DE602004025272D1 - Nichthomogene abschirmung eines mram-chips mit einem magnetfeldsensor - Google Patents

Nichthomogene abschirmung eines mram-chips mit einem magnetfeldsensor

Info

Publication number
DE602004025272D1
DE602004025272D1 DE602004025272T DE602004025272T DE602004025272D1 DE 602004025272 D1 DE602004025272 D1 DE 602004025272D1 DE 602004025272 T DE602004025272 T DE 602004025272T DE 602004025272 T DE602004025272 T DE 602004025272T DE 602004025272 D1 DE602004025272 D1 DE 602004025272D1
Authority
DE
Germany
Prior art keywords
magnetic field
shielding
field sensor
thomous
mram chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004025272T
Other languages
English (en)
Inventor
Hans M Boeve
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE602004025272D1 publication Critical patent/DE602004025272D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)
  • Measuring Magnetic Variables (AREA)
DE602004025272T 2003-11-24 2004-11-09 Nichthomogene abschirmung eines mram-chips mit einem magnetfeldsensor Active DE602004025272D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP03104343 2003-11-24
PCT/IB2004/052358 WO2005050659A1 (en) 2003-11-24 2004-11-09 Non-homogeneous shielding of an mram chip with magnetic field sensor

Publications (1)

Publication Number Publication Date
DE602004025272D1 true DE602004025272D1 (de) 2010-03-11

Family

ID=34610130

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004025272T Active DE602004025272D1 (de) 2003-11-24 2004-11-09 Nichthomogene abschirmung eines mram-chips mit einem magnetfeldsensor

Country Status (9)

Country Link
US (1) US7359233B2 (de)
EP (1) EP1690262B1 (de)
JP (1) JP2007513502A (de)
KR (1) KR20070001065A (de)
CN (1) CN100547677C (de)
AT (1) ATE456137T1 (de)
DE (1) DE602004025272D1 (de)
TW (1) TW200540867A (de)
WO (1) WO2005050659A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10218785A1 (de) * 2002-04-26 2003-11-13 Infineon Technologies Ag Halbleiterspeichereinrichtung und Betriebsverfahren für eine Halbleiterspeichereinrichtung
US7324369B2 (en) * 2005-06-30 2008-01-29 Freescale Semiconductor, Inc. MRAM embedded smart power integrated circuits
US8576641B1 (en) * 2010-02-26 2013-11-05 Xilinx, Inc. Method of and circuit for providing non-volatile memory in an integrated circuit
EP2715541B1 (de) 2011-05-31 2017-12-20 Everspin Technologies, Inc. Mram-feld-störungserkennung und -wiederherstellung
US9627024B2 (en) 2013-09-19 2017-04-18 University of Pittsburgh—of the Commonwealth System of Higher Education Magnetic-assisted nondestructive self-reference sensing method for spin-transfer torque random access memory
TWI479171B (zh) * 2013-11-29 2015-04-01 Ching Ray Chang 磁場感測裝置及方法
KR102235609B1 (ko) 2014-12-08 2021-04-02 삼성전자주식회사 Mram 기반의 프레임 버퍼링 장치, 그 장치를 포함하는 디스플레이 구동 장치 및 디스플레이 장치
US11139341B2 (en) * 2018-06-18 2021-10-05 Taiwan Semiconductor Manufacturing Company, Ltd. Protection of MRAM from external magnetic field using magnetic-field-shielding structure
US11088083B2 (en) 2018-06-29 2021-08-10 Taiwan Semiconductor Manufacturing Company, Ltd. DC and AC magnetic field protection for MRAM device using magnetic-field-shielding structure
CN114200360B (zh) * 2021-11-10 2023-08-15 北京自动化控制设备研究所 三维线圈磁场均匀性测试方法及系统
CN117672285A (zh) * 2022-08-30 2024-03-08 华为技术有限公司 一种芯片及电子设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1046048A1 (de) * 1998-08-14 2000-10-25 Koninklijke Philips Electronics N.V. Magnetfeldfühler mit einem spin-tunnel-sperrschichtelement
US6872993B1 (en) * 1999-05-25 2005-03-29 Micron Technology, Inc. Thin film memory device having local and external magnetic shielding
JP2002171013A (ja) * 2000-12-04 2002-06-14 Sony Corp 磁気抵抗効果素子および磁気抵抗効果型磁気ヘッド
US6747301B1 (en) * 2002-02-06 2004-06-08 Western Digital (Fremont), Inc. Spin dependent tunneling barriers formed with a magnetic alloy
US6999339B2 (en) * 2003-04-22 2006-02-14 Micron Technology, Inc. Integrated circuit including sensor to sense environmental data, method of compensating an MRAM integrated circuit for the effects of an external magnetic field, MRAM integrated circuit, and method of testing
US7230844B2 (en) * 2004-10-12 2007-06-12 Nve Corporation Thermomagnetically assisted spin-momentum-transfer switching memory

Also Published As

Publication number Publication date
US7359233B2 (en) 2008-04-15
ATE456137T1 (de) 2010-02-15
EP1690262A1 (de) 2006-08-16
CN1886800A (zh) 2006-12-27
WO2005050659A1 (en) 2005-06-02
JP2007513502A (ja) 2007-05-24
US20070103967A1 (en) 2007-05-10
KR20070001065A (ko) 2007-01-03
CN100547677C (zh) 2009-10-07
TW200540867A (en) 2005-12-16
EP1690262B1 (de) 2010-01-20

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