DE602005005093D1 - Verfahren und Vorrichtung zur Messung und Anzeige von Augenmustermessungen - Google Patents

Verfahren und Vorrichtung zur Messung und Anzeige von Augenmustermessungen

Info

Publication number
DE602005005093D1
DE602005005093D1 DE602005005093T DE602005005093T DE602005005093D1 DE 602005005093 D1 DE602005005093 D1 DE 602005005093D1 DE 602005005093 T DE602005005093 T DE 602005005093T DE 602005005093 T DE602005005093 T DE 602005005093T DE 602005005093 D1 DE602005005093 D1 DE 602005005093D1
Authority
DE
Germany
Prior art keywords
offsets
signal
operative
generate
desired time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602005005093T
Other languages
English (en)
Other versions
DE602005005093T2 (de
Inventor
Thomas Eugene Waschura
James E Waschura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Synthesis Research Inc
Original Assignee
Synthesis Research Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Synthesis Research Inc filed Critical Synthesis Research Inc
Publication of DE602005005093D1 publication Critical patent/DE602005005093D1/de
Application granted granted Critical
Publication of DE602005005093T2 publication Critical patent/DE602005005093T2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
  • Eye Examination Apparatus (AREA)
DE602005005093T 2004-02-02 2005-01-25 Verfahren und Vorrichtung zur Messung und Anzeige von Augenmustermessungen Expired - Fee Related DE602005005093T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US54140404P 2004-02-02 2004-02-02
US541404P 2004-02-02

Publications (2)

Publication Number Publication Date
DE602005005093D1 true DE602005005093D1 (de) 2008-04-17
DE602005005093T2 DE602005005093T2 (de) 2009-03-19

Family

ID=34652517

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005005093T Expired - Fee Related DE602005005093T2 (de) 2004-02-02 2005-01-25 Verfahren und Vorrichtung zur Messung und Anzeige von Augenmustermessungen

Country Status (6)

Country Link
US (1) US7467336B2 (de)
EP (1) EP1560034B1 (de)
JP (1) JP2005223911A (de)
AT (1) ATE388410T1 (de)
CA (1) CA2495844A1 (de)
DE (1) DE602005005093T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7284141B2 (en) * 2004-02-05 2007-10-16 Anritsu Company Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal
DE102004016359A1 (de) * 2004-04-02 2005-10-27 Texas Instruments Deutschland Gmbh Abtastverfahren und -vorrichtung
US20060020412A1 (en) * 2004-07-23 2006-01-26 Bruensteiner Matthew M Analog waveform information from binary sampled measurements
US20060047449A1 (en) * 2004-08-27 2006-03-02 Broadcom Corporation Graphical test development tool for use with automated test equipment
EP1643258B1 (de) * 2004-09-24 2009-12-16 Tektronic, Inc. Signalmustererkennung und Bitniveaumessungen an sich wiederholenden Signalmustern
US7743288B1 (en) * 2005-06-01 2010-06-22 Altera Corporation Built-in at-speed bit error ratio tester
JP4955303B2 (ja) * 2006-03-23 2012-06-20 テクトロニクス・インコーポレイテッド デジタル信号分析プログラム及び波形表示装置
EP1847844A1 (de) * 2006-04-21 2007-10-24 Agilent Technologies, Inc. Digitale Datensignalanalyse mittels Evaluierung abgetasteter Werte in Zusammenhang mit Signalbitwerten
US20070294590A1 (en) * 2006-05-16 2007-12-20 Texas Instruments Incorporated Compression scheme to reduce the bandwidth requirements for continuous trace stream encoding of system performance
JP5161444B2 (ja) * 2006-08-11 2013-03-13 テクトロニクス・インコーポレイテッド ジッタ特性分析プログラム及びジッタ特性の表又はグラフ表示方法
US8995514B1 (en) * 2012-09-28 2015-03-31 Xilinx, Inc. Methods of and circuits for analyzing a phase of a clock signal for receiving data
US20170109244A1 (en) * 2015-10-15 2017-04-20 Kabushiki Kaisha Toshiba Storage device and method
DE112022000932T5 (de) * 2021-02-03 2023-11-16 Tektronix, Inc. Augen-klassen-separator mit überlapp, zusammgesetzte und dynamisiche augen-trigger für menschen und maschinelles lernen
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US11923896B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
CN112800635B (zh) * 2021-04-08 2021-07-20 深圳市鼎阳科技股份有限公司 矢量网络分析仪和统计眼图生成的方法
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5124849A (en) * 1990-06-01 1992-06-23 Swan Instruments Data storage media certification process
US5228042A (en) * 1991-02-07 1993-07-13 Northern Telecom Limited Method and circuit for testing transmission paths
CA2056679C (en) * 1991-11-29 2002-02-12 Timothy Joseph Nohara Automatic monitoring of digital communication channel conditions using eye patterns
GB2340278B (en) * 1995-02-24 2000-04-19 Advantest Corp Bit error measurement system
US6430715B1 (en) * 1999-09-17 2002-08-06 Digital Lightwave, Inc. Protocol and bit rate independent test system
US6728311B1 (en) * 2000-04-04 2004-04-27 Thomas Eugene Waschura Apparatus and method for creating eye diagram
US6715112B2 (en) * 2000-11-29 2004-03-30 Agilent Technologies, Inc. Method and apparatus for displaying triggered waveform on an error performance analyzer
US20030097226A1 (en) * 2001-11-21 2003-05-22 Synthesys Apparatus and method for sampling eye diagrams with window comparators
US7310389B2 (en) * 2002-03-14 2007-12-18 Syntle Sys Research, Inc Method and apparatus for determining the errors of a multi-valued data signal that are outside the limits of an eye mask
US7606297B2 (en) * 2002-03-15 2009-10-20 Synthesys Research, Inc. Method and system for creating an eye diagram using a binary data bit decision mechanism
EP1460792A1 (de) * 2003-03-19 2004-09-22 Synthesys Research, Inc. Verfahren und System zum Erzeugen eines Augenmusters
EP1460793A1 (de) * 2003-03-19 2004-09-22 Synthesys Research, Inc. Verfahren und Vorrichtung zur Fehlerzählung eines ausserhalb des Bereiches einer Augenmaske liegenden Datensignals

Also Published As

Publication number Publication date
EP1560034A1 (de) 2005-08-03
DE602005005093T2 (de) 2009-03-19
US7467336B2 (en) 2008-12-16
JP2005223911A (ja) 2005-08-18
EP1560034B1 (de) 2008-03-05
US20050246601A1 (en) 2005-11-03
CA2495844A1 (en) 2005-08-02
ATE388410T1 (de) 2008-03-15

Similar Documents

Publication Publication Date Title
ATE388410T1 (de) Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen
EP3369375A1 (de) Verfahren und vorrichtung zur identifizierung des zustands der bewegung des menschlichen körpers
CN105612428B (zh) 局部放电测量设备、局部放电测量方法和记录介质
DE59709584D1 (de) Verfahren zur unterscheidung oder erfassung von partikeln in einer probe durch identifizierung von signalabschnitten zeitaufgelöster, optischer rohsignale aus der probe auf der basis von einzelphotonendetektion
US20090018799A1 (en) Signal baseline processing device and processing method thereof
EP1903461A3 (de) Qualitätskontrollsystem, Analysegerät und Qualitätskontrollverfahren
ATE383106T1 (de) Digitale demodulationsvorrichtung und -verfahren zur messung der elektrischen bioimpedanz oder bioadmittanz
ATE514955T1 (de) Verfahren und vorrichtung zur evaluierung des grades oberflächlicher verunreinigung eines mittel-/hochspannungs-freiluftisolators
CN101923113A (zh) 时间限定的频率掩模触发
CN105259086B (zh) 粉尘浓度的检测方法及检测系统
CN107727906B (zh) 一种示波器自动设置的方法及其设备
GB2439261A (en) Analytical instrumentation apparatus and methods
CN104062004B (zh) 一种极弱光信号探测装置及方法
CN205103129U (zh) 新型颗粒物传感器
CN106405171A (zh) 一种信号检测系统
CN102539302B (zh) 信号处理方法和装置
ATE389883T1 (de) Verfahren und vorrichtung zur messung des frequenzantworts eines digitalen empfängers
TWI265302B (en) alpha-ray measuring device and method thereof
CN104050503B (zh) 一种基于碰撞声音识别的籽粒计数传感器
ATE314758T1 (de) Fehlerratenmessungsverfahren in einem optischen übertragungssystem und vorrichtung zur ausführung des verfahrens
JP3097034B1 (ja) 信号分析装置
GB2162644A (en) Separating heartbeat sources
CN110857909B (zh) 测量微粒粒径的系统
RU2334254C1 (ru) Устройство для электромагнитного зондирования земной коры
RU2504753C1 (ru) Фотоэлектрический способ определения размеров и концентрации взвешенных частиц

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee