DE602006009696D1 - Verfahren und vorrichtung zur analyse der modellqualität in einer prozesssteuerungsumgebung - Google Patents

Verfahren und vorrichtung zur analyse der modellqualität in einer prozesssteuerungsumgebung

Info

Publication number
DE602006009696D1
DE602006009696D1 DE602006009696T DE602006009696T DE602006009696D1 DE 602006009696 D1 DE602006009696 D1 DE 602006009696D1 DE 602006009696 T DE602006009696 T DE 602006009696T DE 602006009696 T DE602006009696 T DE 602006009696T DE 602006009696 D1 DE602006009696 D1 DE 602006009696D1
Authority
DE
Germany
Prior art keywords
analysis
process control
control environment
model quality
quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006009696T
Other languages
English (en)
Inventor
Charles Q Zhan
Joseph Z Lu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of DE602006009696D1 publication Critical patent/DE602006009696D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B17/00—Systems involving the use of models or simulators of said systems
    • G05B17/02—Systems involving the use of models or simulators of said systems electric

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Feedback Control In General (AREA)
  • Testing And Monitoring For Control Systems (AREA)
DE602006009696T 2005-11-17 2006-11-13 Verfahren und vorrichtung zur analyse der modellqualität in einer prozesssteuerungsumgebung Active DE602006009696D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/281,277 US7421374B2 (en) 2005-11-17 2005-11-17 Apparatus and method for analyzing model quality in a process control environment
PCT/US2006/043995 WO2007061665A1 (en) 2005-11-17 2006-11-13 Apparatus and method for analyzing model quality in a process control environment

Publications (1)

Publication Number Publication Date
DE602006009696D1 true DE602006009696D1 (de) 2009-11-19

Family

ID=37776599

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006009696T Active DE602006009696D1 (de) 2005-11-17 2006-11-13 Verfahren und vorrichtung zur analyse der modellqualität in einer prozesssteuerungsumgebung

Country Status (6)

Country Link
US (1) US7421374B2 (de)
EP (1) EP1949187B1 (de)
JP (1) JP2009516301A (de)
CN (1) CN101361029B (de)
DE (1) DE602006009696D1 (de)
WO (1) WO2007061665A1 (de)

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US8620622B2 (en) * 2009-04-02 2013-12-31 Honeywell International Inc. System and method for determining health indicators for impellers
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US10203667B2 (en) * 2011-09-01 2019-02-12 Honeywell International Inc. Apparatus and method for predicting windup and improving process control in an industrial process control system
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US9803902B2 (en) 2013-03-15 2017-10-31 Emerson Climate Technologies, Inc. System for refrigerant charge verification using two condenser coil temperatures
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US9551504B2 (en) 2013-03-15 2017-01-24 Emerson Electric Co. HVAC system remote monitoring and diagnosis
EP2981772B1 (de) 2013-04-05 2022-01-12 Emerson Climate Technologies, Inc. Wärmepumpensystem mit kühlmittelladungsdiagnostik
CN105807611B (zh) * 2016-03-05 2018-06-12 华中科技大学 一种闭环控制系统的模型与对象不匹配的检测方法
CN105700358B (zh) * 2016-03-14 2018-06-12 华中科技大学 一种带漂移干扰的模型预测控制器的建模质量监控方法
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US10976712B2 (en) 2018-02-05 2021-04-13 Honeywell International Inc. Method and system to provide cost of lost opportunity to operators in real time using advance process control
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US11782401B2 (en) 2019-08-02 2023-10-10 Aspentech Corporation Apparatus and methods to build deep learning controller using non-invasive closed loop exploration
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US11947339B2 (en) 2019-10-30 2024-04-02 Honeywell International Inc. Plant-wide optimization including batch operations
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Also Published As

Publication number Publication date
CN101361029B (zh) 2010-12-01
EP1949187A1 (de) 2008-07-30
JP2009516301A (ja) 2009-04-16
WO2007061665A1 (en) 2007-05-31
CN101361029A (zh) 2009-02-04
EP1949187B1 (de) 2009-10-07
US20070112442A1 (en) 2007-05-17
US7421374B2 (en) 2008-09-02

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