ATE388410T1 - Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen - Google Patents
Verfahren und vorrichtung zur messung und anzeige von augenmustermessungenInfo
- Publication number
- ATE388410T1 ATE388410T1 AT05001392T AT05001392T ATE388410T1 AT E388410 T1 ATE388410 T1 AT E388410T1 AT 05001392 T AT05001392 T AT 05001392T AT 05001392 T AT05001392 T AT 05001392T AT E388410 T1 ATE388410 T1 AT E388410T1
- Authority
- AT
- Austria
- Prior art keywords
- offsets
- signal
- operative
- generate
- desired time
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 238000005259 measurement Methods 0.000 title 1
- 238000010586 diagram Methods 0.000 abstract 3
- 239000002131 composite material Substances 0.000 abstract 2
- 230000001419 dependent effect Effects 0.000 abstract 2
- 238000005070 sampling Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/3171—BER [Bit Error Rate] test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US54140404P | 2004-02-02 | 2004-02-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE388410T1 true ATE388410T1 (de) | 2008-03-15 |
Family
ID=34652517
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05001392T ATE388410T1 (de) | 2004-02-02 | 2005-01-25 | Verfahren und vorrichtung zur messung und anzeige von augenmustermessungen |
Country Status (6)
Country | Link |
---|---|
US (1) | US7467336B2 (de) |
EP (1) | EP1560034B1 (de) |
JP (1) | JP2005223911A (de) |
AT (1) | ATE388410T1 (de) |
CA (1) | CA2495844A1 (de) |
DE (1) | DE602005005093T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7284141B2 (en) * | 2004-02-05 | 2007-10-16 | Anritsu Company | Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal |
DE102004016359A1 (de) * | 2004-04-02 | 2005-10-27 | Texas Instruments Deutschland Gmbh | Abtastverfahren und -vorrichtung |
US20060020412A1 (en) * | 2004-07-23 | 2006-01-26 | Bruensteiner Matthew M | Analog waveform information from binary sampled measurements |
US20060047449A1 (en) * | 2004-08-27 | 2006-03-02 | Broadcom Corporation | Graphical test development tool for use with automated test equipment |
DE602005018299D1 (de) * | 2004-09-24 | 2010-01-28 | Tektronix Inc | Signalmustererkennung und Bitniveaumessungen an sich wiederholenden Signalmustern |
US7743288B1 (en) * | 2005-06-01 | 2010-06-22 | Altera Corporation | Built-in at-speed bit error ratio tester |
JP4955303B2 (ja) * | 2006-03-23 | 2012-06-20 | テクトロニクス・インコーポレイテッド | デジタル信号分析プログラム及び波形表示装置 |
EP1847844A1 (de) * | 2006-04-21 | 2007-10-24 | Agilent Technologies, Inc. | Digitale Datensignalanalyse mittels Evaluierung abgetasteter Werte in Zusammenhang mit Signalbitwerten |
US20070294590A1 (en) * | 2006-05-16 | 2007-12-20 | Texas Instruments Incorporated | Compression scheme to reduce the bandwidth requirements for continuous trace stream encoding of system performance |
JP5161444B2 (ja) * | 2006-08-11 | 2013-03-13 | テクトロニクス・インコーポレイテッド | ジッタ特性分析プログラム及びジッタ特性の表又はグラフ表示方法 |
US8995514B1 (en) * | 2012-09-28 | 2015-03-31 | Xilinx, Inc. | Methods of and circuits for analyzing a phase of a clock signal for receiving data |
US20170109244A1 (en) * | 2015-10-15 | 2017-04-20 | Kabushiki Kaisha Toshiba | Storage device and method |
WO2022169996A1 (en) * | 2021-02-03 | 2022-08-11 | Tektronix, Inc. | Eye classes separator with overlay, and composite and dynamic eye-trigger for humans and machine learning |
US11923895B2 (en) | 2021-03-24 | 2024-03-05 | Tektronix, Inc. | Optical transmitter tuning using machine learning and reference parameters |
US11923896B2 (en) | 2021-03-24 | 2024-03-05 | Tektronix, Inc. | Optical transceiver tuning using machine learning |
CN112800635B (zh) * | 2021-04-08 | 2021-07-20 | 深圳市鼎阳科技股份有限公司 | 矢量网络分析仪和统计眼图生成的方法 |
US11940889B2 (en) | 2021-08-12 | 2024-03-26 | Tektronix, Inc. | Combined TDECQ measurement and transmitter tuning using machine learning |
US11907090B2 (en) | 2021-08-12 | 2024-02-20 | Tektronix, Inc. | Machine learning for taps to accelerate TDECQ and other measurements |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5124849A (en) * | 1990-06-01 | 1992-06-23 | Swan Instruments | Data storage media certification process |
US5228042A (en) * | 1991-02-07 | 1993-07-13 | Northern Telecom Limited | Method and circuit for testing transmission paths |
CA2056679C (en) * | 1991-11-29 | 2002-02-12 | Timothy Joseph Nohara | Automatic monitoring of digital communication channel conditions using eye patterns |
US5761216A (en) * | 1995-02-24 | 1998-06-02 | Advantest Corp. | Bit error measurement system |
US6430715B1 (en) * | 1999-09-17 | 2002-08-06 | Digital Lightwave, Inc. | Protocol and bit rate independent test system |
US6728311B1 (en) * | 2000-04-04 | 2004-04-27 | Thomas Eugene Waschura | Apparatus and method for creating eye diagram |
US6715112B2 (en) * | 2000-11-29 | 2004-03-30 | Agilent Technologies, Inc. | Method and apparatus for displaying triggered waveform on an error performance analyzer |
US20030097226A1 (en) * | 2001-11-21 | 2003-05-22 | Synthesys | Apparatus and method for sampling eye diagrams with window comparators |
US7310389B2 (en) * | 2002-03-14 | 2007-12-18 | Syntle Sys Research, Inc | Method and apparatus for determining the errors of a multi-valued data signal that are outside the limits of an eye mask |
US7606297B2 (en) * | 2002-03-15 | 2009-10-20 | Synthesys Research, Inc. | Method and system for creating an eye diagram using a binary data bit decision mechanism |
EP1460793A1 (de) * | 2003-03-19 | 2004-09-22 | Synthesys Research, Inc. | Verfahren und Vorrichtung zur Fehlerzählung eines ausserhalb des Bereiches einer Augenmaske liegenden Datensignals |
EP1460792A1 (de) * | 2003-03-19 | 2004-09-22 | Synthesys Research, Inc. | Verfahren und System zum Erzeugen eines Augenmusters |
-
2005
- 2005-01-24 US US11/089,565 patent/US7467336B2/en not_active Expired - Fee Related
- 2005-01-25 EP EP05001392A patent/EP1560034B1/de not_active Not-in-force
- 2005-01-25 DE DE602005005093T patent/DE602005005093T2/de not_active Expired - Fee Related
- 2005-01-25 AT AT05001392T patent/ATE388410T1/de not_active IP Right Cessation
- 2005-02-02 JP JP2005026798A patent/JP2005223911A/ja active Pending
- 2005-02-02 CA CA002495844A patent/CA2495844A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2005223911A (ja) | 2005-08-18 |
US7467336B2 (en) | 2008-12-16 |
US20050246601A1 (en) | 2005-11-03 |
EP1560034B1 (de) | 2008-03-05 |
CA2495844A1 (en) | 2005-08-02 |
DE602005005093T2 (de) | 2009-03-19 |
DE602005005093D1 (de) | 2008-04-17 |
EP1560034A1 (de) | 2005-08-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |