (en) 2006-12-13

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